JPS6141933A - 物体内の応力測定方法および装置 - Google Patents

物体内の応力測定方法および装置

Info

Publication number
JPS6141933A
JPS6141933A JP16358684A JP16358684A JPS6141933A JP S6141933 A JPS6141933 A JP S6141933A JP 16358684 A JP16358684 A JP 16358684A JP 16358684 A JP16358684 A JP 16358684A JP S6141933 A JPS6141933 A JP S6141933A
Authority
JP
Japan
Prior art keywords
measured
light
stress
optical path
path difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16358684A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0369059B2 (https=
Inventor
Tetsuharu Abe
阿部　徹治
Yutaka Mitsunaga
満永　豊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP16358684A priority Critical patent/JPS6141933A/ja
Publication of JPS6141933A publication Critical patent/JPS6141933A/ja
Publication of JPH0369059B2 publication Critical patent/JPH0369059B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/241—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet by photoelastic stress analysis

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP16358684A 1984-08-03 1984-08-03 物体内の応力測定方法および装置 Granted JPS6141933A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16358684A JPS6141933A (ja) 1984-08-03 1984-08-03 物体内の応力測定方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16358684A JPS6141933A (ja) 1984-08-03 1984-08-03 物体内の応力測定方法および装置

Publications (2)

Publication Number Publication Date
JPS6141933A true JPS6141933A (ja) 1986-02-28
JPH0369059B2 JPH0369059B2 (https=) 1991-10-30

Family

ID=15776728

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16358684A Granted JPS6141933A (ja) 1984-08-03 1984-08-03 物体内の応力測定方法および装置

Country Status (1)

Country Link
JP (1) JPS6141933A (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6325341U (https=) * 1986-08-01 1988-02-19
JP2007121174A (ja) * 2005-10-31 2007-05-17 Univ Nagoya 応力検出装置
JP2009168813A (ja) * 2008-01-14 2009-07-30 Gwangju Inst Of Science & Technology 光ファイバの残留応力測定装置
WO2011065175A1 (ja) * 2009-11-27 2011-06-03 国立大学法人京都工芸繊維大学 応力計測装置及び応力計測方法
CN103091014A (zh) * 2011-11-02 2013-05-08 财团法人工业技术研究院 光学测量装置
CN103115705A (zh) * 2013-01-19 2013-05-22 清华大学 基于正交偏振固体激光的应力和双折射测量仪及测量方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6325341U (https=) * 1986-08-01 1988-02-19
JP2007121174A (ja) * 2005-10-31 2007-05-17 Univ Nagoya 応力検出装置
JP2009168813A (ja) * 2008-01-14 2009-07-30 Gwangju Inst Of Science & Technology 光ファイバの残留応力測定装置
WO2011065175A1 (ja) * 2009-11-27 2011-06-03 国立大学法人京都工芸繊維大学 応力計測装置及び応力計測方法
CN103091014A (zh) * 2011-11-02 2013-05-08 财团法人工业技术研究院 光学测量装置
CN103115705A (zh) * 2013-01-19 2013-05-22 清华大学 基于正交偏振固体激光的应力和双折射测量仪及测量方法

Also Published As

Publication number Publication date
JPH0369059B2 (https=) 1991-10-30

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