JPS6148373U - - Google Patents
Info
- Publication number
- JPS6148373U JPS6148373U JP13382684U JP13382684U JPS6148373U JP S6148373 U JPS6148373 U JP S6148373U JP 13382684 U JP13382684 U JP 13382684U JP 13382684 U JP13382684 U JP 13382684U JP S6148373 U JPS6148373 U JP S6148373U
- Authority
- JP
- Japan
- Prior art keywords
- resistance
- probes
- sets
- measured
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13382684U JPS6148373U (nl) | 1984-09-03 | 1984-09-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13382684U JPS6148373U (nl) | 1984-09-03 | 1984-09-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6148373U true JPS6148373U (nl) | 1986-04-01 |
Family
ID=30692361
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13382684U Pending JPS6148373U (nl) | 1984-09-03 | 1984-09-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6148373U (nl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010002199A (ja) * | 2008-06-18 | 2010-01-07 | Hioki Ee Corp | 抵抗測定装置及び回路基板検査装置 |
-
1984
- 1984-09-03 JP JP13382684U patent/JPS6148373U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010002199A (ja) * | 2008-06-18 | 2010-01-07 | Hioki Ee Corp | 抵抗測定装置及び回路基板検査装置 |