JPS61274204A - Method for detecting magnetic disk surface roughness - Google Patents
Method for detecting magnetic disk surface roughnessInfo
- Publication number
- JPS61274204A JPS61274204A JP11581385A JP11581385A JPS61274204A JP S61274204 A JPS61274204 A JP S61274204A JP 11581385 A JP11581385 A JP 11581385A JP 11581385 A JP11581385 A JP 11581385A JP S61274204 A JPS61274204 A JP S61274204A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- magnetic disk
- track
- magnetic
- characteristic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
Description
【発明の詳細な説明】
【概要〕
磁気ディスクの検査の一環として行われる磁気ディスク
表面粗さ検査方法であって、トラック毎の読取り出力の
変化特性によって表面粗さの可否を決定することにより
、非破壊検査を可能とし且つ検査能率を向上した。[Detailed Description of the Invention] [Summary] A method for inspecting the surface roughness of a magnetic disk, which is carried out as part of the inspection of a magnetic disk. This enables non-destructive testing and improves testing efficiency.
本発明は磁気ディスク表面粗さ検査方法に関するもので
ある。The present invention relates to a magnetic disk surface roughness inspection method.
磁気ディスクは、たとえば軽合金円板上にスピンコーテ
ィング等の方法によって磁性酸化鉄粉等の磁気記録膜を
形成したものである。A magnetic disk is, for example, a light alloy disk on which a magnetic recording film of magnetic iron oxide powder or the like is formed by a method such as spin coating.
軽合金円板は1通常、精密研削によって仕上げられ、洗
浄したあと磁性記録膜を約1ミクロンの厚みに塗布しラ
フピングによって仕上げている。Light alloy discs are usually finished by precision grinding, and after cleaning, a magnetic recording film is coated to a thickness of about 1 micron and finished by roughing.
しかし精密研削された軽合金円板表面には、非常に微細
な同心円状の研削条痕が残るものであり。However, on the surface of a precision-ground light alloy disc, very fine concentric grinding marks remain.
その凹凸が許容値以下であっても、これに磁性記録膜を
塗布すると、凹凸が増大しラッピング仕上げを施したあ
とに許容値以上の凹凸が同心円状に残ることがある。Even if the unevenness is less than the allowable value, when a magnetic recording film is applied thereto, the unevenness increases, and even after finishing the lapping, the unevenness exceeding the allowable value may remain in the form of concentric circles.
したがって、磁気ディスク装置への組込みに先立って表
面粗さの検査を行っているが、この検査が確実かつ効率
的に行われることが望ましい。Therefore, the surface roughness is inspected prior to incorporation into a magnetic disk drive, and it is desirable that this inspection be performed reliably and efficiently.
磁気ディスクの表面粗さの検査には、従来、触針式試験
機による方法が採用されていた。Conventionally, a method using a stylus tester has been used to test the surface roughness of magnetic disks.
上記従来例は、 #yL敏な触針によって磁気ディスク
面をトレースするものであり、検査には長時間を要し非
能率であるばかりでなく、触針によって磁性膜の表面に
傷をつけるため破壊検査ににならざるを得ない。In the above conventional example, the surface of the magnetic disk is traced using a sensitive stylus, which not only takes a long time and is inefficient, but also damages the surface of the magnetic film with the stylus. Destructive inspection will have to be done.
したがって、全数検査ができないという問題点があり1
本発明の目的は検査能率を上げるとともに、全数検査の
可能な磁気ディスク表面粗さ検査方法を提案することに
ある。Therefore, there is a problem that 100% inspection is not possible.
An object of the present invention is to propose a method for inspecting the surface roughness of a magnetic disk, which not only increases inspection efficiency but also enables 100% inspection.
第1図は本発明の原理図であり。 FIG. 1 is a diagram showing the principle of the present invention.
1は磁気ディスクの全トラックに一定周期の磁化反転信
号の書込みを行う書込み工程。1 is a writing process in which a magnetization reversal signal of a constant period is written to all tracks of a magnetic disk.
2は書込み工程1によって磁化反転信号を書込まれた磁
気ディスクのトラック毎の平均読取り出力を測定する測
定工程。2 is a measuring step for measuring the average read output for each track of the magnetic disk to which the magnetization reversal signal has been written in writing step 1;
3はトラック毎の平均読取り出力の磁気ディスク半径方
向の変化特性を生成する変化特性生成工程。3 is a change characteristic generation step for generating a change characteristic of the average read output for each track in the magnetic disk radial direction.
