JPS61244029A - Prevention of uneven spin coating and spin coater - Google Patents

Prevention of uneven spin coating and spin coater

Info

Publication number
JPS61244029A
JPS61244029A JP8563985A JP8563985A JPS61244029A JP S61244029 A JPS61244029 A JP S61244029A JP 8563985 A JP8563985 A JP 8563985A JP 8563985 A JP8563985 A JP 8563985A JP S61244029 A JPS61244029 A JP S61244029A
Authority
JP
Japan
Prior art keywords
coating agent
coating
coated
center
bubbles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8563985A
Other languages
Japanese (ja)
Inventor
Yoshiaki Tada
多田 嘉明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Machine Co Ltd
Original Assignee
Toshiba Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Machine Co Ltd filed Critical Toshiba Machine Co Ltd
Priority to JP8563985A priority Critical patent/JPS61244029A/en
Publication of JPS61244029A publication Critical patent/JPS61244029A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To reduce any uneven coating due to bubbles remarkably, forming coated films with excellent evenness, by a method wherein coating agent is dripped on the position distant from the rotary center of coated material. CONSTITUTION:The center B of nozzle 4 is arranged on the position distant by e from the rotary center A of a coated material 1. When coating agent 5 is dripped from a deflectively located nozzle 4, the dripped coating agent 5 is spread almost circularly on the position deflected from the rotary center A of coated material 1. The dripped amount of coating agent 5 shall be specified to get over the rotary center A toward the opposite side. When a spindle 3 is rotated, bubbles 6 are externally blown away rapidly together with the coating agent 5 disappearing from the coated material 1 since the bubbles 6 being distant from the rotary center A, the coating agent 5 around the bubbles 6 is subject to relatively intensive centrifugal force. Through these procedures, any uneven coating due to explosion of bubbles 6 can be reduced remarkably.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体基板などの被塗布材の表面にレジスト
などの塗布剤をスピンコートする方法およびそのだめの
スピンコータに係り、特に塗布ムラの防止に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method of spin-coating a coating material such as a resist onto the surface of a material to be coated such as a semiconductor substrate, and a spin coater therefor. It is about prevention.

〔従来の技術〕[Conventional technology]

スピンコータは、第3図に示すように被塗布材1を真空
吸着などKより保持するチャック2をスピンドル3の上
端に設け、チャック2の中心上方に塗布剤5を滴下する
ノズル4を設け、被塗布材1の回転中心上に塗布剤5を
滴下させ、スピンドル3を薮1000 r、p、m、で
高速回転させることKよリ、塗布剤5を被塗布材10表
面に広げ1.#111オーダの塗布膜を形成するもので
ある。従来のスピンコータは、被塗布材;上に滴下した
塗布剤5をスピンドル3の回転による遠心力によって被
塗布材1の全表面により均一な厚さになるように広げる
ため、ノズル4をスピンドル30回転中心A上に位置さ
せ、塗布剤5を第3図および第4図に示すように、スピ
ンドル3の回転中尋人すなわちこれと同心上に保持され
ている被塗布材1の中心に滴下させるようになっていた
As shown in FIG. 3, the spin coater is equipped with a chuck 2 at the upper end of a spindle 3 that holds the material 1 to be coated by vacuum suction or other means, and a nozzle 4 for dropping a coating agent 5 above the center of the chuck 2. The coating agent 5 is dropped onto the rotation center of the coating material 1, and the spindle 3 is rotated at a high speed of 1000 r, p, m. A coating film of #111 order is formed. In a conventional spin coater, the nozzle 4 is rotated 30 times on the spindle in order to spread the coating agent 5 dropped onto the material to be coated to a more uniform thickness over the entire surface of the material to be coated 1 by centrifugal force caused by the rotation of the spindle 3. As shown in FIGS. 3 and 4, the coating agent 5 is placed on the center A, and the coating material 5 is dripped onto the center of the workpiece 1 held concentrically with the spindle 3 while it is rotating. It had become.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところで、スピンコート法により半導体基板上にレジス
トを塗布する場合には、塗布膜の厚さの均一性が非常に
重要であるが、第3図および第4が多かった。
Incidentally, when applying a resist onto a semiconductor substrate by a spin coating method, uniformity of the thickness of the applied film is very important, and FIGS. 3 and 4 were the most common.

