JPS6126803A - 低定圧装置 - Google Patents

低定圧装置

Info

Publication number
JPS6126803A
JPS6126803A JP14829884A JP14829884A JPS6126803A JP S6126803 A JPS6126803 A JP S6126803A JP 14829884 A JP14829884 A JP 14829884A JP 14829884 A JP14829884 A JP 14829884A JP S6126803 A JPS6126803 A JP S6126803A
Authority
JP
Japan
Prior art keywords
spindle
spring
coil spring
pressure
displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14829884A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0434681B2 (enrdf_load_stackoverflow
Inventor
Takeshi Miyazaki
武志 宮崎
Tamenori Shirai
白井　為典
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP14829884A priority Critical patent/JPS6126803A/ja
Publication of JPS6126803A publication Critical patent/JPS6126803A/ja
Publication of JPH0434681B2 publication Critical patent/JPH0434681B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/18—Micrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002—Details
    • G01B3/008—Arrangements for controlling the measuring force

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP14829884A 1984-07-16 1984-07-16 低定圧装置 Granted JPS6126803A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14829884A JPS6126803A (ja) 1984-07-16 1984-07-16 低定圧装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14829884A JPS6126803A (ja) 1984-07-16 1984-07-16 低定圧装置

Publications (2)

Publication Number Publication Date
JPS6126803A true JPS6126803A (ja) 1986-02-06
JPH0434681B2 JPH0434681B2 (enrdf_load_stackoverflow) 1992-06-08

Family

ID=15449648

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14829884A Granted JPS6126803A (ja) 1984-07-16 1984-07-16 低定圧装置

Country Status (1)

Country Link
JP (1) JPS6126803A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0947801A3 (en) * 1998-04-03 2001-09-05 Mitutoyo Corporation Micrometer
JP2007047016A (ja) * 2005-08-10 2007-02-22 Mitsutoyo Corp 測定器
US8296966B2 (en) 2010-04-08 2012-10-30 Mitutoyo Corporation Micrometer

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3225950B1 (en) 2016-03-31 2018-09-12 Tesa Sa Portable displacement measuring instrument with constant force mechanism

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5597404U (enrdf_load_stackoverflow) * 1980-01-17 1980-07-07

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5597404U (enrdf_load_stackoverflow) * 1980-01-17 1980-07-07

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0947801A3 (en) * 1998-04-03 2001-09-05 Mitutoyo Corporation Micrometer
JP2007047016A (ja) * 2005-08-10 2007-02-22 Mitsutoyo Corp 測定器
US8296966B2 (en) 2010-04-08 2012-10-30 Mitutoyo Corporation Micrometer

Also Published As

Publication number Publication date
JPH0434681B2 (enrdf_load_stackoverflow) 1992-06-08

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees