JPS61259163A - Specimen stand apparatus for ultrasonic microscope - Google Patents

Specimen stand apparatus for ultrasonic microscope

Info

Publication number
JPS61259163A
JPS61259163A JP60102034A JP10203485A JPS61259163A JP S61259163 A JPS61259163 A JP S61259163A JP 60102034 A JP60102034 A JP 60102034A JP 10203485 A JP10203485 A JP 10203485A JP S61259163 A JPS61259163 A JP S61259163A
Authority
JP
Japan
Prior art keywords
temp
sample stage
specimen
specimen stand
ultrasonic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60102034A
Other languages
Japanese (ja)
Inventor
Shinichi Imaide
慎一 今出
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP60102034A priority Critical patent/JPS61259163A/en
Publication of JPS61259163A publication Critical patent/JPS61259163A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To enable efficient observation without being acted by adverse effect due to the change in temp. of the circumference or during observation, by providing a heat generator and a temp. detection means to a specimen stand to control the temp. of an ultrasonic wave propagating medium. CONSTITUTION:A specimen stand 27 has an upper flat surface capable of mounting a specimen and is formed so as to have a lid shape and mounted to the upper part of a support plate 31 through a heat insulating member 34. A flat plate shaped heater 36 is mounted to the back surface inside the specimen stand 27 through an insulating sheet 35. A fine temp. detecting insert slot 38 is formed from the notch part 37 formed to the upper side part of the specimen stand 27 to the center of the specimen stand 27 and a temp. detecting rod shaped thermistor 39 is arranged in said slot 38. The thermistor 39 is connected to a temp. controller to control the flat plate-shaped heater 36.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、周囲の温度変化あるいは観察中の温度変化に
よる悪影響を受けることなく能率よく観察あるいは検査
可能とする超音波顕微鏡用試料台装置に関するものであ
る。
Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a sample stage device for an ultrasonic microscope that enables efficient observation or inspection without being adversely affected by ambient temperature changes or temperature changes during observation. It is something.

[従来の技術及び発明が解決しようとする問題点]光の
代りに超音波を用いて物体の微視的な構造を観察しよう
という考えが古くからあり、最近機械走査形超音波顕微
鏡が開発された。この超音波顕微鏡は、原理的には細く
絞った超高周波超音波ビームによって試料面を機械的に
走査し、その試料により散乱された超音波を集音して電
気信号に変換し、その信号を陰極線管等の表示面に二次
元的に表示し、顕微鏡像を得るのである。構成としては
超音波の検出の仕方によって、すなわち試料内で散乱あ
るいは減衰しながら透過してきた超音波を検出する場合
と、試料内の音響的性質の差によって反射してきた超音
波を検出する場合とによって、透過型と反射型とに分け
られる。
[Prior art and problems to be solved by the invention] The idea of observing the microscopic structure of objects using ultrasound instead of light has been around for a long time, and recently mechanical scanning ultrasound microscopes have been developed. Ta. In principle, this ultrasonic microscope mechanically scans the surface of a sample with a narrowly focused ultrahigh-frequency ultrasonic beam, collects the ultrasonic waves scattered by the sample, converts them into electrical signals, and converts the signals into electric signals. The image is displayed two-dimensionally on a display screen such as a cathode ray tube to obtain a microscopic image. The configuration depends on how the ultrasound is detected; in other words, there are two methods: detecting ultrasound that has passed through the sample while being scattered or attenuated, and detecting ultrasound that has been reflected due to differences in acoustic properties within the sample. Depending on the type, it can be divided into transmissive type and reflective type.

