JPS61195431U - - Google Patents
Info
- Publication number
- JPS61195431U JPS61195431U JP7921785U JP7921785U JPS61195431U JP S61195431 U JPS61195431 U JP S61195431U JP 7921785 U JP7921785 U JP 7921785U JP 7921785 U JP7921785 U JP 7921785U JP S61195431 U JPS61195431 U JP S61195431U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- light
- mirror
- reflection
- light side
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000004611 spectroscopical analysis Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図は従来の反射装置を示す図、第２図Ａは
本考案による試料光側光学系を示す図、第２図Ｂ
は対照光側光学系を示す図、第２図Ｃは全体概略
図、第３図は応用例の一つを示す図である。
１…試料孔、１′…対照光、２，２′…ミラー
、３…試料光側試料、３′…対照光側試料、４，
４′…ミラー、５，５′…ミラー、６，６′…ミ
ラー、７，７′…凹面ミラー、８，８′…焦点、
９，９′…ミラー、１０，１０′…ミラー、１１
，１１′…ミラー。
Fig. 1 shows a conventional reflection device, Fig. 2A shows a sample light side optical system according to the present invention, Fig. 2B
2C is a diagram showing the optical system on the contrast light side, FIG. 2C is an overall schematic diagram, and FIG. 3 is a diagram showing one of the application examples. 1... Sample hole, 1'... Control light, 2, 2'... Mirror, 3... Sample light side sample, 3'... Control light side sample, 4,
4'...mirror, 5,5'...mirror, 6,6'...mirror, 7,7'...concave mirror, 8,8'...focal point,
9,9'...Mirror, 10,10'...Mirror, 11
, 11'...mirror.
Claims (1)
きた光線を試料へと入射させる少なくとも一枚の
ミラー、及び該試料から反射した該光線を再び元
の光軸上へと戻す少なくとも一枚のミラーから成
る構成を試料光側、対照光側のそれぞれに持つ分
光光度計の反射付属装置において、試料光と対照
光の該試料の反射位置の高さを違えたことを特徴
とするダブルビーム分光光度計用反射付属装置。 A sample stage that holds a sample, at least one mirror that directs the light beam that has entered the sample chamber into the sample, and at least one mirror that returns the light beam reflected from the sample back onto the original optical axis. Double beam spectroscopy characterized in that the reflection attachment device of a spectrophotometer has mirrors on each of the sample light side and the reference light side, in which the heights of the reflection positions of the sample light and the reference light are different from each other. Reflection accessory for photometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7921785U JPS61195431U (en) | 1985-05-29 | 1985-05-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7921785U JPS61195431U (en) | 1985-05-29 | 1985-05-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61195431U true JPS61195431U (en) | 1986-12-05 |
Family
ID=30623922
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7921785U Pending JPS61195431U (en) | 1985-05-29 | 1985-05-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61195431U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008537993A (en) * | 2005-01-13 | 2008-10-02 | ザ・キュレイターズ・オブ・ザ・ユニバーシティ・オブ・ミズーリ | Ultra-sensitive spectrophotometer |
-
1985
- 1985-05-29 JP JP7921785U patent/JPS61195431U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008537993A (en) * | 2005-01-13 | 2008-10-02 | ザ・キュレイターズ・オブ・ザ・ユニバーシティ・オブ・ミズーリ | Ultra-sensitive spectrophotometer |