JPS61227169A - Sputtering device - Google Patents

Sputtering device

Info

Publication number
JPS61227169A
JPS61227169A JP6713585A JP6713585A JPS61227169A JP S61227169 A JPS61227169 A JP S61227169A JP 6713585 A JP6713585 A JP 6713585A JP 6713585 A JP6713585 A JP 6713585A JP S61227169 A JPS61227169 A JP S61227169A
Authority
JP
Japan
Prior art keywords
substrate
susceptor
cooling
block
substrate support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6713585A
Other languages
Japanese (ja)
Inventor
Junzo Toda
戸田 順三
Naoyuki Yamamoto
山本 尚之
Hitoshi Takagi
均 高木
Kazuo Kobayashi
和雄 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP6713585A priority Critical patent/JPS61227169A/en
Publication of JPS61227169A publication Critical patent/JPS61227169A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To quickly and efficiently cool a substrate susceptor of a high temp. after film formation and to improve film forming efficiency by installing a cooling block having a water cooling means and high heat capacity on the rear side of the substrate susceptor and moving the susceptor after film formation so as to contact with said block. CONSTITUTION:This sputtering device forms a film on a substrate 8 supported by a substrate susceptor 5 in a vacuum vessel 1 provided with a discharge device 2 by heating the substrate 8 to about 300 deg.C by an electric heater 6 and sputtering a target 3 on a target support 4. The cooling block 2 having the water cooling means such as water cooling pipe 22 and having high heat capacity is installed on the rear side of the susceptor 5 of the above-mentioned sputtering device and the susceptor 5 is provided in such a manner that the susceptor can be pressed to and parted from the block 21 by an operating mechanism 23 for moving the susceptor. The susceptor 5 of the high temp. after the film formation is moved to contact with the block 21 to cool the substrate 8 to about 150 deg.C without natural cooling and is cooled to the room temp. with a water cooling hose 7 in the susceptor 5, then the substrate is taken out.

Description

【発明の詳細な説明】 〔柵 要〕 スパッタリング法により基板上にターゲット物質からな
る薄膜を形成するスパッタリング装置において、基板を
支持した基板支持体の背面側真空容器の器壁に水冷手段
を有する高熱容量の冷却用ブロックを設置すると共に、
前記基板支持体を該冷却用ブロックに当接・離間可能と
し、成膜後の高温な基板支持体を前記冷却用ブロックへ
移動当接せしめて、前記基板を室温に効率良く冷却し、
短時間で真空容器外へ取出すことを可能にして生産性の
向上を図ったものである。
[Detailed Description of the Invention] [Fence Required] In a sputtering apparatus that forms a thin film of a target material on a substrate by a sputtering method, a high-temperature device having a water cooling means on the wall of a vacuum container on the back side of a substrate support that supports a substrate is used. Along with installing a capacity cooling block,
The substrate support can be brought into contact with and separated from the cooling block, and the high temperature substrate support after film formation is moved and brought into contact with the cooling block to efficiently cool the substrate to room temperature,
This is intended to improve productivity by making it possible to take it out of the vacuum container in a short time.

〔産業上の利用分野〕[Industrial application field]

本発明はスパッタリング法により基板上にターゲット物
質からなる薄膜を形成するスパッタリング装置に係り、
侍に成膜後の高温な基板支持体を短時間に効率良く冷却
し得るようにした装置構成の改良に関するものである。
The present invention relates to a sputtering apparatus for forming a thin film made of a target material on a substrate by a sputtering method,
This invention relates to an improvement in the configuration of an apparatus that can efficiently cool a high-temperature substrate support in a short time after film formation.

スパッタリング法により基板上にターゲット物質からな
る薄膜を形成するスパッタリング装置は半導体装置や磁
気記録媒体の製造の分野において広く用いられており、
種々の装置構成のものが既に提案されている。
Sputtering equipment, which forms a thin film of a target material on a substrate using a sputtering method, is widely used in the field of manufacturing semiconductor devices and magnetic recording media.
Various device configurations have already been proposed.