第6図は反射型の超音波顕微鏡の原理図で、高周波発振
器1からの信号は方向性結合器又はサーキュレータ2に
より送受兼用の超音波トランスジューサ3へ供給される
。この信号は超音波に変換されてこれが一方の面(上端
面)に貼着された送受波兼用のサファイア等の超音波伝
搬媒体材から成る超音波集束レンズ(音響レンズ)4の
一面より内部に放射され、他面側に送波される。この音
響レンズ4の他面は球面状にえぐられて球面レンズ部4
aとされ、球面レンズ部4aと対向して試料保持板5が
配置されるようになっている。音響レンズ4と前記保持
板5との間には超音波伝搬媒体である水6が介在され、
前記球面レンズ部4aの焦点位置に、試料7が保持板5
に取付けできるようになっている。上記保持板5は走査
装置8でX及びY方向に移動され二次元的に平面を走査
するようになっている。勿論、保持板5の代りに音響レ
ンズ4をX及びY方向に移動することも可能であるし、
例えば音響レンズ4をX方向に移動し、−力保持板5を
Y方向に移動するようにすることもできる。
FIG. 6 is a diagram showing the principle of a reflection-type ultrasound microscope, in which a signal from a high-frequency oscillator 1 is supplied by a directional coupler or circulator 2 to an ultrasound transducer 3 for both transmitting and receiving purposes. This signal is converted into an ultrasonic wave, which is transmitted inside through one surface of an ultrasonic focusing lens (acoustic lens) 4 made of an ultrasonic propagation medium material such as sapphire for transmitting and receiving waves, which is attached to one surface (upper end surface). It is radiated and transmitted to the other side. The other surface of this acoustic lens 4 is hollowed out into a spherical shape to form a spherical lens portion 4.
a, and a sample holding plate 5 is disposed facing the spherical lens portion 4a. Water 6, which is an ultrasonic propagation medium, is interposed between the acoustic lens 4 and the holding plate 5,
The sample 7 is placed on the holding plate 5 at the focal position of the spherical lens portion 4a.
It can be installed on. The holding plate 5 is moved in the X and Y directions by a scanning device 8 so as to two-dimensionally scan a plane. Of course, it is also possible to move the acoustic lens 4 in the X and Y directions instead of the holding plate 5,
For example, it is also possible to move the acoustic lens 4 in the X direction and move the -force holding plate 5 in the Y direction.

上記走査袋@8は走査回路9によってtIIinされる
ようになっている。
The scanning bag @8 is tIIined by the scanning circuit 9.

上記超音波トランスジューサ3より音響レンズ4に入射
された超音波は集束されて試料7へ到達する。その反射
波は再び音響レンズ4で集音され、1〜ランスジユーサ
3で電気信号に変換されて、前記方向性結合器2を通っ
て表示袋ff1loへ供給される。
The ultrasonic waves incident on the acoustic lens 4 from the ultrasonic transducer 3 are focused and reach the sample 7. The reflected waves are again collected by the acoustic lens 4, converted into electrical signals by the transducers 1 to 3, and supplied to the display bag ff1lo through the directional coupler 2.

ところで、上述のような超音波顕微鏡において、u W
レンズの球面レンズ部4aと試料との間に介在される超
音波伝達用液体として用いられる水の温度が異ると、第
7図及び第8図に示すように音速Cが大きく変化したり
、各周波数において減衰8αが大きく変化するため、周
囲の温度変化又は観察中の温度変化によって焦点位置が
ずれたり、減衰量αが変化して不鮮明な像になったり、
不均一な温度分布によっても不鮮明な像になる等の不都
合が生じることがあった。
By the way, in the ultrasonic microscope as described above, u W
When the temperature of the water used as the ultrasonic transmission liquid interposed between the spherical lens portion 4a of the lens and the sample changes, the sound speed C changes greatly as shown in FIGS. 7 and 8. Since the attenuation 8α changes greatly at each frequency, the focal position may shift due to changes in the surrounding temperature or temperature changes during observation, or the attenuation amount α may change, resulting in an unclear image.
Non-uniform temperature distribution may also cause problems such as unclear images.

[発明の目的〕 本考案は、上述した点にかんがみてなされたもので、周
囲の温度変化あるいは観察中の温度変化による悪影響を
受けることなく能率よく観察あるいは検査可能とする超
音波顕微鏡用試料台装置を提供することを目的としてい
る。
[Object of the Invention] The present invention has been made in view of the above-mentioned points, and provides a sample stage for an ultrasonic microscope that enables efficient observation or inspection without being adversely affected by ambient temperature changes or temperature changes during observation. The purpose is to provide equipment.

[問題点を解、決するための手段] 上記問題点を解決するために、本発明は、超音波顕微鏡
用の試料台装置において、試料を載置する試料台に発熱
体を設けるとともに、この発熱体による該試料台の温度
を検知する検知手段を設けるように構成して、超音波伝
搬媒体である水等の温度を制御できるようにしている。
[Means for Solving and Resolving the Problems] In order to solve the above problems, the present invention provides a sample stage device for an ultrasonic microscope, in which a heating element is provided on the specimen stage on which the sample is placed, and the heating element is The apparatus is configured to include a detection means for detecting the temperature of the sample stage caused by the body, so that the temperature of the ultrasonic propagation medium, such as water, can be controlled.

