JPS61209340A - Optical measuring apparatus - Google Patents
Optical measuring apparatusInfo
- Publication number
- JPS61209340A JPS61209340A JP60051331A JP5133185A JPS61209340A JP S61209340 A JPS61209340 A JP S61209340A JP 60051331 A JP60051331 A JP 60051331A JP 5133185 A JP5133185 A JP 5133185A JP S61209340 A JPS61209340 A JP S61209340A
- Authority
- JP
- Japan
- Prior art keywords
- measured
- moisture
- measurement
- measurement wavelength
- transmitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野〕
この発明は、被測定対象の種々の性状を複数、同時に測
定することができる光学的測定装置に関するものである
。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an optical measuring device that can simultaneously measure a plurality of various properties of an object to be measured.
従来、光を利用して、被測定対象の坪量・厚み、水分、
色あい等の性状を別個に測定する水分計、厚み計等の光
学的測定装置が知られている。Traditionally, light has been used to determine the basis weight, thickness, moisture content, etc. of the object to be measured.
Optical measuring devices such as moisture meters and thickness meters that separately measure properties such as color tone are known.
[この発明が解決しようとする問題点]しかしながら、
各種の性状を同時に測定しようとする場合、別個の装置
を別位置に設置しなければならず、装置が大型化し、ま
た、被測定対象の同一位置での各極性状の同時測定が困
難であった。[Problems to be solved by this invention] However,
When trying to measure various properties at the same time, separate devices must be installed at different locations, which increases the size of the device and makes it difficult to simultaneously measure each polarity at the same location on the object being measured. Ta.
この発明の目的は、以上の点に鑑み、被測定対象の坪量
・厚み、水分、色あい等を1個の装置で同時に測定でき
るようにした光学的測定@置を提供することである。In view of the above points, it is an object of the present invention to provide an optical measuring device that can simultaneously measure the basis weight, thickness, moisture content, color tone, etc. of an object to be measured using one device.
[問題点を解決するための手段]
この発明は、水分を吸収しない第1の測定波長、水分を
吸収する第2の測定波長、可視光@域の第3の測定波長
による被測定対象からの各波長成分を測定し、第1の測
定波長成分から坪量または厚み、第2の測定波長成分と
第1の測定波長成分の比から水分率、第3の測定波長成
分と第1の測定波長成分の比から色あいを測定するよう
にした光学的測定装置である。[Means for Solving the Problems] The present invention provides a first measurement wavelength that does not absorb moisture, a second measurement wavelength that absorbs moisture, and a third measurement wavelength in the visible light region. Each wavelength component is measured, and the basis weight or thickness is determined from the first measurement wavelength component, the moisture content is determined from the ratio of the second measurement wavelength component and the first measurement wavelength component, and the third measurement wavelength component and the first measurement wavelength are determined. This is an optical measurement device that measures color tone based on the ratio of components.
[実施例]
第1図は、この発明の一実施例を示す構成説明図である
。[Embodiment] FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention.
図において、1は投光用の光源で、この光源1の光は、
投光レンズ2で被測定対象3に投光され、その透過光ま
たは反射光は集光レンズ4で集光され、モータMにより
回転する回転セクタ5に設けられた水分を吸収しない約
1.0μmのような第1の測定波長λ1を透過させるフ
ィルタ51、水分を吸収する約0.95μmのような第
2の測定波長λ2を透過させるフィルタ52、可視光領
域の約0.8〜0.5μ園の第3の測定波長λ3を透過
させるフィルタ53を介して検出素子6に入射する。な
お、フィルタ54は、たとえば可視光領域の第3の測定
波長λ3と異なる第4の測定波長で、測定に用いてもよ
く、又、予備として他の光学的性質の測定に用いてもよ
い。検出素子6の検出信号は、増幅器7で増幅され、第
1、第2、第3の測定波長λ1、λ2、λ3の成分に対
応した第1、第2、第3の信号e1、e2、e3が、回
転セクタ5に設けられた同期信号発生器50の同期信号
により第1、第2、第3のサンプルホールド回路81,
82.83にホールドされる。そして、第1のサンプル
ホールド回路81の第1の測定波長λ1の成分に対応し
た信号e1から被測定対象3の坪量または厚みが測定さ
れ、第2のサンプルホールド回路82の第2の測定波長
λ2に対応した信号e2と、第1のサンプルホールド回
路81の信号e1との比e2/elを第1の割算器91
により演算し、被測定対象3の水分率を測定し、さらに
、第3のサンプルホールド回路83の第3の測定波長λ
3に対応した信号e3と第1のサンプルホールド回路8
1の信号e1との比e3/′e1を第2の割算器92で
演算し、色あい等を測定する。In the figure, 1 is a light source for projecting light, and the light from this light source 1 is
