JPH0339183U - - Google Patents
Info
- Publication number
- JPH0339183U JPH0339183U JP9923789U JP9923789U JPH0339183U JP H0339183 U JPH0339183 U JP H0339183U JP 9923789 U JP9923789 U JP 9923789U JP 9923789 U JP9923789 U JP 9923789U JP H0339183 U JPH0339183 U JP H0339183U
- Authority
- JP
- Japan
- Prior art keywords
- surge
- test device
- switching circuit
- circuit
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 7
- 239000003990 capacitor Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9923789U JPH0339183U (nl) | 1989-08-24 | 1989-08-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9923789U JPH0339183U (nl) | 1989-08-24 | 1989-08-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0339183U true JPH0339183U (nl) | 1991-04-16 |
Family
ID=31648294
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9923789U Pending JPH0339183U (nl) | 1989-08-24 | 1989-08-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0339183U (nl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009069147A (ja) * | 2007-09-17 | 2009-04-02 | Toppoly Optoelectronics Corp | 計測システムと方法 |
-
1989
- 1989-08-24 JP JP9923789U patent/JPH0339183U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009069147A (ja) * | 2007-09-17 | 2009-04-02 | Toppoly Optoelectronics Corp | 計測システムと方法 |