JPS6160880A - Spattering device - Google Patents

Spattering device

Info

Publication number
JPS6160880A
JPS6160880A JP17983384A JP17983384A JPS6160880A JP S6160880 A JPS6160880 A JP S6160880A JP 17983384 A JP17983384 A JP 17983384A JP 17983384 A JP17983384 A JP 17983384A JP S6160880 A JPS6160880 A JP S6160880A
Authority
JP
Japan
Prior art keywords
target
magnet
plasma
flux guide
flux
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17983384A
Other languages
Japanese (ja)
Other versions
JPH0351788B2 (en
Inventor
Ikuo Sakai
郁夫 坂井
Kunyu Sumita
住田 勲勇
Yasuhiko Nakayama
中山 靖彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP17983384A priority Critical patent/JPS6160880A/en
Publication of JPS6160880A publication Critical patent/JPS6160880A/en
Publication of JPH0351788B2 publication Critical patent/JPH0351788B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Thin Magnetic Films (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To obtain a titled device for raising a utilization factor of a target and improving the efficiency, by moving a magnetic flux of a magnet by a flux guide placed so as to be movable between the target and the magnet provided so as to be opposed to said target. CONSTITUTION:In a spattering device which has provided a plasma converging magnet 13 on the rear side of a cooling plate 12 placed closely to a target 11, a flux guide 14 is placed so as to be movable between said cooling plate 12 and the magnet 13. A magnetic flux emitted from one magnetic pole of said magnet 13 passes through the flux guide 14, reaches the surface of the target 11 and converges a plasma. In this case, said flux guide 14 is moved suitably as indicated with an arrow, a part where the plasma is converged is moved, and an erosion area of the target 11 is widened. In this way, a utilization factor of the target is improved to about >=30%.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はターゲット利用率の高いマグネトロン方式のス
パッタリング装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a magnetron type sputtering apparatus with high target utilization.

従来例の構成とその問題点 従来、スパッタリング装置は、マグネトロン方式により
、連続的に高速で、しかも基板温度上昇を少なく薄膜の
形成が行なえるという特徴をいかして、高分子フィルム
または紙等の連続した基板上に金属膜等を連続形成す、
ることに用いられてきた0 以下図面を参照しながら、従来のマグネトロンスパッタ
リング装置について説明する。
Conventional configurations and their problems Traditionally, sputtering equipment uses a magnetron method to form thin films continuously at high speed and with little rise in substrate temperature. Continuously forming metal films etc. on the substrate
A conventional magnetron sputtering apparatus will be described below with reference to the drawings.

第1図は従来のスパッタリング装置のスパッタガンの構
造を示す断面図である。図において、1はターゲット、
2はターゲット1が密着して置かれた冷却板、3は冷却
板2の裏面に配置されたプラズマ収束用マグネットであ
る。
FIG. 1 is a sectional view showing the structure of a sputter gun of a conventional sputtering apparatus. In the figure, 1 is the target,
2 is a cooling plate on which the target 1 is placed closely; 3 is a plasma convergence magnet placed on the back surface of the cooling plate 2.

以上のようなスパッタリング装置は、プラズマ収束用マ
グネット3から発生した磁束がターゲット1表面で、電
離した電子およびスパッタリングによって生じた二次電
子をとらえるため、ターゲット1表面での電子密度が高
くなり、これらの電子と中性ガス分子との衝突確率が高
くなってプラズマ密度を高くすることができ、スパッタ
リングレートを高周波2極スパツタリング装置に比べ1
桁以上速くすることができ、しかも、高エネルギーをも
っている二次電子を磁界でとじこめる之め、膜形成を行
なおうとする基板への熱損傷もないという特徴をもって
いる。
In the sputtering apparatus described above, the magnetic flux generated from the plasma focusing magnet 3 captures ionized electrons and secondary electrons generated by sputtering on the surface of the target 1, so the electron density on the surface of the target 1 increases, and these The probability of collision between electrons and neutral gas molecules increases, making it possible to increase the plasma density and reduce the sputtering rate by 1% compared to high-frequency bipolar sputtering equipment.
It can be made faster by several orders of magnitude, and because secondary electrons with high energy are trapped in a magnetic field, there is no thermal damage to the substrate on which the film is to be formed.

