JPS6132240A - Production of stamper for optical disk - Google Patents
Production of stamper for optical diskInfo
- Publication number
- JPS6132240A JPS6132240A JP15340584A JP15340584A JPS6132240A JP S6132240 A JPS6132240 A JP S6132240A JP 15340584 A JP15340584 A JP 15340584A JP 15340584 A JP15340584 A JP 15340584A JP S6132240 A JPS6132240 A JP S6132240A
- Authority
- JP
- Japan
- Prior art keywords
- sputtering
- electrode film
- film
- substrate
- stamper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
- G11B7/24—Record carriers characterised by shape, structure or physical properties, or by the selection of the material
- G11B7/26—Apparatus or processes specially adapted for the manufacture of record carriers
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Manufacturing Optical Record Carriers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は欠陥密度を減少した光ディスク用スタンパの製
造方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for manufacturing a stamper for optical discs with reduced defect density.
光ディスクはレーザ光を使用して情報の記録と再生を行
うメモリであって、大容量記録が可能であり、非接触で
記録、再生ができ、また塵埃の影響を受は難いなど優れ
た特徴を備えている。Optical disks are memory devices that use laser light to record and play back information, and they have excellent features such as being capable of large-capacity recording, non-contact recording and playback, and being unaffected by dust. We are prepared.
すなわちレーザ光はレンズによって径約1μmの小さな
光スボントに絞り込むことができる。That is, the laser beam can be focused by the lens into a small optical spout with a diameter of about 1 μm.
従って1ビ・71・の情報記録に要する面積は1μm2
程度の微少面積で足り、磁気ディスクが1ヒントの情報
記録に数10〜数100 、+1m 2の面積が必要な
のと較べて格段に大容量な情報記録が可能である。Therefore, the area required to record 1 bit of information is 1 μm2
It is possible to record a much larger capacity of information than with a magnetic disk, which requires an area of several tens to hundreds of square meters or +1 m2 to record one hint of information.
またレンズによって絞り込まれたレーザ光は記録媒体面
まで1〜2龍の距離を取り得るので、厚さ11■程度の
透明カバーを通して記録媒体に光スポットを結ぶことが
できる。Furthermore, since the laser beam focused by the lens can reach the recording medium surface at a distance of 1 to 2 mm, a light spot can be directed to the recording medium through a transparent cover about 11 cm thick.
そのため非接触構造をとることができ、またカバーの上
に塵埃が存在していても、カバーの上面では光ビームの
径は1ml程度と大きいので数lOμm程度の塵埃が存
在していても記録や再生に殆ど影響を及ぼさない。Therefore, it is possible to have a non-contact structure, and even if there is dust on the cover, the diameter of the light beam on the top surface of the cover is as large as about 1 ml, so even if there is dust on the order of several 10μm, it will not be possible to record. It has almost no effect on playback.
このような特徴を持つ光ディスクはニッケル(N、i)
製のスタンパを用いて樹脂鋳型し、このようにしてでき
た透明基板上に記録媒体を膜形成した後、かかる二枚の
基板を記録媒体面を内側としてエアーサンドインチ型の
構造をとり使用している。Optical discs with these characteristics are made of nickel (N,i)
After forming a film of the recording medium on the transparent substrate made in this way using a resin mold using a stamper made by the manufacturer, the two substrates were used in an air-sand inch structure with the recording medium side facing inside. ing.
本発明はかかる光ディスク基板を作るスタンパの製造方
法に関するものである。The present invention relates to a method of manufacturing a stamper for manufacturing such an optical disk substrate.
スタンパは平滑なガラス基板にレジストを被覆し、これ
に写真食刻技術(ホトリソグラフィ)を用いて同心円状
のプリグループを作り、かかるレジスト被覆基板にNi
を真空蒸着し、その後Ni蒸着膜を陰極としてNi メ
ッキを行い、ガラス基板から剥離することによって作ら
れている。The stamper coats a smooth glass substrate with resist, uses photolithography to create concentric pre-groups, and then coats the resist-coated substrate with Ni.
It is made by vacuum evaporating the film, then plating with Ni using the Ni evaporated film as a cathode, and peeling it off from the glass substrate.
第1図〜第5図はこの工程を示すもので、実施例につい
て説明すると次のようになる。FIGS. 1 to 5 show this process, and an example will be explained as follows.
表面を研磨して平坦にした厚さ約1 cmのガラス基板
lの上にスピンコード法により厚さ約0.1 μmのレ
ジスト11U2を形成する(第1図)。A resist 11U2 with a thickness of about 0.1 μm is formed by a spin code method on a glass substrate l with a thickness of about 1 cm whose surface has been polished and made flat (FIG. 1).
次に、かかるレジスト膜2に写真食刻技術を用いてプリ
グループ3をパターン形成する。Next, a pre-group 3 is patterned on the resist film 2 using photolithography.
ここでプリグループ3は情報の記録位置となるもので例
えば0.5〜0,7 μII+の幅をもち、■。6μm
間隔で同心円状に多数形成されている(第2図)。Here, the pre-group 3 serves as a recording position of information and has a width of, for example, 0.5 to 0.7 μII+. 6μm
A large number of concentric circles are formed at intervals (Fig. 2).
