JPS61223605A - Method for inspecting surface shape - Google Patents

Method for inspecting surface shape

Info

Publication number
JPS61223605A
JPS61223605A JP6394985A JP6394985A JPS61223605A JP S61223605 A JPS61223605 A JP S61223605A JP 6394985 A JP6394985 A JP 6394985A JP 6394985 A JP6394985 A JP 6394985A JP S61223605 A JPS61223605 A JP S61223605A
Authority
JP
Japan
Prior art keywords
inspected
plate
image
inspection
inspecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6394985A
Other languages
Japanese (ja)
Inventor
Kenji Ozawa
小沢 健治
Katsunobu Yamamoto
山本 勝信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP6394985A priority Critical patent/JPS61223605A/en
Publication of JPS61223605A publication Critical patent/JPS61223605A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To simplify the constitution of an inspecting system and to reduce the cost of inspection by picking up the image of an inspecting plate through the surface of an object to be inspected formed into a specular surface to inspect the surface shape of the object to be inspected. CONSTITUTION:An object 10 to be inspected has a surface 10a formed into a specular surface, and an inspecting plate 12 illuminated by a light source 11 is arranged above this object 10. Lines 12a are recorded at a certain pitch on the lower face of the object 10. The light from the plate 12 is made incident on the surface 10a of the object 10 through an optical path A. the light from the plate 12 is reflected on the surface 10a and passes an optical path B to reach a lens 16. The lens 16 forms the image of the stripe pattern recorded on the plate 12 on the image receiving face of an image pickup device 15. The device 15 converts this image to a video signal and sends it to a picture display device 17 and a picture processor 18. The stripe pattern for the flat surface 10a is stored in the processor, and this pattern is compared with the inputted stripe pattern, and the surface 10a is judged to be rugged if they are different from each other.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、表面が鏡面状をした被検査物体を検査するた
めの表面形状検査方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a surface shape inspection method for inspecting an object to be inspected whose surface is mirror-like.

〔従来の技術〕[Conventional technology]

被検査物体の表面形状を検査する方法としては、例えば
「光技術ハンドブッ°り」 (昭和54年:朝倉書店発
行)の第905頁〜906頁に記載されているように、
被検査物体の表面をライン状に照明し、その反射光をス
クリーンに投影して表面の凹凸を検査する光切断法が知
られている。この光切断法は、細長のスリットを形成し
たスリット板の背後に光源を配置し、このスリット板を
透過したスリット光をスリット投影レンズで被検査物体
上に結像させてこれをライン状に照明するものである。
As a method for inspecting the surface shape of an object to be inspected, for example, as described on pages 905 to 906 of "Optical Technology Handbook" (published by Asakura Shoten in 1978),
A light cutting method is known in which the surface of an object to be inspected is illuminated in a line and the reflected light is projected onto a screen to inspect the surface irregularities. In this light cutting method, a light source is placed behind a slit plate with an elongated slit, and the slit light transmitted through the slit plate is imaged onto the object to be inspected using a slit projection lens, which is then illuminated in a line. It is something to do.

ライン状に照明された被検査物体からの反射光は、投影
レンズによりスクリーン上に拡大投影される。被検査物
体の表面が平坦である場合には、スクリーンに投影され
たスリット像が直線になっており、表面に凹凸がある場
合にはその程度に応じてスリット像が曲線となる。
The reflected light from the object to be inspected illuminated in a line is enlarged and projected onto a screen by a projection lens. If the surface of the object to be inspected is flat, the slit image projected onto the screen will be a straight line; if the surface is uneven, the slit image will be a curved line depending on the degree of unevenness.

前述した従来の表面検査方法では、被検査物体をライン
状に照明するために、収差補正が良好な高精度のスリッ
ト投影レンズ等が必要になり、そのために検査システム
の構造が複雑になり、コストがかかるという問題があっ
た。また、被検査物体が大きい場合には、これに応じて
大きなスリット投影レンズを用いなければならず、装置
が大型化する原因となる。
In the conventional surface inspection method described above, a high-precision slit projection lens with good aberration correction is required to illuminate the object to be inspected in a line, which complicates the structure of the inspection system and increases costs. There was a problem that it took a while. Furthermore, if the object to be inspected is large, a correspondingly large slit projection lens must be used, which causes an increase in the size of the apparatus.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

本発明は、スリット投影レンズが不要な表面形状検査方
法を提供することを目的とするものである。
An object of the present invention is to provide a surface shape inspection method that does not require a slit projection lens.