一般にスパッタリング装置によって基板上に薄膜を形成
する場合、基板に対する薄膜の密着性及び膜質等を向上
させるために該基板温度を数百度程度にした状態でスパ
ッタリングを行うことが多い。この際、成膜後の高温な
基板支持体は容易に冷えず、該基板支持体上の成膜され
た基板を装置内より外部に゛取出すまでに長時間を要す
る問題があり、このような問題点を解消して成膜効率を
向上することが要望されている。
Generally, when forming a thin film on a substrate using a sputtering apparatus, sputtering is often performed at a substrate temperature of about several hundred degrees in order to improve the adhesion and film quality of the thin film to the substrate. At this time, there is a problem that the hot substrate support after film formation does not cool down easily, and it takes a long time to take out the film-formed substrate on the substrate support from the inside of the apparatus. It is desired to solve the problems and improve the film formation efficiency.

〔従来の技術〕[Conventional technology]

上記のような従来のスパッタリング装置は、第3図に示
すように排気装置2が付設された真空容器1内に、ター
ゲット3が取付けられたターゲット支持体4と、それに
対向して薄膜を形成すべき基板8を支持した基板支持体
5が配置されている。
As shown in FIG. 3, the conventional sputtering apparatus described above has a target support 4 on which a target 3 is attached, and a thin film is formed on the target support 4 in a vacuum vessel 1 equipped with an exhaust device 2, as shown in FIG. A substrate support 5 supporting a substrate 8 to be processed is disposed.

また該基板支持体5には、基板8を加熱するための電熱
ヒータ6と加熱された基板8を冷却するための水冷蛇管
7が内蔵されている。
Further, the substrate support 5 has built-in an electric heater 6 for heating the substrate 8 and a water-cooled corrugated pipe 7 for cooling the heated substrate 8.

そしてこのようなスパッタリング装置を用いて基板を3
00℃程度に加熱して、該基板8上に薄膜を形成した後
、該基板8を室温まで下げて真空容器1外へ取り出す場
合、該基板8の温度を少なくとも150℃程度に迄自然
放冷した後、基板支持体5に内蔵された水冷蛇管7に冷
却水を流して冷却し、基板を略室温の状態で真空容器1
外へ取り出している。
Then, using this kind of sputtering equipment, the substrate is
After forming a thin film on the substrate 8 by heating it to about 00°C, when the substrate 8 is lowered to room temperature and taken out of the vacuum container 1, the temperature of the substrate 8 is naturally cooled to at least about 150°C. After that, the substrate is cooled by flowing cooling water through the water-cooled corrugated tube 7 built into the substrate support 5, and the substrate is placed in the vacuum container 1 at approximately room temperature.
I'm taking it outside.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記のような基板冷却の方法を用いる所以は、成膜後3
00℃程度の温度にある基板支持体5に内蔵された水冷
蛇管7に、いきなり冷却水を流入させると、その際の熱
収縮衝撃や発生する急増高圧水蒸気等により、該水冷蛇
管7が破損する等の障害を避けるためである。
The reason for using the above substrate cooling method is that
If cooling water is suddenly allowed to flow into the water-cooled corrugated tube 7 built into the substrate support 5 which is at a temperature of about 0.000 C., the water-cooled corrugated tube 7 will be damaged due to the thermal shrinkage shock and rapidly generated high-pressure steam. This is to avoid problems such as

このようなことから基板8を含む基板支持体5を150
℃程度に迄自然放冷するのに長時間(少なくとも5〜6
時間程度)を必要とし、これに起因してこれら装置での
単位時間当たりの成膜処理数が低く制限される欠点があ
った。
For this reason, the substrate support 5 including the substrate 8 is
It takes a long time (at least 5 to 6 degrees Celsius) to let it cool down naturally to about
This has the drawback that the number of film formation processes per unit time in these apparatuses is limited to a low number due to this.

本発明は上記のような問題点に鑑みてなされたもので、
その目的とするところは、成膜後の基板8を含む基板支
持体5の降温に自然放冷を用いずに、簡単な冷却手段に
より短時間に効率良く冷却することを可能にしたスパッ
タリング装置を提供することにある。
The present invention was made in view of the above-mentioned problems.
The purpose is to develop a sputtering device that can efficiently cool down the substrate support 5 including the substrate 8 after film formation in a short time using a simple cooling method without using natural cooling. It is about providing.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は上記目的を達成するため、第1図に示すように
、真空容器1内のターゲット3と対向配置した基板支持
体5の背面側に、該基板支持体5と同心ドーナツ形状で
、かつ渦巻き状水冷パイプ22からなる冷却手段を備え
た高熱容量の冷却用ブロック21を離間して設置し、該
基板支持体5は前記高熱容量の冷却用ブロック21に対
して当接、或いは離間するように移動操作可能に構成さ
れている。
In order to achieve the above object, as shown in FIG. A high heat capacity cooling block 21 equipped with a cooling means consisting of a spiral water cooling pipe 22 is installed at a distance, and the substrate support 5 is in contact with or separated from the high heat capacity cooling block 21. It is configured so that it can be moved.

〔作 用〕[For production]

このような装置構成においては、成膜後の基板8を含む
高温な基板支持体5を移動操作機構23により、その背
面側に離間して設置された渦巻き状水冷パイプ22から
なる水冷手段を備えた冷却用ブロック21の方向に移動
して当接させた状態にすることにより、前記基板支持体
5の熱放散が促進され、室温に低下させる所要時間を大
幅に短縮することが可能となる。
In such an apparatus configuration, the high-temperature substrate support 5 containing the substrate 8 after film formation is moved by the movement operation mechanism 23, and is equipped with a water cooling means consisting of a spiral water cooling pipe 22 installed at a distance on the back side thereof. By moving in the direction of the cooling block 21 and bringing it into contact with the cooling block 21, heat dissipation of the substrate support 5 is promoted, and the time required for cooling the substrate support 5 to room temperature can be significantly shortened.

〔実施例〕〔Example〕

以下図面を用いて本発明の実施例について詳細に説明す
る。
Embodiments of the present invention will be described in detail below with reference to the drawings.

第1図は本発明に係るスパッタリング装置の一実施例を
示す断面図である。
FIG. 1 is a sectional view showing an embodiment of a sputtering apparatus according to the present invention.

図において、1は排気装置2が付設された真空容器1.
4は該ターゲット3が取付けられたターゲット支持体で
あり、該ターゲット支持体4に対向して基板加熱用の電
熱ヒータ6と基板冷却用の水冷蛇管7が内蔵され、かつ
薄膜を形成すべき基板8を支持した基板支持体5が配置
されている。
In the figure, reference numeral 1 denotes a vacuum vessel 1.
Reference numeral 4 denotes a target support to which the target 3 is attached, and a substrate on which a thin film is to be formed. A substrate support 5 supporting a substrate 8 is arranged.

該基板支持体5は移動操作機構23により上下動可能と
なっており、その背面側の真空容器lの壁部に該基板支
持体5ど同心ドーナツ形状で、かつ渦巻き状水冷パイプ
22を上面に備えた、例えば銅(Cu)、調合金製、或
いはステンレス製等の高熱容量の冷却用ブロック21が
図示のように設置された構成となっている。
The substrate support 5 can be moved up and down by a moving operation mechanism 23, and a concentric donut-shaped spiral water cooling pipe 22 is provided on the wall of the vacuum container l on the back side of the substrate support 5. A cooling block 21 having a high heat capacity made of copper (Cu), prepared alloy, or stainless steel is installed as shown in the figure.

尚、上記渦巻き状水冷パイプ22の替わりに放熱フィン
付きの電子冷却器を付設してもよい。
Incidentally, instead of the spiral water cooling pipe 22, an electronic cooler with radiation fins may be provided.

さて、次にこのような構成のスパッタリング装置の動作
を説明する。
Next, the operation of the sputtering apparatus having such a configuration will be explained.

先ず、前記冷却用ブロック21と離間された状態の基板
支持体5に支持された基板8を、該基板支持体5に内蔵
された電熱ヒータ6によって例えば300℃程度に加熱
してその加熱状態の基板8上にスパッタリングを行って
所定膜厚の薄膜を被着形成する。
First, the substrate 8 supported by the substrate support 5 in a state separated from the cooling block 21 is heated to, for example, about 300° C. by the electric heater 6 built in the substrate support 5, and the heated state is maintained. A thin film having a predetermined thickness is deposited on the substrate 8 by sputtering.

