JPS61288077A - Thin film forming device - Google Patents

Thin film forming device

Info

Publication number
JPS61288077A
JPS61288077A JP12964885A JP12964885A JPS61288077A JP S61288077 A JPS61288077 A JP S61288077A JP 12964885 A JP12964885 A JP 12964885A JP 12964885 A JP12964885 A JP 12964885A JP S61288077 A JPS61288077 A JP S61288077A
Authority
JP
Japan
Prior art keywords
substrate
electrodes
thin film
electrode
container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12964885A
Other languages
Japanese (ja)
Inventor
Makoto Araki
荒木 信
Hiroshi Osame
浩史 納
Yuji Uehara
裕二 上原
Kohei Kiyota
航平 清田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP12964885A priority Critical patent/JPS61288077A/en
Publication of JPS61288077A publication Critical patent/JPS61288077A/en
Pending legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • C23C16/5093Coaxial electrodes

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Photoreceptors In Electrophotography (AREA)

Abstract

PURPOSE:To prevent the intrusion of the pulverous powder of the reaction product into a discharge system and to permit easy pressure regulation by installing heating means into a vessel except the space where the electrodes for impressing voltage provided to face each other and a substrate face each other. CONSTITUTION:The substrate 1 and the electrodes 4 facing the substrate are provided in the vessel 2 and the heating means 31, 36 are provided therein except the space where the electrodes 4 and the substrate 1 face each other. A reactive gas is then introduced into the vessel 2 and the voltage is impressed between the substrate 1 and the electrodes 4, by which the above-mentioned reactive gas is converted to plasma and is thus cracked and activated. Covers 32, 33, 34, 35 and the electrodes 4 are at the same time heated by the heaters 31, 36. The active seed of the resultant product of cracking is stuck in the form of a film-like resultant product 37 on the substrate. The generation of the pulverous powder is thus prevented and the clogging of the discharge system is prevented.

Description

【発明の詳細な説明】 (概要〕 電子写真感光体に用いるアモルファスシリコンの製造等
に用いられる薄膜形成装置の改良であって、特にシラン
(SiH4)ガス、或いはジシラン(5i2H6)ガス
等の反応ガスを分解してアモルファスシリコンを形成す
る際、分解生成物のシIJコンの微粉末によって装置の
排気特性が劣化するのを防止するようにした薄膜生成装
置。
DETAILED DESCRIPTION OF THE INVENTION (Summary) This is an improvement of a thin film forming apparatus used for manufacturing amorphous silicon used in electrophotographic photoreceptors, etc., in particular, using a reactive gas such as silane (SiH4) gas or disilane (5i2H6) gas. A thin film generating device that prevents deterioration of the exhaust characteristics of the device due to fine powder of silicon, which is a decomposition product, when decomposing amorphous silicon to form amorphous silicon.

〔産業上の利用分野〕[Industrial application field]

本発明は薄膜形成装置、特に電子写真感光体に用いられ
るアモルファスシリコンの薄膜形成装置に係り、特に反
応ガスが分解されて発生するシリコンの微粉末によって
装置の排気特性が劣化するを防止した薄膜形成装置に関
する。
The present invention relates to a thin film forming apparatus, particularly an amorphous silicon thin film forming apparatus used for electrophotographic photoreceptors, and more particularly to a thin film forming apparatus that prevents deterioration of exhaust characteristics of the apparatus due to fine silicon powder generated by decomposition of a reaction gas. Regarding equipment.

記録ドラムの周囲に形成した光導電層を一様に帯電させ
、この光導電層に対して印字情報に基づいてレーザ光を
照射して、この光導電層の、帯電電位を選択的に低下さ
せて静電潜像を形成する。
A photoconductive layer formed around the recording drum is uniformly charged, and the photoconductive layer is irradiated with laser light based on printed information to selectively lower the charged potential of the photoconductive layer. to form an electrostatic latent image.

その後、この潜像形成箇所に帯電トナーを付着させて現
像し、この現像した印字画像を記録紙に転写記録するレ
ーザプリンタのような電子写真装置は周知である。
Thereafter, an electrophotographic apparatus such as a laser printer is well known in which a charged toner is applied to the latent image forming area and developed, and the developed printed image is transferred and recorded on recording paper.