本発明のもう1つの目的は、検査システムの構成を簡単
にし、コストを安くすることができるようにした表面形
状検査方法を提供することにある。
Another object of the present invention is to provide a surface shape inspection method that can simplify the configuration of an inspection system and reduce costs.

〔問題点を解決するための手段〕[Means for solving problems]

被検査物体としては、表面が鏡面状をしたものがあるが
、本発明はこの鏡面状表面を利用して検査を行うように
したものである。すなわち、模様を一定ピッチで設けた
検査プレートと、テレビカメラ等の撮像装置とを用い、
被検査物体の鏡面状表面を介して検査プレートを撮像す
るものである。
Some objects to be inspected have mirror-like surfaces, and the present invention utilizes these mirror-like surfaces for inspection. That is, using an inspection plate with patterns arranged at a constant pitch and an imaging device such as a television camera,
The inspection plate is imaged through the mirror-like surface of the object to be inspected.

被検査物体の表面に凹凸がある場合には、検査プレート
の模様の像が変形するから、この変形の度合を調べるこ
とにより、鏡面状表面の状態を検査することができる。
If the surface of the object to be inspected has irregularities, the image of the pattern on the inspection plate will be deformed, and by examining the degree of this deformation, the condition of the mirror-like surface can be inspected.

以下、図面を参照して本発明の一実施例について詳細に
説明する。
Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

〔実施例〕〔Example〕

第1図において、被検査物体10は、その表面10aが
鏡面状をしており、矢線方向に連続的に移送されている
。この被検査物体10の上方には、光源1)で照明され
る検査プレート12が配置されている。この検査プレー
ト12は、被検査物体10の表面10aの凹凸に応じた
縞目模様を持ったものが用いられる。この実施例の検査
プレート12は、その下面にライン12aが例えば黒色
塗料で一定ピッチで記録されている。テレビカメラ13
は、被検査物体10の表面10aを介して、検査プレー
ト12を撮像するように傾けて配置されている。このテ
レビカメラ13は、周知のように、カメラボディ14の
内部に撮像装置15を備え、また前面にレンズ16が取
り付けられている。
In FIG. 1, an object to be inspected 10 has a mirror-like surface 10a and is continuously transported in the direction of the arrow. An inspection plate 12 illuminated by a light source 1) is arranged above the object to be inspected 10. The inspection plate 12 used has a striped pattern corresponding to the unevenness of the surface 10a of the object 10 to be inspected. The inspection plate 12 of this embodiment has lines 12a recorded at a constant pitch on its lower surface using, for example, black paint. TV camera 13
is arranged at an angle so as to image the inspection plate 12 through the surface 10a of the object 10 to be inspected. As is well known, the television camera 13 includes an imaging device 15 inside a camera body 14, and a lens 16 attached to the front surface.

前記被検査物体10の検査時には、レンズ16が物点距
離(A+B)にある検査プレート12にピントが合うよ
うに焦点調節がなされている。検査プレート12からの
光は、光路Aを通って入射角αで被検査物体10の表面
10aに入射する。
When inspecting the object to be inspected 10, the focus is adjusted so that the lens 16 focuses on the inspection plate 12 located at the object point distance (A+B). The light from the inspection plate 12 passes through the optical path A and is incident on the surface 10a of the object to be inspected 10 at an incident angle α.

ここで、光路Aの長さを長くすれば、撮像装置15に結
像された縞目模様の像のピッチが小さくなり、それに応
じて検出感度も低下する。この被検査物体10は、その
表面10aが鏡面状をしているため、検査プレート12
からの光は、その表面10aで反射角αで反射され、光
路Bを通ってレンズ16に達する。このレンズ16は、
検査プレート12に記録された縞目模様を撮像装置15
の受像面に結像する。なお、角度αは、検出感度が最も
良好となる値に設定される。
Here, if the length of the optical path A is increased, the pitch of the striped pattern image formed on the imaging device 15 becomes smaller, and the detection sensitivity also decreases accordingly. This object to be inspected 10 has a mirror-like surface 10a, so the inspection plate 12
The light from the lens is reflected by the surface 10a at a reflection angle α and reaches the lens 16 through the optical path B. This lens 16 is
The striped pattern recorded on the inspection plate 12 is captured by the imaging device 15.
The image is formed on the image receiving surface. Note that the angle α is set to a value that provides the best detection sensitivity.

