JPS6172549A - Processing optical system for laser marking - Google Patents

Processing optical system for laser marking

Info

Publication number
JPS6172549A
JPS6172549A JP19513384A JP19513384A JPS6172549A JP S6172549 A JPS6172549 A JP S6172549A JP 19513384 A JP19513384 A JP 19513384A JP 19513384 A JP19513384 A JP 19513384A JP S6172549 A JPS6172549 A JP S6172549A
Authority
JP
Japan
Prior art keywords
processing
laser beam
optical system
mask
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19513384A
Other languages
Japanese (ja)
Inventor
Koichi Hiratsuka
平塚 宏一
Masakazu Nakano
正和 中野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP19513384A priority Critical patent/JPS6172549A/en
Publication of JPS6172549A publication Critical patent/JPS6172549A/en
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41CPROCESSES FOR THE MANUFACTURE OR REPRODUCTION OF PRINTING SURFACES
    • B41C1/00Forme preparation
    • B41C1/02Engraving; Heads therefor
    • B41C1/04Engraving; Heads therefor using heads controlled by an electric information signal
    • B41C1/05Heat-generating engraving heads, e.g. laser beam, electron beam

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Plasma & Fusion (AREA)
  • Manufacturing & Machinery (AREA)
  • Manufacture Or Reproduction Of Printing Formes (AREA)
  • Thermal Transfer Or Thermal Recording In General (AREA)

Abstract

PURPOSE:To provide the titled apparatus used in a semiconductive process generating no scattering of the molten lump of a processing material and enhancing marking quality, constituted by specially modulating laser beam by providing a mask having a plurality of specific opening parts in laser beam. CONSTITUTION:The titled optical system is constituted of a beam expander 8, a scanning optical system 9 forming a pattern and a processing lens 10 and the mask 8 has a plurality of circular opening parts 8a each having a size 1/20-1/5 the diameter of laser beam and the opening parts 8a are arranged so as to be symmetric or at random to an optical axis in 1/4 rotary symmetric arrangement. The mask 8 is provided to a processing surface in the vicinity of a galvano emitting port at a position forming beam intensity distribution corresponding to opening positions. Because a processing cross-section takes a shape showing a high beam scattering property wherein the pitch of the valley 12 and crest 12b of a bottom part is 5-50mum and a depth is 2,500Angstrom -1mum and marking easy to look a character is formed.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はレーザマーキング装置における加工用光学系、
さらに詳しく云えば、レーザビームを空間的に変調する
ことによってマーキングの品質向上を考慮した光学系忙
関する。
Detailed Description of the Invention (Industrial Application Field) The present invention relates to a processing optical system in a laser marking device,
More specifically, the optical system is designed to improve the quality of marking by spatially modulating the laser beam.

(従来の技術) 半導体プロセスに用いられるレーザマーキング装置は半
導体ウニへ表面に文字などのパターンや管理番号を高速
かつ非接触でマーキングするものである。
(Prior Art) Laser marking devices used in semiconductor processes mark patterns such as letters and management numbers on the surface of semiconductors at high speed and in a non-contact manner.

第3図にこの装置の一構成例を示す。FIG. 3 shows an example of the configuration of this device.

発振器lから出力されるレーザビームは反射鏡2によっ
て900方向が変えられ、ビーム幅を広げるビームエク
スパンダ3を通過しオプティカルスキャナ4に入射する
。オプティカルスキャナ4でパターンが形成された後、
加工面6に達する。
The laser beam output from the oscillator 1 is changed in direction by a reflecting mirror 2, passes through a beam expander 3 that widens the beam width, and enters an optical scanner 4. After the pattern is formed with the optical scanner 4,
The machined surface 6 is reached.

このレーザ加工はレーザマーキングをも含めて熱的加工
の一種であり、加工材料の表面でレーザ光を吸収させる
ことによって加工材料を溶融または瞬時に蒸発させ、溶
融塊の飛散すなわちごみ飛散させるプロセスである。
This laser processing, which also includes laser marking, is a type of thermal processing, and is a process in which the surface of the material to be processed melts or instantly evaporates by absorbing laser light, causing the molten mass to scatter, that is, to scatter dust. be.

