JPS6125281A - Color marksensor - Google Patents
Color marksensorInfo
- Publication number
- JPS6125281A JPS6125281A JP14529884A JP14529884A JPS6125281A JP S6125281 A JPS6125281 A JP S6125281A JP 14529884 A JP14529884 A JP 14529884A JP 14529884 A JP14529884 A JP 14529884A JP S6125281 A JPS6125281 A JP S6125281A
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical system
- output
- receiving
- amplifiers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/10—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation
- G06K7/10544—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation by scanning of the records by radiation in the optical part of the electromagnetic spectrum
- G06K7/10821—Methods or arrangements for sensing record carriers, e.g. for reading patterns by electromagnetic radiation, e.g. optical sensing; by corpuscular radiation by scanning of the records by radiation in the optical part of the electromagnetic spectrum further details of bar or optical code scanning devices
- G06K7/10851—Circuits for pulse shaping, amplifying, eliminating noise signals, checking the function of the sensing device
Abstract
Description
【発明の詳細な説明】
〔技術分野〕
本発明は物体面におけるマークを自動検出するのに使用
するカラーマークセンサに関するものである。DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to a color mark sensor used to automatically detect marks on an object surface.
従来のカラーマークセンサは第4図のような光学系と第
5図に示すような構成の回路とを有して構成されている
。第4図の光学系において、ランプ2から出た光は、し
:7ズL1によシはぼ平行光となり、レンズLによシ物
体面M上に集光される。A conventional color mark sensor has an optical system as shown in FIG. 4 and a circuit as shown in FIG. 5. In the optical system shown in FIG. 4, the light emitted from the lamp 2 becomes approximately parallel light through the lens L1, and is focused onto the object surface M by the lens L.
この物体面M上で反射された光(信号光)は、上記レン
ズL!によシ一旦平行光になシ、ハーフミラ−HMで反
射受光光量の約半分がレン″”J、 L3側に反射され
、このレンズL、により第]の受光素子PD1に集めら
れる。またラン′プ2の光の一部は絞りAを介して参照
光用の第2の受光素子PD、 に受光される。第5図
回路罠おいて、OPt 、O’Pzけ夫々オペアンプで
あシ、前記受光素子FD、、PD2の出力の信号処理回
路を構成している。The light (signal light) reflected on this object plane M is transmitted through the lens L! Once converted into parallel light, approximately half of the amount of reflected light received by the half mirror HM is reflected toward the lens "J" and L3, and is collected by this lens L onto the second light receiving element PD1. Further, a part of the light from the lamp 2 is received via the aperture A by the second light receiving element PD for reference light. In the circuit shown in FIG. 5, operational amplifiers OPt and O'Pz constitute a signal processing circuit for the outputs of the light receiving elements FD, . . . PD2.
今、物体面M上のマークを検出する方法について説明す
る。ことでマークは物体面Mの下地よシ反射率が低いも
のとする。まずマークの下地に投光スポットを照射し、
そのとき絞シAを開閉して両受光素子PD、 、 FD
、の出力電流がほぼ同じで第1の受光素子PD1の方の
出力がやや大きい程度に設定し、このとき第5図回路の
出力は%H,Iとなる。次にマークに投光スポットを照
射し、改めて絞#)Aを開閉して両受光素子PD、 、
PD、の出力がほぼ同じになるように設定する。この後
、絞りAを、上記両方の設定操作による位置の中央にセ
ットする。このようにすることによって、マークを検出
したときのオペアンプOP1の出力電圧Voutが、オ
ペアンプOP! よりなるコンパレータのしきい値V
cより低くなるように設定されたことになる。従ってマ
ークより反射率が高い物体面Mの下地部分に投光スポッ
トが照射されているとき、出力電圧VOutがしきい値
電圧Vcを越えて検出出力が%LIとなシ、マークを検
出したとき%HI−出力を生じるようになり、マークの
自動検出ができるものである。Now, a method for detecting marks on the object plane M will be explained. Therefore, it is assumed that the mark has a lower reflectance than the base of the object surface M. First, illuminate the base of the mark with a light spot,
At that time, the diaphragm A is opened and closed to detect both photodetectors PD, , FD.