次に、かかる基板面にN1を約300 人の厚さに真空
蒸着して電極膜4を形成する(第3図)。Next, an electrode film 4 is formed by vacuum evaporating N1 to a thickness of about 300 nm on the surface of the substrate (FIG. 3).
次に、この電極膜4を陰極としてNi メッキ浴に浸漬
し、電解をおこなって電極膜4の上に厚さ約300μm
のメッキ層5を形成する(第4図)。Next, this electrode film 4 is used as a cathode and immersed in a Ni plating bath, and electrolysis is performed to form a layer of about 300 μm thick on the electrode film 4.
A plating layer 5 is formed (FIG. 4).
次にメッキ膜5をガラス基板1から剥離して第5図に示
すようなスタンパ6が作られる。Next, the plating film 5 is peeled off from the glass substrate 1 to produce a stamper 6 as shown in FIG.
このようにして作られたスタンパ6は鋳型として使われ
、アクリル樹脂のような透明な樹脂を鋳型して多数の光
ディスク基板が作られる。The stamper 6 thus made is used as a mold, and a large number of optical disk substrates are made by molding transparent resin such as acrylic resin.
ここでスタンパ6の必要条件は正確にプリグルーブパタ
ーンが形成されているごとと共に欠陥の含有率が少ない
ことである。Here, the necessary conditions for the stamper 6 are that the pregroove pattern is accurately formed and that the content of defects is small.
なお、ここで欠陥とは直径が0.5 μm以−にの凹凸
を指す。Note that the term "defect" as used herein refers to irregularities with a diameter of 0.5 μm or more.
発明者等は光ディスク基板の品質を向上するために第1
図〜第5図に示す各工程において欠陥の発生密度を調査
した結果、電極膜4にNiメッキを行いメッキ膜を作り
、次ぎにこれを剥離してスタンパ6を作る段階で異常に
欠陥密度が増加することを見いだした。In order to improve the quality of optical disc substrates, the inventors
As a result of investigating the occurrence density of defects in each process shown in Figs. 5 to 5, it was found that the defect density was abnormally high at the stage where the electrode film 4 was plated with Ni to form a plated film, and then this was peeled off to form the stamper 6. It was found that there was an increase in
このことは電極膜4を蒸着した後、この電極膜4を陰極
としてメッキする際の密着性が悪いことを意味している
。This means that after the electrode film 4 is vapor-deposited, the adhesion is poor when plating is performed using the electrode film 4 as a cathode.
以上記したようにスタンバ形成工程のうち、電極膜4の
上にメッキ層5を形成する工程で欠陥密度が増加し、品
質を低下さゼていることが問題である。As described above, the problem is that the defect density increases in the step of forming the plating layer 5 on the electrode film 4 in the step of forming the standby bar, resulting in a decrease in quality.
上記の問題点はガラス基板にレジストを被覆し、写真食
刻技術により該ガラス基板に達するプリグルーブパター
ンを形成後、この上にニッケル蒸着を行って電極膜の形
成を行い、次に該電極膜を陰極としてニッケルメッキを
行いスタンパを形成する工程において、メッキ処理前に
電極膜の付いたガラス基板をスパッタ装置に装着し、酸
素ガス雰囲気中でスパッタし、電極膜のクリーニング処
理を行うスタンパの製造方法により解決することができ
る。The above problem is solved by coating a glass substrate with a resist, forming a pregroove pattern that reaches the glass substrate using photolithography, and then forming an electrode film by evaporating nickel on the pregroove pattern. In the process of forming a stamper by performing nickel plating with nickel as a cathode, the glass substrate with the electrode film is mounted on a sputtering device before the plating process, sputtering is performed in an oxygen gas atmosphere, and the electrode film is cleaned. This can be solved by a method.
スタンパ6の形成段階で欠陥密度が増大していることは
メッキ層5をガラス基板1から剥離する際に電極膜4の
一部がレジスト膜2に付着していることであり、このこ
とは電極膜4とメッキ層5との密着性が不充分なことを
示している。The increase in defect density at the stage of forming the stamper 6 is due to a portion of the electrode film 4 adhering to the resist film 2 when the plating layer 5 is peeled off from the glass substrate 1. This indicates that the adhesion between the film 4 and the plating layer 5 is insufficient.
この原因は電極1lU4の膜厚が約300人と極めて薄
いためピンホールが多数存在し、それを通してレジスト
の滲み上がりが避けられず、また真空蒸着の過程での拡
散ポンプ油の逆拡散などによって電極膜4が汚染されて
おり、そのために濡れ性が劣ることが原因であると推定
した。The reason for this is that the film thickness of the electrode 1lU4 is extremely thin (approximately 300 mm), so there are many pinholes, through which it is inevitable for the resist to bleed, and also due to back diffusion of diffusion pump oil during the vacuum deposition process. It was presumed that the cause was that the membrane 4 was contaminated, resulting in poor wettability.