通常レーザマーキングは研磨前の半導体ウェハに対して
行なわれるので、ごみ飛散が発生しても、以後の研磨工
程で取り除かれ、間層とはならなIAa Lかし、半導
体製造プロセス中でマーキングする場合には溶融塊がウ
ニ八表面に傷をつけたり、ホトエッチングエ椙でマスク
の密着性を悪くしたり、エピタキシャル気相成長工程で
溶融塊を核とした異常な気相成長を起こしたりするので
問題となる。
Normally, laser marking is performed on semiconductor wafers before polishing, so even if dust scatters, it will be removed during the subsequent polishing process and will not form an interlayer. In some cases, the molten lumps may scratch the surface of the sea urchin, impair the adhesion of the mask during photo-etching, or cause abnormal vapor phase growth with the molten lumps as the core during the epitaxial vapor growth process. It becomes a problem.

(発明が解決しようとする問題点) この問題を解決するために、ごみ飛散の全く見うれない
マーキング法の開発の要請がある。
(Problems to be Solved by the Invention) In order to solve this problem, there is a need to develop a marking method that does not cause any visible dust scattering.

このようなマーキングを実現するためにレーザ出力が安
定な状態で減衰フィルタを用いたり、ビームエキスパン
ダの倍率を変えたり、焦点面1       をずらし
た位置での加工を行なったりしてレーザ出力を抑えるご
み飛散のないマーキング方法が考えられる。
To achieve this kind of marking, it is necessary to suppress the laser output by using an attenuation filter while the laser output is stable, changing the magnification of the beam expander, or performing processing at a position where the focal plane 1 is shifted. A marking method that does not scatter dust can be considered.

これらのマーキングでは印字された文字の見やすさを決
定するものとしてまず第1に上げられる線幅、文字の大
きさは得ることができるが、加工断面の形状がなめらか
になるため、特定の角度からしか見ることができず、文
字の見やすさを決定する第2の条件である加工断面での
光散乱が十分得られず印字文字が見すら込ものとなる欠
点を持ってbる。
With these markings, it is possible to obtain the line width and character size, which are the first factors that determine the visibility of printed characters, but since the shape of the processed cross section becomes smooth, it is difficult to see from a specific angle. This has the disadvantage that sufficient light scattering at the processed cross section, which is the second condition that determines the legibility of characters, cannot be obtained, making the printed characters difficult to see.

本発明の目的はごみ飛散がなく、印字文字の見ヤスいレ
ーザマーキング装置くシける加工光学系を提供すること
にある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a processing optical system for a laser marking device that does not cause dust scattering and allows printed characters to be easily seen.

(問題を解決するための手段) 前記目的を達成するために本発明によるレーザマーキン
グ用加工光学系はレーザ光源と、前記レーザ光源小ら出
射されるレーザビームを拡げるエキスパンダと、前記エ
キスパンダからのレーザビームを走査するためのスキャ
ニング光学系と、加工レンズとを含んで構成されるレー
ザマーキング装置く>Inて、前記エキスパンダ出射口
近傍のレーザビーム中に、レーザビーム光軸に対して1
74回転対称位置になるように配列され、個々の大きさ
がレーザビームの20分の1以上5分の1以下の開口部
複数個を有するマスクを設け、加工面に、前記開口部の
開口位置に対応する光強度分布を与えるように構成しで
ある。
(Means for solving the problem) In order to achieve the above object, the processing optical system for laser marking according to the present invention includes a laser light source, an expander for expanding a laser beam emitted from the laser light source, and a laser marking processing optical system for laser marking according to the present invention. The laser marking device includes a scanning optical system for scanning the laser beam, and a processing lens.
A mask having a plurality of apertures arranged so as to have 74-rotation symmetrical positions and each having a size of 1/20 or more and 1/5 or less of the laser beam is provided, and the opening positions of the apertures are set on the processing surface. The structure is configured to provide a light intensity distribution corresponding to .