, the output currents of the first light receiving element PD1 are set to be approximately the same and the output of the first light receiving element PD1 is slightly larger, and at this time, the output of the circuit of FIG. 5 becomes %H,I. Next, illuminate the mark with the projected light spot, open and close the aperture #)A again, and select both photodetectors PD, ,
Set so that the outputs of PD and PD are almost the same. After this, the aperture A is set at the center of the position determined by both of the setting operations described above. By doing this, the output voltage Vout of the operational amplifier OP1 when the mark is detected is changed to the operational amplifier OP! The comparator threshold value V
This means that it is set to be lower than c. Therefore, when the projected light spot is illuminated on the underlying part of the object surface M, which has a higher reflectance than the mark, the output voltage VOut exceeds the threshold voltage Vc and the detection output becomes %LI.When the mark is detected, %HI- output is generated, and marks can be automatically detected.
ところが上述のような従来例において、物体面Mからの
正反射光を受光するような構成となっていたため、物体
面Mが光沢面であるときのマーク等は反射光量差が小さ
くなシ、マークの検出が困難である問題を有する他、こ
の第5図の回路でアナログ出力を取り出す場合、ランプ
!の光量変動に対する補正ができない問題があシ、さら
にある反射率のマークだけを検出するというようなこと
もできない問題を有していた。However, in the conventional example described above, since the configuration was such that the specularly reflected light from the object surface M was received, marks etc. when the object surface M was a glossy surface had a small difference in the amount of reflected light. In addition to the problem that it is difficult to detect the lamp, when extracting analog output using the circuit shown in Fig. There is a problem in that it is not possible to correct for variations in the amount of light, and there is also a problem in that it is not possible to detect only marks with a certain reflectance.
第6図は従来の光ファイバFA、、FA、を用いた光学
系の例を示すものであって、少なく′とも投受光面側で
は投光用の光ファイバFA、の周囲にドーナツ状に受光
用の光ファイバFA、が配列され、ランプ!及び受光素
子FD1側では両光ファイバF A、 、−F A、、
け分離され、夫々ランづJ及び受光素子PD、に対向し
ている。ところが′かかる従来例においては、光ファイ
バFA、%FA、の先端と物採面Mとの間の距離dが0
.5〜1.5藺と極端に短く、この距離dが変動すると
光ファイバFA、 、FA2の先端と物体面Mとが接触
するおそれが郵る等、設置が困難である問題があった。Figure 6 shows an example of an optical system using conventional optical fibers FA, FA, where at least on the light emitting/receiving surface side, light is received in a donut shape around the light emitting optical fiber FA. Optical fiber FA for use is arranged and lamp! And on the light receiving element FD1 side, both optical fibers FA, , -FA, ,
The light receiving element PD is separated from the light receiving element 2 and faces the light receiving element PD, respectively. However, in such a conventional example, the distance d between the tip of the optical fiber FA, %FA and the sampling surface M is 0.
.. The distance d is extremely short at 5 to 1.5 mm, and if this distance d fluctuates, there is a risk that the tips of the optical fibers FA, FA2 may come into contact with the object plane M, making installation difficult.
本発明は、物体面が光沢面である場合においてもその影
響を受けることなく適確にマークを検出できるようにし
たカラーマークセンサを提供する゛ことを第1の目的と
し、さらに任意の反射率のマークの選択的な検出を可能
にすることを第2の目的とするとともに、光フアイバ使
用のものにおいて設定設置が極く容易にできるようにす
ることを第3の目的とするものである。The first object of the present invention is to provide a color mark sensor that can accurately detect marks without being affected even when the object surface is a glossy surface. A second purpose is to enable selective detection of the marks, and a third purpose is to make setting and installation extremely easy for those using optical fibers.