そこで本発明は蒸着処理過程において形成された電極膜
4上の有機物を酸素雰囲気中で高周波スパッタし、強制
酸化することによって除去し、これによって電極膜4の
濡れ性を回復させるものである。Therefore, the present invention removes the organic substances formed on the electrode film 4 during the vapor deposition process by performing high-frequency sputtering in an oxygen atmosphere to perform forced oxidation, thereby restoring the wettability of the electrode film 4.
第2図に示すようにレジスト膜2にプリグループ3をパ
ターン形成した後、真空蒸着装置にこのガラス基板1を
装着し、従来と同様に140°Cで基板加熱を行いなが
らNiを300人の厚さに蒸着して電極膜4を作り、次
ぎにこれを高周波スバタリング装置に移し、酸素ガス圧
2.3 Xl0−2Torr、周波数13.36 Mt
lz、電力200Wの条件で20分間に互ってスパッタ
を行う、この条件では電極膜4のスパッタは進行せず、
表面に付着している有機物の酸化だけが進行し、有機物
はガス化して除去される。After forming a pattern of pregroups 3 on the resist film 2 as shown in Fig. 2, this glass substrate 1 was mounted on a vacuum evaporation device, and while heating the substrate at 140°C as in the conventional method, Ni was deposited by 300 people. The electrode film 4 was formed by vapor deposition to a thickness, and then transferred to a high-frequency sputtering device at an oxygen gas pressure of 2.3 Xl0-2 Torr and a frequency of 13.36 Mt.
Sputtering is performed alternately for 20 minutes under the conditions of 1z and power of 200 W. Under these conditions, the sputtering of the electrode film 4 does not proceed;
Only the oxidation of organic matter adhering to the surface progresses, and the organic matter is gasified and removed.
なお、これよりも電力を大きくするか或いはスパッタ時
間を延長すると電極膜4のエツチングが進行してパター
ン精度が低下する。Note that if the power is increased or the sputtering time is extended beyond this, etching of the electrode film 4 will progress and the pattern accuracy will decrease.
このような処理を行った後、従来のようにメッキ液に浸
漬すると電極1IQ4の濡れ性は極めて良く、スタンパ
6の欠陥密度を大幅に減少さ−Uることができる。After such treatment, when the electrode 1IQ4 is immersed in a plating solution as in the prior art, the wettability of the electrode 1IQ4 is extremely good, and the defect density of the stamper 6 can be significantly reduced.
具体的には従来のスタンパの欠陥密度は1ビット当たり
10−5個程度であったが本発明の実施により10−7
個に減少さ−lるごとができ、品質と収率の向」二が達
成された。Specifically, the defect density of conventional stampers was about 10-5 per bit, but with the implementation of the present invention, it has been reduced to 10-7.
This resulted in improved quality and yield.
以上記したように本発明の実施によりスタンパの形成工
程で増大していた欠陥密度を低下させることが可能とな
り、この適用により、光ディスクの品質を向上ざ−Uる
ことができる。As described above, by carrying out the present invention, it is possible to reduce the defect density that has increased in the stamper forming process, and by applying this, it is possible to improve the quality of optical discs.
第1図乃至第5図は光ディスクを製造するスタンパの製
作工程を説明する断面図である。
図において、
1はガラス基板、 2はレジスト膜、3はプリグ
ループ、 4は電極膜、
5はメッキ層、 6はスタンパ、である。FIGS. 1 to 5 are cross-sectional views illustrating the manufacturing process of a stamper for manufacturing optical discs. In the figure, 1 is a glass substrate, 2 is a resist film, 3 is a pre-group, 4 is an electrode film, 5 is a plating layer, and 6 is a stamper.
Claims (1)
ガラス基板に達するプリグルーブパターンを形成後、こ
の上にニッケル蒸着を行って電極膜の形成を行い、次に
該電極膜を陰極としてニッケルメッキを行いスタンパを
形成する工程において、メッキ処理前に電極膜の付いた
ガラス基板をスパッタ装置に装着し、酸素ガス雰囲気中
でスパッタし、電極膜のクリーニング処理を行うことを
特徴とする光ディスク用スタンパの製造方法。After coating a glass substrate with resist and forming a pregroove pattern that reaches the glass substrate using photolithography, nickel is deposited on top of this to form an electrode film, and then nickel plating is performed using the electrode film as a cathode. A stamper for an optical disk, characterized in that in the step of forming a stamper by performing plating, a glass substrate with an electrode film is mounted on a sputtering device, sputtering is performed in an oxygen gas atmosphere, and the electrode film is cleaned. manufacturing method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15340584A JPS6132240A (en) | 1984-07-24 | 1984-07-24 | Production of stamper for optical disk |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15340584A JPS6132240A (en) | 1984-07-24 | 1984-07-24 | Production of stamper for optical disk |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6132240A true JPS6132240A (en) | 1986-02-14 |
Family
ID=15561768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15340584A Pending JPS6132240A (en) | 1984-07-24 | 1984-07-24 | Production of stamper for optical disk |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6132240A (en) |
-
1984
- 1984-07-24 JP JP15340584A patent/JPS6132240A/en active Pending
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