次に成膜後の基板加熱を止めて該基板8を含む高温な基
板支持体5を移動操作機構23により、その背面側に離
間設置され、かつ予め水冷されてなる前記冷却用ブロッ
ク21側へ移動して当接させた状態とする。
Next, the heating of the substrate after film formation is stopped, and the high temperature substrate support 5 including the substrate 8 is moved by the operation mechanism 23 to the cooling block 21, which is installed at a distance on the back side thereof and is cooled with water in advance. Move and bring them into contact.

このようにすれば、該基板支持体5の熱は背面から当接
した前記冷却用ブロック21を介して急速に真空容器l
外へ放散され、冷却が促進されることから約150℃程
度に降温する時間が、従来より略半減される。その後こ
れと平行して基板支持体5に内蔵された水冷蛇管7にも
冷却水を流して冷却することにより前記基板8の冷却時
間を著しく短縮することが可能となる。従って基板8を
略室温の状態で真空容器1外へ従来の冷却時間よりも略
半減させた短時間で取出すことができ、生産性が向上す
る。
In this way, the heat of the substrate support 5 is rapidly transferred to the vacuum vessel through the cooling block 21 that comes into contact with it from the back side.
Since the heat is dissipated to the outside and cooling is promoted, the time required for the temperature to drop to approximately 150° C. is reduced by approximately half compared to the conventional method. Thereafter, by cooling the water-cooled corrugated tube 7 built in the substrate support 5 by flowing cooling water in parallel thereto, it becomes possible to significantly shorten the cooling time of the substrate 8. Therefore, the substrate 8 can be taken out of the vacuum container 1 at approximately room temperature in a short time that is approximately half the cooling time required in the prior art, improving productivity.

尚、以上の実施例では前記冷却用ブロック21の渦巻き
状水冷パイプ22が該冷却用ブロック21の上面に付設
され、かつ該冷却用ブロック21と基板支持体5との当
接面が平面状である場合の例について説明したが、本発
明の構成はこの例に限定されるものではなく、例えば第
2図に示すように渦巻き状水冷パイプ22を冷却用ブロ
ック21に内蔵すると共に、該冷却用ブロック21と基
板支持体5との当接面21aと58を相互に嵌合する凹
凸面状にして、相互の接触面積を大きくした構成とする
ようにしてもよく、この場合も同様の効果が得られる。
In the above embodiment, the spiral water cooling pipe 22 of the cooling block 21 is attached to the upper surface of the cooling block 21, and the contact surface between the cooling block 21 and the substrate support 5 is flat. Although a certain example has been described, the configuration of the present invention is not limited to this example. For example, as shown in FIG. The abutment surfaces 21a and 58 of the block 21 and the substrate support 5 may be formed into uneven surfaces that fit into each other to increase the mutual contact area, and the same effect can be obtained in this case as well. can get.

〔発明の効果〕〔Effect of the invention〕

以上の説明から明らかなように、本発明に係るスパッタ
リング装置によれば、渦巻き状水冷パイプ等からなる冷
却手段を備えた高熱容量の冷却用ブロックにより、成膜
後の高温な基板の冷却が促進され、該基板を略室温の状
態にして真空容器外へ取出す冷却時間を従来よりも大幅
に短縮することが可能となり、当該装置による成膜工程
の生産性を大きく向上させることができる優れた効果を
奏する。
As is clear from the above description, according to the sputtering apparatus according to the present invention, cooling of a high-temperature substrate after film formation is facilitated by a high heat capacity cooling block equipped with a cooling means such as a spiral water-cooled pipe. This makes it possible to significantly shorten the cooling time for bringing the substrate to approximately room temperature and taking it out of the vacuum container compared to the conventional method, which has an excellent effect of greatly improving the productivity of the film forming process using this device. play.

従って、この種のスパッタリング装置に通用して実用上
極めて有利である。
Therefore, it is applicable to this type of sputtering apparatus and is extremely advantageous in practice.

