JPS61272368A - Thin film forming device - Google Patents
Thin film forming deviceInfo
- Publication number
- JPS61272368A JPS61272368A JP11464185A JP11464185A JPS61272368A JP S61272368 A JPS61272368 A JP S61272368A JP 11464185 A JP11464185 A JP 11464185A JP 11464185 A JP11464185 A JP 11464185A JP S61272368 A JPS61272368 A JP S61272368A
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- thin film
- filament
- film forming
- vapor deposition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、るつは内の蒸着物質を基板上に水着させて
薄膜を形成する薄膜形成装置、特にるつぼ内を電子ボン
バードにより加熱昇圧するフィラメントの巻回構造の改
良に関するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a thin film forming apparatus that forms a thin film by depositing a vapor deposited substance in a crucible onto a substrate, and in particular, a thin film forming apparatus that heats and pressurizes the inside of the crucible by electron bombardment. This invention relates to improvements in the winding structure of filaments.
第3図及び第4図は、例えば特開昭54−9542号公
報に示されたものを基にした従来の#膜形成装置を示す
断面図であり、図において、(1)は真空槽、(2)ハ
先端にノズル(2a)e有する物質蒸気発生用るつぼ、
(8νは蒸着物質、(4)は蒸着物質(8)を加熱する
九めにるつぼ(2)の外周部に巻回配置された電子ボン
バード°用フィラメント、(5)は熱シールド板、(6
)はイオン化部、(7)は加速電極、(8)は物質蒸気
のクラスターイオンビーム、(9)は薄膜を被着すべき
基板である。3 and 4 are cross-sectional views showing a conventional # film forming apparatus based on, for example, the one disclosed in Japanese Patent Application Laid-Open No. 54-9542. In the figures, (1) is a vacuum chamber; (2) A crucible for generating substance vapor having a nozzle (2a)e at the tip;
(8ν is the vapor deposition material, (4) is the electron bombardment filament wound around the outer periphery of the ninth crucible (2) that heats the vapor deposition material (8), (5) is the heat shield plate, (6
) is an ionization part, (7) is an accelerating electrode, (8) is a cluster ion beam of material vapor, and (9) is a substrate to which a thin film is to be deposited.
従来の薄膜形成装置は上記のように構成さh1真空槽(
1)内の高真空領域で、蒸着物質(3)を入れたるつぼ
(2) t−、電子ボンバード用フィラメント(4)か
らの電子ボンバードにより加熱する。加熱を効率的に行
なうために、るつぼ(2)及び電子ボンバード用フィラ
メント(4)の周囲に熱シールド板(5)を設けている
。るつぼ(2)内の蒸着物質(8)の蒸気圧が数TOR
,程度になると、蒸着物質(8)は、るつぼ(2)先端
に設けられたノズル(2a)から高真空領域へ噴出し、
このとき断熱膨張による過冷却状態に工って、クラスタ
ービーム(8)が発生する0これを、イオン化部(6)
で電子照射によりイオン化してクラスターイオンビーム
(8)とし、さらに、加速電極(γ)により加速して、
基板(9)に射突させ、基板(9)上に蒸着物質(8)
の薄膜を形成させる。A conventional thin film forming apparatus is configured as described above, and has an h1 vacuum chamber (
In a high vacuum region in 1), a crucible (2) t- containing the vapor deposition substance (3) is heated by electron bombardment from an electron bombardment filament (4). In order to perform heating efficiently, a heat shield plate (5) is provided around the crucible (2) and the electronic bombardment filament (4). The vapor pressure of the vapor deposition substance (8) in the crucible (2) is several TOR
, the vapor deposition substance (8) is ejected from the nozzle (2a) provided at the tip of the crucible (2) into a high vacuum area,
At this time, a supercooled state is created due to adiabatic expansion, and a cluster beam (8) is generated.
is ionized by electron irradiation to form a cluster ion beam (8), further accelerated by an accelerating electrode (γ),
The substrate (9) is bombarded with a vapor deposited substance (8) on the substrate (9).
Form a thin film.
上記のような従来の薄膜形成装置においては、るつぼ(
2)の上部には、クラスターイオンビーム(8)を通過
させる必要があることから熱シールド板(5)を設置す
ることができず、ためにるつぼ(2)内の蒸着物質(8
)の量が少なくなると、るつぼ(2)上部が冷えてるつ
ぼ(2)内の温度分布にバラ付きが生じ、安定した蒸着
運転が難しくなるという問題があった。In the conventional thin film forming apparatus as described above, a crucible (
A heat shield plate (5) cannot be installed above the crucible (2) because the cluster ion beam (8) needs to pass therethrough.
) decreases, there is a problem in that the temperature distribution inside the crucible (2), which is cold at the top, becomes uneven, making stable vapor deposition operation difficult.
この発明はかかる問題点を解決する友めになされたもの
で、るつぼ内の蒸着物質の量が少なくなってもるつぼ内
の温度分布にパラ付きが生じることがなく、安定な蒸着
運転を確保することができる薄膜形成装置を得ることを
目的とする。This invention was made to solve this problem, and even if the amount of vapor deposition material in the crucible decreases, the temperature distribution in the crucible does not fluctuate, thereby ensuring stable vapor deposition operation. The purpose of the present invention is to obtain a thin film forming apparatus that can perform the following steps.
この発明に係る薄膜形成装置は、電子ボンバードにより
るつぼ内を加熱昇圧するためにるつぼの外周部に巻回配
置したフィラメントの巻回状態をるつぼ先端のノズル側
で密とするようにしたものである。In the thin film forming apparatus according to the present invention, the filament is wound around the outer periphery of the crucible in order to heat and pressurize the inside of the crucible by electron bombardment, and the filament is wound tightly on the nozzle side at the tip of the crucible. .