(実施例1)
第1図は本発明の第1の実施例の光学系を示し、図から
明らかなように1投光光学系の光軸と受光光学系の光軸
との間に角度0をもたせ、これにより物体面Mで正反射
した光は受光光学系に入射せず、物体面Mの拡散反射光
のみが受光光学系に入射検出できるようKしたものであ
り、このため、物体面Mの光沢に影響を受けることなく
、マークの検出ができるようKしである。図中AI 、
A!け夫々参照光側及び信号光側の絞りであ多。第2図
は、本発明の実施例回路を示し、前述の第5図従来例の
回路のものに比べ、信号光系と参照光系とを別々のアン
プAPs、AP、で増巾するようにした点、2個のコン
パレータcp1、CP、 を使用してウィンドコンパレ
ータを構成し、そのウィンド中を可変抵抗VR1で設定
できるようにした点、ウィンドコンパレータ内のスイッ
チSW1をオフにすることによって従来と同様な動作を
するよう゛にしである点、信号光と参照光との両方のア
゛す0ジ信号を取り出せるよ′うにし、外部のコンパレ
ータにて数段階に分離することも可能にするとともに1
、ランプ!の光量変動は参照光側の出力により検出でき
るため光量変動補正が容易にできる点、等において相達
している。(Example 1) Figure 1 shows an optical system according to a first example of the present invention. As a result, the light specularly reflected by the object surface M does not enter the light-receiving optical system, and only the diffusely reflected light from the object surface M can be detected by the light-receiving optical system. K is used so that marks can be detected without being affected by the gloss of M. AI in the figure,
A! There are many apertures on the reference beam side and signal beam side, respectively. FIG. 2 shows a circuit according to an embodiment of the present invention, which is different from the conventional circuit shown in FIG. The two comparators cp1 and CP are used to configure the window comparator, and the inside of the window can be set using the variable resistor VR1. By turning off the switch SW1 in the window comparator, In order to operate in the same way, it is possible to extract the zero level signal of both the signal light and the reference light, and it is also possible to separate it into several stages using an external comparator. 1
,lamp! The light intensity fluctuations can be detected by the output of the reference light, so light intensity fluctuations can be easily corrected.
この第2図実施例回路において、アンプAP、。In this embodiment circuit of FIG. 2, an amplifier AP.
AP2は夫々受光素子PD1、PD2の出力を増巾する
ものであり、コンパレータcp、 、cp2けアンプA
P、の出力電圧を比較するためのウィンドコンパレータ
を構成しておシ、そのしきい値はアン″:5AP2の出
力電圧によシ決定されるとともにウィンド中は可変抵抗
VR,の調整によシ決定され、またア?/プAP、の出
力電圧は、絞りAにより受光素子PD、に入射する光量
を調整することにより調整できる。またトランジスタT
ry。AP2 amplifies the outputs of the light receiving elements PD1 and PD2, respectively, and comparators cp, , cp2 and amplifier A
A window comparator is constructed to compare the output voltages of P, and its threshold value is determined by the output voltage of AP2, and during the window, it is determined by adjusting the variable resistor VR. The output voltage of the amplifier AP can be adjusted by adjusting the amount of light incident on the photodetector PD using the aperture A.
ry.
Tr2け電流源を構成し、AVRけ電圧レイユレータで
あり、図中LED、〜LED3け発光ダイオード、Tr
3〜Tr6けトランジスタ、5O1ROけ夫々信号及び
参照光のアナ0ジ出力端子である。かくてこの第1図及
び第2図の実施例のもののセンサとしの使用方法は、前
述の従来例と全く変らないものであり、特にスイッチS
W1を開いているときけ、従来例と実質的に同一の動作
を行う。またスイッチSW、を閉じた場合、ウィンドコ
ンパレータが機能し、予め設定さ九た任意の反射率の範
囲内忙あるマークのみを検出できるよう罠なるものであ
る。It constitutes a current source of 2 transistors, and is a voltage regulator for an AVR.
These are analog 0 output terminals for 3 to 6 transistors, 5O1RO signals and reference light. Thus, the method of using the embodiment shown in FIGS. 1 and 2 as a sensor is completely the same as that of the conventional example described above.
