JPS61270815A - Thin film formation equipment - Google Patents

Thin film formation equipment

Info

Publication number
JPS61270815A
JPS61270815A JP11285685A JP11285685A JPS61270815A JP S61270815 A JPS61270815 A JP S61270815A JP 11285685 A JP11285685 A JP 11285685A JP 11285685 A JP11285685 A JP 11285685A JP S61270815 A JPS61270815 A JP S61270815A
Authority
JP
Japan
Prior art keywords
vapor
crucible
filament
ionized
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11285685A
Other languages
Japanese (ja)
Inventor
Shigeru Yamaji
茂 山地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP11285685A priority Critical patent/JPS61270815A/en
Publication of JPS61270815A publication Critical patent/JPS61270815A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/02631Physical deposition at reduced pressure, e.g. MBE, sputtering, evaporation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To form a uniform film on all the surface of a substrate ionizing metal vapor which passes near the side wall of a funnel and improving the efficiency of evaporation by providing the second ionizing filament inside the funnel at the top of a crucible. CONSTITUTION:An evaporation material 2 housed in a crucible 1 in the vacuum container 18 of a thin film formation equipment is heated by a bombardment filament 5 and the generated vapor of the material 2 is ejected from an exhaust port 3. The generated vapor is ionized by the first ionizing filament 9. The second ionizing filament 20 is also provided inside the funnel at the top of the exhaust port 3 of the crucible 1 and the vapor passing near the side wall of the funnel is ionized. The metal vapor in the orbit 4 of the ionized metal vapor and the metal vapor in the orbit 4a of not ionized metal vapor are projected on a substrate 15 and an evaporation film 16 is formed. The efficiency of evaporation is also improved and the uniform evaporation film 16 is formed on the substrate 15.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は金属蒸気を基板に蒸着させる薄膜形成装置の
蒸気噴出装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a vapor ejecting device for a thin film forming apparatus for depositing metal vapor onto a substrate.

〔従来の技術〕[Conventional technology]

第2図は従来の薄膜形成装置を示す断面図であり、図に
おいて、(1)はるつぼ、(2)は該るつAの蒸着物質
、(3)は上記るつぼ(1)に設けた噴出孔、(4)は
イオン化された金属蒸気の軌道、(4a)はイオン化さ
れない金属蒸気の軌道、(5)は上記るつぼ(1)加熱
用ボンバードフィラメント、(6)は、該フィラメント
(5)加熱用電源、(7)はボンバード電源%(8)は
グリッド、(9)は金属蒸気をイオン化するための電子
を放出する第1のイオン化フィラメント、αQは該イオ
ン化フィラメント(9)加熱用電源、(ロ)はイオン化
電源、(ロ)はイオン加速電極、(至)は上記グリッド
(8)の支持板、α4はイオン加速用電源、(至)は基
板、αQは蒸着膜、αηは熱シールド板、−明は真空容
器、α9は上記イオン厘速電極(2)、上記グリッド支
持板(至)及び上記グリッド(8)間に形成される等電
位線である0 次に動作について説明する。
FIG. 2 is a sectional view showing a conventional thin film forming apparatus. In the figure, (1) a crucible, (2) a vapor deposited material in the crucible A, and (3) a spout provided in the crucible (1). hole, (4) is the trajectory of ionized metal vapor, (4a) is the trajectory of non-ionized metal vapor, (5) is the bombarded filament for heating the crucible (1), and (6) is the heating of the filament (5). (7) is a bombarded power source, (8) is a grid, (9) is a first ionizing filament that emits electrons to ionize metal vapor, αQ is a power source for heating the ionizing filament (9), ( b) is an ionization power source, (b) is an ion accelerating electrode, (to) is a support plate for the grid (8), α4 is an ion acceleration power source, (to) is a substrate, αQ is a deposited film, αη is a heat shield plate , - Light is a vacuum vessel, and α9 is an equipotential line formed between the ion velocity electrode (2), the grid support plate (to), and the grid (8).Next, the operation will be described.

