JPS61260149A - 試料走査形質量分析方法および試料走査装置 - Google Patents

試料走査形質量分析方法および試料走査装置

Info

Publication number
JPS61260149A
JPS61260149A JP60104883A JP10488385A JPS61260149A JP S61260149 A JPS61260149 A JP S61260149A JP 60104883 A JP60104883 A JP 60104883A JP 10488385 A JP10488385 A JP 10488385A JP S61260149 A JPS61260149 A JP S61260149A
Authority
JP
Japan
Prior art keywords
sample
specimen
component
primary
matrix agent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60104883A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0437542B2 (enrdf_load_stackoverflow
Inventor
Yuzo Nakagawa
中川 有造
Koji Iwatani
岩谷 宏治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shionogi and Co Ltd
Original Assignee
Shionogi and Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shionogi and Co Ltd filed Critical Shionogi and Co Ltd
Priority to JP60104883A priority Critical patent/JPS61260149A/ja
Publication of JPS61260149A publication Critical patent/JPS61260149A/ja
Publication of JPH0437542B2 publication Critical patent/JPH0437542B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP60104883A 1985-05-15 1985-05-15 試料走査形質量分析方法および試料走査装置 Granted JPS61260149A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60104883A JPS61260149A (ja) 1985-05-15 1985-05-15 試料走査形質量分析方法および試料走査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60104883A JPS61260149A (ja) 1985-05-15 1985-05-15 試料走査形質量分析方法および試料走査装置

Publications (2)

Publication Number Publication Date
JPS61260149A true JPS61260149A (ja) 1986-11-18
JPH0437542B2 JPH0437542B2 (enrdf_load_stackoverflow) 1992-06-19

Family

ID=14392579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60104883A Granted JPS61260149A (ja) 1985-05-15 1985-05-15 試料走査形質量分析方法および試料走査装置

Country Status (1)

Country Link
JP (1) JPS61260149A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008071510A (ja) * 2006-09-12 2008-03-27 Mems Core Co Ltd 質量分析装置
JP2012163548A (ja) * 2011-01-19 2012-08-30 Canon Inc 情報取得方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11335546B2 (en) 2017-11-28 2022-05-17 Hamamatsu Photonics K.K. Laser desorption/ionization method, mass spectrometry method, sample support body, and manufacturing method of sample support body
JP7236394B2 (ja) 2017-11-28 2023-03-09 浜松ホトニクス株式会社 レーザ脱離イオン化法及び質量分析方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008071510A (ja) * 2006-09-12 2008-03-27 Mems Core Co Ltd 質量分析装置
JP2012163548A (ja) * 2011-01-19 2012-08-30 Canon Inc 情報取得方法

Also Published As

Publication number Publication date
JPH0437542B2 (enrdf_load_stackoverflow) 1992-06-19

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