JPH0239144U - - Google Patents
Info
- Publication number
- JPH0239144U JPH0239144U JP11791688U JP11791688U JPH0239144U JP H0239144 U JPH0239144 U JP H0239144U JP 11791688 U JP11791688 U JP 11791688U JP 11791688 U JP11791688 U JP 11791688U JP H0239144 U JPH0239144 U JP H0239144U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample chamber
- chamber
- reflecting mirror
- outside
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 6
- 230000004907 flux Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図は本案の一実施例の光学系平面図、第２
図は第１図の正面図、第３図は反射光学系の一実
施例の平面図である。
１……光学室部、２……試料室部、３……分光
器部、４……試料光、５……対照光、６……試料
、７，８，９，１０……反射鏡、１１……光学系
ベース。
Figure 1 is a plan view of the optical system of one embodiment of the present invention;
The figure is a front view of FIG. 1, and FIG. 3 is a plan view of an embodiment of the reflective optical system. 1... Optical chamber section, 2... Sample chamber section, 3... Spectrometer section, 4... Sample light, 5... Control light, 6... Sample, 7, 8, 9, 10... Reflecting mirror, 11... Optical system base.
Claims (1)
に用いる赤外分光光度計において、試料光束を試
料室部の外部に導光する試料光軸上に置かれた第
一の反射鏡と、試料室部の外部で一定以上の光路
長を得た後に再度試料室部に導光する第二の反射
鏡を試料室内部に設けたことを特徴とする赤外分
光光度計の試料室。 In an infrared spectrophotometer used for measurement in the infrared region, which consists of a light source, a sample chamber, and a spectrometer, a first reflecting mirror placed on the sample optical axis guides the sample light flux to the outside of the sample chamber, and a sample A sample chamber of an infrared spectrophotometer, characterized in that a second reflecting mirror is provided inside the sample chamber to guide light into the sample chamber again after obtaining an optical path length of a certain value or more outside the chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11791688U JPH0239144U (en) | 1988-09-09 | 1988-09-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11791688U JPH0239144U (en) | 1988-09-09 | 1988-09-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0239144U true JPH0239144U (en) | 1990-03-15 |
Family
ID=31361799
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11791688U Pending JPH0239144U (en) | 1988-09-09 | 1988-09-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0239144U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10325755A (en) * | 1997-01-22 | 1998-12-08 | Nippon Steel Corp | Spectroscopic analyzer and analytic method |
-
1988
- 1988-09-09 JP JP11791688U patent/JPH0239144U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10325755A (en) * | 1997-01-22 | 1998-12-08 | Nippon Steel Corp | Spectroscopic analyzer and analytic method |