JPS61223632A - Measuring device measuring grain size and grain size distribution of grain - Google Patents
Measuring device measuring grain size and grain size distribution of grainInfo
- Publication number
- JPS61223632A JPS61223632A JP61059628A JP5962886A JPS61223632A JP S61223632 A JPS61223632 A JP S61223632A JP 61059628 A JP61059628 A JP 61059628A JP 5962886 A JP5962886 A JP 5962886A JP S61223632 A JPS61223632 A JP S61223632A
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- sensor
- measuring device
- particles
- particle size
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009826 distribution Methods 0.000 title claims description 13
- 239000002245 particle Substances 0.000 claims description 40
- 238000000034 method Methods 0.000 claims description 10
- 238000011156 evaluation Methods 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims description 4
- 238000005286 illumination Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 9
- 238000004458 analytical method Methods 0.000 description 3
- 238000004062 sedimentation Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 239000012798 spherical particle Substances 0.000 description 2
- 229920000426 Microplastic Polymers 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000002296 dynamic light scattering Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000003337 fertilizer Substances 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000007873 sieving Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- G01N15/1433—
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Electro-optical investigation, e.g. flow cytometers
- G01N15/1456—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
- G01N15/1459—Electro-optical investigation, e.g. flow cytometers without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals the analysis being performed on a sample stream
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Electro-optical investigation, e.g. flow cytometers
- G01N2015/1486—Counting the particles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/10—Investigating individual particles
- G01N15/14—Electro-optical investigation, e.g. flow cytometers
- G01N2015/1493—Particle size
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、製品流内の粒子の粒度分布を測定するための
装置に関する。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to an apparatus for measuring the particle size distribution of particles in a product stream.
従来の技術
多数の生産プロセスでは、品質管理のための粒度分布を
測定することが必要である。最適な結果は、粒度分布の
測定を高速でかつ製品流から連続的にサンプルを取出し
ながら実施することができる際に達成される。主として
、4種類の測定原理が公知である。BACKGROUND OF THE INVENTION In many production processes, it is necessary to measure particle size distribution for quality control purposes. Optimal results are achieved when particle size distribution measurements can be performed at high speed and with continuous sample removal from the product stream. Mainly, four types of measurement principles are known.
■】 ふるい及び空気分級
2)沈降
3)計数法
4)光学的方法
適用すべき測定法の選択は、分析すべき製品の大きさ及
び性質によって決定される。個々の方法は、その使用分
野及び必要な技術的費用によって異なる。■] Sieve and air classification 2) Sedimentation 3) Counting method 4) Optical method The choice of the measuring method to be applied is determined by the size and nature of the product to be analyzed. The individual methods differ depending on their field of use and the required technical outlay.
ふるい分けによる粒子の形態上の分離は、広範囲内で粒
度分布の受容を許容する。この場合には、。Morphological separation of particles by sieving allows acceptance of particle size distributions within a wide range. In this case.
以下のことが欠点である:
1)粒子が球状の形態を有していない限り、優先方向に
よる測定誤差が生じる。The following are disadvantages: 1) Unless the particles have a spherical morphology, measurement errors due to the preferred direction occur.
2)シーブメツシュの目詰りが起る。2) Clogging of the sheave mesh occurs.
3)シーブ被膜及び製品が摩耗する。3) The sieve coating and product wear out.
4)網目組織に許容差が存在する。4) Tolerance exists in the network structure.
5ノ 全分布に対して測定点が極めて小さい。5. Measurement points are extremely small compared to the entire distribution.
6)連続的測定のための大きな技術的費用がかかる。6) High technical outlay for continuous measurements.
空気分級は物理的分離法として密度、ガス温度及び粒子
形に左右される。この場合も、全分布を記録すべき限り
、極めて大きな費用がかかる。Air classification is a physical separation method that depends on density, gas temperature and particle shape. Again, this is extremely expensive, as long as the entire distribution has to be recorded.
沈降法は特に粒度範囲<50μm内の粒子分析のために
使用される。沈降法は例えば鉱石、石炭及び砂利工業に
おいて大規模に分級するために役立つが、しかしながら
生産される製品の分析のために役立たない。Sedimentation methods are used in particular for particle analysis within the particle size range <50 μm. Sedimentation methods are useful for large-scale classification, for example in the ore, coal and gravel industries, but are not useful, however, for the analysis of the products produced.
計数法及び光学的方法、例えば光子相関分光分析法又は
イメージ分析法は、0.05μm以上の寸法を有する粒
度のために適当である。しかしながら、この場合には以
下の点が欠点として挙げられる=1)その都度使用され
ろ装置の測定範囲が極めて狭く制限されている。Counting and optical methods, such as photon correlation spectroscopy or image analysis, are suitable for particle sizes with dimensions of 0.05 μm or more. However, in this case, the following points are listed as disadvantages: 1) The measurement range of the device used each time is extremely narrowly limited.
