JPS61283453A - Inspection method for joining part of plate like joining member - Google Patents

Inspection method for joining part of plate like joining member

Info

Publication number
JPS61283453A
JPS61283453A JP12572885A JP12572885A JPS61283453A JP S61283453 A JPS61283453 A JP S61283453A JP 12572885 A JP12572885 A JP 12572885A JP 12572885 A JP12572885 A JP 12572885A JP S61283453 A JPS61283453 A JP S61283453A
Authority
JP
Japan
Prior art keywords
plate
joining
joint
target
thermal stress
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12572885A
Other languages
Japanese (ja)
Other versions
JPH068506B2 (en
Inventor
Terushi Mishima
昭史 三島
Takeshi Yoshida
武司 吉田
Masaki Morikawa
正樹 森川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Metal Corp
Original Assignee
Mitsubishi Metal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Metal Corp filed Critical Mitsubishi Metal Corp
Priority to JP60125728A priority Critical patent/JPH068506B2/en
Publication of JPS61283453A publication Critical patent/JPS61283453A/en
Publication of JPH068506B2 publication Critical patent/JPH068506B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PURPOSE:To enable to surely inspect the quality of the joining state by giving a thermal stress by heating the surface of one part side simultaneously with cooling the other part side for the soldered plate like joining member and by observing the joining state of a joining part. CONSTITUTION:The target for spattering consisting of a target member 1 and packing plate 2 is set by a bolt 4 to a water cooling jacket 3. The bottom face of the plate 2 is cooled with the circulation feeding of a cooling water to the water cooling jacket 3 and on the other hand a TIG welding torch 5 is arranged eccentrically on the upper part of the target member 1. A thermal stress is given by heating the surface of the target member 1 by generating an arc on the torch 5 and by its rotation. The separation state of the joining part is inspected by visual observation on the target for spattering of this consequence.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、ろう付けまたははんだ付け(以下単にはん
だ付けという〕された板状接合部材の接合部の接合状況
を検査子る方法に閣下るものである。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention is directed to a method for inspecting the joint status of a joint part of a plate-shaped joint member that has been brazed or soldered (hereinafter simply referred to as soldering). It is something.

〔従来の技術〕[Conventional technology]

一般に、例えば板状接合部材として、バッキングプレー
トにターゲット部材7a/はんだ付けしたものからなる
スパッタリング用ターゲットが知られている。
In general, a sputtering target made of a target member 7a/soldered to a backing plate is known as, for example, a plate-like bonding member.

通常、これらスパッタリング用ターゲットなどの板状接
合部材の接合部の接合状況は、X線透過法や超音波探傷
法により検査さnている。
Usually, the bonding condition of the bonded portion of plate-like bonding members such as these sputtering targets is inspected by X-ray transmission method or ultrasonic flaw detection method.

〔発明が解決しよ9と丁る問題点〕 しかし、前者のX線透過法では、撮影したフィルム上に
現わnるのは、接合部のはんだ材の厚さの変化や、ブロ
ーホールなどの欠陥の有無だけであって、はんだ付けの
程度については判定丁ることができないばかりでlぐ、
板状接合部材がスパツタリング用ターゲットであって、
こnを構成するターゲット部材が比重の大きい、例えば
W−Ti合金である場合や、板状接合部材のいずれか一
万、あるいは両方が厚肉の場合などには、X線が透過し
にくく、検査が困難あるいは不可能であるなどの問題点
がある。
[9 Problems to be Solved by the Invention] However, with the former X-ray transmission method, what appears on the photographed film are changes in the thickness of the solder material at the joint, blowholes, etc. It is impossible to judge the degree of soldering, only the presence or absence of defects.
The plate-shaped joining member is a sputtering target,
If the target member constituting this unit has a high specific gravity, for example, a W-Ti alloy, or if one or both of the plate-shaped joint members are thick, it is difficult for X-rays to pass through. There are problems such as testing being difficult or impossible.

また、後者の超音波探傷法では、板状接合部材が、例え
ばスパッタリング用ターゲットであって、そのターゲッ
ト部材が結晶粒径の非常に大きい純Alであるよりな場
合には、超音波の結晶粒界からの反射を無視下ることが
でキナいので、実質的に接合部の良否を正確に判定する
のが困難である。
In addition, in the latter ultrasonic flaw detection method, when the plate-like bonding member is, for example, a sputtering target and the target member is made of pure Al with a very large crystal grain size, the crystal grains of the ultrasonic Since it is difficult to ignore the reflection from the field, it is practically difficult to accurately judge whether the joint is good or bad.