When W1 is open, the operation is substantially the same as in the conventional example. In addition, when the switch SW is closed, the window comparator functions and becomes a trap so that only marks within a preset arbitrary reflectance range can be detected.
(実施例2)
第3図は本発明の第2の実施例の光学系を示し、信号の
増巾・処理回路は第2図実施例と同様のものが使用され
る。この第3図実施例は投光系及び受光系に夫々光ファ
イバFA、 、FA、を使用し、これら光ファイバF
A 0、F A 2の先端部に自己集束しンズL、いム
、を配置し、物体面Aに至る投学光光軸がθなる角度を
有するようにしたものである。金集束レンズL。1、L
O!”の屈折率分布定数をB1中心屈折率をn。、レン
ズ長を Zとし、光学系中の各部の寸法を図示の通シと
すると、寸法石0とJ3.との関係は、
となシ、また寸法!□ と12 との関係は、となるも
のであシ、−さらに寸法r1とr、とは、!
rl =roXm:rOX ’となる。かく
てこの実施例の場合、自己集束レンJL。l、LO2の
先端面と物体面Mとの間の寸法石、を比較的大きく取る
ことができるようになり、光学系の設置調整が容易にで
きるようになる効果を有する他、前述の第1の実施例と
同様の効果を有するものである。(Embodiment 2) FIG. 3 shows an optical system of a second embodiment of the present invention, in which the same signal amplification/processing circuit as in the embodiment of FIG. 2 is used. In the embodiment shown in FIG. 3, optical fibers FA, FA, FA, and
A self-focusing lens L is arranged at the tip of A 0 and F A 2, so that the optical axis of the projected light reaching the object plane A has an angle of θ. Gold focusing lens L. 1.L
O! Assuming that the refractive index distribution constant of ``B1 is n, the lens length is Z, and the dimensions of each part in the optical system are as shown in the diagram, the relationship between dimension stones 0 and J3 is as follows. , and the relationship between the dimensions !□ and 12 is as follows.-Furthermore, the dimensions r1 and r are !rl = roXm:rOX'.Thus, in the case of this example, the self-focusing lens JL.l, the dimension between the tip surface of LO2 and the object plane M can be made relatively large, which has the effect of making it easier to adjust the installation of the optical system, as well as the above-mentioned This embodiment has the same effects as the first embodiment.
本発明は上述のように、投光光学系の光軸に対し受光光
学系の光軸を傾斜させて受光光学系により物体面の拡散
反射光のみを受光するようにしたものであるから、物体
面が光沢面である場合にもこれに左右されることなく′
適確にマークを検出できる効果を有するものであり、ま
た信号光受光用の第1の受光素子の出力と、参照光学充
用の第2の受光素子の出力を夫々別個のアンプによシ増
巾し、これら両アンプの出力によシ信号の判別処理を行
うようにしたので、任意の反射率の範囲のマークを検出
するようにすることにより特定色のマークのみの検出を
可能にする等の多様な検出方法を可能にし、多色判別に
応用することも容易にできるようになる効果を有するも
のである。As described above, in the present invention, the optical axis of the light-receiving optical system is tilted with respect to the optical axis of the light-emitting optical system so that only the diffusely reflected light from the object surface is received by the light-receiving optical system. Even if the surface is a glossy surface, it is not affected by this.
It has the effect of accurately detecting marks, and it also amplifies the output of the first light receiving element for receiving the signal light and the output of the second light receiving element for serving as the reference optical system using separate amplifiers. However, since the output of both amplifiers is used to discriminate the signals, it is possible to detect marks in an arbitrary reflectance range, making it possible to detect only marks of a specific color. This has the effect of enabling a variety of detection methods and easily applying it to multicolor discrimination.
第1図は本発明の第1の実施例の光学系の概略図、第2
図は同上の回路図、第3図は本発明の第2の実施例の光
学系の概略図、第4図は従来例の光学系の概略図、第5
図は同上の回路図、第6図は別の従来例の光学系の概略
図であり、PD、 、PD!は夫々第1及び第2の受光
素子、AP、 、AP、は夫々アンプである。FIG. 1 is a schematic diagram of the optical system of the first embodiment of the present invention, and FIG.