4は、変化特性生成工程3によって生成された変化特性
を平滑化することによって、基準特性を生成する平滑化
工程。4 is a smoothing step for generating a reference characteristic by smoothing the change characteristic generated in the change characteristic generation step 3;
5は、前記変化特性を予め設定された許容限界と照合す
ることによって、磁気ディスクの表面粗さの良否を判定
する良否判定工程である。5 is a quality determination step in which the quality of the surface roughness of the magnetic disk is determined by comparing the change characteristics with a preset allowable limit.
本発明は、前述のように磁気ディスクの凹凸が同心円状
に生じやすいことに着目し、トランク毎の平均読取り出
力の変化によって凹凸を検出するようにしたものである
。The present invention focuses on the fact that, as described above, the unevenness of a magnetic disk tends to occur concentrically, and detects the unevenness based on the change in the average read output for each trunk.
第2図は測定工程2によって得られた平均読取り出力の
変化特性の例を示す図であり、縦軸は読取り出力(mV
pρ)、横軸は磁気ディスクの半径(mm)である。FIG. 2 is a diagram showing an example of the change characteristics of the average readout output obtained in measurement step 2, and the vertical axis is the readout output (mV
pρ), and the horizontal axis is the radius (mm) of the magnetic disk.
図示例では■・■・■のような特異点が見られるが、従
来例の方法によって測定した結果、これらの部分には半
径方向に0.2〜0.3 ミクロンの凹凸が確認されて
いる。In the illustrated example, singular points such as ■, ■, and ■ can be seen, but as a result of measurement using the conventional method, irregularities of 0.2 to 0.3 microns in the radial direction were confirmed in these parts. .
第3図は実施例の構成図である。 FIG. 3 is a configuration diagram of the embodiment.
7は、を込み工程1において利用する書込み回路であり
1切替え回路8と磁気へラド9とを介し。Reference numeral 7 denotes a write circuit used in the write process 1, and the write circuit 7 is used to write data through a switching circuit 8 and a magnetic heald 9.
磁気ディスク10の全トランクに対し1メガヘルツの磁
化反転信号の書込みを行う。A 1 MHz magnetization reversal signal is written to all trunks of the magnetic disk 10.
11は、測定工程2において利用する読取り回路であり
、磁気ディスク10を毎分3600回転で回転するとと
もに、磁気ヘッド位置決め制御のための制御回路12と
ステンピングモータ13とによって磁気へラド9をトラ
ック毎にステップ状に駆動し、磁気ヘッド9と取切替え
回路8とを介し、トラ、り毎の平均読取り出力を測定す
る。Reference numeral 11 denotes a reading circuit used in the measurement step 2, which rotates the magnetic disk 10 at 3,600 revolutions per minute, and tracks the magnetic helad 9 by a control circuit 12 for magnetic head positioning control and a stamping motor 13. The magnetic head 9 and switching circuit 8 measure the average readout output for each reading.
14は、変化特性生成工程3において利用する第一の記
憶部であり、読取り回路11によって得られたトラック
毎の平均読取り出力の磁気ディスク半径方向の変化特性
を格納する。Reference numeral 14 denotes a first storage section used in the change characteristics generation step 3, which stores the change characteristics of the average read output for each track obtained by the reading circuit 11 in the magnetic disk radial direction.
15は、平滑化工程4において利用する平滑化回路であ
り、その出力は基準特性として第二の記憶部16に格納
される。15 is a smoothing circuit used in the smoothing step 4, and its output is stored in the second storage section 16 as a reference characteristic.
17は、第二の記憶部16に格納した基準特性を基準と
して、予め設定した許容限界に対応する電圧を加算する
ことによって上限基準特性を設定し。17 sets an upper limit reference characteristic by adding a voltage corresponding to a preset allowable limit using the reference characteristic stored in the second storage unit 16 as a reference.
また−律に減算することによって下限基準特性を設定し
、設定された上限下限基準特性は第二の記憶部16に格
納される。Further, a lower limit reference characteristic is set by regular subtraction, and the set upper and lower limit reference characteristics are stored in the second storage unit 16.
18は、良否判定工程において利用する照合回路であり
、第一の記憶部14に格納する変化特性を第二の記憶部
16に格納する上限下限基準特性と比較することによっ
て、磁気ディスクの表面粗さの良否の判定を行う。Reference numeral 18 denotes a verification circuit used in the pass/fail judgment process, which compares the change characteristics stored in the first storage section 14 with the upper and lower limit reference characteristics stored in the second storage section 16 to determine the surface roughness of the magnetic disk. Determine whether the quality is good or bad.