さらに、上記のいずnの方法においても、板状接合部材
の使用中における接合不良の発生を予測することは不可
能である。
Furthermore, in any of the above methods, it is impossible to predict the occurrence of bonding defects during use of the plate-shaped bonding member.

一万、板状接合部材の接合部に接合不良があると、これ
が、例えば下部のバッキングプレートが使用中強制冷却
さnるスパッタリング用ターゲットである場合、スパッ
タ中の前記接合不良部の冷却は緩慢となり、この部分で
局部的に温度が上昇するようになるので、長時間の使用
VCすると、この部分のはんだ材が溶融して、ターゲッ
ト部材がバッキングプレートから脱落したり、あるいは
ターゲット部材の温度が異常に高温となることから、ス
パッタリング速度が過大となり、膜厚の制御が不能とな
るなどのトラブルの発生を避けることができない。
If there is a bonding defect in the joint of a plate-shaped bonding member, for example, if the lower backing plate is a sputtering target that is forcibly cooled during use, the cooling of the defective bond during sputtering will be slow. Therefore, if the VC is used for a long time, the solder material in this part may melt and the target member may fall off the backing plate, or the temperature of the target member may rise. Since the temperature is abnormally high, the sputtering speed becomes excessive, and troubles such as the inability to control the film thickness cannot be avoided.

〔問題点を解決するための手段〕[Means for solving problems]

そこで、本発明者等は、上述のような観点から、はんだ
付けされた板状接合部材の接合部の接合状況の良否を、
使用中の剥離発生の有無の予測も含めて、確実に検査す
ることができる方法を開発すべく研究を行なつ友結果、
はんだ付けされた板状接合部材に対して、その一方側部
材の表面を加熱すると同時に、同他方側部材の表面を冷
却することからなる熱応力を付与すると、前記板状接合
部材の接合部に接合不良がある場合、前記熱応力によっ
て前記接合不良部で剥離が生じ、この剥離は、(υ 接
合部外周の目視、 ■ 加熱側部材の浮上り量の測定、 (■ 熱応力付与中の加熱側部材の温度変化の測定、 以上(1)〜(3)のうちの少なくともいずれかの手段
によって確認することがでキ、シかもこの場合、板状接
合部材の寸法および形状、並びにこnを構成する部材の
材質に何ら影響されるものではなく、さらに、前記板状
接合部材が、例えばスパッタリング用ターゲットであれ
ば、上記の熱応力は前記スパッタリング用ターゲットの
使用条件に相当するものであるから、この熱応力の付加
によって接合部に剥離発生のないものは、使用中に接合
部に剥離の発生がないことを予測することができるなど
の知見を得たのである。
Therefore, from the above-mentioned viewpoint, the present inventors evaluated the quality of the joint of the joint of the soldered plate-like joint member.
As a result of our research to develop a method that can reliably inspect the occurrence of peeling during use, including the prediction of the occurrence of peeling,
When a thermal stress is applied to a soldered plate-shaped joining member by heating the surface of one side member and cooling the surface of the other side member at the same time, the joint part of the plate-shaped joining member If there is a defective bond, the thermal stress causes peeling at the defective bond, and this peeling can be detected by (υ visual inspection of the outer periphery of the joint, ■ measurement of the floating amount of the heating side member, (■ heating during application of thermal stress) Measuring the temperature change of the side member may be confirmed by at least one of the means (1) to (3) above.In this case, the dimensions and shape of the plate-shaped joint member, and It is not affected by the materials of the constituent members, and furthermore, if the plate-shaped bonding member is, for example, a sputtering target, the above thermal stress corresponds to the usage conditions of the sputtering target. We have obtained the knowledge that if there is no peeling at the joint due to the application of this thermal stress, it can be predicted that no peeling will occur at the joint during use.

この発明は、上記知見にもとづいてなされたものであっ
て、板状接合部材の接合部における接合状況の検査を、
はんだ付けさnた板状接合部材に対し′て、その一方側
部材の表面を加熱すると同時に、同他方側部材の表面を
冷却することからなる熱応力を付与し、この熱応力付与
中あるいは熱応力付与後の板状接合部材の接合部の接合
状況を観察することにより行なう点に特徴を有するもの
である。
This invention has been made based on the above findings, and includes inspection of the joint status at the joint portion of plate-shaped joint members.
A thermal stress is applied to the soldered plate-shaped joint member by heating the surface of one side member and simultaneously cooling the surface of the other side member. This method is characterized in that it is carried out by observing the bonding condition of the bonded portions of the plate-like bonded members after stress has been applied.

