JPS6173221A - Inspecting system of magnetic head - Google Patents

Inspecting system of magnetic head

Info

Publication number
JPS6173221A
JPS6173221A JP19511884A JP19511884A JPS6173221A JP S6173221 A JPS6173221 A JP S6173221A JP 19511884 A JP19511884 A JP 19511884A JP 19511884 A JP19511884 A JP 19511884A JP S6173221 A JPS6173221 A JP S6173221A
Authority
JP
Japan
Prior art keywords
head
magnetic head
magnetic
master
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19511884A
Other languages
Japanese (ja)
Inventor
Kazuo Matsuda
松田 和雄
Sunao Nakamura
直 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP19511884A priority Critical patent/JPS6173221A/en
Publication of JPS6173221A publication Critical patent/JPS6173221A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/455Arrangements for functional testing of heads; Measuring arrangements for heads

Landscapes

  • Magnetic Heads (AREA)

Abstract

PURPOSE:To inspect a magnetic head, by connecting a master magnetic head and the magnetic head to be inspected with a head tester, with the gap of the magnetic head being faced to the gap of the master head with a prescribed interval in between, and detecting the magnetic flux induced by the master head by means of the head to be inspected. CONSTITUTION:A master head (tester head) 11 is connected with a head tester 7 through a write amplifier 8 and a magnetic head to be inspected 12 is also connected with the tester 7 closely to the master head 11 through a read amplifier 9. When a write current is made to flow to the master head 11, a leakage magnetic flux 14 is produced at the gap 13 of the master head 11 and the magnetic flux 14 is detected by the gap 15 of the magnetic head to be inspected 12 and amplified by the read amplifier 9. That is to say, the crosstalk of the master head 11 against the magnetic head to be inspected 12 is received and detected.

Description

【発明の詳細な説明】 〔産業上の利用分野] 本発明は、磁気ヘッド検査に係わり、被検査磁気ヘッド
に隣接して接続された他方の磁気ヘッド(マスター磁気
ヘッド)にライト電流を流し、その漏洩磁束を積極的に
利用し、それを検出、増幅して検査する磁気ヘッド検査
方式に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to magnetic head testing, and involves passing a write current to another magnetic head (master magnetic head) connected adjacent to the magnetic head to be tested; The present invention relates to a magnetic head inspection method that actively uses the leakage magnetic flux to detect and amplify it for inspection.

磁気ヘッドを用いている磁気ディスク装置は、例えば第
3図に示すように駆動装置(図示せず)により回転する
磁気ディスク1とヘッド駆動用ポジショナ−2に取り付
けられたヘッドアーム3と該ヘッドアーム3にジンバル
バネ4を介し取り付けた磁気ヘッド5で構成されている
。なお、図のポジショナ−2はスイングアーム型を示し
、6はベースである。
For example, as shown in FIG. 3, a magnetic disk device using a magnetic head includes a magnetic disk 1 rotated by a drive device (not shown), a head arm 3 attached to a head drive positioner 2, and the head arm. 3 through a gimbal spring 4. Note that the positioner 2 in the figure shows a swing arm type, and 6 is a base.

上記磁気へ・ノド5と磁気ディスクIとの相対的な運動
中に磁気ヘッド5により情報が磁気ディスク1上に書き
込みまれ、又は読み出される。
Information is written onto or read from the magnetic disk 1 by the magnetic head 5 during the relative movement between the magnetic nodule 5 and the magnetic disk I.

磁気ヘッド5は上記のように読み/書きを行うので、一
般にヘッド出力、レベル分解能等の特性試験が行われる
。この試験はマスターディスク円板を回転させ磁気ヘッ
ドを浮上させ、ヘッド試験器によりおこなうが、磁気ヘ
ッドの浮上量が小さいため、ヘッドクラシュを起し易く
、ヘッドクラシュを起さないような磁気ヘッド検査方式
が望まれる。
Since the magnetic head 5 performs reading/writing as described above, characteristic tests such as head output and level resolution are generally performed. This test is performed using a head tester by rotating the master disk disk to levitate the magnetic head, but since the flying height of the magnetic head is small, it is easy to cause a head crash, and magnetic head testing is required to prevent head crashes. A method is desired.

