JPS6123976A - Testing method of subscriber circuit - Google Patents

Testing method of subscriber circuit

Info

Publication number
JPS6123976A
JPS6123976A JP14424684A JP14424684A JPS6123976A JP S6123976 A JPS6123976 A JP S6123976A JP 14424684 A JP14424684 A JP 14424684A JP 14424684 A JP14424684 A JP 14424684A JP S6123976 A JPS6123976 A JP S6123976A
Authority
JP
Japan
Prior art keywords
circuit
subscriber
subscriber circuit
frequency
selectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14424684A
Other languages
Japanese (ja)
Inventor
Hisaki Mie
三重 久樹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP14424684A priority Critical patent/JPS6123976A/en
Publication of JPS6123976A publication Critical patent/JPS6123976A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To shorten the transmission characteristic measurement time of a subscriber circuit by applying signals of plural frequencies at the same time. CONSTITUTION:Respective frequency signals f1-fn from oscillators 11-1n are put together by a circuit 7 and the composite signal is applied to 2W sides of subscriber circuits 41-4n. Then 4w sides of the circuits 41-4n are connected to respective selectors 8 on multiple basis and outputs of the selectors 8 are passed through D/A converters 5 and then filters 91-9n corresponding to respective frequencies, and measured by selection level meters 61-6n. Therefore, the frequency need not be varied according to a measurement point and a response wait time is shortened.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は加入者回路パッケージの伝送特性を測定する方
法に関するものであるO 〔発明の背景〕 従来の加入者回路パッケージの伝送特性の測定回路は、
第1図に示すように1つの発振器1で信号印加し、1つ
の選択レベルメータ6で測定していた。この方法では加
入者回路パッケージへの直流印加時および1つの発振器
で信号印加するため、信号印加時の過渡応答時間が多大
にかかり測定時間が長くなる場合がある。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a method for measuring the transmission characteristics of a subscriber circuit package. [Background of the Invention] A conventional measurement circuit for measuring the transmission characteristics of a subscriber circuit package is ,
As shown in FIG. 1, one oscillator 1 was used to apply a signal, and one selected level meter 6 was used for measurement. In this method, since a DC signal is applied to the subscriber circuit package and a signal is applied using one oscillator, a transient response time when applying a signal is required, which may result in a long measurement time.

〔発明の目的〕[Purpose of the invention]

本発明の目的は上記した従来技術の欠点を改善するもの
で、複数周波数を印加し、それぞれの周波数に対応した
伝送特性を同時に測定することを提供することにある@ 〔発明の概要〕 本発明は、加入者回路パッケージの伝送特性測定回路に
おいて、複数の発振器出力を合成する回路、加入者回路
PKGの2W側を複式接続する回路と負荷、セレクタ、
複数の選択レベルメータからなり、同時に複数周波数を
印加し、それぞれの周波数に対応した伝送特性を同時に
測定することを特徴とするものである。
The purpose of the present invention is to improve the drawbacks of the prior art described above, and to provide a method for applying multiple frequencies and simultaneously measuring transmission characteristics corresponding to each frequency. In the transmission characteristic measurement circuit of the subscriber circuit package, there is a circuit that combines multiple oscillator outputs, a circuit that connects the 2W side of the subscriber circuit PKG, a load, a selector,
It is characterized by consisting of a plurality of selective level meters, applying a plurality of frequencies at the same time, and simultaneously measuring the transmission characteristics corresponding to each frequency.

〔発明の実施例〕[Embodiments of the invention]

本発明の実施例を第2図を参照して説明する。 An embodiment of the present invention will be described with reference to FIG.