本願発明者は、前記塗布ムラの発生について鋭意研究の
結果、次のことを知見した。すなわち、ノズル4から滴
下される塗布剤5は、塗布剤5を貯えている図示しない
容器からノズル4に至る配管系のリークや途中に設けら
れているフィルタから発生するガスなどにより気泡が混
入していたり、また、ノズル4から被塗布材1に滴下し
たとき、この滴下によって滴下中心位置の近傍に、第4
図に示すような小さな気泡6が発生する。この気泡6は
、塗布剤5が被塗布材10表面に広げられ、その厚さが
気泡6の径より薄くなると破裂し、これによって第5図
に示したような塗布ムラを生ずる。そして、該気泡6が
被塗布材Iの回転中心の極く近傍にあるとき、この気泡
6が被塗布材1を高速回転させても最後まで被塗布材(
上に残り、スピンコートの最終段階近くで破裂し、前記
塗布ムラ7を生じてしまう。
The inventors of the present application have made the following findings as a result of intensive research on the occurrence of coating unevenness. That is, the coating agent 5 dripped from the nozzle 4 may be contaminated with air bubbles due to leaks in the piping system leading from the container (not shown) storing the coating agent 5 to the nozzle 4 or gas generated from a filter provided along the way. Also, when a drop is dropped from the nozzle 4 onto the material 1 to be coated, a fourth droplet is formed near the center position of the drop.
Small bubbles 6 as shown in the figure are generated. The bubbles 6 burst when the coating agent 5 is spread over the surface of the material 10 and the thickness thereof becomes thinner than the diameter of the bubbles 6, thereby causing uneven coating as shown in FIG. When the air bubbles 6 are located very close to the rotation center of the material I, the air bubbles 6 will keep the material (
It remains on the top and ruptures near the final stage of spin coating, resulting in the uneven coating 7.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、塗布剤を被塗布材の回転中心からずれた位置
に滴下させること、およびそのためのスピンコータにお
る。
The present invention relates to dropping a coating agent onto a position offset from the rotation center of a material to be coated, and a spin coater for this purpose.

〔作 用〕[For production]

塗布剤を被塗布材の回転中心からずれた位置に滴下させ
ると、気泡が前記回転中心の極く近傍に位置することは
はとんどなくなる。該回転中心から離れた位置にある気
泡は被塗布材の回転開始後、比較的早い時期に遠心力に
よって被塗布材上から外方へ飛び出し、気泡の破裂が問
題になるような厚さまで塗布膜が薄くなったときには被
塗布材上からほとんど気泡はなくなり、該気泡による塗
布膜の発生が大巾に減少する。
If the coating agent is dropped at a position offset from the rotation center of the material to be coated, air bubbles are unlikely to be located very close to the rotation center. Air bubbles located away from the center of rotation will be thrown out from the surface of the material due to centrifugal force at a relatively early stage after the material starts rotating, and the coating film will reach a thickness such that bubble bursting becomes a problem. When the coating material becomes thin, there are almost no air bubbles on the material to be coated, and the occurrence of a coating film due to the air bubbles is greatly reduced.

〔実施例〕〔Example〕

以下本発明の一実施例を示す第1図ないし第2図につい
て説明する。なお、前述した第3図ないし第4図と同一
部分には同一符号を用い、説明を一部省略する。第1図
に示すように、ノズル4の中心Bは被塗布材1の回転中
心Aから距離eだけずらせて配置されている。このノズ
ル4は元端側に図示しないビニールホースなどの可とう
性の配管を用いて移動可能に支持するか、まだはノズル
4金被塗布材1の回転中心Aから離れた位置を中心に旋
回可能に取付けることによ抄、前記距離eを適宜に調節
できるようになっている。
1 and 2 showing one embodiment of the present invention will be explained below. Note that the same parts as in FIGS. 3 and 4 described above are denoted by the same reference numerals, and some explanations will be omitted. As shown in FIG. 1, the center B of the nozzle 4 is offset from the rotation center A of the material 1 to be coated by a distance e. This nozzle 4 may be movably supported using flexible piping such as a vinyl hose (not shown) on the base end side, or the nozzle 4 may be rotated around a position away from the rotation center A of the gold coated material 1. The distance e can be adjusted as appropriate by attaching the distance e.

