JPS61290370A - Critical current measuring instrument for superconductive wire - Google Patents
Critical current measuring instrument for superconductive wireInfo
- Publication number
- JPS61290370A JPS61290370A JP60130913A JP13091385A JPS61290370A JP S61290370 A JPS61290370 A JP S61290370A JP 60130913 A JP60130913 A JP 60130913A JP 13091385 A JP13091385 A JP 13091385A JP S61290370 A JPS61290370 A JP S61290370A
- Authority
- JP
- Japan
- Prior art keywords
- current
- superconductive wire
- superconducting wire
- terminal
- current terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 21
- 238000005259 measurement Methods 0.000 claims description 2
- 229910000679 solder Inorganic materials 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 5
- 239000000523 sample Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の属する技術分野〕
本発明は、Ｍｉ−４線の臨界電流を求める装置（二Ｓい
て、供試超電導線に流す電流端子の構造（二関する。DETAILED DESCRIPTION OF THE INVENTION [Technical field to which the invention pertains] The present invention relates to an apparatus (2S) for determining the critical current of a Mi-4 wire, and a structure (2) of a current terminal to be applied to a test superconducting wire.
超峨尋線の臨界電流（以下ＩＣと略す）は、一般に四端
子法で測られている。すなわちある一定の均−磁場窒間
に置かれた供試超電導線に電流導体を通して流れた電流
に対して０．１−１μＶの出力電圧が観測されたときの
電流をＩＣとしている。The critical current (hereinafter abbreviated as IC) of a superwire is generally measured by the four-probe method. That is, the current when an output voltage of 0.1-1 μV is observed for a current flowing through a current conductor in a test superconducting wire placed between a certain uniform magnetic field and a constant magnetic field is defined as IC.
第４図は、従来用いられているＩＣ測定装装置（以下Ｉ
Ｃプローブと略す）の概略である。Figure 4 shows the conventionally used IC measuring equipment (hereinafter referred to as I).
This is an outline of the C-probe.
第５図は、ＩＣプローブ先端部２を拡大して示した。超
電導線４は平板の電流端子３上にハンダ１４で固定され
る。しかし、この方法で供試超電導線を電流端子に収付
けると第６図のようなＩＣ曲線を示し、ＩＣ値の判定が
非常Ｃｌ、 ｌ： （い欠点があった。FIG. 5 shows an enlarged view of the tip portion 2 of the IC probe. The superconducting wire 4 is fixed onto the flat current terminal 3 with solder 14. However, when the test superconducting wire was placed in a current terminal using this method, it showed an IC curve as shown in Figure 6, and the IC value was difficult to judge.
本発明の目的は、従来のＩＣプローブによる供試超電導
線と電流端子の接触方法を改善することによりＩＣの判
定をしやすくすることにある。An object of the present invention is to improve the method of contacting a test superconducting wire with a current terminal using a conventional IC probe, thereby making IC determination easier.
本発明では、電流導体の端子と供試超電導線との接触は
従来のような平板状の電流端子上に置いてハンダで固定
する方法と異なり電流端子と供試超電導線が接する部分
を超電導線の全周とし、かつ電流端子から供試超電導線
に流れる電流は供試超電導線に集中する構造を待ちある
いは供試超電導線のみから流呂する構造の電流端子であ
ることを特徴とする電流端子と供試超電導線を接触する
方法に関する。In the present invention, the contact between the terminal of the current conductor and the superconducting wire under test is different from the conventional method of placing the terminal on a flat current terminal and fixing it with solder. A current terminal characterized in that the current terminal has a structure in which the current flowing from the current terminal to the test superconducting wire is concentrated on the test superconducting wire or flows only from the test superconducting wire. and a method of contacting the superconducting wire under test.
本発明（：よれば、従来方式による電流端子と超ｉｉ導
線の接触の不都合によって生じたＩＣ値の判定のしにく
さは解消される。According to the present invention, the difficulty in determining the IC value caused by the inconvenience of contact between the current terminal and the super II conductor in the conventional method is resolved.
本発明の実施例を第１図に示す。供試超電導線４と電流
端子１５はちょうど鉛筆のような構造になってｇす、電
流端子１５に流れる磁流は供試超電導線４（二渠申して
流出するような構造（＝なっている。An embodiment of the invention is shown in FIG. The superconducting wire 4 under test and the current terminal 15 have a pencil-like structure, and the magnetic current flowing through the current terminal 15 flows through the superconducting wire 4 under test. .
電流端子にあけた長手方向の穴１６は、供試超電導線４
がさし込まれる構造になっている。さし込んだ後は、ハ
ンダによって供試超電導線と′磁流端子の接触をさらに
密にする。また磁流端子の形状は、電流端子の一端に供
試超電導線が突き出る構造のものである。The longitudinal hole 16 drilled in the current terminal is connected to the test superconducting wire 4.
It has a structure that allows it to be inserted. After insertion, the contact between the test superconducting wire and the magnetic terminal is made even tighter using solder. Moreover, the shape of the magnetic current terminal is such that the test superconducting wire protrudes from one end of the current terminal.