7、〜7nはそれぞれf、−fnの周波数信号を出力す
る発振器で8はこれらの周波数信号を合成する回路であ
る。この周波数信号合成回路8で合成された信号はそれ
ぞれ加入者回路パッケージ41〜4nの2W[llに印
加される。加入者回路パッケージ4.〜4nの4W側は
マルチにセレクタ5にそれぞれ接続されセレクタ5の出
力はそれぞれD/A変換機5を介してそれぞれの周波数
に対応したフィルタ11.〜1inを介し注目する周波
′I!I成分を出力させ選択レベル計6.〜6nで測定
する。
Reference numerals 7 and 7n are oscillators that output frequency signals of f and -fn, respectively, and 8 is a circuit that synthesizes these frequency signals. The signals synthesized by this frequency signal synthesis circuit 8 are applied to 2W[ll of subscriber circuit packages 41 to 4n, respectively. Subscriber circuit package 4. The 4W sides of 4n to 4n are connected to selectors 5 in multiple ways, and the outputs of the selectors 5 are sent via D/A converters 5 to filters 11 . The frequency of interest 'I! through ~1in! Output the I component and select a level meter6. Measured at ~6n.

従って周波数を測定ポイントにあわせて変更する必要は
なく応答待時間を短かくできる。
Therefore, there is no need to change the frequency according to the measurement point, and the response waiting time can be shortened.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば同時に複数周波数
印加し同時に測定できるので、加入者回路パッケージの
伝送特性測定時間をいちじるしく減少させることができ
る・
As explained above, according to the present invention, since multiple frequencies can be simultaneously applied and measured, the time required to measure the transmission characteristics of subscriber circuit packages can be significantly reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の測定法を説明するブロック図、第2図は
本発明の一実施例のブロック図である。 1.11〜1n:発振器、  2:コンデン゛す、5:
直流重畳回路、 4.41〜4n:加入者回路パッケージ、6.61〜6
n:選択レベル計、 7:周波数合成回路・ 8:セレクタ、 91〜9n:フィルタ。
FIG. 1 is a block diagram illustrating a conventional measurement method, and FIG. 2 is a block diagram of an embodiment of the present invention. 1.11~1n: Oscillator, 2: Capacitor, 5:
DC superimposition circuit, 4.41~4n: Subscriber circuit package, 6.61~6
n: selection level meter, 7: frequency synthesis circuit, 8: selector, 91 to 9n: filter.

Claims (1)

【特許請求の範囲】[Claims] 1、加入者回路パッケージの伝送特性測定回路において
、複数の発振器出力を合成する回路、加入者回路PKG
の2W側を複式接続する回路と負荷、セレクタ、複数の
選択レベルメータからなり、同時に複数周波数を印加し
、それぞれの周波数に対応した伝送特性を同時に測定す
ることを特徴とする加入者回路試験法。
1. In the transmission characteristic measurement circuit of the subscriber circuit package, the subscriber circuit PKG is a circuit that synthesizes multiple oscillator outputs.
A subscriber circuit testing method consisting of a circuit that double-connects the 2W side of the circuit, a load, a selector, and a plurality of selection level meters, which simultaneously applies multiple frequencies and simultaneously measures the transmission characteristics corresponding to each frequency. .
JP14424684A 1984-07-13 1984-07-13 Testing method of subscriber circuit Pending JPS6123976A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14424684A JPS6123976A (en) 1984-07-13 1984-07-13 Testing method of subscriber circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14424684A JPS6123976A (en) 1984-07-13 1984-07-13 Testing method of subscriber circuit

Publications (1)

Publication Number Publication Date
JPS6123976A true JPS6123976A (en) 1986-02-01

Family

ID=15357635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14424684A Pending JPS6123976A (en) 1984-07-13 1984-07-13 Testing method of subscriber circuit

Country Status (1)

Country Link
JP (1) JPS6123976A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010246108A (en) * 2009-03-30 2010-10-28 Advantest Corp Transmission characteristic measurement apparatus, transmission characteristic measurement method, and electronic device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010246108A (en) * 2009-03-30 2010-10-28 Advantest Corp Transmission characteristic measurement apparatus, transmission characteristic measurement method, and electronic device

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