次いでこの装置による塗布作用を説明する。前記のよう
に偏心して位置させたノズル4から塗布剤5を被塗布材
1に滴下すると、滴下された塗布剤5は、第2図によく
表わされているように、被塗布材1の回転中心Aから偏
心した位置に略円形状に広がる。塗布剤5の滴下量は、
塗布剤5が回転中心Aを越えて反対側(第1.2図にお
いて左側)に所定置去がる量とする。
Next, the coating action by this device will be explained. When the coating agent 5 is dripped onto the material 1 to be coated from the nozzle 4 positioned eccentrically as described above, the dropped coating agent 5 will spread onto the material 1 to be coated, as clearly shown in FIG. It spreads in a substantially circular shape at a position eccentric from the rotation center A. The dropping amount of coating agent 5 is
A predetermined amount of the coating agent 5 is left on the opposite side (the left side in FIG. 1.2) beyond the center of rotation A.

このように塗布剤5を被塗布材1上に滴下すると、気泡
6は、第2図に示すように、回転中心Aからずれた位置
に生ずるようになる。
When the coating material 5 is dropped onto the material 1 to be coated in this way, the bubbles 6 will be generated at positions shifted from the center of rotation A, as shown in FIG.

次いで、スピンドル3を回転させると、気泡6は、回転
中心Aから離れており、この部分の塗布剤5は比較的大
きな遠心力を受けるため、該気泡6は塗布剤5と共に早
期に外方へ振り飛ばされ、塗布剤5が遠心力によって被
塗布剤10表面に薄く引き伸ばされた状態に々るときに
は、該気泡6は被塗布材l上からみくなっている。そこ
で、気泡6の破裂による塗布ムラの発生が大巾に減少す
る。
Next, when the spindle 3 is rotated, the air bubbles 6 are separated from the center of rotation A, and the coating agent 5 in this area is subjected to a relatively large centrifugal force, so that the air bubbles 6 together with the coating agent 5 move outward quickly. When the coating agent 5 is blown away and is spread thinly on the surface of the material 10 to be coated by centrifugal force, the air bubbles 6 are not visible from above the material 1 to be coated. Therefore, the occurrence of uneven coating due to the bursting of the bubbles 6 is greatly reduced.

前記回転中心Aとノズル4の中心Bとの距離eは、2馴
程度あれば、その効果が十分得られる。
The effect can be sufficiently obtained if the distance e between the rotation center A and the center B of the nozzle 4 is about 2 degrees.

なお、この距離eをあまり大きくすると、塗布剤50滴
下量を多くしなければならないので、10mm程度に止
めることが好ましい。
Note that if this distance e is made too large, the amount of 50 drops of coating agent must be increased, so it is preferable to keep it at about 10 mm.

〔発明の効果〕〔Effect of the invention〕

以上述べたように本発明によれば、被塗布材上に滴下さ
れた塗布剤中の気泡によって生ずる塗布ムラを大巾に減
少させ、極めて均一性のよい塗布膜を得ることができ、
半導体基板などへのレジスト塗布に対して非常に大きな
効果が得られる。
As described above, according to the present invention, it is possible to greatly reduce coating unevenness caused by air bubbles in a coating agent dropped onto a material to be coated, and to obtain a coating film with extremely good uniformity.
A very large effect can be obtained when applying resist to semiconductor substrates, etc.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す要部側面図、第2図は
第1図のノズルを省略した平面図、第3図は従来例を示
す要部側面図、第4図は第3図のノズルを省略した平面
図、第5図は従来例によってスピンコートした場合の塗
布ムラの発生状態を示す平面図である。 1・・・・・・被塗布材、 2・・・・・・チャック、
3・・・・・・スピンドル、  4・・・・・・ノズル
、5・・・・・・塗布剤、  6・・・・・気泡、  
7・・・・・・塗布ムラ。
Fig. 1 is a side view of the main part showing an embodiment of the present invention, Fig. 2 is a plan view with the nozzle of Fig. 1 omitted, Fig. 3 is a side view of the main part showing a conventional example, and Fig. FIG. 3 is a plan view with the nozzle omitted, and FIG. 5 is a plan view showing how uneven coating occurs when spin coating is performed by a conventional example. 1...material to be coated, 2...chuck,
3...Spindle, 4...Nozzle, 5...Coating agent, 6...Bubble,
7...Uneven coating.