このような光導電層としては、従来よりセレン(Se)
系の材料が用いられてきたが、このSeは有害であり、
長時間使用した後、廃棄する場合に公害問題が発注する
。また機械的強度が小さく光導電層の表面に傷が発生し
て、長時間使用すると印字品位の低下を招く等問題が多
い。
Conventionally, selenium (Se) has been used as such a photoconductive layer.
Se-based materials have been used, but this Se is harmful;
Pollution problems occur when discarding after long-term use. In addition, the mechanical strength is low, and scratches occur on the surface of the photoconductive layer, causing many problems such as deterioration of printing quality when used for a long time.

そこで最近は導電性ドラムの周囲に光導電層として、S
eの代わりに人体に無害で且つ機械的強度の大きいアモ
ルファスシリコン感光体層を形成した記録ドラムが開発
されている。
Therefore, recently S
A recording drum has been developed in which an amorphous silicon photoreceptor layer, which is harmless to the human body and has high mechanical strength, is formed instead of e.

〔従来の技術〕[Conventional technology]

第2図はこのようなアモルファスシリコンを形成するた
めの従来のWiM形成装置の模式図である。
FIG. 2 is a schematic diagram of a conventional WiM forming apparatus for forming such amorphous silicon.

図示するように従来の薄膜形成装置は、加熱ヒータ(図
示せず)を内部に有する円筒状の〜の基体1が、気密に
封止した容器2内に設置され、モータ3によって回転さ
れている。この基体1の周囲には、内部が中空で二重構
造となった円筒状の電極4が設けられ、この電極4に接
続されているガス導入管5にはアモルファスシリコン感
光体層の形成用ガスのジシラン(Si2H6)ガスボン
ベ6が接続されている。
As shown in the figure, in the conventional thin film forming apparatus, a cylindrical base 1 having a heater (not shown) inside is installed in an airtightly sealed container 2 and rotated by a motor 3. . A cylindrical electrode 4 with a hollow interior and a double structure is provided around the base 1, and a gas introduction tube 5 connected to the electrode 4 is filled with gas for forming an amorphous silicon photoreceptor layer. A disilane (Si2H6) gas cylinder 6 is connected.

また電極40基体lと対向する面には多数のガス排出ロ
アが設けられ、電極4と接続しているガス導入管5の一
端部には高周波電源8が接続されている。
Further, a large number of gas discharge lowers are provided on the surface of the electrode 40 facing the base 1, and a high frequency power source 8 is connected to one end of the gas introduction pipe 5 connected to the electrode 4.

更に容器2の排気口9には排気系としてのバルブ10、
反応生成物の微粉末を濾過するストレーナ11、メカニ
カルブースタポンプ12、ロータリーポンプ13が接続
されている。
Further, the exhaust port 9 of the container 2 is provided with a valve 10 as an exhaust system.
A strainer 11 for filtering the fine powder of the reaction product, a mechanical booster pump 12, and a rotary pump 13 are connected.