〔従来の技術〕[Conventional technology]

従来の磁気ヘッド検査方式としては、第4図に示すよう
にヘッド試験器7に被検査磁気ヘッド5のライトアンプ
8.リードアンプ9を通して接続され、回転するマスク
円板10上に浮上し、リード/ライトさせ磁気へラド5
特性の検査を行っている。
In the conventional magnetic head testing method, as shown in FIG. 4, a head tester 7 includes a write amplifier 8. A magnetic helad 5 is connected through a read amplifier 9, floats above a rotating mask disk 10, and performs read/write operations.
Characteristics are being inspected.

マスク円板10は一般の磁気ディスクより選び出し、そ
の特性を全部測っておいて、それを基にして被検査磁気
ヘッド5の特性を評価している。又被検査磁気ヘッド5
はアンプを塔載したプリント板、リード線、コネクタ、
アーム等を組立てたヘッドアッセンブリの状態である。
The mask disk 10 is selected from a general magnetic disk, all of its characteristics are measured, and the characteristics of the magnetic head 5 to be tested are evaluated based on the measured characteristics. Also, the magnetic head to be inspected 5
is a printed board with an amplifier mounted on it, lead wires, connectors,
This is the state of the head assembly with the arm etc. assembled.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記磁気ヘッド検査方式では、被検査磁気ヘッド5をマ
スク円板10上に浮上させなくてはならず、その浮上量
は0.2 ミクロンメータと非常に小さい。
In the magnetic head testing method described above, the magnetic head 5 to be tested must be floated above the mask disk 10, and the flying height is as small as 0.2 micrometers.

その為マスク円板10の回転中に、被検査磁気へ。Therefore, during the rotation of the mask disk 10, the magnetic field to be inspected.

ド5が振動等によりマスク円板1oに接触し、磁気ヘッ
ドを破損或いはクラッシュ等を惹起する危険性がある。
There is a risk that the disk 5 may come into contact with the mask disk 1o due to vibration or the like, causing damage to the magnetic head or causing a crash.

又ヘッドクラッシュを起すと、マスク円板10が使えな
くなり、新しいマスク円板loを作らねばならないとと
も、被検査磁気ヘッド5も使えなくなる。又マスタ円板
10上に被検査磁気ヘッド5をセットする時、磁気ヘッ
ド5がジンバルバネ4を介しアーム3に保持されている
ので、慎重に取扱わないとマスク円板10に衝撃を与え
るため、慎重に行なう必要があり、検査工程が複雑であ
るという問題点がある。
Furthermore, if a head crash occurs, the mask disk 10 becomes unusable, a new mask disk LO must be made, and the magnetic head 5 to be inspected becomes unusable. Furthermore, when setting the magnetic head 5 to be inspected on the master disk 10, the magnetic head 5 is held by the arm 3 via the gimbal spring 4, so be careful not to handle it carefully as it may cause a shock to the mask disk 10. There is a problem that the inspection process is complicated.

〔問題点を解決するための手段〕[Means for solving problems]

上記問題点は、ヘッド試験器にマスター磁気ヘッドを接
続しておき、該マスター磁気ヘッドのギャップに対し所
定間隔を隔て被検査磁気ヘッドのギャップを対向させて
前記ヘッド試験器に接続し、該被検査磁気ヘッドが前記
マスター磁気ヘッドにより誘起された磁束を検出し、被
検査磁気ヘッドの異常を検査することを特徴とする本発
明の磁気ヘッド検査方式によって解決される。
The above problem can be solved by connecting a master magnetic head to a head tester, and connecting the magnetic head to the head tester with the gap of the magnetic head to be tested facing the gap of the master magnetic head at a predetermined distance. This problem is solved by the magnetic head testing method of the present invention, characterized in that the testing magnetic head detects the magnetic flux induced by the master magnetic head to test for abnormalities in the magnetic head to be tested.

〔作用〕[Effect]

ヘッド試験器にライトアンプを通しマスター磁気ヘッド
を接続し、又リードアンプを通し被検査ヘッドがマスタ
ーヘッドに近接して接続し、ライト電流を流すことによ
り発生したマスターヘッドのギャップ磁束を、被検査磁
気ヘッドにより増幅検出することにより、磁気ヘッドの
各特性(分解能、断線等)が検査できる。
The master magnetic head is connected to the head tester through a write amplifier, and the head to be tested is connected closely to the master head through a read amplifier, and the gap magnetic flux of the master head generated by passing a write current is measured. By amplifying and detecting with the magnetic head, each characteristic (resolution, disconnection, etc.) of the magnetic head can be inspected.

〔実施例〕〔Example〕

以下、本発明の要旨を図面により具体的に説明する。 Hereinafter, the gist of the present invention will be specifically explained with reference to the drawings.