前記構成によれば、加工溝に凹凸の多す光散乱性断面構
造を形成し、光の散乱性を増加させることができるので
印字文字を見やすくすることができる。
According to the above configuration, a light-scattering cross-sectional structure with many unevenness can be formed in the processed groove to increase the light-scattering property, thereby making it possible to make the printed characters easier to see.

(実 施 例) 以下、図面を参照して本発明の一実施例を詳細に説明す
る。第2図は本発明による加工光学系の実施例を示す斜
視図であり、ビームエキスパンダ7、レーザビームに空
間的な変調を与えるための開口部が配列されたマスク8
、加工面に文字等のパターンを作るスキャニング光学系
9および加工用レンズ10から構成されてAる。
(Example) Hereinafter, an example of the present invention will be described in detail with reference to the drawings. FIG. 2 is a perspective view showing an embodiment of the processing optical system according to the present invention, in which the beam expander 7 and the mask 8 are arranged with openings for giving spatial modulation to the laser beam.
, a scanning optical system 9 for forming patterns such as letters on a processing surface, and a processing lens 10.

マスク8は複数個の円または矩形の開口部8aを有して
おり、開口部8aはl/4回転回転対列配、光軸に対称
に配列されるものか、またはランダムに配列されるもの
である。マスク8はガルバノ出射口近傍で、加工面に開
口位置に対応する光強度分布を形成させる位置に設けら
れる。
The mask 8 has a plurality of circular or rectangular apertures 8a, and the apertures 8a are arranged in a 1/4 rotation pair, arranged symmetrically about the optical axis, or arranged randomly. It is. The mask 8 is provided near the galvano exit opening at a position where a light intensity distribution corresponding to the opening position is formed on the processing surface.

1/4回転対称位置に配列させられる開口部8aの大き
さはビームエキスパンダ7より出射されたビーム径が5
斜であるとき、1辺または直径が0.25−1.Om 
(1/!O〜”15 )である。
The size of the apertures 8a arranged at 1/4 rotation symmetrical positions is such that the diameter of the beam emitted from the beam expander 7 is 5.
When it is oblique, one side or diameter is 0.25-1. Om
(1/!O~”15).

このように構成された加工光学系で得られる加工断面の
構造を第2図に示す。レーザビームによって溝12が形
成され、その底部の谷12aと山12bのピッチが約5
μm〜50μmで、深さは2500人〜1μmとなる。
FIG. 2 shows the structure of a processed cross section obtained with the processing optical system configured in this manner. Grooves 12 are formed by the laser beam, and the pitch between valleys 12a and peaks 12b at the bottom is approximately 5.
μm to 50 μm, and the depth is 2500 to 1 μm.

山と谷のピッチは必ずしも均一くなってはおらず、光散
乱性の高い形状となる。
The pitch of the peaks and valleys is not necessarily uniform, resulting in a shape with high light scattering properties.

(発明の効果) 以上、詳しく説明したように本発明による加工光学系に
よれば、加工材料の溶融塊の飛散によるごみの飛散がな
く、しかも文字の見やすいマーキングを実現することが
できる。
(Effects of the Invention) As described above in detail, according to the processing optical system according to the present invention, there is no scattering of dust due to scattering of the molten lump of the processing material, and markings with easy-to-read characters can be realized.

また、高光出力のレーザを用いる必要がないので搭載す
るレーザ発櫨器が小形化できるばかりでなくマーキング
加工機の小形化も可能である。
Furthermore, since there is no need to use a laser with high optical output, not only the laser generator to be mounted can be made smaller, but also the marking machine can be made smaller.