Light is projected onto the object to be measured 3 by the projection lens 2, and its transmitted light or reflected light is collected by the condensing lens 4, and the rotating sector 5 rotated by the motor M is provided with a diameter of approximately 1.0 μm that does not absorb moisture. A filter 51 that transmits a first measurement wavelength λ1 such as λ1, a filter 52 that transmits a second measurement wavelength λ2 of approximately 0.95 μm that absorbs moisture, and a filter 52 that transmits a second measurement wavelength λ2 of approximately 0.8 to 0.5 μm in the visible light region. The light enters the detection element 6 via a filter 53 that transmits the third measurement wavelength λ3. Note that the filter 54 may be used for measurement at a fourth measurement wavelength different from the third measurement wavelength λ3 in the visible light region, or may be used as a preliminary measurement for other optical properties. The detection signal of the detection element 6 is amplified by an amplifier 7 to produce first, second, and third signals e1, e2, and e3 corresponding to the components of the first, second, and third measurement wavelengths λ1, λ2, and λ3. However, the first, second and third sample and hold circuits 81,
It is held at 82.83. Then, the basis weight or thickness of the object to be measured 3 is measured from the signal e1 corresponding to the component of the first measurement wavelength λ1 of the first sample and hold circuit 81, and the second measurement wavelength of the second sample and hold circuit 82 is measured. The first divider 91 calculates the ratio e2/el between the signal e2 corresponding to λ2 and the signal e1 of the first sample hold circuit 81.
, the moisture content of the object to be measured 3 is calculated, and the third measurement wavelength λ of the third sample hold circuit 83 is calculated.
3 and the first sample hold circuit 8
The ratio e3/'e1 of 1 to the signal e1 is calculated by the second divider 92, and the color tone and the like are measured.
このようにして、被測定対象3の坪量または厚み、水分
率、色あい等の性状が同時に測定できる。In this way, properties such as basis weight or thickness, moisture content, color tone, etc. of the object to be measured 3 can be measured simultaneously.
なお、サンプルホールド回路81.82.83、割算器
91.92等の機能を、メモリを含むマイクロコンピュ
ータ、パーソナルコンピュータ等の演算手段を用いて実
現してもよい。Note that the functions of the sample and hold circuits 81, 82, 83, dividers 91, 92, etc. may be realized using arithmetic means such as a microcomputer including a memory, a personal computer, etc.
第2図は、他の実施例を示し、被測定対象3からの測定
光は、集光レンズ4で集光され、プリズム、回折格子の
ような分光手段10で分光されCODのようなイメージ
センサ11の各素子に異なった波長の光が入射する。こ
のイメージセンサ11の各波長成分に対応した信号は、
順次読み出され、マイクロコンピュータのような演算手
段12により、第1図で説明したような測定波長成分に
対応した信号について演算がなされ、測定が行われる。FIG. 2 shows another embodiment, in which measurement light from an object to be measured 3 is focused by a condenser lens 4, separated by a spectroscopic means 10 such as a prism or a diffraction grating, and then applied to an image sensor such as a COD. Light of different wavelengths enters each of the 11 elements. The signals corresponding to each wavelength component of this image sensor 11 are
The signals are sequentially read out, and a calculation means 12 such as a microcomputer performs calculations on the signals corresponding to the measurement wavelength components as explained in FIG. 1, and measurements are performed.
[発明の効果]
以上述べたように、この発明は、複数波長成分により演
算を行うようにしているので、同時に坪量または厚み、
水分、色あい等の被測定対象の性状を、同時に高精度に
単一の装置で測定することができ、小型、安価なものと
なる。[Effects of the Invention] As described above, the present invention performs calculations using multiple wavelength components, so the basis weight, thickness,
The properties of the object to be measured, such as moisture content and color tone, can be measured simultaneously and with high precision using a single device, which is small and inexpensive.
第1図、第2図は、この発明の一実施例を示す構成説明
図である。FIGS. 1 and 2 are configuration explanatory diagrams showing one embodiment of the present invention.