電流端子の形状の一例を第２図に示す。このような構造
の電流端子と超電導線の組ろ合せによって、ＩＣ測定し
た結果、第３因で示したようになり、ＩＣ値は、従来に
比べ非常に判定しやすくなった。An example of the shape of the current terminal is shown in FIG. By combining the current terminal and the superconducting wire with such a structure, the IC measurement result is as shown in the third factor, and the IC value is much easier to judge than before.
＠１図は本発明による臨界電流測定装置の先端部の概略
図、第２図は本発明による臨界電流測定装置で測った特
性図、第３図は本発明による臨界電流測定装置の先端部
の各種磁流端子の概略図。
第４図は四端子法による超電導線の臨界電流測定方法の
概略図、第５図は臨界′硫流測定装置の先端部の概略図
、第６図は従来使用されている臨界電流測定装置で測っ
た特性図である。
１・・・臨界電流測定装置
２・・・臨界電流測定装置先端部
３・・・従来型電流端子 ４・・・供試超電導線５・
・・外部′磁流端子 ６・・・４圧端子７・・・シ
ャフト ８・・・電源９・・・ＸＹレコーダ
ｌＯ・・・クライオスタンド１１・・・液体ヘリ
ウム １２・・・超電導マグネット１３・・・チン
プルホルダー １４・・・ハンダ１５・・・本発明によ
る電流端子
１６・・・本発明による磁流端子にあけた供試超電導線
接触穴
代理人 弁理士 則 近 思 佑
（ばか１名）
第 １ 図
第 ２ 図
第 ４ 図@ Figure 1 is a schematic diagram of the tip of the critical current measuring device according to the present invention, Figure 2 is a characteristic diagram measured by the critical current measuring device according to the present invention, and Figure 3 is a diagram of the tip of the critical current measuring device according to the present invention. Schematic diagram of various magnetic current terminals. Figure 4 is a schematic diagram of the critical current measurement method for superconducting wires using the four-terminal method, Figure 5 is a schematic diagram of the tip of the critical sulfur flow measuring device, and Figure 6 is a conventional critical current measuring device. This is a diagram of the measured characteristics. 1... Critical current measuring device 2... Critical current measuring device tip 3... Conventional current terminal 4... Superconducting wire under test 5.
...External magnetic current terminal 6...4 voltage terminal 7...Shaft 8...Power source 9...XY recorder lO...Cryostand 11...Liquid helium 12...Superconducting magnet 13. ...Chimple holder 14...Solder 15...Current terminal according to the present invention 16...Test superconducting wire contact hole drilled in the magnetic current terminal according to the present invention Agent Patent attorney Nori Chika Suiyu (1 idiot) ) Figure 1 Figure 2 Figure 4
Claims (1)
超電導線が接触する電流端子の構造は、電流端子と供試
超電導線が接する部分を超電導線の全周とし、かつ電流
端子から供試超電導線に流れる電流は供試超電導線に集
中あるいは、供試超電導線のみから流出する構造を持つ
電流端子であることを特徴とする超電導線の臨界電流測
定装置。In a critical current measurement device for a superconducting wire, the structure of the current terminal in which the current terminal and the test superconducting wire come into contact is such that the contact area between the current terminal and the test superconducting wire is the entire circumference of the superconducting wire, and the current terminal is connected to the test superconducting wire. A critical current measuring device for a superconducting wire, characterized in that the current terminal has a structure in which the current flowing through the wire is concentrated in the superconducting wire under test or flows out only from the superconducting wire under test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60130913A JPS61290370A (en) | 1985-06-18 | 1985-06-18 | Critical current measuring instrument for superconductive wire |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60130913A JPS61290370A (en) | 1985-06-18 | 1985-06-18 | Critical current measuring instrument for superconductive wire |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61290370A true JPS61290370A (en) | 1986-12-20 |
Family
ID=15045664
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60130913A Pending JPS61290370A (en) | 1985-06-18 | 1985-06-18 | Critical current measuring instrument for superconductive wire |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61290370A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0860705A2 (en) * | 1997-02-25 | 1998-08-26 | Sumitomo Electric Industries, Ltd. | Method and apparatus for measuring critical current value of superconducting wire |
| JP2007142137A (en) * | 2005-11-18 | 2007-06-07 | Railway Technical Res Inst | High-temperature superconducting current lead basic property test equipment |
| CN110275122A (en) * | 2019-04-23 | 2019-09-24 | 上海超导科技股份有限公司 | Superconduction belt material critical current test device and test method |
-
1985
- 1985-06-18 JP JP60130913A patent/JPS61290370A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0860705A2 (en) * | 1997-02-25 | 1998-08-26 | Sumitomo Electric Industries, Ltd. | Method and apparatus for measuring critical current value of superconducting wire |
| EP0860705A3 (en) * | 1997-02-25 | 2001-08-08 | Sumitomo Electric Industries, Ltd. | Method and apparatus for measuring critical current value of superconducting wire |
| JP2007142137A (en) * | 2005-11-18 | 2007-06-07 | Railway Technical Res Inst | High-temperature superconducting current lead basic property test equipment |
| CN110275122A (en) * | 2019-04-23 | 2019-09-24 | 上海超导科技股份有限公司 | Superconduction belt material critical current test device and test method |
| CN110275122B (en) * | 2019-04-23 | 2021-07-13 | 上海超导科技股份有限公司 | Superconducting tape critical current testing device and testing method |
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