〔実施例〕〔Example〕

つぎに、この発明の方法を実施例により具体的に説明下
る。
Next, the method of the present invention will be specifically explained using examples.

実施例 l 板状接合部材として、直径:240mX厚さ:20n+
の寸法並びにAA!−1%Siの組成な有するターゲッ
ト部材を、直径:320mmX厚さ:15nの寸法を有
する無酸素銅製バッキングプレートに、Sn −3,5
%Agの組成を有する厚さ: 0.3 龍の箔状はんだ
を用い、真空中、温度:235℃に5分間保持の条件で
はんだ付けしてなるスパッタリング用ターゲット:20
個を用意した。
Example 1 As a plate-like joining member, diameter: 240m x thickness: 20n+
Dimensions and AA! A target member having a composition of -1% Si was placed on an oxygen-free copper backing plate having dimensions of diameter: 320 mm x thickness: 15 nm.
Thickness: 0.3 having a composition of %Ag Sputtering target made by soldering in a vacuum at a temperature of 235°C for 5 minutes using a dragon foil solder: 20
I prepared a piece.

ついで、第1図に概略説明図で示さnるように、上記の
ターゲット部材1とバッキングプレート2からなるスパ
ッタリング用ターゲットを、水冷ジャケット3にポルト
4によりセットし、この状態で前記水冷ジャケット3に
冷却水を循環供給して、前記バッキングプレート2の底
面を冷却し、−万前記ターゲット部材1の上方には、偏
心してTIG溶接トーチ5を配し、このトーチ5に、ア
ーク電流:100A、アーク電圧:30vの条件でアー
クを発生させ、これを200 crn / m1llの
速度で旋回させて、前記ターゲット部材1の表面を加熱
することからなる熱応力を5分間付与した。なお、図中
、6はTIG溶接電源である。
Next, as shown in the schematic diagram in FIG. Cooling water is circulated and supplied to cool the bottom surface of the backing plate 2. A TIG welding torch 5 is eccentrically arranged above the target member 1, and an arc current of 100 A is applied to the torch 5. An arc was generated at a voltage of 30 V, and the arc was rotated at a speed of 200 crn/ml to apply thermal stress by heating the surface of the target member 1 for 5 minutes. In addition, in the figure, 6 is a TIG welding power source.

この結果のスパッタリング用ターゲットについて、接合
部の剥離状況を目視により検査したところ、5個のもの
に剥離が見られた。さらに、剥離のないものと、これの
有\るものについて、はんだ接合面積を測定したところ
、剥離のないものは。
When the resulting sputtering targets were visually inspected for peeling of the joints, peeling was observed in five targets. Furthermore, we measured the solder joint area for those without peeling and those with peeling.

いずれも90%以上の接合面積を有するのに対して、剥
離のあったものは、いずnも20%以下の接合面積しか
もたないものであった。
All of them had a bonding area of 90% or more, whereas all of the samples with peeling had a bonding area of 20% or less.

実施例 2 同様に、板状接合部材として、ターゲット部材の厚さを
Lowとする以外に、実施例1におけると同一の条件で
、20個のスパッタリング用ターゲットを用意した。
Example 2 Similarly, 20 sputtering targets were prepared as plate-shaped bonding members under the same conditions as in Example 1 except that the thickness of the target member was set to Low.

ついで、これらのスパッタリング用ターゲットのそれぞ
れに対して、第1図に示さnる状態で、かつ実施例1に
おけると同一の条件で熱応力を付与し、熱応力付与後の
スパッタリング用ターゲットにおけるターゲット部材の
浮上り量を測定した。
Next, thermal stress was applied to each of these sputtering targets in the state shown in FIG. 1 and under the same conditions as in Example 1, and the target member in the sputtering target after applying the thermal stress was The amount of floating was measured.

なお、前記浮上り量は熱応力付与前後のスパッタリング
用ターゲットの高さの差をもって示した。
Note that the flying height is expressed as the difference in height of the sputtering target before and after applying thermal stress.