フィラメント(5)は加熱用電源(6)により加熱され
てボンバード電源(7)により熱電子を放出する。該熱
電子はるつぼ(1)に衝突しるつぼ(1)を加熱する。
The filament (5) is heated by a heating power source (6) and emits thermoelectrons by a bombarded power source (7). The thermionic electrons hit the crucible (1) and heat the crucible (1).

そのことにより上記るつぼ(1)内の蒸着物質(2)は
蒸気を生じ、該蒸気は噴出孔(3)より噴出する0噴出
した上記蒸気は第1のイオン化フィラメント(9)より
放出された熱電子と衝突し、イオン化される0該イオン
化された金属蒸気はイオン加速電極(6)とグリッド支
持板(至)及びグリッド(8)間に形成される電界中に
8いて等電位線α9に略直交する方向に加速され、イオ
ン化されない金属蒸気がるつぼ(1)から噴出されると
きのエネルギーで基板(lE;)に衝突するのと共に、
基板(ト)に衝突し、該基板四上に薄膜を形成する。
As a result, the vapor deposited substance (2) in the crucible (1) generates steam, which is ejected from the ejection hole (3). The ionized metal vapor collides with electrons and is ionized. The ionized metal vapor is in the electric field formed between the ion accelerating electrode (6), the grid support plate (to), and the grid (8), and is approximately aligned with the equipotential line α9. Accelerated in the orthogonal direction, the non-ionized metal vapor is ejected from the crucible (1) and hits the substrate (lE;) with the energy;
It collides with the substrate (4) and forms a thin film on the substrate (4).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来の薄膜形成装置は以上の様に構成されているので、
るつぼから噴出した金属蒸気のうちるつぼの煙突部の側
面近傍を移動する金属蒸気はイオン化されにくり、該イ
オン化されない金属は電気力の作用を受けずに直進する
ので基板に到達しない。それ故に蒸気の一部は薄膜の形
成に寄与しないという問題点があった。
Conventional thin film forming equipment is configured as described above.
Of the metal vapor ejected from the crucible, the metal vapor moving near the side of the chimney of the crucible is unlikely to be ionized, and the non-ionized metal travels straight without being affected by electric force, so it does not reach the substrate. Therefore, there is a problem that a part of the vapor does not contribute to the formation of a thin film.

この発明は、上記のような問題点を解消するためになさ
れたもので、蒸着効率の高い薄膜形成装置を提供するこ
とを目的とする。
This invention was made to solve the above problems, and an object thereof is to provide a thin film forming apparatus with high vapor deposition efficiency.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係る薄膜形成装置は、るつぼ上部の煙突部の
内部にも第2のイオン化フィラメントを設けたものであ
る。
The thin film forming apparatus according to the present invention includes a second ionization filament also provided inside the chimney above the crucible.

〔作 用〕[For production]

この発明に2いては、るつぼ上部の煙突部の側面近傍を
通る金属蒸気も煙突内部にて第2のイオン化フィラメン
トによりイオン化され、より多くのイオン化蒸気が得ら
れるから、蒸着効率を高めることができ、より多くのイ
オン化された金属魚肉 気を広い#P度範囲から加速電界中に入れることができ
るので、広範囲にわたる均一な膜を得ることができる。
In the second aspect of the present invention, the metal vapor passing near the side surface of the chimney at the top of the crucible is also ionized by the second ionization filament inside the chimney, and more ionized vapor is obtained, so that the vapor deposition efficiency can be increased. Since more ionized metallic fish particles can be introduced into the accelerating electric field from a wide #P degree range, a uniform film over a wide range can be obtained.