このような装置を用いて基体1上にアモルファスシリコ
ン層を形成する場合について説明すると、まず容器2内
に基体1を設置した後、バルブ10を開放にして図示し
ないが別個に設けた排気系のディフュージョンポンプ、
或いはロータリーポンプを用いて容器2内を1O−6t
orrの真空度になる迄排気する。次いで基体1を20
0〜300℃に加熱した後、ジシランガスボンベ6より
ジシランガスを容器2内に導入し、容器内をQ、5 t
orr程度の圧力になるように、図示したメカニカルブ
ースタポンプ12、及びロータリーポンプ13を用いて
保ちながら、高周波電源8を用いて基体1と電極4間に
高周波電圧を印加してグロー放電を発生させ、この導入
されたガスをプラズマ状態となし、基体1上にそのガス
の分解生成物を付着させてアモルファスシリコン層を形
成している。
To explain the case of forming an amorphous silicon layer on the substrate 1 using such a device, first, the substrate 1 is placed in the container 2, and then the valve 10 is opened and the exhaust system, which is separately provided (not shown), is opened. diffusion pump,
Alternatively, use a rotary pump to pump 1O-6t inside the container 2.
Evacuate until the vacuum level reaches orr. Next, the base 1 is
After heating to 0 to 300°C, disilane gas is introduced into the container 2 from the disilane gas cylinder 6, and the inside of the container is heated to Q, 5 t.
A glow discharge is generated by applying a high frequency voltage between the substrate 1 and the electrode 4 using the high frequency power supply 8 while maintaining the pressure to about The introduced gas is turned into a plasma state, and the decomposition products of the gas are deposited on the substrate 1 to form an amorphous silicon layer.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところで、第3図に示すようにこの容器2の内壁の上部
領域21、並びに底部領域22、電極4の表面の温度は
基体1の温度程上昇していない。そのため、加熱されて
いる基体1の表面にジシランガスが分解された励起分子
、励起原子、遊離基、イオン等の活性種が、膜状のアモ
ルファスシリコンとなって付着せずに、温度が低い内壁
の上部領域21、底部領域22、電極4の基体1との対
向面、並びに電極4の両端部にシリコンの微粉末2jと
成って付着する。そしてこのシリコンの微粉末23が排
気口9を通過して第2図に示した前記したバルブ10に
入り込んで、バルブ10やストレーナ11の目詰まりを
発生させ、容器2内の圧力上昇を起こす問題がある。
By the way, as shown in FIG. 3, the temperature of the upper region 21 and bottom region 22 of the inner wall of this container 2 and the surface of the electrode 4 has not increased as much as the temperature of the base 1. Therefore, active species such as excited molecules, excited atoms, free radicals, and ions generated by the decomposition of disilane gas do not adhere to the surface of the heated substrate 1 as a film-like amorphous silicon, but rather are deposited on the inner wall where the temperature is low. Fine silicon powder 2j is deposited on the upper region 21, the bottom region 22, the surface of the electrode 4 facing the base 1, and both ends of the electrode 4. Then, this fine silicon powder 23 passes through the exhaust port 9 and enters the valve 10 shown in FIG. There is.

そのため、バルブ10の開き具合を手動、または自動圧
力調整器により行って容器2の内部の圧力調整を行って
いたが、このような装置では取扱が煩雑で、容器2の内
部の生成膜の膜質に影響を及ぼす圧力調整が正確に実施
できない欠点があった。
For this reason, the pressure inside the container 2 has been adjusted by manually opening the valve 10 or by using an automatic pressure regulator, but such devices are complicated to handle and may affect the quality of the film formed inside the container 2. There was a drawback that pressure adjustment that affected the temperature could not be carried out accurately.

そのため、形成されるアモルファスシリコン感光体の特
性が安定しない問題がある。
Therefore, there is a problem that the characteristics of the amorphous silicon photoreceptor formed are not stable.

またバルブ10より更にメカニカルブースタポンプ12
やロータリーポンプ13にまで前記したシリコンの微粉
末23が入り込み、ポンプの排気能力を低下させる問題
がある。
In addition, a mechanical booster pump 12 is further provided than the valve 10.
There is a problem in that the fine silicon powder 23 gets into the rotary pump 13 and reduces the pump's pumping ability.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の薄膜形成装置は上記した反応ガスの分解生成物
が容器2の排気口9に導入されないようにした装置の提
供を目的とするもので、第1図に示すように本発明の装
置は、温度が比較的低温度で、かつ活性種が形成される
箇所を覆うように、シーズヒータ等の加熱手段31を備
えたカバー32゜33、34.35を設けると共に、電
極4の基体1との対同面の背面側にも加熱手段36を設
ける。
The purpose of the thin film forming apparatus of the present invention is to provide an apparatus that prevents the decomposition products of the reaction gas described above from being introduced into the exhaust port 9 of the container 2. As shown in FIG. Covers 32, 33, 34, and 35 equipped with heating means 31 such as sheathed heaters are provided so as to cover areas where the temperature is relatively low and where active species are formed. A heating means 36 is also provided on the back side of the opposite side.

〔作用〕[Effect]

本発明の薄膜形成装置は、活性種が加熱された基体1上
では膜状のシリコンとなって基体1上に付着する現象を
利用する。
The thin film forming apparatus of the present invention utilizes the phenomenon that active species become film-like silicon on the heated substrate 1 and adhere to the substrate 1.