し実施例] 以下図面を参照して本発明による実施例を具体的に説明
する。
Embodiments] Embodiments of the present invention will be specifically described below with reference to the drawings.

第1図は超音波顕微鏡用試料台装置の平面図、第2図は
第1図のA−A線断面図、第3図は第1図のB−B線断
面図、第4図は本発明の試料台装置を装備した超音波顕
微鏡の正面図、第5図は第4図の右側面図である。
Figure 1 is a plan view of the sample stage device for an ultrasonic microscope, Figure 2 is a cross-sectional view taken along line A-A in Figure 1, Figure 3 is a cross-sectional view taken along line B-B in Figure 1, and Figure 4 is a cross-sectional view taken along line B-B in Figure 1. FIG. 5 is a front view of an ultrasonic microscope equipped with the sample stage device of the invention, and FIG. 5 is a right side view of FIG. 4.

これらの図において、符号11は超音波顕微鏡であり、
この超音波顕微鏡11は、車輪付で移動可能な架台12
上に図示しない防振装置を介してベースプレート13が
支持されている。このベースプレート13上には、図示
しない試料台駆動袋打によりXY方向に移動可能にした
試料台装置14と、この試料台装置14を跨ぐよう口字
状に形成されたアーム15とが固定されている。このア
ーム15のほぼ中央には、光学観察用対物レンズ16と
加振装置17を介して超音波音響レンズ18とをX方向
に所定の距離だけ離間してX方向に摺動し切換自在に取
付けた取付部材19が設けられている。この取付部材1
9は、前記アーム15に7方向に移動自在にしたZ方向
スライド装置20を介して取付けられている。また、取
付部材19の上部には、#R筒21と、この鏡筒11に
光伝送体22を介して接続された光源装置23とが装着
されている。又、前記鏡筒21には、光学像観察用の双
眼の接眼レンズ24が装着されている。
In these figures, numeral 11 is an ultrasound microscope;
This ultrasonic microscope 11 is equipped with a mount 12 that is movable with wheels.
The base plate 13 is supported via a vibration isolator (not shown). On this base plate 13, a sample stage device 14 which is movable in the X and Y directions by a sample stage driving mechanism (not shown) and an arm 15 formed in a mouth shape so as to straddle this sample stage device 14 are fixed. There is. At approximately the center of this arm 15, an ultrasonic acoustic lens 18 is attached via an optical observation objective lens 16 and an excitation device 17 so as to be able to slide and switch in the X direction at a predetermined distance apart. A mounting member 19 is provided. This mounting member 1
9 is attached to the arm 15 via a Z-direction slide device 20 that is movable in seven directions. Further, on the upper part of the mounting member 19, a #R cylinder 21 and a light source device 23 connected to this lens barrel 11 via a light transmission body 22 are mounted. Further, the lens barrel 21 is equipped with binocular eyepieces 24 for observing optical images.

なお、前記ベースプレート3の上面には、試料台装置1
4を露呈させて、他の部分を覆うようにしたカバー25
が設けられている。
Note that the sample stage device 1 is provided on the upper surface of the base plate 3.
A cover 25 that exposes part 4 and covers other parts.
is provided.

前記試料台装置14は、傾斜調整装置26の上部に試料
台27を取付けた構成になっている。前記傾斜調整装置
27は、支持体28内に上端面がゆるやかに傾斜した第
1および第2円筒29.30が配設され、この円筒29
.30の上部に中心部を傾斜自在に支持された支持板3
1が配設されている。そして、この支持板31には、そ
れぞれ円筒29.30の上部に摺動自在に当接された摺
動部材31−が設けられている。又、前記支持体の直交
する側面には調整つまみ32.33が設けられている。
The sample stage device 14 has a structure in which a sample stage 27 is attached to the top of an inclination adjustment device 26. The inclination adjustment device 27 includes first and second cylinders 29 and 30 whose upper end surfaces are gently sloped in a support body 28.
.. A support plate 3 whose center part is supported on the upper part of 30 so as to be freely tiltable.
1 is arranged. The support plate 31 is provided with sliding members 31- which are slidably abutted on the upper portions of the cylinders 29 and 30, respectively. Adjustment knobs 32, 33 are also provided on the orthogonal sides of the support.