〔実施例〕〔Example〕

以下、この発明の一実施例を図について説明する。第1
図は本発明の一実施例による薄膜形成装置を示し、図中
、′s2図と同一符号は同一部分を示す。■はるつぼ上
部の煙突部内部に設けられ金属蒸気をイオン化するため
のイオン化フィラメント、Ω1は該フィラメント■加熱
用電源である。
An embodiment of the present invention will be described below with reference to the drawings. 1st
The figure shows a thin film forming apparatus according to an embodiment of the present invention, and in the figure, the same reference numerals as in figure 's2 indicate the same parts. (2) An ionizing filament installed inside the chimney at the top of the crucible to ionize metal vapor; Ω1 is a power source for heating the filament (1).

次に動作について説明する。Next, the operation will be explained.

従来の装置における場合と同様にるつぼ+1)をフィラ
メント(5)により加熱すると、上記るつぼ口)内の蒸
着物質(2)は蒸気を生じ、該蒸気は噴出孔(3)より
噴出する。本実施例による薄膜形成装置ではるつぼの煙
突部内部に第2のイオン化フィラメント…を設けである
ので、煙突部側部近傍を通過する蒸気もイオン化され、
これによりイオン化される蒸気の量が増加する。そして
その第2のイオン化フィラメント囚によってイオン化さ
れた蒸気は、るつぼ煙突部の側面近傍の広い角度範囲か
ら従来よりも大きな弧を描いて加速電界中に入ることと
なり、該加速′4界中で収束されて広い角度範囲で基板
(ト)に到達する。その結果、基板(2)全体にわたっ
て、均一な薄膜を得ることができる。しかもこ゛の際、
イオン化された蒸気の量が多いことから蒸着効率も高め
られることとなる。
When the crucible +1) is heated by the filament (5) as in the conventional apparatus, the vapor deposited substance (2) in the crucible mouth) generates steam, which is ejected from the jet hole (3). In the thin film forming apparatus according to this embodiment, the second ionizing filament is provided inside the chimney of the crucible, so the steam passing near the side of the chimney is also ionized.
This increases the amount of vapor that is ionized. The vapor ionized by the second ionized filament enters the accelerating electric field from a wide angular range near the side of the chimney of the crucible, drawing a larger arc than before, and converging in the accelerating field. to reach the substrate (g) over a wide angular range. As a result, a uniform thin film can be obtained over the entire substrate (2). Moreover, in times of crisis,
Since the amount of ionized vapor is large, the vapor deposition efficiency is also increased.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明に係る薄膜形成装置によれば、
るつぼ上部の煙突部の側面近傍を通る金属蒸気をもイオ
ン化できるように煙突内部にイオン化フィラメントを設
けたので、蒸着効率を向上でき、かつ基板全体にわたっ
て均一は膜が得られる0
As described above, according to the thin film forming apparatus according to the present invention,
An ionizing filament is provided inside the chimney to ionize the metal vapor passing near the side of the chimney at the top of the crucible, which improves vapor deposition efficiency and allows a uniform film to be obtained over the entire substrate.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例による薄膜形成装置を示す
断面側面図、第2図は従来の薄膜形成装置を示す断面側
面図である。 4a・・・イオン化されない金属蒸気の一軌道、5・・
・ボンバードフィラメント、6・・・加熱用電源、7・
・・ボンバード用電源、8・・・グリッド、9・・・第
1のイオン化フィラメント、10・・・加熱用電源、1
1・・・イオン化電源、12・・・1オン加速電極、°
13・・・グリッド支持板、14・・・イオン加速用電
源、15・・・基板、16・・・蒸着膜、17・・・熱
シールド板、18・・・真空容器、19・・・等電位線
、20・・・第2のイオン化フィラメント、21°゛・
カロ熱用電源0 なお、図中同一符号は同−又は相当部分を示す。
FIG. 1 is a sectional side view showing a thin film forming apparatus according to an embodiment of the present invention, and FIG. 2 is a sectional side view showing a conventional thin film forming apparatus. 4a... One orbit of metal vapor that is not ionized, 5...
・Bombarded filament, 6... Heating power supply, 7.
...Bombarding power supply, 8...Grid, 9...First ionization filament, 10...Heating power supply, 1
1... Ionization power supply, 12... 1-on acceleration electrode, °
13... Grid support plate, 14... Power source for ion acceleration, 15... Substrate, 16... Vapor deposited film, 17... Heat shield plate, 18... Vacuum container, 19... etc. Potential line, 20...Second ionized filament, 21°
Power supply for calo heat 0 Note that the same reference numerals in the drawings indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] (1)所定の真空度を保持する真空槽と、該真空槽内に
設けた蒸着物質を収容するための煙突部を有するるつぼ
と、上記蒸着物質に蒸気を発生させるためのボンバード
フィラメントと、発生した蒸気をイオン化するための第
1のイオン化フィラメントと、上記蒸気のうちるつぼ上
部の煙突部の側面近傍を通るものをイオン化するために
煙突部内部に設けられた第2のイオン化フィラメントと
、上記イオン化した金属蒸気をイオン化されていない金
属蒸気と共に基板に衝突させて薄膜を形成させるための
電界加速手段とを備えたことを特徴とする薄膜形成装置
(1) A vacuum chamber that maintains a predetermined degree of vacuum, a crucible provided in the vacuum chamber and having a chimney for accommodating a vapor deposition material, a bombarded filament for generating steam in the vapor deposition material, and a generator. a first ionizing filament for ionizing the vapor, a second ionizing filament provided inside the chimney for ionizing the vapor passing near the side of the chimney above the crucible; 1. A thin film forming apparatus comprising an electric field accelerating means for colliding ionized metal vapor with non-ionized metal vapor against a substrate to form a thin film.
JP11285685A 1985-05-25 1985-05-25 Thin film formation equipment Pending JPS61270815A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11285685A JPS61270815A (en) 1985-05-25 1985-05-25 Thin film formation equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11285685A JPS61270815A (en) 1985-05-25 1985-05-25 Thin film formation equipment