即ち、容器2の内部で温度が上昇し難い容器2の内壁の
上部領域21と底部領域22に対向するようにヒータ3
1を設けたカバー32.33,34.35を設置すると
共に、電極4の基体1との対向面の背面側にヒータ36
を設け、ヒータ31と36とを加熱することで、そのカ
バー32.33.34.35と電極4の基体1との対向
面側に、反応ガスの反応生成物の活性種を薄膜状のシリ
コンの固形物として付着させる。そして容器2の排気口
9を通過して、活性種が微粉末のシリコンと成って、排
気パルプ等の排気系に導入されないようにしたものであ
る。
That is, the heater 3 is placed so as to face the upper region 21 and the bottom region 22 of the inner wall of the container 2, where the temperature inside the container 2 is difficult to rise.
In addition, a heater 36 is installed on the back side of the surface of the electrode 4 facing the base 1.
By heating the heaters 31 and 36, the active species of the reaction products of the reaction gas are deposited on the opposite surface of the cover 32, 33, 34, 35 and the base 1 of the electrode 4 into a thin film of silicon. It is attached as a solid substance. The activated species then pass through the exhaust port 9 of the container 2 and become finely powdered silicon, so that they are prevented from being introduced into the exhaust system such as exhaust pulp.

〔実施例〕〔Example〕

本発明の薄膜形成装置の要部の断面図を第1図に示す。 FIG. 1 shows a sectional view of essential parts of the thin film forming apparatus of the present invention.

図示するように本発明の薄膜形成装置は、容器2の内壁
で活性種が形成される箇所で、温度が上昇し難い上部領
域21および底部領域22を覆うように加熱ヒータ31
を備えたカバー33とカバー32を設けると共に、温度
が上昇し難い電極4の両端部にもヒータ31を備えたカ
バー34.35を設け、更に電極4の基体1と対向する
面の背面領域に加熱ヒータ36を設置する。
As shown in the figure, in the thin film forming apparatus of the present invention, a heater 31 is installed so as to cover an upper region 21 and a bottom region 22 where the temperature does not easily rise, where active species are formed on the inner wall of the container 2.
In addition to providing covers 33 and 32 equipped with heaters 31 and 32, covers 34 and 35 equipped with heaters 31 are also provided at both ends of the electrode 4 where the temperature does not easily rise, and furthermore, covers 34 and 35 equipped with heaters 31 are provided on the back area of the surface of the electrode 4 facing the base 1. A heater 36 is installed.

このようにして反応ガスを装置内に導入して電極4と基
体1間に電圧を印加して、導入された反応ガスをプラズ
マ状とする時、同時にヒータ31.36を加熱してカバ
ー32.33.34.35を加熱すると共に電極4を加
熱する。
When the reactant gas is thus introduced into the apparatus and a voltage is applied between the electrode 4 and the substrate 1 to turn the introduced reactant gas into a plasma state, the heaters 31 and 36 are simultaneously heated to cover the cover 32. 33, 34, and 35, and also heats the electrode 4.

すると反応ガスの分解生成物の活性種が、膜状の生成物
37と成って、がこのカバー32.33.34.35と
電極4の基体lとの対向面に付着し、そのため、低温領
域で発生する反応ガスの生成物のシリコンの微粉末が容
器2の底部の排気口9を通過して排気バルブの方向に移
動しなくなり、排気系の排気能力が低下することがなく
なり、容器内の圧力が一定の値に保たれる。
Then, the active species of the decomposition products of the reaction gas form a film-like product 37, which adheres to the facing surface of the cover 32, 33, 34, 35 and the base 1 of the electrode 4, and therefore The fine silicon powder, which is a product of the reaction gas generated, will no longer pass through the exhaust port 9 at the bottom of the container 2 and move toward the exhaust valve, and the exhaust capacity of the exhaust system will not be reduced. Pressure is kept at a constant value.

このカバー32.33.34.35の表面、並びに電極
4−  の基体1との対向面に付着した膜状の生成物3
7は後の工程でエツチング除去すると良い。
A film-like product 3 attached to the surface of this cover 32, 33, 34, 35 and the surface facing the base 1 of the electrode 4-
7 should be removed by etching in a later process.

また本実施例の代わりに、他の実施例としてカバー32
.33.34.35の表面にアルミニウム箔等の金属箔
を設置し、この金属箔に付着した固形状の分解生成物を
金属箔と共に廃棄すると、より作業が簡単になる。
Moreover, instead of this embodiment, as another embodiment, the cover 32
.. The work becomes easier if a metal foil such as aluminum foil is placed on the surface of 33, 34, 35, and the solid decomposition products adhering to this metal foil are disposed of together with the metal foil.

