JPS6151739U - - Google Patents
Info
- Publication number
- JPS6151739U JPS6151739U JP13646484U JP13646484U JPS6151739U JP S6151739 U JPS6151739 U JP S6151739U JP 13646484 U JP13646484 U JP 13646484U JP 13646484 U JP13646484 U JP 13646484U JP S6151739 U JPS6151739 U JP S6151739U
- Authority
- JP
- Japan
- Prior art keywords
- stay
- entrance
- exit
- tray
- elastic member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第1図は本考案のICトレイの一例の構成を示
す斜視図。第2図は本考案に係るICトレイを適
用するIC試験装置の一例の構成を示すブロツク
図、第3図はその要部の概略構成を示す斜視図、
第4図はIC試験部の構成を線図的に示す図、第
5図はICステツクの一例の構成を一部切欠いて
示す斜視図、第6図A〜Cは第1図に示すICト
レイのICステイツクに対する作用およびICト
レイに装着されたICステイツクに作用するゲー
トシリンダのプランジヤ構造を説明するための図
である。
1…IC取出部、2…サプライ側トレイ格納部
、3…IC排出部、4…IC試験部、5…検出部
、6…不良ICリジエクト部、7…不良品箱、8
…IC反転部、9…IC収納部、10…IC挿入
部、11…レシーブ側トレイ格納部、12…トレ
イ搬送部、13…トレイ回転部、14…トレイ移
送部、14a…バツフア部、14b…供給部、2
1…ICステイツク、22…ICトレイ、25a
,25b,43a,43b…保持搬送機構、33
,45…トレイ移送機構、61…搬送レール、6
5,111…ゲートシリンダ、66…IC、81
〜84…撮像装置、121…トレイ本体、122
…IC出入口、123…板ばね、124…底板、
125…規制部材、126,127…側板、12
8…閉塞部材、129…位置決め用金具、130
…押え板、131,132…長孔、133,13
4…開口、135…穴。
FIG. 1 is a perspective view showing the structure of an example of an IC tray of the present invention. FIG. 2 is a block diagram showing the configuration of an example of an IC testing device to which the IC tray according to the present invention is applied, and FIG. 3 is a perspective view showing the schematic configuration of the main parts thereof.
4 is a diagram diagrammatically showing the configuration of the IC test section, FIG. 5 is a partially cutaway perspective view showing the configuration of an example of the IC stick, and FIGS. 6A to 6C are the IC trays shown in FIG. 1. FIG. 4 is a diagram for explaining the action of the gate cylinder on the IC stick and the plunger structure of the gate cylinder that acts on the IC stick mounted on the IC tray. DESCRIPTION OF SYMBOLS 1... IC extraction part, 2... Supply side tray storage part, 3... IC ejection part, 4... IC test part, 5... detection part, 6... defective IC reject part, 7... defective product box, 8
...IC reversing section, 9...IC storage section, 10...IC insertion section, 11...receiving side tray storage section, 12...tray transport section, 13...tray rotation section, 14...tray transfer section, 14a...buffer section, 14b... Supply section, 2
1...IC stake, 22...IC tray, 25a
, 25b, 43a, 43b...holding and conveying mechanism, 33
, 45...tray transfer mechanism, 61...transport rail, 6
5,111...Gate cylinder, 66...IC, 81
~84...Imaging device, 121...Tray body, 122
...IC entrance/exit, 123...plate spring, 124...bottom plate,
125...Restriction member, 126, 127...Side plate, 12
8... Closing member, 129... Positioning metal fitting, 130
... Pressing plate, 131, 132 ... Long hole, 133, 13
4...opening, 135...hole.
Claims (1)
を開放端とした複数の筒状のICトレイを着脱自
在に並列して装着するICステイツクであつて、
上面をほぼ開放した扁平な箱状のトレイ本体の前
記ICステイツクの配列方向と平行で前記開放端
と対向する端面に形成したIC出入口と、このI
C出入口の近傍に設けられ各ICステイツクの前
記開放端部を上方に偏倚する弾性部材と、この弾
性部材によるICステイツクの偏倚を規制する規
制部材と、この規制部材にICステイツクが当接
している状態で該ICステイツクの前記開放端を
閉塞する閉塞部材とを具え、各ICステイツクを
前記弾性部材による偏倚力に抗して押圧すること
によりその開放端を前記IC出入口に臨ませてI
Cの挿脱を行い得るよう構成したことを特徴とす
るICトレイ。 An IC stay in which a plurality of cylindrical IC trays each having an open end and each capable of storing a large number of ICs in a linear manner are mounted in parallel in a removable manner,
an IC entrance/exit hole formed on an end face parallel to the arrangement direction of the IC stays and opposite to the open end of a flat box-shaped tray main body with an almost open top surface;
An elastic member provided near the C entrance and exit that biases the open end of each IC stay upward; a regulation member that regulates the deflection of the IC stay due to the elastic member; and the IC stay is in contact with the regulation member. a closing member that closes the open ends of the IC stays in the IC state, and presses each IC stay against the biasing force of the elastic member so that the open ends thereof face the IC entrance/exit.
An IC tray characterized in that it is configured such that C can be inserted and removed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984136464U JPH0331081Y2 (en) | 1984-09-08 | 1984-09-08 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984136464U JPH0331081Y2 (en) | 1984-09-08 | 1984-09-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6151739U true JPS6151739U (en) | 1986-04-07 |
JPH0331081Y2 JPH0331081Y2 (en) | 1991-07-01 |
Family
ID=30694921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984136464U Expired JPH0331081Y2 (en) | 1984-09-08 | 1984-09-08 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0331081Y2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0269601U (en) * | 1988-11-15 | 1990-05-28 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6045435U (en) * | 1983-09-02 | 1985-03-30 | 株式会社 東京精密 | Semiconductor device transport equipment |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6045435B2 (en) * | 1977-04-05 | 1985-10-09 | 株式会社リコー | Registration correction method for variable magnification type copying machine |
-
1984
- 1984-09-08 JP JP1984136464U patent/JPH0331081Y2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6045435U (en) * | 1983-09-02 | 1985-03-30 | 株式会社 東京精密 | Semiconductor device transport equipment |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0269601U (en) * | 1988-11-15 | 1990-05-28 |
Also Published As
Publication number | Publication date |
---|---|
JPH0331081Y2 (en) | 1991-07-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0322698U (en) | ||
JPS6151739U (en) | ||
JPH04745U (en) | ||
JPH038776U (en) | ||
JPS63108636U (en) | ||
JPS6115223U (en) | Classification mechanism of IC test equipment | |
JPH0249905U (en) | ||
JPH0385647U (en) | ||
JPS63192232U (en) | ||
JPH04811U (en) | ||
JPS62117656U (en) | ||
JPH01127850U (en) | ||
JPH0338806U (en) | ||
JPH0199807U (en) | ||
JPH0385584U (en) | ||
JPH0184179U (en) | ||
JPS60126048U (en) | bed device | |
JPS59106639U (en) | mold lift device | |
JPH01159625U (en) | ||
JPH0315684U (en) | ||
JPH0464782U (en) | ||
JPS585154U (en) | Media ejection mechanism | |
JPS6232045U (en) | ||
JPS6335735U (en) | ||
JPH038277U (en) |