2)調製費用が高くかつサンプル調製に対する要求が高
い。2) High preparation costs and high requirements for sample preparation.
3)液体中に分散する。3) Disperse in liquid.
4)連続的測定のために高い技術的費用がかかる。4) High technical costs due to continuous measurements.
発明が解決しようとする問題点
従来の通常の測定法の前記欠点を排除するために、本発
明の課題は、製品流からの連続的サンプル取出しのため
に使用可能である、粒子の粒度及び粒度分布を測定する
技術的にできるだけ簡単な測定装置を開発することであ
った。新規測定装置は特に以下の要求を満足すべきであ
る:1)接触しない、摩耗の生じない測定
2)非球状粒子において優先方向による誤差が生じない
。Problem to be Solved by the Invention In order to eliminate the above-mentioned drawbacks of conventional conventional measuring methods, the object of the invention is to determine the particle size and granularity of particles, which can be used for continuous sampling from a product stream. The aim was to develop a technically simple measuring device for measuring the distribution. The new measuring device should in particular satisfy the following requirements: 1) Contact-free, wear-free measurement 2) No errors due to preferred direction in non-spherical particles.
3)高いサンプル通過量
4)高速の、コンピュータを利用し赴評価5)振動及び
ダストに対する不感性
問題点を解決するための手段
前記課題は、本発明により、粒子の個別化装置7.8と
、該個別化装置の後方に配置され、かつ側面にセンサ1
2が配置された測定通路10かも成る測定セル9と、上
記センサに引続いた粒度及び粒度分布を測定するための
評価装置16とから構成されていることを特徴とする、
粒度及び粒度分布を測定する測定装置によって解決され
る。3) High sample throughput 4) Fast, computer-aided on-site evaluation 5) Means for solving the problems of insensitivity to vibration and dust , placed at the rear of the individualization device, and with a sensor 1 on the side.
characterized in that it consists of a measuring cell 9, which also comprises a measuring channel 10 in which a particle 2 is arranged, and an evaluation device 16 for measuring the particle size and particle size distribution following the sensor,
The problem is solved by a measuring device that measures particle size and particle size distribution.
実施例
次に本発明による測定装置の詳細及び有利な構成を図示
の実施例につき説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS The details and advantageous configurations of the measuring device according to the invention will now be explained with reference to the exemplary embodiments shown.
搬送装置1によって搬送された粒状物の製品流から、連
続的に、又は規則に繰返されろ時間間隔でサンプル3が
取出される。この取出しは例えば長手方向にスリットが
設けられかつ周期的に製品流によって運動せしめられる
管4によって行われる。サンプルは搬送路5及び該搬送
路に引続いたホッパ6を介して2つの相前後して配置さ
れた、サンプルの粒子の個別化及び搬送を行うための振
動ホッパ7及び8上に達する。個別化はもちろん別の適
当な装置、例えば回転管型サンプル分配器によって実施
することもできる。両者の振動トラフは、個々の粒子間
で搬送方向で間隔が生じるように、種々異なった搬送速
度で運転される。Samples 3 are taken continuously or at regularly repeated time intervals from the product stream of granulate transported by the transport device 1 . This removal takes place, for example, by means of a tube 4 which is provided with a longitudinal slit and which is periodically moved by the product stream. The sample reaches via a conveying path 5 and a hopper 6 following the conveying path onto two vibrating hoppers 7 and 8 arranged one after the other for singulation and conveyance of the particles of the sample. The individualization can of course also be carried out using other suitable devices, for example rotary tube sample distributors. The two vibrating troughs are operated at different conveying speeds in order to create a spacing between the individual particles in the conveying direction.
個別化装置7.8に測定セルが引続いており、該測定セ
ルは管の形の鉛直な測定通路IO1管9内の貫通口11
の高さに側方に配置された光電式センサ12と、通路を
センサの方向に照射する光源13とから成る。センサと
しては、実質的にモノリシック集積において夫々13X
13μmの面積を有する多数の、例えば2048個の光
電素子が行状に配置されており、それらの光線によって
発生した電荷が制御周期により一方の記憶帯域から次の
記憶帯域にシフト可能である、画像処理するOODライ
ンセンサ又はライン走査カメラを使用するのが有利であ
る。この種のセンサに関しては、専門文献又は製造元の
技術的データ表に詳細に記載されている。The singulation device 7.8 is followed by a measuring cell, which has a vertical measuring channel IO1 in the form of a tube and a through opening 11 in the tube 9.
It consists of a photoelectric sensor 12 arranged laterally at a height of , and a light source 13 that illuminates the passage in the direction of the sensor. As sensors, each 13X in virtually monolithic integration
Image processing in which a large number of photoelectric elements, for example 2048, with an area of 13 μm are arranged in a row, and the charges generated by their light beams can be shifted from one storage band to the next according to a control period. It is advantageous to use an OOD line sensor or a line scan camera. Sensors of this type are described in detail in the specialized literature or in the manufacturer's technical data sheets.