尚、本発明の薄膜形成装置は排気系を用いて容器内部を
排気しながらプラズマCVD法で薄膜を、形成する際、
その装置内の低温領域で、反応ガスの活性種が衝突して
微粉末が発生するような装置に通用可能である。
The thin film forming apparatus of the present invention uses an exhaust system to evacuate the inside of the container while forming a thin film by plasma CVD.
It can be applied to devices in which active species of reactive gases collide to generate fine powder in the low temperature region of the device.

〔発明の効果〕〔Effect of the invention〕

以上の説明より明らかなように、本発明の薄膜形成装置
によれば、排気系に反応生成物微粉末の侵入が防げるの
で、生成膜質に大きい影響を与える装置の圧力調整が容
易となる。また容器内が微粉末で汚染されることが無く
なるので、装置の清掃も容易となり装置の保守が簡単に
なる。また排気系が汚染されないので、排気装置の性能
劣化が無くムリ、装置の保守管理が容易となる。
As is clear from the above description, according to the thin film forming apparatus of the present invention, it is possible to prevent the reaction product fine powder from entering the exhaust system, and therefore it becomes easy to adjust the pressure of the apparatus, which has a large effect on the quality of the produced film. Furthermore, since the inside of the container is not contaminated with fine powder, cleaning of the device becomes easier and maintenance of the device becomes easier. Furthermore, since the exhaust system is not contaminated, there is no performance deterioration of the exhaust system, and maintenance of the system is facilitated.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の薄膜形成装置の要部を示す断面図、 第2図は従来の薄膜形成装置の模式図、第3図は従来の
装置に於ける不具合の状態を説明する説明図である。 図に於いて1は基体、2は容器、4は電極、9は排気口
、21は上部領域、22は底部領域、31.36はヒー
タ、32.33.g、34.35はカバー、37は膜状
生成物を示す。
Fig. 1 is a sectional view showing the main parts of the thin film forming apparatus of the present invention, Fig. 2 is a schematic diagram of a conventional thin film forming apparatus, and Fig. 3 is an explanatory diagram illustrating a malfunction in the conventional apparatus. be. In the figure, 1 is a base, 2 is a container, 4 is an electrode, 9 is an exhaust port, 21 is an upper region, 22 is a bottom region, 31.36 is a heater, 32.33. g, 34.35 is a cover, and 37 is a film-like product.

Claims (1)

【特許請求の範囲】 容器(2)内に基体(1)と該基体(1)に対向して電
極(4)を設け、該容器(2)内に反応ガスを導入して
基体(1)と電極(4)間に電圧を印加して前記反応ガ
スをプラズマ状となし、前記反応ガスを分解、活性化せ
しめて基体(1)上に堆積させる装置に於いて、 前記容器(2)内の少なくとも電極(4)と基体(1)
の対向空間を除いて加熱手段(31、36)を設置した
ことを特徴とする薄膜形成装置。
[Claims] A substrate (1) and an electrode (4) facing the substrate (1) are provided in a container (2), and a reactive gas is introduced into the container (2) to form a substrate (1). and an electrode (4) to turn the reaction gas into a plasma state, decompose and activate the reaction gas, and deposit it on the substrate (1), wherein: at least the electrode (4) and the substrate (1)
A thin film forming apparatus characterized in that a heating means (31, 36) is installed except for the space facing the.
JP12964885A 1985-06-13 1985-06-13 Thin film forming device Pending JPS61288077A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12964885A JPS61288077A (en) 1985-06-13 1985-06-13 Thin film forming device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12964885A JPS61288077A (en) 1985-06-13 1985-06-13 Thin film forming device

Publications (1)

Publication Number Publication Date
JPS61288077A true JPS61288077A (en) 1986-12-18

Family

ID=15014712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12964885A Pending JPS61288077A (en) 1985-06-13 1985-06-13 Thin film forming device

Country Status (1)

Country Link
JP (1) JPS61288077A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5326404A (en) * 1991-12-19 1994-07-05 Sony Corporation Plasma processing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5326404A (en) * 1991-12-19 1994-07-05 Sony Corporation Plasma processing apparatus

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