JPS6157840A - 放射線断層検査装置 - Google Patents
放射線断層検査装置Info
- Publication number
- JPS6157840A JPS6157840A JP59179643A JP17964384A JPS6157840A JP S6157840 A JPS6157840 A JP S6157840A JP 59179643 A JP59179643 A JP 59179643A JP 17964384 A JP17964384 A JP 17964384A JP S6157840 A JPS6157840 A JP S6157840A
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- attenuation
- correction
- projection direction
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 title claims description 55
- 238000003325 tomography Methods 0.000 title claims description 8
- 238000007689 inspection Methods 0.000 title claims description 4
- 238000012937 correction Methods 0.000 claims description 88
- 238000005510 radiation hardening Methods 0.000 claims description 44
- 238000010521 absorption reaction Methods 0.000 claims description 40
- 230000006870 function Effects 0.000 claims description 20
- 239000000203 mixture Substances 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 6
- 238000001514 detection method Methods 0.000 description 20
- 238000010586 diagram Methods 0.000 description 9
- 230000007246 mechanism Effects 0.000 description 9
- 238000013519 translation Methods 0.000 description 9
- 238000013480 data collection Methods 0.000 description 7
- 238000007781 pre-processing Methods 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 5
- 238000001228 spectrum Methods 0.000 description 5
- 230000009466 transformation Effects 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000002238 attenuated effect Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- CVOFKRWYWCSDMA-UHFFFAOYSA-N 2-chloro-n-(2,6-diethylphenyl)-n-(methoxymethyl)acetamide;2,6-dinitro-n,n-dipropyl-4-(trifluoromethyl)aniline Chemical compound CCC1=CC=CC(CC)=C1N(COC)C(=O)CCl.CCCN(CCC)C1=C([N+]([O-])=O)C=C(C(F)(F)F)C=C1[N+]([O-])=O CVOFKRWYWCSDMA-UHFFFAOYSA-N 0.000 description 1
- 241001077262 Conga Species 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000002591 computed tomography Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59179643A JPS6157840A (ja) | 1984-08-29 | 1984-08-29 | 放射線断層検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59179643A JPS6157840A (ja) | 1984-08-29 | 1984-08-29 | 放射線断層検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6157840A true JPS6157840A (ja) | 1986-03-24 |
| JPH0327046B2 JPH0327046B2 (en, 2012) | 1991-04-12 |
Family
ID=16069353
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59179643A Granted JPS6157840A (ja) | 1984-08-29 | 1984-08-29 | 放射線断層検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6157840A (en, 2012) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2664708A1 (fr) * | 1990-07-10 | 1992-01-17 | Gen Electric Cgr | Procede de correction du durcissement d'un faisceau de rayons x dans un scanner. |
| US5376640A (en) * | 1989-12-25 | 1994-12-27 | Nisshin Flour Milling Co., Ltd. | Lipolytic enzyme inhibitors |
| US5411956A (en) * | 1989-12-25 | 1995-05-02 | Nisshin Flour Milling Co., Ltd. | Lipolytic enzyme inhibitors |
| DE10051158A1 (de) * | 2000-10-16 | 2002-01-17 | Siemens Ag | Verfahren zur Korrektur von Bildartefakten in einem Röntgen-Computertomographiebild eines Untersuchungsobjekts |
| JP2006162452A (ja) * | 2004-12-08 | 2006-06-22 | Hitachi Ltd | 薄膜評価方法及びその装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6238303B2 (ja) * | 2012-04-10 | 2017-11-29 | 国立大学法人 東京大学 | Ｘ線投影像補正装置及びｘ線投影像補正方法 |
-
1984
- 1984-08-29 JP JP59179643A patent/JPS6157840A/ja active Granted
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5376640A (en) * | 1989-12-25 | 1994-12-27 | Nisshin Flour Milling Co., Ltd. | Lipolytic enzyme inhibitors |
| US5411956A (en) * | 1989-12-25 | 1995-05-02 | Nisshin Flour Milling Co., Ltd. | Lipolytic enzyme inhibitors |
| FR2664708A1 (fr) * | 1990-07-10 | 1992-01-17 | Gen Electric Cgr | Procede de correction du durcissement d'un faisceau de rayons x dans un scanner. |
| DE10051158A1 (de) * | 2000-10-16 | 2002-01-17 | Siemens Ag | Verfahren zur Korrektur von Bildartefakten in einem Röntgen-Computertomographiebild eines Untersuchungsobjekts |
| JP2006162452A (ja) * | 2004-12-08 | 2006-06-22 | Hitachi Ltd | 薄膜評価方法及びその装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0327046B2 (en, 2012) | 1991-04-12 |
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