この調整つまみ32.33は、その端部材がウオームに
形成され、それぞれ円筒側面に形成された図示しないウ
オーム歯車部に噛合わされている。即ち、調整つまみ3
2.33をそれぞれ別個に回すことにより第1および第
2円筒29.30が回転する。この第1および第2円筒
2つ、30の回転とともに摺動部材31′が該第1、第
2円筒29.30の傾斜した上面を摺動する。
The end members of the adjustment knobs 32 and 33 are formed into worms, and are meshed with worm gears (not shown) formed on the side surfaces of the cylinders. That is, adjustment knob 3
2.33, the first and second cylinders 29.30 are rotated. As the two first and second cylinders 30 rotate, the sliding member 31' slides on the inclined upper surfaces of the first and second cylinders 29, 30.

従って、支持板31が任意の方向に傾斜するようになっ
ている。
Therefore, the support plate 31 can be tilted in any direction.

前記試料台27は、上面を平坦にして試料を載置できる
ようにするとともに、蓋状に形成されており、前記支持
板31上部に断熱部材34.・・・を介在させて取付け
られている。又、前記試料台27の内側の裏面には絶縁
シート35を介して平板状ヒータ36が被着されている
。一方、前記試料台27の上側の一側部には、切欠部3
7が形成されている。又、この切欠部37から試料台2
7の中央部分にかけて細い温度検出用の挿通孔38が形
成されている。そして、この挿通孔38内には、温度検
知用の棒状サーミスタ39が配設されている。この棒状
サーミスタ39は図示しない温度制御器に接続され平板
状ヒータ36を制御するようになっている。
The sample stage 27 has a flat upper surface on which a sample can be placed, and is formed into a lid shape, with a heat insulating member 34 attached above the support plate 31. It is installed with... Further, a flat heater 36 is attached to the inner back surface of the sample stage 27 with an insulating sheet 35 interposed therebetween. On the other hand, a notch 3 is provided on one side of the upper side of the sample stage 27.
7 is formed. Also, from this notch 37 the sample stage 2
A thin through hole 38 for temperature detection is formed toward the center of the tube 7 . A rod-shaped thermistor 39 for temperature detection is disposed within this insertion hole 38. This rod-shaped thermistor 39 is connected to a temperature controller (not shown) to control the flat-plate heater 36.

このような構成では、試料台27に試料を載置するとと
もに、超音波音響レンズ17と試料との間に超音波伝達
用液体として水を介在させて使用される。資料台27は
平板状ヒータ36と棒状サーミスタ39により温度制御
が行われるため周囲の温度変化あるいは観察中の温度変
化による悪影響を受けることなく観察あるいは検査等を
行うことができる。又、資料台27は、断熱部材34゜
・・・により断熱され、下方の傾斜調整装置26に熱的
悪影響を与えることがない。
In such a configuration, a sample is placed on the sample stage 27, and water is used as an ultrasonic transmission liquid between the ultrasonic acoustic lens 17 and the sample. Since the temperature of the data table 27 is controlled by a flat heater 36 and a rod-shaped thermistor 39, observation or inspection can be performed without being adversely affected by ambient temperature changes or temperature changes during observation. Further, the document stand 27 is insulated by the heat insulating members 34°, so that no adverse thermal influence is exerted on the lower inclination adjustment device 26.

尚、前記実施例において、平板状ヒータ36を設けてい
るが、他の発熱体でもよい。又、棒状ナーミスタ39も
、温度検知ができる検知手段を用いてもよい。さらに、
試料台に発熱体、検知手段が設けられていればよ〈実施
例に限定されない。
In the above embodiment, a flat heater 36 is provided, but other heating elements may be used. Further, the rod-shaped nermistor 39 may also use a detection means capable of detecting temperature. moreover,
It is only necessary that the sample stage is provided with a heating element and a detection means (not limited to the embodiment).