Claims (1)

【特許請求の範囲】 1、被塗布材上に塗布剤を滴下し、該被塗布材を回転さ
せて塗布剤を被塗布材の表面に広げることにより塗布す
るスピンコートにおいて、塗布剤を被塗布材の回転中心
からずれた位置に滴下 することを特徴とする塗布ムラ 防止方法。 2、回転中心からのずれ量が2〜10mmであることを
特徴とする特許請求の範囲第1項記載の塗布ムラ防止方
法。 3、被塗布材が半導体基板であり、塗布剤がレジストで
あることを特徴とする特許請求の範囲第1または2項記
載の塗布ムラ防止方法。 4、被塗布材を保持するチャックと、同チャックを取付
け回転を与えられるスピンドルと、前記チャックに対向
して設けられた塗布剤滴下用のノズルからなるスピンコ
ータにおいて、前記ノズルをスピンドルの回転中心から
ずらせて配置したことを特徴とするスピンコータ。 5、ノズルがスピンドルの半径方向へ移動可能に取付け
られていることを特徴とする特許請求の範囲第4項記載
のスピンコータ。
[Scope of Claims] 1. In spin coating, in which a coating agent is applied dropwise onto a material to be coated and the material is rotated to spread the coating agent over the surface of the material to be coated, A method for preventing uneven coating that is characterized by applying drops at a position offset from the center of rotation of the material. 2. The method for preventing uneven coating according to claim 1, wherein the amount of deviation from the center of rotation is 2 to 10 mm. 3. The method for preventing uneven coating according to claim 1 or 2, wherein the material to be coated is a semiconductor substrate and the coating agent is a resist. 4. In a spin coater consisting of a chuck that holds a material to be coated, a spindle to which the chuck is attached and rotated, and a nozzle for dropping a coating agent provided opposite to the chuck, the nozzle is moved from the center of rotation of the spindle. A spin coater characterized by being arranged in a staggered manner. 5. The spin coater according to claim 4, wherein the nozzle is mounted so as to be movable in the radial direction of the spindle.
JP8563985A 1985-04-22 1985-04-22 Prevention of uneven spin coating and spin coater Pending JPS61244029A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8563985A JPS61244029A (en) 1985-04-22 1985-04-22 Prevention of uneven spin coating and spin coater

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8563985A JPS61244029A (en) 1985-04-22 1985-04-22 Prevention of uneven spin coating and spin coater

Publications (1)

Publication Number Publication Date
JPS61244029A true JPS61244029A (en) 1986-10-30

Family

ID=13864396

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8563985A Pending JPS61244029A (en) 1985-04-22 1985-04-22 Prevention of uneven spin coating and spin coater

Country Status (1)

Country Link
JP (1) JPS61244029A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007013540A1 (en) * 2005-07-28 2007-02-01 Hoya Corporation Mask blank fabrication method and exposure mask fabrication method
JP2013171987A (en) * 2012-02-21 2013-09-02 Tokyo Electron Ltd Coating processing method and coating processor

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS572159B2 (en) * 1974-07-05 1982-01-14
JPS57130570A (en) * 1981-02-04 1982-08-13 Hitachi Ltd Spinner coating method and apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS572159B2 (en) * 1974-07-05 1982-01-14
JPS57130570A (en) * 1981-02-04 1982-08-13 Hitachi Ltd Spinner coating method and apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007013540A1 (en) * 2005-07-28 2007-02-01 Hoya Corporation Mask blank fabrication method and exposure mask fabrication method
JP2007058200A (en) * 2005-07-28 2007-03-08 Hoya Corp Mask blank manufacturing method and exposure mask manufacturing method
JP2013171987A (en) * 2012-02-21 2013-09-02 Tokyo Electron Ltd Coating processing method and coating processor

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