すなわち、第4図に示すように、変化特性生成工程3に
よって変化特性Aが生成され、平滑化工程4によって基
準特性Bが得られ、基準特性Bから許容限界の上限Cお
よび下限りが得られる。That is, as shown in FIG. 4, the variation characteristic A is generated in the variation characteristic generation step 3, the reference characteristic B is obtained in the smoothing step 4, and the upper limit C and lower limit of the allowable limit are obtained from the reference characteristic B. .
ついで、良否判定工程5によって変化特性Aが許容限界
の上限Cおよび下限りと照合され、変化特性Aが上限C
または下限りを超える部分(ハンチング部分)が検出さ
れ、その有無によって磁気ディスク10の凹凸の可否を
決定する。Then, in the pass/fail judgment step 5, the variation characteristic A is compared with the upper limit C and the lower limit of the allowable limit, and the variation characteristic A is compared with the upper limit C and the lower limit of the allowable limit.
Alternatively, a portion exceeding the lower limit (hunting portion) is detected, and whether or not the magnetic disk 10 is uneven is determined based on its presence or absence.
なお第3図の構成において、書込み回路7・切替え回路
8・磁気ヘッド9・読取り回路11・制御回路12・ス
テッピングモータ13等は、いずれも磁気ディスク装置
の構成要素をそのまま用いることができる。In the configuration shown in FIG. 3, the write circuit 7, switching circuit 8, magnetic head 9, read circuit 11, control circuit 12, stepping motor 13, etc. can all be the same components of the magnetic disk device as they are.
以上説明したように2本発明によれば、破壊検査になら
ないので全数検査が可能であり、従来例に比し短時間で
検査を行うことができる。As explained above, according to the second aspect of the present invention, since a destructive test is not required, a 100% test is possible, and the test can be performed in a shorter time than in the conventional example.
第1図は本発明の原理図。 第2図は作用の説明図。 第3図は実施例の構成図。 第4図は実施例の説明図である。 図中。 1は書込み工程、 2は測定工程。 3は変化特性生成工程、4は平滑化工程。 5は良否判定工程、 7は書込み回路。 9は磁気ヘッド、 10は磁気ディスク。 11は読取り回路、15は平滑化回路。 FIG. 1 is a diagram showing the principle of the present invention. FIG. 2 is an explanatory diagram of the action. FIG. 3 is a configuration diagram of the embodiment. FIG. 4 is an explanatory diagram of the embodiment. In the figure. 1 is the writing process, 2 is the measurement process. 3 is a change characteristic generation process, and 4 is a smoothing process. 5 is a pass/fail judgment process, and 7 is a write circuit. 9 is a magnetic head, 10 is a magnetic disk. 11 is a reading circuit, and 15 is a smoothing circuit.
Claims (1)
書込み(1)、 前記磁化反転信号を書込まれた磁気ディスクのトラック
毎の平均読取り出力を測定(2)し、前記トラック毎の
平均読取り出力の磁気ディスク半径方向の変化特性を生
成(3)し、 前記生成された変化特性を平滑化(4)して基準特性を
生成し、 前記変化特性を予め設定された許容限界と照合すること
によって磁気ディスクの表面粗さの良否を決定する(5
)ことを特徴とする磁気ディスク表面粗さ検査方法。[Claims] Write a magnetization reversal signal of a constant period on all tracks of a magnetic disk (1), measure the average read output for each track of the magnetic disk to which the magnetization reversal signal is written (2), Generating (3) a variation characteristic of the average read output for each track in the magnetic disk radial direction, smoothing (4) the generated variation characteristic to generate a reference characteristic, and subjecting the variation characteristic to a preset tolerance. Determine the quality of the surface roughness of the magnetic disk by comparing it with the limit (5
) A magnetic disk surface roughness inspection method characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11581385A JPS61274204A (en) | 1985-05-29 | 1985-05-29 | Method for detecting magnetic disk surface roughness |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11581385A JPS61274204A (en) | 1985-05-29 | 1985-05-29 | Method for detecting magnetic disk surface roughness |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61274204A true JPS61274204A (en) | 1986-12-04 |
Family
ID=14671733
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11581385A Pending JPS61274204A (en) | 1985-05-29 | 1985-05-29 | Method for detecting magnetic disk surface roughness |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61274204A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54145566A (en) * | 1978-05-04 | 1979-11-13 | Matsushita Electric Ind Co Ltd | Surface roughness measuring method using magnetic recording method |
-
1985
- 1985-05-29 JP JP11581385A patent/JPS61274204A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54145566A (en) * | 1978-05-04 | 1979-11-13 | Matsushita Electric Ind Co Ltd | Surface roughness measuring method using magnetic recording method |
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