【図面の簡単な説明】 第1図は本発明に係るスパッタリング装置の一実施例を
示す断面図、 第2図は本発明に係るスパッタリング装置の他の実施例
を説明するための要部断面図、第3図は従来のスパッタ
リング装置を説明する丸めの断面図である。 第1図乃至第2図において、 ■は真空容器、3はターゲット、5は基板支持体、6は
電熱ヒーター、7は水冷管、8は基板、21は冷却用ブ
ロック、22は渦巻き状水冷パイプ、23は移動操作機
構をそれぞれ示す。 III  圀 u=slffi槙八“を置棚)へ口 第3図
[BRIEF DESCRIPTION OF THE DRAWINGS] Fig. 1 is a cross-sectional view showing one embodiment of a sputtering apparatus according to the present invention, and Fig. 2 is a cross-sectional view of essential parts for explaining another embodiment of the sputtering apparatus according to the present invention. , FIG. 3 is a rounded cross-sectional view illustrating a conventional sputtering apparatus. In Figures 1 and 2, (2) is a vacuum vessel, 3 is a target, 5 is a substrate support, 6 is an electric heater, 7 is a water cooling tube, 8 is a substrate, 21 is a cooling block, and 22 is a spiral water cooling pipe. , 23 indicate moving operation mechanisms, respectively. III 圀u=slffi Makihachi” on the shelf) Figure 3

Claims (1)

【特許請求の範囲】[Claims] 真空容器(1)内にターゲット(3)と、これに対向し
て基板(8)を支持した基板支持体(5)が配置され、
該真空容器(1)内をスパッタ用ガス雰囲気にした状態
で基板(8)上にターゲット物質をスパッタリングによ
り被着形成する装置構成において、上記基板支持体(5
)の背面側に水冷手段を有する高熱容量の冷却用ブロッ
ク(21)を設置すると共に、前記基板支持体(5)を
該冷却用ブロック(21)に対して当接、または離間で
きるように設けたことを特徴とするスパッタリング装置
A target (3) and a substrate support (5) supporting a substrate (8) facing the target (3) are arranged in a vacuum container (1),
In an apparatus configuration in which a target material is deposited on the substrate (8) by sputtering while the inside of the vacuum container (1) is in a sputtering gas atmosphere, the substrate support (5)
) is provided with a high heat capacity cooling block (21) having a water cooling means on the back side of the cooling block (21), and the substrate support (5) is provided so as to be able to come into contact with or be separated from the cooling block (21). A sputtering device characterized by:
JP6713585A 1985-03-29 1985-03-29 Sputtering device Pending JPS61227169A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6713585A JPS61227169A (en) 1985-03-29 1985-03-29 Sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6713585A JPS61227169A (en) 1985-03-29 1985-03-29 Sputtering device

Publications (1)

Publication Number Publication Date
JPS61227169A true JPS61227169A (en) 1986-10-09

Family

ID=13336151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6713585A Pending JPS61227169A (en) 1985-03-29 1985-03-29 Sputtering device

Country Status (1)

Country Link
JP (1) JPS61227169A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6417863A (en) * 1987-07-14 1989-01-20 Nippon Steel Corp Work-cooling device for ion implantation equipment
JPS6418730U (en) * 1987-07-23 1989-01-30
JPH02107767A (en) * 1988-10-15 1990-04-19 Nippon Biitec:Kk Base plate holding device for vacuum deposition
JPH0463266A (en) * 1990-06-30 1992-02-28 Sukegawa Electric Co Ltd Vacuum heater
US5228940A (en) * 1990-10-03 1993-07-20 Mitsubishi Denki Kabushiki Kaisha Fine pattern forming apparatus
CN111850501A (en) * 2020-07-20 2020-10-30 江苏集萃有机光电技术研究所有限公司 Substrate frame structure and vacuum evaporation device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6417863A (en) * 1987-07-14 1989-01-20 Nippon Steel Corp Work-cooling device for ion implantation equipment
JPH0434624B2 (en) * 1987-07-14 1992-06-08 Shinnippon Seitetsu Kk
JPS6418730U (en) * 1987-07-23 1989-01-30
JPH02107767A (en) * 1988-10-15 1990-04-19 Nippon Biitec:Kk Base plate holding device for vacuum deposition
JPH0463266A (en) * 1990-06-30 1992-02-28 Sukegawa Electric Co Ltd Vacuum heater
US5228940A (en) * 1990-10-03 1993-07-20 Mitsubishi Denki Kabushiki Kaisha Fine pattern forming apparatus
US5292401A (en) * 1990-10-03 1994-03-08 Mitsubishi Denki Kabushiki Kaisha Method of forming a fine pattern
CN111850501A (en) * 2020-07-20 2020-10-30 江苏集萃有机光电技术研究所有限公司 Substrate frame structure and vacuum evaporation device

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