前記撮像装置15は、縞目模様の像をビデオ信号に変換
して出力し、これを画像表示装置17及び画像処理装置
18に送る。この画像表示装置17は、ビデオ信号を再
生してCRTの画面に縞目模様を表示する。前記画像処
理装置18は、表面10aが平坦な正常な場合の縞目模
様が記憶されており、入力された縞目模様と比較し、そ
の差の有無を検出して出力する。この差がある場合には
、表面10aに凹凸がある時である。
The imaging device 15 converts the striped pattern image into a video signal, outputs it, and sends it to an image display device 17 and an image processing device 18. This image display device 17 reproduces a video signal and displays a striped pattern on a CRT screen. The image processing device 18 stores the striped pattern when the surface 10a is flat and normal, compares it with the inputted striped pattern, detects the presence or absence of a difference, and outputs it. If this difference exists, it means that the surface 10a has irregularities.

第2図は鏡面状表面10aに凸部10bがある被検査物
体10を示すものである。このような被検査物体10を
テレビカメラ13で撮像すると、第3図に示すように、
画像表示部17のCRTの表示面には乱れた縞目模様2
0が表示される。この縞目模様20の変化から、表面1
0aの形状を検査することができる。そして、この縞目
模様20の乱れの程度から、表面10aの凹凸の程度を
知ることができる。なお、検査システムにもよるが、約
3μ程度の凹凸を検査することができる。
FIG. 2 shows an object to be inspected 10 having a convex portion 10b on a mirror-like surface 10a. When such an object to be inspected 10 is imaged by the television camera 13, as shown in FIG.
A disordered striped pattern 2 appears on the CRT display surface of the image display unit 17.
0 is displayed. From this change in the striped pattern 20, the surface 1
The shape of 0a can be inspected. The degree of unevenness of the surface 10a can be determined from the degree of disorder of the striped pattern 20. Although it depends on the inspection system, it is possible to inspect irregularities of about 3 μm.

〔発明の効果〕〔Effect of the invention〕

本発明は、規則的な模様を記録した検査プレートを鏡面
状表面を介して撮像するようにしたから、従来の表面形
状検査方法に比べてスリット板及びスリット投影レンズ
等が不要とな、す、したがって検査システムの構造が簡
単となり、コストを安くすることができる。
In the present invention, since the inspection plate on which a regular pattern is recorded is imaged through the mirror-like surface, a slit plate, a slit projection lens, etc. are not required compared to the conventional surface shape inspection method. Therefore, the structure of the inspection system becomes simple and costs can be reduced.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明を実施する検査システムの概略図である
。 第2図は表面に凸部が形成された被検査物体と検査プレ
ートとを示す斜視図である。 第3図は第2図に示す被検査物体を撮像してCRTに表
示した状態を示す説明図である。 10・・・被検査物体 10a・・鏡面状表面 10b・・凸部 12・・・検査プレート 12a・・縞目模様 13・・・テレビカメラ I5・・・撮像装置 20・・・CRTに表示された縞目模様。 第2図 第3図
FIG. 1 is a schematic diagram of an inspection system implementing the present invention. FIG. 2 is a perspective view showing an inspection plate and an object to be inspected having a convex portion formed on its surface. FIG. 3 is an explanatory diagram showing a state in which the object to be inspected shown in FIG. 2 is imaged and displayed on a CRT. 10...Object to be inspected 10a...Mirror surface 10b...Convex portion 12...Inspection plate 12a...Striped pattern 13...Television camera I5...Imaging device 20...Displayed on CRT Striped pattern. Figure 2 Figure 3

Claims (2)