[発明の効果] 以上説明したように本発明によれば、超音波顕微鏡の試
料台に発熱体と、この発熱体による試料台の温度を検知
する検知手段を設けるようにしているため、周囲の温度
変化あるいは観察中の温度変化による悪影響を受けるこ
となく能率よく観察あるいは検査できる効果がある。
[Effects of the Invention] As explained above, according to the present invention, the sample stage of an ultrasonic microscope is provided with a heating element and a detection means for detecting the temperature of the specimen stage by the heating element, so that This has the effect of allowing efficient observation or inspection without being adversely affected by temperature changes or temperature changes during observation.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は超音波顕微鏡用試料台装置の平面図、第2図は
第1図のA−A線断面図、第3図は第1図のB−B線断
面図、第4図は本発明の試料台装置を装備した超音波顕
微鏡の正面図、第5図は第4図の右側面図、第6図は超
音波顕微鏡の原理を示す説明図、第7図は水中を伝播さ
せた場合における音速及び減衰mの温度依存性を示す特
性図、第8図は温度をパラメータとする各周波数におけ
る減衰特性を示す特性図である。 11・・・超音波顕微鏡  14・・・試料台装置26
・・・傾斜調整装置  27・・・試料台34・・・断
熱部材    36・・・平板状ヒータ39・・・棒状
サーミスタ 1へ11、  ノ ー1.−町 第3図 手続ネ「n1書(方式) 昭和60年9月9日 事件との関係   特許出願人 代表者  −ト  山  敏  部 4、代理人
Figure 1 is a plan view of the sample stage device for an ultrasonic microscope, Figure 2 is a cross-sectional view taken along line A-A in Figure 1, Figure 3 is a cross-sectional view taken along line B-B in Figure 1, and Figure 4 is a cross-sectional view taken along line B-B in Figure 1. A front view of an ultrasonic microscope equipped with the sample stage device of the invention, FIG. 5 is a right side view of FIG. FIG. 8 is a characteristic diagram showing the temperature dependence of sound velocity and attenuation m in the case of FIG. 11... Ultrasonic microscope 14... Sample stage device 26
...Inclination adjustment device 27...Sample stage 34...Insulating member 36...Flat heater 39...11 to rod-shaped thermistor 1, No.1. -Town Figure 3 Proceedings ``N1 Book (Method) Relationship with the September 9, 1985 Incident Representative of the Patent Applicant - To Satoshi Yama Department 4, Agent

Claims (3)

【特許請求の範囲】[Claims] (1)超音波顕微鏡用の試料台装置において、試料を載
置する試料台に発熱体と、この発熱体による該試料台の
温度を検知する検知手段とを設けたことを特徴とする超
音波顕微鏡用試料台装置。
(1) A sample stage device for an ultrasonic microscope, characterized in that a sample stage on which a sample is placed is provided with a heating element and a detection means for detecting the temperature of the specimen stage by the heating element. Microscope sample stage device.
(2)前記発熱体は、試料台の裏面に被着した平板状ヒ
ータであることを特徴とする特許請求の範囲第1項記載
の超音波顕微鏡用試料台装置。
(2) The sample stage apparatus for an ultrasonic microscope according to claim 1, wherein the heating element is a flat heater attached to the back surface of the sample stage.
(3)前記検知手段は、試料台に埋め込まれた棒状サー
ミスタであることを特徴とする特許請求の範囲第1項記
載の超音波顕微鏡用試料台装置。
(3) The sample stage device for an ultrasound microscope according to claim 1, wherein the detection means is a rod-shaped thermistor embedded in the sample stage.
JP60102034A 1985-05-14 1985-05-14 Specimen stand apparatus for ultrasonic microscope Pending JPS61259163A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60102034A JPS61259163A (en) 1985-05-14 1985-05-14 Specimen stand apparatus for ultrasonic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60102034A JPS61259163A (en) 1985-05-14 1985-05-14 Specimen stand apparatus for ultrasonic microscope

Publications (1)

Publication Number Publication Date
JPS61259163A true JPS61259163A (en) 1986-11-17

Family

ID=14316476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60102034A Pending JPS61259163A (en) 1985-05-14 1985-05-14 Specimen stand apparatus for ultrasonic microscope

Country Status (1)

Country Link
JP (1) JPS61259163A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005114429A (en) * 2003-10-03 2005-04-28 Junichi Kushibiki Ultrasonic material property analyzer of high precision, and temperature control method therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005114429A (en) * 2003-10-03 2005-04-28 Junichi Kushibiki Ultrasonic material property analyzer of high precision, and temperature control method therefor

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