しかしながら、上記のようなスパッタリング装置は、図
に示したようにターゲット1表面上に生じている磁界の
分布が均一ではなく、プラズマ収束上マグネット3のポ
ールとポールの中間部分のターゲット1表面上の磁界が
最も強くなり、したがってこの部分が最も早く浸食され
る。第2図にターゲット1の浸食された状態での斜視図
、第3図に第2図のA−A’における断面図を示す。こ
れらの図かられかるように、実際にスパッタリングして
膜形成に寄与するターゲット1の体積比率をターゲット
利用率とすれば、非磁性体のターゲットの場合、利用率
は約20〜25チと低く、強磁性体の場合は、浸食され
た部分に磁束が集中し浸食の形状かさらKするどくなり
、利用率は10〜15%とさらに低くなるという欠点を
有していた。
However, in the above sputtering apparatus, as shown in the figure, the distribution of the magnetic field generated on the surface of the target 1 is not uniform, and due to plasma convergence, the magnetic field on the surface of the target 1 between the poles of the magnet 3 is not uniform. The magnetic field will be the strongest and therefore this area will erode the fastest. FIG. 2 shows a perspective view of the target 1 in an eroded state, and FIG. 3 shows a sectional view taken along line AA' in FIG. 2. As can be seen from these figures, if the volume ratio of target 1 that actually contributes to film formation by sputtering is taken as the target utilization rate, the utilization rate is as low as about 20 to 25 cm in the case of a non-magnetic target. In the case of a ferromagnetic material, the magnetic flux concentrates in the eroded part, making the eroded shape even more difficult, and the utilization rate becomes even lower at 10 to 15%.

発明の目的 本発明は以上のような欠点を解消するもので、ターゲッ
ト利用率が30チ以上と高い効率でターゲットを使用で
きるスパッタリング装置を提供するものである。
OBJECTS OF THE INVENTION The present invention eliminates the above-mentioned drawbacks and provides a sputtering apparatus that can use targets with high efficiency, such as a target utilization rate of 30 inches or more.

発明の構成 本発明による基本溝成はスパッタリング用ターゲットの
裏面にプラズマ収束用のマグネットを備え、さらにター
ゲットとマグネットの間に7ラノクスガイドを置き、プ
ラズマ収束用マグネットから生ずる磁束をフラックスガ
イドを移動させることによって移動するようにしたもの
である。
Structure of the Invention The basic groove formation according to the present invention includes a magnet for plasma convergence on the back side of a sputtering target, and a 7-lanox guide placed between the target and the magnet to move the magnetic flux generated from the magnet for plasma convergence through the flux guide. It was designed to move by.

実施例の説明 以下に本発明の一実施例について図面を参照しながら説
明する。第4図は本発明の一実施例におけるスパッタリ
ング装置のスパッタガンの構造を示す断面図である。第
4図において11はターゲット、12はターゲット11
が密着して置かれた冷却板、13は冷却板12の裏面に
配置されたプラズマ収束用マグネット、14は冷却板1
2とプラズマ収束用マグネット13の間に置かれたフラ
ックスガイドである。
DESCRIPTION OF EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 4 is a sectional view showing the structure of a sputter gun of a sputtering apparatus in an embodiment of the present invention. In Fig. 4, 11 is the target, 12 is the target 11
13 is a plasma convergence magnet placed on the back side of the cooling plate 12, and 14 is the cooling plate 1.
2 and the plasma focusing magnet 13.

以上のように構成されたスノ(ツタリング装置について
、以下その動作を説明する。プラズマ収束用マグネット
13の1つの磁極から出た磁束は、フラックスガイド1
4を通り、一部はターゲット11表面まで達し、また一
部はフラックスガイド14を通シ、別の磁極に入る。こ
のとき、ターゲット11表面での磁界は各フラックスガ
イド14の中間部で最も強くなり、その結果この部分で
プラズマが収束され、ターゲット11の浸食が生じる。
The operation of the snow tuttering device configured as described above will be explained below.The magnetic flux emitted from one magnetic pole of the plasma convergence magnet 13 is
4, some of it reaches the surface of the target 11, and some of it passes through the flux guide 14 and enters another magnetic pole. At this time, the magnetic field on the surface of the target 11 is strongest at the middle part of each flux guide 14, and as a result, the plasma is focused in this part, causing erosion of the target 11.

