JPS6153877B2 - - Google Patents

Info

Publication number
JPS6153877B2
JPS6153877B2 JP53100558A JP10055878A JPS6153877B2 JP S6153877 B2 JPS6153877 B2 JP S6153877B2 JP 53100558 A JP53100558 A JP 53100558A JP 10055878 A JP10055878 A JP 10055878A JP S6153877 B2 JPS6153877 B2 JP S6153877B2
Authority
JP
Japan
Prior art keywords
semiconductor region
type region
semiconductor
breakdown
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53100558A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5527618A (en
Inventor
Ikunori Takada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP10055878A priority Critical patent/JPS5527618A/ja
Publication of JPS5527618A publication Critical patent/JPS5527618A/ja
Publication of JPS6153877B2 publication Critical patent/JPS6153877B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/103Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices
    • H10D62/105Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE] 
    • H10D62/108Constructional design considerations for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse-biased devices by having particular doping profiles, shapes or arrangements of PN junctions; by having supplementary regions, e.g. junction termination extension [JTE]  having localised breakdown regions, e.g. built-in avalanching regions 
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00Diodes
    • H10D8/411PN diodes having planar bodies

Landscapes

  • Bipolar Transistors (AREA)
JP10055878A 1978-08-17 1978-08-17 Planar diode Granted JPS5527618A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10055878A JPS5527618A (en) 1978-08-17 1978-08-17 Planar diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10055878A JPS5527618A (en) 1978-08-17 1978-08-17 Planar diode

Publications (2)

Publication Number Publication Date
JPS5527618A JPS5527618A (en) 1980-02-27
JPS6153877B2 true JPS6153877B2 (enrdf_load_stackoverflow) 1986-11-19

Family

ID=14277253

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10055878A Granted JPS5527618A (en) 1978-08-17 1978-08-17 Planar diode

Country Status (1)

Country Link
JP (1) JPS5527618A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63131080U (enrdf_load_stackoverflow) * 1987-02-20 1988-08-26

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6094780A (ja) * 1983-10-28 1985-05-27 Hitachi Ltd 定電圧ダイオ−ド
JPS61228677A (ja) * 1985-04-01 1986-10-11 Rohm Co Ltd 半導体装置
JPH01290259A (ja) * 1988-05-18 1989-11-22 Fuji Electric Co Ltd 半導体装置
JPH0288753A (ja) * 1988-09-27 1990-03-28 Natl Res Inst For Metals 溶融めっきアルミニウム
JPH02111078A (ja) * 1988-10-20 1990-04-24 Matsushita Electron Corp 半導体装置
JP2006222213A (ja) * 2005-02-09 2006-08-24 Matsushita Electric Ind Co Ltd サージ保護用半導体素子およびその製造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63131080U (enrdf_load_stackoverflow) * 1987-02-20 1988-08-26

Also Published As

Publication number Publication date
JPS5527618A (en) 1980-02-27

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