3 is a schematic diagram of the optical system of the second embodiment of the present invention, FIG. 4 is a schematic diagram of the optical system of the conventional example, and FIG.
This figure is the same circuit diagram as above, and FIG. 6 is a schematic diagram of another conventional optical system, with PD, , PD! are first and second light-receiving elements, AP, and AP are amplifiers, respectively.
Claims (3)
斜させて受光光学系により物体面の拡散反射光のみを受
光するようにし、信号光受光用の第1の受光素子の出力
と、参照光受光用の第2の受光素子の出力を夫々別個の
アンプにより増巾し、これら両アンプの出力により信号
の判別処理を行うようにして成ることを特徴とするカラ
ーマークセンサ。(1) The optical axis of the light-receiving optical system is tilted with respect to the optical axis of the light-emitting optical system so that only the diffusely reflected light from the object surface is received by the light-receiving optical system, and the first light-receiving element for receiving signal light is A color mark sensor characterized in that the output and the output of a second light receiving element for receiving reference light are amplified by separate amplifiers, and signal discrimination processing is performed based on the outputs of these amplifiers.
出力をウインドコンパレータに入力し、適宜のしきい値
レベルの巾の中に受光反射光量があるか否かを判別でき
るようにして成ることを特徴とする特許請求の範囲第1
項記載のカラーマークセンサ。(2) When performing signal discrimination processing, the outputs of the two amplifiers are input to a window comparator so that it can be determined whether or not the amount of received and reflected light is within the width of an appropriate threshold level. Claim 1 characterized by
Color mark sensor described in section.
先端の自己集束レンズとにより構成して成ることを特徴
とする特許請求の範囲第1項記載のカラーマークセンサ
。(3) The color mark sensor according to claim 1, wherein the light projecting optical system and the light receiving optical system are constituted by an optical fiber and a self-focusing lens at the tip thereof.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14529884A JPS6125281A (en) | 1984-07-13 | 1984-07-13 | Color marksensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14529884A JPS6125281A (en) | 1984-07-13 | 1984-07-13 | Color marksensor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6125281A true JPS6125281A (en) | 1986-02-04 |
JPH0452507B2 JPH0452507B2 (en) | 1992-08-24 |
Family
ID=15381906
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14529884A Granted JPS6125281A (en) | 1984-07-13 | 1984-07-13 | Color marksensor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6125281A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01113756U (en) * | 1988-01-26 | 1989-07-31 | ||
JPH01116854U (en) * | 1988-01-29 | 1989-08-07 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5146228U (en) * | 1974-10-01 | 1976-04-05 | ||
JPS553373U (en) * | 1979-05-17 | 1980-01-10 | ||
JPS5599677A (en) * | 1979-01-25 | 1980-07-29 | Nec Corp | Mark detector circuit |
JPS5988672A (en) * | 1982-11-12 | 1984-05-22 | Toshiba Corp | Optical fiber sensor |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5146228B2 (en) * | 1972-02-17 | 1976-12-08 | ||
JPS53130743A (en) * | 1977-04-20 | 1978-11-15 | Sumitomo Chem Co Ltd | Improved composition of reinforced polyolefin |
-
1984
- 1984-07-13 JP JP14529884A patent/JPS6125281A/en active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5146228U (en) * | 1974-10-01 | 1976-04-05 | ||
JPS5599677A (en) * | 1979-01-25 | 1980-07-29 | Nec Corp | Mark detector circuit |
JPS553373U (en) * | 1979-05-17 | 1980-01-10 | ||
JPS5988672A (en) * | 1982-11-12 | 1984-05-22 | Toshiba Corp | Optical fiber sensor |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01113756U (en) * | 1988-01-26 | 1989-07-31 | ||
JPH01116854U (en) * | 1988-01-29 | 1989-08-07 |
Also Published As
Publication number | Publication date |
---|---|
JPH0452507B2 (en) | 1992-08-24 |
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