JPS61256207A - モニタ画面上における物体の相対測長装置 - Google Patents

モニタ画面上における物体の相対測長装置

Info

Publication number
JPS61256207A
JPS61256207A JP9663385A JP9663385A JPS61256207A JP S61256207 A JPS61256207 A JP S61256207A JP 9663385 A JP9663385 A JP 9663385A JP 9663385 A JP9663385 A JP 9663385A JP S61256207 A JPS61256207 A JP S61256207A
Authority
JP
Japan
Prior art keywords
cursor
length measurement
length measuring
monitor screen
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9663385A
Other languages
English (en)
Japanese (ja)
Other versions
JPH058761B2 (enExample
Inventor
Yukihiko Toyozumi
豊住　幸彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokina Optical Co Ltd
Original Assignee
Tokina Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokina Optical Co Ltd filed Critical Tokina Optical Co Ltd
Priority to JP9663385A priority Critical patent/JPS61256207A/ja
Publication of JPS61256207A publication Critical patent/JPS61256207A/ja
Publication of JPH058761B2 publication Critical patent/JPH058761B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/022—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of tv-camera scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP9663385A 1985-05-09 1985-05-09 モニタ画面上における物体の相対測長装置 Granted JPS61256207A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9663385A JPS61256207A (ja) 1985-05-09 1985-05-09 モニタ画面上における物体の相対測長装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9663385A JPS61256207A (ja) 1985-05-09 1985-05-09 モニタ画面上における物体の相対測長装置

Publications (2)

Publication Number Publication Date
JPS61256207A true JPS61256207A (ja) 1986-11-13
JPH058761B2 JPH058761B2 (enExample) 1993-02-03

Family

ID=14170236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9663385A Granted JPS61256207A (ja) 1985-05-09 1985-05-09 モニタ画面上における物体の相対測長装置

Country Status (1)

Country Link
JP (1) JPS61256207A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02122207A (ja) * 1988-10-31 1990-05-09 Sumitomo Densetsu Kk 延線制御用弛度観測装置
JPH03282304A (ja) * 1990-03-30 1991-12-12 Toppan Printing Co Ltd 表裏パターン検査装置
WO1994024518A1 (fr) * 1993-04-21 1994-10-27 Omron Corporation Appareil de support pour controle visuel, appareil de controle de substrat, et procedes de controle et de correction de soudure utilisant ces appareils

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005015958A (ja) * 2003-06-26 2005-01-20 Shima Seiki Mfg Ltd 編地見本の作成方法、ニットデザイン方法、糸径測定装置、及び編地見本の作成装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5381153A (en) * 1976-12-27 1978-07-18 Hitachi Ltd Inspecting apparatus for positions of object to be inspected

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5381153A (en) * 1976-12-27 1978-07-18 Hitachi Ltd Inspecting apparatus for positions of object to be inspected

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02122207A (ja) * 1988-10-31 1990-05-09 Sumitomo Densetsu Kk 延線制御用弛度観測装置
JPH03282304A (ja) * 1990-03-30 1991-12-12 Toppan Printing Co Ltd 表裏パターン検査装置
WO1994024518A1 (fr) * 1993-04-21 1994-10-27 Omron Corporation Appareil de support pour controle visuel, appareil de controle de substrat, et procedes de controle et de correction de soudure utilisant ces appareils
US6362877B1 (en) 1993-04-21 2002-03-26 Omron Corporation Visual inspection supporting apparatus and printed circuit board inspecting apparatus, and methods of soldering inspection and correction using the apparatuses

Also Published As

Publication number Publication date
JPH058761B2 (enExample) 1993-02-03

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