この結果、上記スパッタリング用ターゲット=20個中
、18個は、その浮上り量が0.05m以下であるのに
対して、残りの2個は浮上り量がいfnも0.1 tm
以上になるものであった。
As a result, 18 of the 20 sputtering targets have a flying height of 0.05 m or less, while the remaining 2 have a flying height of 0.1 tm or less.
It was more than that.

さらに、これらのはんだ接合面積を測定し九ところ、前
者の浮上p量の少ないもの鉱、いずれも90%以上の接
合面積をもつのに対して、後者の浮上り量の多いものは
、20%以下の接合面積しか示さないものであり、実施
例1における場合ともども、はんだ付けの良否を確実に
検査できることが明らかである。
Furthermore, we measured the joint area of these solders and found that the former solder with a small floating amount had a joint area of over 90%, while the latter with a large floating amount had a joint area of 20%. Only the following bonding area is shown, and it is clear that the quality of soldering can be reliably inspected as in the case of Example 1.

実施例 3 板状接合部材として、直径:240mX厚さ:5」の寸
法並びにW−10%Tiの組成を有するターゲット部材
を、直径: 320 HX厚さ:15nの寸法を有する
無酸素銅製バッキングプレートに、にんだ材として厚さ
:0.3mを有する箔状Inを用い、真空中、温度:1
70°Cに5分間保持の条件ではんだ付けしてなるスパ
ッタリング用ターゲット:20個を用意した。
Example 3 As a plate-like bonding member, a target member having dimensions of diameter: 240 m x thickness: 5'' and a composition of W-10% Ti was used as an oxygen-free copper backing plate having dimensions of diameter: 320 m x thickness: 15 nm. In this process, In foil having a thickness of 0.3 m was used as the solder material, and the temperature was 1 in a vacuum.
Twenty sputtering targets were prepared by soldering at 70°C for 5 minutes.

ついで、こ扛らのスパッタリング用ターゲットのそnぞ
nに対して、第1図に示される状態で、かつ実施例1に
おけると同一の条件で熱応力を付与し、さらにこの熱応
力の付与中、上記ターゲット部材の上面における外周縁
近辺の等間隔3個所の熱変化を熱電対とペンレコーダを
用いて測定記録した。
Next, thermal stress was applied to each of these sputtering targets in the state shown in FIG. 1 and under the same conditions as in Example 1, and during the application of this thermal stress. Thermal changes at three equally spaced locations near the outer periphery of the upper surface of the target member were measured and recorded using a thermocouple and a pen recorder.

この結果、上記のスパッタリング用ターゲット:20個
のうち、17個のものは第2図に示されるパターンの熱
変化を示し、残りの3個は第3図に示さnるパターンの
熱変化を示した。
As a result, out of the 20 sputtering targets mentioned above, 17 showed the thermal change in the pattern shown in Figure 2, and the remaining 3 showed the thermal change in the pattern shown in Figure 3. Ta.

ま之、これらのスパッタリング用ターゲットに 7つい
て、はんだ接合面積を測定したところ、第2図の熱変化
曲線な示すものは、90%以上の接合面積をもつのに対
して、第3図の熱変化曲線な示すものは20%以下の接
合面積しかもたないものであり、これらの結果から、前
者の接合面積の高いスパッタリング用ターゲットにおい
ては、その接合部に剥離の発生がないので、熱応力付加
中、ターゲット部材の表面温度がほぼ一定に保持される
ものであり、−万、後者の接合面積の低いスパッタリン
グ用ターゲットにおいては、その接合部に剥離が発生し
、この、tめターゲット部材の表面温度が時間の経過と
共に、漸次上昇するようになることがわかる。
However, when we measured the solder joint area of 7 of these sputtering targets, we found that the thermal change curve in Figure 2 had a joint area of over 90%, whereas the thermal change curve in Figure 3 had a joint area of over 90%. The change curve shows that the joint area is less than 20%, and from these results, it can be seen that in the former sputtering target with a high joint area, there is no peeling at the joint, so it is difficult to apply thermal stress. In the second case, the surface temperature of the target member is kept almost constant, and in the second case, in sputtering targets with a small bonding area, peeling occurs at the bonding part, and the surface temperature of the target member is It can be seen that the temperature gradually increases over time.

