JPS61197572U - - Google Patents
Info
- Publication number
- JPS61197572U JPS61197572U JP8240885U JP8240885U JPS61197572U JP S61197572 U JPS61197572 U JP S61197572U JP 8240885 U JP8240885 U JP 8240885U JP 8240885 U JP8240885 U JP 8240885U JP S61197572 U JPS61197572 U JP S61197572U
- Authority
- JP
- Japan
- Prior art keywords
- switch
- capacitor
- close
- charging
- control circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003990 capacitor Substances 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8240885U JPS61197572U (nl) | 1985-05-31 | 1985-05-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8240885U JPS61197572U (nl) | 1985-05-31 | 1985-05-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61197572U true JPS61197572U (nl) | 1986-12-10 |
Family
ID=30630097
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8240885U Pending JPS61197572U (nl) | 1985-05-31 | 1985-05-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61197572U (nl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4513940B2 (ja) * | 2000-10-24 | 2010-07-28 | Ｔｄｋ株式会社 | 静電気吸収素子の電気特性評価方法及び装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59175742A (ja) * | 1983-03-26 | 1984-10-04 | Nec Home Electronics Ltd | 電子部品のストレス試験方法 |
-
1985
- 1985-05-31 JP JP8240885U patent/JPS61197572U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59175742A (ja) * | 1983-03-26 | 1984-10-04 | Nec Home Electronics Ltd | 電子部品のストレス試験方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4513940B2 (ja) * | 2000-10-24 | 2010-07-28 | Ｔｄｋ株式会社 | 静電気吸収素子の電気特性評価方法及び装置 |