Claims (1)
第2の測定波長、可視光領域の第3の測定波長による被
測定対象からの各波長成分を測定し、第1の測定波長成
分から坪量または厚み、第2の測定波長成分と第1の測
定波長成分の比から水分率、第3の測定波長成分と第1
の測定波長成分の比から色あいを測定することを特徴と
する光学的測定装置。 2、前記第1、第2、第3の測定波長として、約1.0
μm、約0.95μm、約0.8〜0.5μmを用いた
ことを特徴とする特許請求の範囲第1項記載の光学的測
定装置。[Claims] 1. Measuring each wavelength component from the object to be measured using a first measurement wavelength that does not absorb moisture, a second measurement wavelength that absorbs moisture, and a third measurement wavelength in the visible light region; The basis weight or thickness is determined from the first measurement wavelength component, the moisture content is determined from the ratio of the second measurement wavelength component to the first measurement wavelength component, and the moisture content is determined from the ratio of the second measurement wavelength component to the first measurement wavelength component.
An optical measurement device that measures color tone from the ratio of measured wavelength components. 2. The first, second, and third measurement wavelengths are approximately 1.0
2. The optical measurement device according to claim 1, wherein the optical measurement device uses a diameter of about 0.95 μm, about 0.8 to 0.5 μm.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5133185A JPH06100541B2 (en) | 1985-03-14 | 1985-03-14 | Optical measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5133185A JPH06100541B2 (en) | 1985-03-14 | 1985-03-14 | Optical measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61209340A true JPS61209340A (en) | 1986-09-17 |
JPH06100541B2 JPH06100541B2 (en) | 1994-12-12 |
Family
ID=12883936
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5133185A Expired - Fee Related JPH06100541B2 (en) | 1985-03-14 | 1985-03-14 | Optical measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH06100541B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02115750A (en) * | 1988-10-25 | 1990-04-27 | Yokogawa Electric Corp | Infrared moisture meter less affected by basis weight |
JPH03117750U (en) * | 1990-03-15 | 1991-12-05 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS508554A (en) * | 1973-05-19 | 1975-01-29 | ||
JPS52139480U (en) * | 1976-04-16 | 1977-10-22 | ||
JPS5641239U (en) * | 1979-09-10 | 1981-04-16 |
-
1985
- 1985-03-14 JP JP5133185A patent/JPH06100541B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS508554A (en) * | 1973-05-19 | 1975-01-29 | ||
JPS52139480U (en) * | 1976-04-16 | 1977-10-22 | ||
JPS5641239U (en) * | 1979-09-10 | 1981-04-16 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02115750A (en) * | 1988-10-25 | 1990-04-27 | Yokogawa Electric Corp | Infrared moisture meter less affected by basis weight |
JPH03117750U (en) * | 1990-03-15 | 1991-12-05 |
Also Published As
Publication number | Publication date |
---|---|
JPH06100541B2 (en) | 1994-12-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5892841A (en) | Densitometer | |
CN111060711B (en) | Optical rotating speed measuring system and method based on Stokes vector | |
JPS61209340A (en) | Optical measuring apparatus | |
US3481671A (en) | Apparatus and method for obtaining optical rotatory dispersion measurements | |
JPS6140928B2 (en) | ||
JPH0854264A (en) | Optical measuring apparatus | |
JPH0531732B2 (en) | ||
JPS60224002A (en) | Infrared thickness gage | |
JPS6153549A (en) | Optical measuring apparatus | |
SU1550378A1 (en) | Method of determining the index of refraction of transparent media | |
JPS58195140A (en) | Measuring method of turbidity, haze value and chromaticity by integrating sphere | |
CN108871572A (en) | Birefringent Fourier transformation imaging spectral band extension method and its imaging device | |
JPS6166139A (en) | Filter-film examining device | |
JP2006242822A (en) | Optical measuring device | |
JPS6350703A (en) | Apparatus for measuring film thickness | |
JPH0210441Y2 (en) | ||
JPH0489553A (en) | Double refraction measuring apparatus | |
JPH04355308A (en) | Multilayer film thickness measuring device | |
JPS6211128A (en) | Optical measuring apparatus | |
JPH0718962Y2 (en) | Optical film thickness meter | |
JPH01147306A (en) | Film thickness measuring instrument | |
JPH0543963B2 (en) | ||
JPH0429364Y2 (en) | ||
JPH01131405A (en) | Film thickness measuring instrument | |
RU2234693C2 (en) | Method for measuring concentration of optically active substances in solutions (variants) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |