JPS6115223U - Classification mechanism of IC test equipment - Google Patents
Classification mechanism of IC test equipmentInfo
- Publication number
- JPS6115223U JPS6115223U JP9884184U JP9884184U JPS6115223U JP S6115223 U JPS6115223 U JP S6115223U JP 9884184 U JP9884184 U JP 9884184U JP 9884184 U JP9884184 U JP 9884184U JP S6115223 U JPS6115223 U JP S6115223U
- Authority
- JP
- Japan
- Prior art keywords
- rails
- rail
- classification
- storage
- discharge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Feeding Of Articles To Conveyors (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Special Conveying (AREA)
- Intermediate Stations On Conveyors (AREA)
- Sorting Of Articles (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は、この考案のび類機構の一例を示す千面図、第
２図はその斜視歯、第３図は第１図のストツパ解除機構
部分の断面図、第４図はＩＣ試験装置を示す簡略図、第
５図は第４図の斜視図、第６図及び第７図は従来の分類
機構における吐出レール、分類レール、収納レールの関
係を示す図であ６゜１６：Ｉ。
カイ、品ｉ＄Ｌ／−ｔｖ、３，５９類レニル、３８：収
納レール、４５：可動板、−４６：搬送体、５１：スド
ツパ、５２：保合片、５３：コイルばね、５４−：棒状
駆動体、５５：解除片、５６：空気シリンダ、５７：解
除機構。Fig. 1 is a 100-sided view showing an example of the screw mechanism of this invention, Fig. 2 is a perspective view of its teeth, Fig. 3 is a cross-sectional view of the stopper release mechanism portion of Fig. 1, and Fig. 4 is an IC testing device. 5 is a perspective view of FIG. 4, and FIGS. 6 and 7 are diagrams showing the relationship among the discharge rail, classification rail, and storage rail in a conventional sorting mechanism. Kai, product i$L/-tv, 3,59 class Renil, 38: storage rail, 45: movable plate, -46: conveyor, 51: sudotsupa, 52: retention piece, 53: coil spring, 54-: Rod-shaped driving body, 55: release piece, 56: air cylinder, 57: release mechanism.
Claims (1)
ほぼ平行に配列された複数の収納レールとの間に、これ
らのレールの配列方向に移動自在に配列された複数の分
類レールが設けられ、これら吐出レール、収納レール、
分類レールの各長手方向はそれぞれほぼ平行し、吐出レ
ールからの測定されたＩＣ素子が上記分類レールに供給
されてそめストツパに保持され、分類レールを移動させ
て測定結果に応じて決められた収納レールと対向する位
置でストツパ解除機構によって上記ストツパを解除し、
上記分類レールよりのＩＣ素子を収納レールに供給する
ＩＣ試験装置の分類機構において、上記吐出レールの間
隔と上記分類レールの間隔とは同一間隔とされ、これら
間隔と上記収納レールとの間隔は異ならされ、上記スト
ツパ解除機構は上記各収納レールと同一間隔でそれらと
対応してストツパ解除片が設けられ、そのストツパ解除
片は共通の駆動手段で駆動するように互に連結されてい
ることを特徴↑するＩＣ試験装置の分類機構。A plurality of classification rails are provided between a plurality of discharge rails arranged substantially parallel to each other and a plurality of storage rails arranged substantially parallel to each other, and arranged movably in the direction in which these rails are arranged. , these discharge rails, storage rails,
The longitudinal directions of the classification rails are approximately parallel to each other, and the measured IC elements from the discharge rail are supplied to the classification rail and held by the stoppers, and the classification rails are moved to store them in a manner determined according to the measurement results. The stopper is released by the stopper release mechanism at a position facing the rail,
In the sorting mechanism of the IC testing device that supplies IC elements from the sorting rail to the storage rail, the spacing between the discharge rail and the classification rail are the same, and the spacing between these rails and the storage rail is different. and the stopper release mechanism is characterized in that stopper release pieces are provided at the same spacing and corresponding to each of the storage rails, and the stopper release pieces are connected to each other so as to be driven by a common driving means. ↑Classification mechanism for IC test equipment.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9884184U JPS6115223U (en) | 1984-06-29 | 1984-06-29 | Classification mechanism of IC test equipment |
| US06/747,560 US4691831A (en) | 1984-06-25 | 1985-06-21 | IC test equipment |
| DE8585107793T DE3582752D1 (en) | 1984-06-25 | 1985-06-24 | TEST DEVICE FOR INTEGRATED CIRCUITS. |
| EP85107793A EP0166409B1 (en) | 1984-06-25 | 1985-06-24 | Ic test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9884184U JPS6115223U (en) | 1984-06-29 | 1984-06-29 | Classification mechanism of IC test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6115223U true JPS6115223U (en) | 1986-01-29 |
| JPH045465Y2 JPH045465Y2 (en) | 1992-02-17 |
Family
ID=30658358
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9884184U Granted JPS6115223U (en) | 1984-06-25 | 1984-06-29 | Classification mechanism of IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6115223U (en) |
-
1984
- 1984-06-29 JP JP9884184U patent/JPS6115223U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH045465Y2 (en) | 1992-02-17 |
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