Publications (1)

Publication Number Publication Date
JPS61270815A true JPS61270815A (en) 1986-12-01

Family

ID=14597244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11285685A Pending JPS61270815A (en) 1985-05-25 1985-05-25 Thin film formation equipment

Country Status (1)

Country Link
JP (1) JPS61270815A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2623819A1 (en) * 1987-11-26 1989-06-02 Thomson Csf Electron bombardment oven for vacuum evaporation

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2623819A1 (en) * 1987-11-26 1989-06-02 Thomson Csf Electron bombardment oven for vacuum evaporation

Similar Documents

Publication Publication Date Title
US4812326A (en) Evaporation source with a shaped nozzle
JPS56139673A (en) Manufacture of lead coat
JPH04109598A (en) Source of high-speed automatic beam
JPS61270815A (en) Thin film formation equipment
JPH0543784B2 (en)
JPS62112777A (en) Apparatus for forming thin film
JP2000144392A (en) Thin film forming device and formation of thin film
JPS6199670A (en) Ion plating device
JPS6280263A (en) Thin film forming device
JPS60125368A (en) Vapor deposition device for thin film
JPS6254076A (en) Ion plating device
JPS60124931A (en) Device for vapor deposition of thin film
JPH01119663A (en) Thin film-forming apparatus
JP2671219B2 (en) Fast atom beam source
JPS6386863A (en) Thin film producing apparatus
JPS61170563A (en) Method and device for reforming surface layer of inside wall surface of hole of work
JPS5920748B2 (en) Ion beam deposition device
JPH0347571B2 (en)
JPS6342365A (en) Thin film forming device
JPS60124915A (en) Thin film deposition equipment
JPH0766873B2 (en) Fast atom beam source
JPS6212120A (en) Heating filament for evaporation source
JPS5579870A (en) Evaporation apparatus for substance in vacuum
JPS6329925A (en) Forming device for compound thin-film
JPS60124930A (en) Device for vapor deposition of thin film