第1図は本発明の一実施例を説明するための図、第2図
はライト電流とヘッド出力を示す図である。
FIG. 1 is a diagram for explaining one embodiment of the present invention, and FIG. 2 is a diagram showing write current and head output.

なお、全図を通し同一符合は同一対象物を示す。Note that the same reference numerals throughout the figures indicate the same objects.

第1図において、ヘッド試験器7には、ライトアンプ8
を通しマスターヘッド(試験器ヘッド)11が接続され
、又リードアンプ9を通し被検査磁気ヘッド12がマス
ターヘッド11に近接して接続している。マスターヘッ
ド11にはライト電流を流すことにより、ギャップ13
に漏れ磁束14が発生し、この漏れ磁束14を被検査磁
気ヘッド12ギヤ、プ15で検出し、リードアンプ9で
増幅する。即ち、被検査磁気ヘッド12に対するマスタ
ーヘッド11のクロストーク受は検出となる。
In FIG. 1, the head tester 7 includes a light amplifier 8.
A master head (tester head) 11 is connected through the read amplifier 9, and a magnetic head 12 to be tested is connected in close proximity to the master head 11 through a read amplifier 9. By passing a write current through the master head 11, the gap 13 is
A leakage magnetic flux 14 is generated, this leakage magnetic flux 14 is detected by the magnetic head 12 gear to be inspected and the gear 15, and is amplified by the read amplifier 9. That is, the crosstalk of the master head 11 with respect to the magnetic head 12 to be tested is detected.

具体的には、第2図に示すマスターヘッド11のライト
電流(矩形波)の微分された波形が被検査磁気ヘノ12
で検出できる(ヘッド出力)。この検出波形を利用する
ことにより、磁気ヘッドの各特性(分解能、断線等)が
検査できる。なお、上記微分された波形は磁気ディスク
に書か\れた磁束を読むと同じ波形である。
Specifically, the differentiated waveform of the write current (rectangular wave) of the master head 11 shown in FIG.
(head output). By using this detected waveform, various characteristics (resolution, disconnection, etc.) of the magnetic head can be inspected. Note that the differentiated waveform described above is the same waveform when reading the magnetic flux written on the magnetic disk.

又被検査磁気ヘッド12は上記のようにマスターヘッド
11に近接(距離a)しているが、その近接aは実施例
では、例えば5龍とし、治具を用い取りつけ、この距離
における被検査磁気ヘッド12の良否を決めるための規
格を決めておく。
The magnetic head 12 to be inspected is close to the master head 11 (distance a) as described above, and the proximity a is, for example, 5 dragons in the embodiment, and the magnetic head 12 to be inspected is mounted using a jig and the magnetic head to be inspected at this distance is Standards for determining the quality of the head 12 are determined in advance.

以下手順を要約すると、 (1)マスターヘッド11を決め、ヘッド試験器7にセ
ントする。
The steps are summarized below: (1) Determine the master head 11 and insert it into the head tester 7.

(2)規格を決めるための磁気ヘッドを決め、上記治具
にセントする。
(2) Determine the magnetic head for determining the standard and place it in the jig.

(3)上記磁気ヘッドのマスターヘッド11に対する影
響をヘッド試験器7で検査し規格化する。
(3) The influence of the magnetic head on the master head 11 is tested using the head tester 7 and standardized.

(4)規格化後は、上記磁気へ・ノドを取り外し、代わ
りに被検査磁気ヘッド12をセットし、検査した結果を
規格により判定する。
(4) After standardization, remove the magnetic head, set the magnetic head 12 to be tested in its place, and judge the test results according to the standard.

上記磁気ヘッドの検査は、6従来のようにマスター円板
を使わないので、被検査磁気ヘッド12は回転円板上に
浮上させることなく非接触である。従って、従来のよう
にヘッドクラッシュを起し被検査磁気ヘッド12を破損
させるようなことはない。
The magnetic head inspection described above does not use a master disk as in the conventional method, so the magnetic head 12 to be inspected is not brought into contact with the rotating disk without being levitated above it. Therefore, there is no possibility that a head crash will occur and damage the magnetic head 12 to be inspected, unlike in the conventional case.