〔総括的効果〕[Overall effect]

上述のように、この発明の方法によれば、にんだ付けさ
れた板状接合部材の寸法および形状、さらにこれを構成
する部材の材質に何ら影響されることなく、その接合部
の接合状況の良否を、使用中の剥離発生の有無の予測も
合せて、確実に検査することができるのである。
As described above, according to the method of the present invention, the welding condition of the welded portion can be controlled without being influenced in any way by the dimensions and shape of the soldered plate-like joining member, or the materials of the members constituting it. It is possible to reliably inspect the quality of the product, including predicting whether or not peeling will occur during use.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の方法の実施例における熱応力付加態
様を示す概略説明図、第2図および第3図はこの発明の
方法の実施例におけるターゲット部材の表面温度の熱変
化曲線な示す図である。 1・・・、ターゲット部材、2・・・バッキングプレー
ト、3・・・水冷ジャケット、4・・・ボルト、5・・
・TIG溶接トーチ、6・・・TIG溶接電源。
FIG. 1 is a schematic explanatory diagram showing a thermal stress application mode in an embodiment of the method of this invention, and FIGS. 2 and 3 are diagrams showing thermal change curves of the surface temperature of a target member in an embodiment of the method of this invention. It is. DESCRIPTION OF SYMBOLS 1... Target member, 2... Backing plate, 3... Water cooling jacket, 4... Bolt, 5...
・TIG welding torch, 6...TIG welding power source.

Claims (2)

【特許請求の範囲】[Claims] (1)ろう付けまたははんだ付けされた板状接合部材に
対して、その一方側部材の表面を加熱すると同時に、同
他方側部材の表面を冷却することからなる熱応力を付与
し、前記熱応力付与中あるいは熱応力付与後の板状接合
部材の接合状況を観察することを特徴とするろう付けま
たははんだ付けされた板状接合部材の接合部の検査方法
(1) Applying thermal stress to a brazed or soldered plate-shaped joint member by heating the surface of one side member and simultaneously cooling the surface of the other side member, and A method for inspecting a joint of a plate-shaped joint member that is brazed or soldered, the method comprising observing the joint status of the plate-shaped joint member during or after applying thermal stress.
(2)上記板状接合部材が、その一方側部材がターゲッ
ト部材で構成され、同他方側部材がバッキングプレート
で構成されたスパッタリング用ターゲットであることを
特徴とする上記特許請求の範囲第(1)項記載のろう付
けまたははんだ付けされた板状接合部材の接合部の検査
方法。
(2) The plate-shaped joining member is a sputtering target in which one side member is a target member and the other side member is a backing plate. ) Method for inspecting joints of plate-like joint members that are brazed or soldered.
JP60125728A 1985-06-10 1985-06-10 Method for manufacturing sputtering target having high bonding area Expired - Lifetime JPH068506B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60125728A JPH068506B2 (en) 1985-06-10 1985-06-10 Method for manufacturing sputtering target having high bonding area

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60125728A JPH068506B2 (en) 1985-06-10 1985-06-10 Method for manufacturing sputtering target having high bonding area

Publications (2)

Publication Number Publication Date
JPS61283453A true JPS61283453A (en) 1986-12-13
JPH068506B2 JPH068506B2 (en) 1994-02-02

Family

ID=14917308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60125728A Expired - Lifetime JPH068506B2 (en) 1985-06-10 1985-06-10 Method for manufacturing sputtering target having high bonding area

Country Status (1)

Country Link
JP (1) JPH068506B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007273875A (en) * 2006-03-31 2007-10-18 Espec Corp Bonding defect detector and bonding defect detection method
CN110280865A (en) * 2019-06-19 2019-09-27 南京卡德威焊切器材有限公司 Plasma electrode hafnium filament brazing equipment and its method for welding

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5499687U (en) * 1978-08-09 1979-07-13
JPS5568045U (en) * 1978-11-01 1980-05-10

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5499687U (en) * 1978-08-09 1979-07-13
JPS5568045U (en) * 1978-11-01 1980-05-10

Cited By (4)

* Cited by examiner, † Cited by third party
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JP2007273875A (en) * 2006-03-31 2007-10-18 Espec Corp Bonding defect detector and bonding defect detection method
JP4676370B2 (en) * 2006-03-31 2011-04-27 エスペック株式会社 Bonding failure detection device and bonding failure detection method
CN110280865A (en) * 2019-06-19 2019-09-27 南京卡德威焊切器材有限公司 Plasma electrode hafnium filament brazing equipment and its method for welding
CN110280865B (en) * 2019-06-19 2023-07-25 南京卡德威焊切器材有限公司 Plasma electrode hafnium wire brazing equipment and brazing method thereof

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