安全性の面においては、レーザマーキングの際、加工面
から散乱または反射されるレーザ光強度が比較的小さ騒
ので、目に見える障害も軽減されるという利点がある。
In terms of safety, there is an advantage that during laser marking, the intensity of the laser light scattered or reflected from the processed surface is relatively small and noisy, so that visible damage is reduced.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による加工光学系の実施例を示す斜視図
、第2図は本発明光学系によって作られる加工断面の光
散乱性断面構造の一例を示す図、第3図は従来のスキャ
ニングマーカ光学系のブロック図である。 1・・・発掘器    2・・・反射傭3・・・ビーム
エキスパンダ 4.9・・・ガルバノ型オプテ4カルスキャナ5.10
・・・加工用レンズ 1j         6.11・・・加工面7・・・
ビームエキスパンダ 8・・・マスク オ 1 回 才 2 図 ; −一二−l−−6
FIG. 1 is a perspective view showing an embodiment of the processing optical system according to the present invention, FIG. 2 is a diagram showing an example of a light-scattering cross-sectional structure of a processed section created by the optical system of the present invention, and FIG. 3 is a diagram showing a conventional scanning method. FIG. 2 is a block diagram of a marker optical system. 1... Excavator 2... Reflector 3... Beam expander 4.9... Galvano type optic 4 Cal scanner 5.10
...Processing lens 1j 6.11...Processing surface 7...
Beam expander 8... Masko 1 time 2 Figure; -12-l--6

Claims (1)

【特許請求の範囲】[Claims] レーザ光源と、前記レーザ光源から出射されるレーザビ
ームを拡げるエキスパンダと、前記エキスパンダからの
レーザビームを走査するためのスキヤニング光学系と、
加工レンズとを含んで構成されるレーザマーキング装置
において、前記エキスパンダ出射口近傍のレーザビーム
中に、レーザビーム光軸に対して1/4回転対称位置に
なるように配列され、個々の大きさがレーザビームの2
0分の1以上5分の1以下の開口部複数個を有するマス
クを設けることにより、加工面に、前記マスクの開口位
置に対応する光強度分布を与えることを特徴とするレー
ザマーキング用加工光学系。
a laser light source, an expander that expands the laser beam emitted from the laser light source, and a scanning optical system that scans the laser beam from the expander;
In the laser marking device including a processing lens, in the laser beam near the expander exit port, the laser marking device is arranged so as to have a 1/4 rotation symmetrical position with respect to the laser beam optical axis, and has individual sizes. is the laser beam 2
Processing optics for laser marking, characterized in that by providing a mask having a plurality of openings of 1/0 or more and 1/5 or less, a light intensity distribution corresponding to the opening position of the mask is given to the processing surface. system.
JP19513384A 1984-09-18 1984-09-18 Processing optical system for laser marking Pending JPS6172549A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19513384A JPS6172549A (en) 1984-09-18 1984-09-18 Processing optical system for laser marking

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19513384A JPS6172549A (en) 1984-09-18 1984-09-18 Processing optical system for laser marking

Publications (1)

Publication Number Publication Date
JPS6172549A true JPS6172549A (en) 1986-04-14

Family

ID=16336018

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19513384A Pending JPS6172549A (en) 1984-09-18 1984-09-18 Processing optical system for laser marking

Country Status (1)

Country Link
JP (1) JPS6172549A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5708252A (en) * 1986-09-26 1998-01-13 Semiconductor Energy Laboratory Co., Ltd. Excimer laser scanning system
US6149988A (en) * 1986-09-26 2000-11-21 Semiconductor Energy Laboratory Co., Ltd. Method and system of laser processing
US6261856B1 (en) 1987-09-16 2001-07-17 Semiconductor Energy Laboratory Co., Ltd. Method and system of laser processing

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5708252A (en) * 1986-09-26 1998-01-13 Semiconductor Energy Laboratory Co., Ltd. Excimer laser scanning system
US6149988A (en) * 1986-09-26 2000-11-21 Semiconductor Energy Laboratory Co., Ltd. Method and system of laser processing
US6261856B1 (en) 1987-09-16 2001-07-17 Semiconductor Energy Laboratory Co., Ltd. Method and system of laser processing

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