第2の振動トラフ8からV字形の流出口14を介して個
々にかつ連続して測定通路10を経て自由落下する粒子
15は、透過照射でセンサに結像される。The particles 15, which fall freely from the second vibrating trough 8 via the V-shaped outlet 14 individually and successively through the measuring channel 10, are imaged onto the sensor with transmitted illumination.
センサと接続された評価電子装置が光電素子、いわゆる
ピクセル(Pixel )から成るアレイを、粒子がそ
の運動中に数回検出される周波数、例えば5 kHzで
走査する。この際、照射されなかったピクセルの数が計
算されかつ最大粒子直径に相当する最大数が記録される
。それから、評価電子装置は測定された粒子の数と一緒
に粒度分布を形成する。適当な評価装置は市販のコンピ
ュータ又はプロセスコンピュータである。評価装置16
にハ、出力装置、例えば印刷機が接続されている。Evaluation electronics connected to the sensor scan an array of photoelectric elements, so-called pixels, at a frequency, for example 5 kHz, at which the particles are detected several times during their movement. In this case, the number of pixels that are not illuminated is calculated and the maximum number corresponding to the maximum particle diameter is recorded. The evaluation electronics then forms the particle size distribution together with the number of particles measured. Suitable evaluation devices are commercially available computers or process computers. Evaluation device 16
An output device, for example a printing press, is connected.
光源としては、準平行な均一光を発生するものが特に適
当である。異種光の影響を避けるために、有利には走査
周波数と同期化された赤外光、単色光又は交番光で作業
することもできる。分析すべき粒子が固有発光力を有す
る場合には、場合によって光源を省くことができる。同
様に、粒子の反射を利用することができる。しかしなが
ら、上記の両者の場合には、測定通路10とセンサ12
との間に、粒子の鮮鋭な画像なセンサ上に結像する光学
系を配置すべきである。Particularly suitable light sources are those that generate quasi-parallel, uniform light. In order to avoid effects of foreign light, it is also possible to work with infrared light, monochromatic light or alternating light, preferably synchronized with the scanning frequency. If the particles to be analyzed have an intrinsic luminescent power, the light source can optionally be omitted. Similarly, particle reflections can be used. However, in both of the above cases, the measurement path 10 and the sensor 12
An optical system should be placed between them to form a sharp image of the particles onto the sensor.
特定の場合には、分析すべき粒子を形状係数によってな
お詳細に調査することが必要な場合もある。このために
は、2つ以上のラインセンサ又はライン走査カメラを相
互に一定の角度、有利には直角に配置することができる
。In certain cases, it may be necessary to investigate the particles to be analyzed in more detail by means of their shape factors. For this purpose, two or more line sensors or line scanning cameras can be arranged at an angle to each other, preferably at right angles.
発明の効果
工業的規模の実験においで、本発明による測定装置を用
いると球状粒子においてだけでなく、また不規則な形状
の粒子、例えば肥料又はプラスチック顆粒において高い
サンプル流量で精確なかつ再現可能な分析結果が得られ
ることが判明した。Effects of the invention In experiments on an industrial scale, the measuring device according to the invention allows precise and reproducible analysis at high sample flow rates not only in spherical particles, but also in irregularly shaped particles, for example fertilizer or plastic granules. It turned out that results were obtained.
図面は本発明による測定装置の1実施例の略示構成図で
ある。The drawing is a schematic diagram of an embodiment of a measuring device according to the present invention.
Claims (6)
定装置において、粒子の個別化装置(7、8)と、該個
別化装置の後方に配置され、かつ側面にセンサ(12)
が配置された測定通路(10)から成る測定セル(9)
と、上記センサに引続いた粒度及び粒度分布を測定する
ための評価装置(16)とから構成されていることを特
徴とする、粒度及び粒度分布を測定する測定装置。(1) A measuring device for measuring the particle size and particle size distribution of particles in a product stream, which includes a particle singulation device (7, 8) and a sensor (12) located behind the particle singulation device and on the side.
A measuring cell (9) consisting of a measuring channel (10) in which
and an evaluation device (16) for measuring particle size and particle size distribution following the sensor.
る光源(13)が配属されている特許請求の範囲第1項
記載の測定装置。(2) The measuring device according to claim 1, wherein the sensor (12) is assigned a light source (13) for transmitting illumination of the measuring path (10).
通路(10)とセンサ(12)との間に光学素子が配置
されている特許請求の範囲第1項記載の測定装置。(3) A measuring device according to claim 1, wherein an optical element is arranged between the measuring path (10) and the sensor (12) when the particles reflect or emit light.