このとき、フラックスガイド14を移動することKよシ
、磁界の最も強い部分が移動し、そのため、ターゲット
11の浸食部分が広くなる。
At this time, by moving the flux guide 14, the part where the magnetic field is strongest moves, so that the eroded part of the target 11 becomes wider.

本実施例によれば、ターゲット11とプラズマ収束用マ
グネット13の間に設置されたフラックスガイド14を
移動させることにより、ターゲット11の浸食される面
積が広がり、ターゲット利用率が、非磁性体で36%以
上1強磁性体でも30チ程度と非常に高い利用率を得る
ことができる。
According to this embodiment, by moving the flux guide 14 installed between the target 11 and the plasma convergence magnet 13, the eroded area of the target 11 is expanded, and the target utilization rate is increased to 36 Even with a ferromagnetic material of 1% or more, a very high utilization rate of about 30cm can be obtained.

発明の効果 以上のように本発明は、ターゲットとプラズマ収束用マ
グネットの間に移動可能なフラックスガイドを配置した
ものであるため、ターゲットの浸食面積をひろげること
ができ、ターゲット利用率30%以上と非常に利用効率
の高いという優れた効果が得られる。
Effects of the Invention As described above, in the present invention, since a movable flux guide is arranged between the target and the plasma convergence magnet, the eroded area of the target can be expanded, and the target utilization rate can be increased to 30% or more. The excellent effect of extremely high utilization efficiency can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のスパッタリング装置のスパッタガンの構
造を示す断面図、第2図は従来のスパッタリング装置で
使用したターゲットの浸食状態を示す斜視図、第3図は
従来のスパッタリング装置で使用したターゲットの浸食
状態を示す断面図、第4図は本発明の一実施例における
スパッタリング装置のスパッタガンの構造を示す断面図
である。 1111・・・・・・ターゲット、2.12・・・・・
冷却板、3.13・・・・・・プラズマ収束用マグネッ
ト、14・・・・7ラツクスガイド。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
図 第3図 第4図
Figure 1 is a sectional view showing the structure of a sputter gun in a conventional sputtering device, Figure 2 is a perspective view showing the erosion state of a target used in a conventional sputtering device, and Figure 3 is a target used in a conventional sputtering device. FIG. 4 is a sectional view showing the structure of a sputtering gun of a sputtering apparatus in an embodiment of the present invention. 1111...Target, 2.12...
Cooling plate, 3.13...Plasma convergence magnet, 14...7 Lux guide. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Figure 3 Figure 4

Claims (1)

【特許請求の範囲】[Claims] スパッタリング用ターゲットと、前記ターゲットに対向
して設けられたプラズマ収束用マグネットと、前記ター
ゲットとマグネットの間に移動可能に設けられたフラッ
クスガイドとを具備することを特徴とするスパッタリン
グ装置。
A sputtering apparatus comprising: a sputtering target; a plasma convergence magnet provided opposite the target; and a flux guide movably provided between the target and the magnet.
JP17983384A 1984-08-29 1984-08-29 Spattering device Granted JPS6160880A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17983384A JPS6160880A (en) 1984-08-29 1984-08-29 Spattering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17983384A JPS6160880A (en) 1984-08-29 1984-08-29 Spattering device

Publications (2)

Publication Number Publication Date
JPS6160880A true JPS6160880A (en) 1986-03-28
JPH0351788B2 JPH0351788B2 (en) 1991-08-07

Family

ID=16072691

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17983384A Granted JPS6160880A (en) 1984-08-29 1984-08-29 Spattering device

Country Status (1)

Country Link
JP (1) JPS6160880A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01165771A (en) * 1987-12-21 1989-06-29 Matsushita Electric Ind Co Ltd Magnetron sputtering cathode
JPH04128372A (en) * 1990-09-18 1992-04-28 Shinku Kikai Kogyo Kk Sputtering method and device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01165771A (en) * 1987-12-21 1989-06-29 Matsushita Electric Ind Co Ltd Magnetron sputtering cathode
JPH04128372A (en) * 1990-09-18 1992-04-28 Shinku Kikai Kogyo Kk Sputtering method and device

Also Published As

Publication number Publication date
JPH0351788B2 (en) 1991-08-07

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Legal Events

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EXPY Cancellation because of completion of term