この発明においては、フィラメントの巻回状態が、るつ
ぼ先端のノズル側で密となっているので、るつぼ内の蒸
着物質の量が少なくなってもるつぼ内に温度勾配が生じ
難く、したがって安定な蒸着運転が可能となる。In this invention, since the filament is wound tightly on the nozzle side at the tip of the crucible, it is difficult for a temperature gradient to occur in the crucible even if the amount of vapor deposition material in the crucible is small, and therefore stable vapor deposition is achieved. Driving becomes possible.
第1図及び第2図はこの発明の一実施例を示すもので、
図中、第3図及び第4図と同一符号は同−又は相当部分
を示す。この実施例では、電子ボンバードによりるつぼ
(2)内を加熱昇圧するためにるつぼ(2)の外周部に
巻回配置したフィラメント(4)の巻回状態が、ノズル
(2a)側で密、下端側で粗となっており、粗密の程度
は、蒸着物質(8)の種類、量に応じて最適となるよう
に適宜設定される。そ □してこれにより、るつ
ぼ(2)内の蒸着物質(8)の量が少なくなってもるつ
ぼ(2)内に温度勾配が生じ難くなり、安定した蒸着運
転が可能となる。FIG. 1 and FIG. 2 show an embodiment of this invention.
In the figure, the same reference numerals as in FIGS. 3 and 4 indicate the same or corresponding parts. In this embodiment, the filament (4) is wound around the outer periphery of the crucible (2) in order to heat and pressurize the inside of the crucible (2) by electron bombardment. It is coarser on the side, and the degree of coarseness is appropriately set to be optimal depending on the type and amount of the vapor deposition substance (8). □As a result, even if the amount of the vapor deposition substance (8) in the crucible (2) is reduced, a temperature gradient is less likely to occur in the crucible (2), and stable vapor deposition operation is possible.
この発明は以上説明したとおり、るつぼ加熱昇圧用のフ
ィラメントの巻回状態を、るつぼ先端のノズル側で密と
するようにしているので、蒸着物質が少なくなった場合
にもるつぼ内に温度勾配が生じ難くなり、安定した蒸着
運転が可能となる等の効果がある。As explained above, in this invention, the filament for heating and pressurizing the crucible is wound tightly on the nozzle side at the tip of the crucible, so even when the amount of deposited material decreases, there is no temperature gradient inside the crucible. This has the effect of making stable vapor deposition operation possible.
第1図はこの発明の一実施例を示す断面図、第2図は第
1図の要部拡大斜視図、第3図は従来の薄膜形成装置を
示す第1図相当図、第4図は第3図の要部を示す第2図
相当図である。
(2)・・るつぼ (2a)・・ノズル(8)・
e蒸着物質 (4)・・フィラメント(9)拳・基
板
なお、各図中、同一符号は同−又は相当部分を示すもの
とする。FIG. 1 is a sectional view showing an embodiment of the present invention, FIG. 2 is an enlarged perspective view of the main part of FIG. 1, FIG. 3 is a view equivalent to FIG. 1 showing a conventional thin film forming apparatus, and FIG. FIG. 2 is a diagram corresponding to FIG. 2 showing the main part of FIG. 3; (2)... Crucible (2a)... Nozzle (8)...
e Evaporated substance (4)...Filament (9) Fist/Substrate Note that in each figure, the same reference numerals indicate the same or corresponding parts.
Claims (1)
ボンバードによりるつぼ内を加熱昇圧し、るつぼ内に配
した蒸着物質の蒸気を、るつぼ先端のノズルから高真空
領域内に噴射して基板上に蒸着させるものにおいて、上
記フィラメントの巻回状態を、上記ノズル側で密とした
ことを特徴とする薄膜形成装置。The inside of the crucible is heated and pressurized by electron bombardment from a filament wound around the outer periphery of the crucible, and the vapor of the deposition material placed inside the crucible is injected into a high vacuum area from a nozzle at the tip of the crucible to deposit it on the substrate. A thin film forming apparatus characterized in that the filament is wound tightly on the nozzle side.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11464185A JPS61272368A (en) | 1985-05-28 | 1985-05-28 | Thin film forming device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11464185A JPS61272368A (en) | 1985-05-28 | 1985-05-28 | Thin film forming device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61272368A true JPS61272368A (en) | 1986-12-02 |
Family
ID=14642886
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11464185A Pending JPS61272368A (en) | 1985-05-28 | 1985-05-28 | Thin film forming device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61272368A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006075755A1 (en) * | 2005-01-17 | 2006-07-20 | Youtec Co., Ltd. | Evaporation source and vapor deposition apparatus |
US7402779B2 (en) * | 2004-07-13 | 2008-07-22 | Lucent Technologies Inc. | Effusion cell and method for use in molecular beam deposition |
CN103726022A (en) * | 2013-11-22 | 2014-04-16 | 上海和辉光电有限公司 | Heating evaporation source for organic materials |
-
1985
- 1985-05-28 JP JP11464185A patent/JPS61272368A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7402779B2 (en) * | 2004-07-13 | 2008-07-22 | Lucent Technologies Inc. | Effusion cell and method for use in molecular beam deposition |
WO2006075755A1 (en) * | 2005-01-17 | 2006-07-20 | Youtec Co., Ltd. | Evaporation source and vapor deposition apparatus |
JPWO2006075755A1 (en) * | 2005-01-17 | 2008-06-12 | 株式会社ユーテック | Evaporation source and vapor deposition equipment |
CN103726022A (en) * | 2013-11-22 | 2014-04-16 | 上海和辉光电有限公司 | Heating evaporation source for organic materials |
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