又被検査磁気ヘッド12を治具にセントすればよいので
、検査工程が簡単である。
Furthermore, since it is only necessary to place the magnetic head 12 to be tested on a jig, the testing process is simple.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明によれば被検査磁気ヘッドを
、試験器に接続したマスターヘッドに近接してマスター
ヘッドの漏洩磁束を検出することで、被検査磁気ヘッド
を非接触で容易に検査でき、従来のような磁気ヘッドの
破損がない。
As explained above, according to the present invention, the magnetic head to be tested can be easily tested in a non-contact manner by bringing the magnetic head to be tested close to the master head connected to the tester and detecting the leakage magnetic flux of the master head. , there is no damage to the magnetic head like in the conventional case.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を説明するための図、第2図
はライト電流とヘッド出力を示す図、第3図は磁気ディ
スク装置をせつめいする図、第4図は従来の磁気ヘッド
検査方式を説明する図である。 図において、 7はヘッド試験器、 8はライトアンプ、 9はリードアンプ、 11はマスターヘッド、 12は被検査磁気ヘッド、 13.15はギヤ、7プ、 14は磁束を示す。
Fig. 1 is a diagram for explaining one embodiment of the present invention, Fig. 2 is a diagram showing write current and head output, Fig. 3 is a diagram showing a magnetic disk device, and Fig. 4 is a diagram showing a conventional magnetic disk drive. FIG. 3 is a diagram illustrating a head inspection method. In the figure, 7 is a head tester, 8 is a write amplifier, 9 is a read amplifier, 11 is a master head, 12 is a magnetic head to be tested, 13.15 is a gear, 7 is a pin, and 14 is a magnetic flux.

Claims (1)

【特許請求の範囲】[Claims] ヘッド試験器を用いて磁気ヘッドを検査する方式におい
て、前記ヘッド試験器にマスター磁気ヘッドを接続して
おき、該マスター磁気ヘッドのギャップに対し所定間隔
を隔て被検査磁気ヘッドのギャップを対向させて前記ヘ
ッド試験器に接続し、該被検査磁気ヘッドが前記マスタ
ー磁気ヘッドにより誘起された磁束を検出し、被検査磁
気ヘッドの異常を検査することを特徴とする磁気ヘッド
検査方式。
In a method of testing a magnetic head using a head tester, a master magnetic head is connected to the head tester, and the gap of the magnetic head to be tested is opposed to the gap of the master magnetic head at a predetermined interval. A magnetic head testing method characterized in that the magnetic head to be tested is connected to the head tester, the magnetic head to be tested detects magnetic flux induced by the master magnetic head, and the magnetic head to be tested is tested for abnormalities.
JP19511884A 1984-09-18 1984-09-18 Inspecting system of magnetic head Pending JPS6173221A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19511884A JPS6173221A (en) 1984-09-18 1984-09-18 Inspecting system of magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19511884A JPS6173221A (en) 1984-09-18 1984-09-18 Inspecting system of magnetic head

Publications (1)

Publication Number Publication Date
JPS6173221A true JPS6173221A (en) 1986-04-15

Family

ID=16335792

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19511884A Pending JPS6173221A (en) 1984-09-18 1984-09-18 Inspecting system of magnetic head

Country Status (1)

Country Link
JP (1) JPS6173221A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03288344A (en) * 1990-04-04 1991-12-18 Digital Sutoriimu:Kk Method and device for generating optical disk reference signal and method and device for inspecting optical head characteristic using optical disk reference signal
JPH04337512A (en) * 1991-05-14 1992-11-25 Sharp Corp Electric conversion characteristic measuring device for magnetic head
US5721488A (en) * 1995-01-06 1998-02-24 Tdk Corporation Method and apparatus for testing integrated magnetic head assembly
WO1998037429A1 (en) * 1997-02-21 1998-08-27 Pemstar, Inc. A magnetic recording head tester
US6534974B1 (en) 1997-02-21 2003-03-18 Pemstar, Inc, Magnetic head tester with write coil and read coil

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03288344A (en) * 1990-04-04 1991-12-18 Digital Sutoriimu:Kk Method and device for generating optical disk reference signal and method and device for inspecting optical head characteristic using optical disk reference signal
JPH04337512A (en) * 1991-05-14 1992-11-25 Sharp Corp Electric conversion characteristic measuring device for magnetic head
US5721488A (en) * 1995-01-06 1998-02-24 Tdk Corporation Method and apparatus for testing integrated magnetic head assembly
WO1998037429A1 (en) * 1997-02-21 1998-08-27 Pemstar, Inc. A magnetic recording head tester
US6534974B1 (en) 1997-02-21 2003-03-18 Pemstar, Inc, Magnetic head tester with write coil and read coil

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