JPS617556A - 二次イオン質量分析計 - Google Patents

二次イオン質量分析計

Info

Publication number
JPS617556A
JPS617556A JP60115303A JP11530385A JPS617556A JP S617556 A JPS617556 A JP S617556A JP 60115303 A JP60115303 A JP 60115303A JP 11530385 A JP11530385 A JP 11530385A JP S617556 A JPS617556 A JP S617556A
Authority
JP
Japan
Prior art keywords
ions
mass spectrometer
belt
alkali metal
primary
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60115303A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0351253B2 (cs
Inventor
Hideki Kanbara
秀記 神原
Hiroshi Hirose
広瀬　博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP60115303A priority Critical patent/JPS617556A/ja
Publication of JPS617556A publication Critical patent/JPS617556A/ja
Publication of JPH0351253B2 publication Critical patent/JPH0351253B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Sources, Ion Sources (AREA)
  • Electron Tubes For Measurement (AREA)
JP60115303A 1985-05-30 1985-05-30 二次イオン質量分析計 Granted JPS617556A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60115303A JPS617556A (ja) 1985-05-30 1985-05-30 二次イオン質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60115303A JPS617556A (ja) 1985-05-30 1985-05-30 二次イオン質量分析計

Publications (2)

Publication Number Publication Date
JPS617556A true JPS617556A (ja) 1986-01-14
JPH0351253B2 JPH0351253B2 (cs) 1991-08-06

Family

ID=14659289

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60115303A Granted JPS617556A (ja) 1985-05-30 1985-05-30 二次イオン質量分析計

Country Status (1)

Country Link
JP (1) JPS617556A (cs)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1987001452A1 (en) * 1985-08-29 1987-03-12 Hitachi, Ltd. Mass spectroscope
JPH01255147A (ja) * 1988-04-02 1989-10-12 Kokuritsu Kogai Kenkyusho 高圧質量分析法のためのイオン化法
JPH01255146A (ja) * 1988-04-02 1989-10-12 Kokuritsu Kogai Kenkyusho 高圧質量分析法のためのイオン化方法及び装置
WO2007139425A1 (en) * 2006-05-29 2007-12-06 Blashenkov Nikolai Mikhailovic Tape ioniser for the ion source of a mass-spectrometer

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5364089A (en) * 1976-11-19 1978-06-08 Hitachi Ltd Solid ion source

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5364089A (en) * 1976-11-19 1978-06-08 Hitachi Ltd Solid ion source

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1987001452A1 (en) * 1985-08-29 1987-03-12 Hitachi, Ltd. Mass spectroscope
JPH01255147A (ja) * 1988-04-02 1989-10-12 Kokuritsu Kogai Kenkyusho 高圧質量分析法のためのイオン化法
JPH01255146A (ja) * 1988-04-02 1989-10-12 Kokuritsu Kogai Kenkyusho 高圧質量分析法のためのイオン化方法及び装置
WO2007139425A1 (en) * 2006-05-29 2007-12-06 Blashenkov Nikolai Mikhailovic Tape ioniser for the ion source of a mass-spectrometer

Also Published As

Publication number Publication date
JPH0351253B2 (cs) 1991-08-06

Similar Documents

Publication Publication Date Title
Nudnova et al. Active capillary plasma source for ambient mass spectrometry
US4178507A (en) Ionization of organic substances on conveyor means in mass spectrometer
Medhe Ionization techniques in mass spectrometry: a review
US20090084950A1 (en) Apparatus for detecting chemical substances and method therefor
JPS5935347A (ja) イオン生成装置
Bookmeyer et al. Single‐photon‐induced post‐ionization to boost ion yields in MALDI mass spectrometry imaging
GB2239985A (en) Method and apparatus for surface analysis
US7442921B2 (en) Protein profiles with atmospheric pressure ionization
JPH0611485A (ja) 中性活性種の検出方法とその装置
US11527397B2 (en) Desorption ion source with dopant-gas assisted ionization
Pak et al. Internal energy distribution of peptides in electrospray ionization: ESI and collision‐induced dissociation spectra calculation
JP3300602B2 (ja) 大気圧イオン化イオントラップ質量分析方法及び装置
JPS617556A (ja) 二次イオン質量分析計
Pan et al. The characterization of selected drugs with infrared laser desorption/tunable synchrotron vacuum ultraviolet photoionization mass spectrometry
Liu et al. Direct detection of the anti‐cancer drug 9‐phenylacridine in tissues by graphite rod laser desorption vacuum‐ultraviolet post‐ionization mass spectrometry
Barber et al. Fast atom bombardment mass spectrometry (FAB). Negative-ion spectra of some simple monosaccharides
Ring et al. A comparative study of a liquid and a solid matrix in matrix‐assisted laser desorption/ionization time‐of‐flight mass spectrometry and collision cross section measurements
Yin et al. Exploration and performance evaluation of microwave‐induced plasma with different discharge gases for ambient desorption/ionization mass spectrometry
JPH0542101B2 (cs)
JP6607770B2 (ja) イオン化方法、イオン化装置及び質量分析計
Fujiwara et al. Effects of a proton‐conducting ionic liquid on secondary ion formation in time‐of‐flight secondary ion mass spectrometry
Li et al. Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters
JPH02115761A (ja) 有機化合物の質量分析法およびその装置
CN118156118A (zh) 气相离子反应装置、质谱仪及非极性化合物的检测方法
Newman et al. Organic mass spectrometry and control of fragmentation using a fast flow glow discharge ion source