動トラフ(7、8)から成る特許請求の範囲第1項記載
の測定装置。4. Measuring device according to claim 1, in which the individualization device consists of one or more vibrating troughs (7, 8) arranged one behind the other.
サ又はライン走査カメラであり、該センサの走査周波数
は、自由落下状態でセンサアレーの前方を運動する粒子
(15)が連続する区間内で検出されるように選択され
ている特許請求の範囲第1項記載の測定装置。(5) The sensor (12) is a CCD line sensor or line scanning camera that processes images, and the scanning frequency of the sensor is detected within a continuous section of particles (15) moving in front of the sensor array in a free-falling state. 2. The measuring device according to claim 1, wherein the measuring device is selected such that:
めに、2個又は数個のラインセンサ又はライン走査カメ
ラ(12)が相互に一定の角度で、有利には直角に配置
されている、特許請求の範囲第1項記載の測定装置。(6) In order to measure the shape factor of the particles (15) to be detected, two or several line sensors or line scanning cameras (12) are arranged at an angle to each other, preferably at right angles. The measuring device according to claim 1, wherein:
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3510363.9 | 1985-03-22 | ||
DE19853510363 DE3510363A1 (en) | 1985-03-22 | 1985-03-22 | MEASURING ARRANGEMENT FOR PARTICLE SIZE ANALYSIS |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61223632A true JPS61223632A (en) | 1986-10-04 |
Family
ID=6265995
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61059628A Pending JPS61223632A (en) | 1985-03-22 | 1986-03-19 | Measuring device measuring grain size and grain size distribution of grain |
Country Status (8)
Country | Link |
---|---|
EP (1) | EP0195420A3 (en) |
JP (1) | JPS61223632A (en) |
BR (1) | BR8601290A (en) |
DE (1) | DE3510363A1 (en) |
DK (1) | DK130686A (en) |
ES (1) | ES8706957A1 (en) |
NO (1) | NO861117L (en) |
ZA (1) | ZA862115B (en) |
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JPH05149864A (en) * | 1991-04-12 | 1993-06-15 | Onoda Cement Co Ltd | Device for measuring fineness |
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GB8927742D0 (en) * | 1989-12-07 | 1990-02-07 | Diatec A S | Process and apparatus |
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DE4309939C2 (en) * | 1993-03-26 | 1996-10-02 | Guenter Dr Ing Dau | Method and device for the fully automatic analysis of the mixing quality of solid mixers |
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CA2194534A1 (en) * | 1997-01-07 | 1998-07-07 | Maztech Microvision Ltd. | Method and apparatus for quantifying particle components |
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DE202014100974U1 (en) * | 2014-03-04 | 2015-06-08 | Retsch Technology Gmbh | Device for determining the particle size and / or the particle shape of a particle mixture |
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US1722751A (en) * | 1927-11-19 | 1929-07-30 | Bell Telephone Labor Inc | Optical inspection system |
GB1479972A (en) * | 1975-02-19 | 1977-07-13 | Coal Ind | Particle sizing apparatus |
US4457434A (en) * | 1982-02-01 | 1984-07-03 | Fmc Corporation | Apparatus for orienting, singulating and sizing mushrooms and like objects |
DE3427535C2 (en) * | 1984-07-26 | 1986-10-02 | Lorenz Ing.(grad.) 4722 Ennigerloh Bohle | Device for classifying lumpy, oblong-shaped products |
-
1985
- 1985-03-22 DE DE19853510363 patent/DE3510363A1/en not_active Withdrawn
-
1986
- 1986-03-18 EP EP86103677A patent/EP0195420A3/en not_active Withdrawn
- 1986-03-19 JP JP61059628A patent/JPS61223632A/en active Pending
- 1986-03-21 ES ES553247A patent/ES8706957A1/en not_active Expired
- 1986-03-21 NO NO861117A patent/NO861117L/en unknown
- 1986-03-21 ZA ZA862115A patent/ZA862115B/en unknown
- 1986-03-21 DK DK130686A patent/DK130686A/en not_active Application Discontinuation
- 1986-03-21 BR BR8601290A patent/BR8601290A/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05149864A (en) * | 1991-04-12 | 1993-06-15 | Onoda Cement Co Ltd | Device for measuring fineness |
Also Published As
Publication number | Publication date |
---|---|
EP0195420A3 (en) | 1988-01-27 |
ES553247A0 (en) | 1987-07-01 |
ZA862115B (en) | 1986-11-26 |
BR8601290A (en) | 1986-12-02 |
ES8706957A1 (en) | 1987-07-01 |
DK130686D0 (en) | 1986-03-21 |
NO861117L (en) | 1986-09-23 |
DK130686A (en) | 1986-09-23 |
EP0195420A2 (en) | 1986-09-24 |
DE3510363A1 (en) | 1986-09-25 |
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