【特許請求の範囲】[Claims] (1)鏡面状をした被検査物体の表面形状を検査する方
法において、 被検査物体の上方に、規則的な模様が記録された検査プ
レートと撮像装置とを配置し、被検査物体の表面を介し
て検査プレートを撮像することにより、模様の形状変化
から被検査物体の表面形状を検査することを特徴とする
表面形状検査方法。
(1) In a method of inspecting the surface shape of a mirror-like object to be inspected, an inspection plate on which a regular pattern is recorded and an imaging device are placed above the object to be inspected, and the surface of the object to be inspected is inspected. A surface shape inspection method characterized in that the surface shape of an object to be inspected is inspected based on changes in the shape of a pattern by imaging an inspection plate through a camera.
(2)前記検査プレートには、所定のピッチで縞模様が
記録されていることを特徴とする特許請求の範囲第1項
記載の表面形状検査方法。
(2) The surface shape inspection method according to claim 1, wherein striped patterns are recorded on the inspection plate at a predetermined pitch.
JP6394985A 1985-03-29 1985-03-29 Method for inspecting surface shape Pending JPS61223605A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6394985A JPS61223605A (en) 1985-03-29 1985-03-29 Method for inspecting surface shape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6394985A JPS61223605A (en) 1985-03-29 1985-03-29 Method for inspecting surface shape

Publications (1)

Publication Number Publication Date
JPS61223605A true JPS61223605A (en) 1986-10-04

Family

ID=13244094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6394985A Pending JPS61223605A (en) 1985-03-29 1985-03-29 Method for inspecting surface shape

Country Status (1)

Country Link
JP (1) JPS61223605A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63100308A (en) * 1986-10-16 1988-05-02 Tokai Rika Co Ltd Surface defect inspecting instrument
JPH01120606U (en) * 1988-02-05 1989-08-16
JPH0372206A (en) * 1989-08-11 1991-03-27 Asahi Glass Co Ltd Shape checking apparatus of curved plate-like body
US5533139A (en) * 1992-05-29 1996-07-02 Eastman Kodak Company Coating density analyzer and method using image processing
WO1998017971A1 (en) * 1996-10-18 1998-04-30 Innomess Gesellschaft Für Messtechnik Mbh Method and device for measuring the course of reflective surfaces
CN102022985A (en) * 2009-09-18 2011-04-20 学校法人福冈工业大学 Three dimensional information measuring device and three dimensional information measuring method
CN102507594A (en) * 2011-11-15 2012-06-20 奇瑞汽车股份有限公司 Automobile body covering part surface quality detection device and detection method thereof
CN102928429A (en) * 2012-11-08 2013-02-13 中国建材检验认证集团秦皇岛有限公司 Device for observing weathering of glass and test method for observing weathering of glass by using device
US9846689B2 (en) 2008-01-29 2017-12-19 Adobe Systems Incorporated Method and system to provide portable database functionality in an electronic form

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58206908A (en) * 1982-05-28 1983-12-02 Dainippon Printing Co Ltd Detection of ruggedness on finished surface

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58206908A (en) * 1982-05-28 1983-12-02 Dainippon Printing Co Ltd Detection of ruggedness on finished surface

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63100308A (en) * 1986-10-16 1988-05-02 Tokai Rika Co Ltd Surface defect inspecting instrument
JPH01120606U (en) * 1988-02-05 1989-08-16
JPH0544725Y2 (en) * 1988-02-05 1993-11-15
JPH0372206A (en) * 1989-08-11 1991-03-27 Asahi Glass Co Ltd Shape checking apparatus of curved plate-like body
US5533139A (en) * 1992-05-29 1996-07-02 Eastman Kodak Company Coating density analyzer and method using image processing
WO1998017971A1 (en) * 1996-10-18 1998-04-30 Innomess Gesellschaft Für Messtechnik Mbh Method and device for measuring the course of reflective surfaces
US9846689B2 (en) 2008-01-29 2017-12-19 Adobe Systems Incorporated Method and system to provide portable database functionality in an electronic form
CN102022985A (en) * 2009-09-18 2011-04-20 学校法人福冈工业大学 Three dimensional information measuring device and three dimensional information measuring method
CN102507594A (en) * 2011-11-15 2012-06-20 奇瑞汽车股份有限公司 Automobile body covering part surface quality detection device and detection method thereof
CN102928429A (en) * 2012-11-08 2013-02-13 中国建材检验认证集团秦皇岛有限公司 Device for observing weathering of glass and test method for observing weathering of glass by using device
CN102928429B (en) * 2012-11-08 2015-04-22 中国建材检验认证集团秦皇岛有限公司 Device for observing weathering of glass and test method for observing weathering of glass by using device

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