JPS6235209U - - Google Patents
Info
- Publication number
- JPS6235209U JPS6235209U JP12765685U JP12765685U JPS6235209U JP S6235209 U JPS6235209 U JP S6235209U JP 12765685 U JP12765685 U JP 12765685U JP 12765685 U JP12765685 U JP 12765685U JP S6235209 U JPS6235209 U JP S6235209U
- Authority
- JP
- Japan
- Prior art keywords
- light source
- optical path
- eyepiece
- light
- reflected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 4
Description
第１図は本考案による顕微鏡の概略断面図、第
２図は接眼レンズ部分の平面図、第３図は別実施
例の接眼レンズ部分の平面図である。
Ａ…測定光路、Ｂ…参照光路、Ｓ…被測定面、
３…接眼レンズ、４…光源、５…ハーフミラー、
６，７，８…反射鏡。
FIG. 1 is a schematic sectional view of a microscope according to the present invention, FIG. 2 is a plan view of the eyepiece portion, and FIG. 3 is a plan view of the eyepiece portion of another embodiment. A...Measurement optical path, B...Reference optical path, S...Measurement surface,
3...eyepiece, 4...light source, 5...half mirror,
6, 7, 8...Reflector.
Claims (1)
の光を前記ハーフミラーを通して接眼レンズに投
射させる測定光路と、前記光源または該光源と同
一特性の別光源からの光を反射鏡で反射させて前
記接眼レンズに投射させる参照光路とを有する顕
微鏡。 A measurement optical path in which light from a light source reflected by a half mirror and a surface to be measured is projected onto the eyepiece through the half mirror, and a measurement optical path in which light from the light source or another light source having the same characteristics as the light source is reflected by a reflecting mirror to the eyepiece. A microscope having a reference optical path that is projected onto a lens.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12765685U JPS6235209U (en) | 1985-08-20 | 1985-08-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12765685U JPS6235209U (en) | 1985-08-20 | 1985-08-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6235209U true JPS6235209U (en) | 1987-03-02 |
Family
ID=31022619
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12765685U Pending JPS6235209U (en) | 1985-08-20 | 1985-08-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6235209U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006337310A (en) * | 2005-06-06 | 2006-12-14 | Global Nuclear Fuel-Japan Co Ltd | Method for measuring thickness of oxide film on metal surface |
-
1985
- 1985-08-20 JP JP12765685U patent/JPS6235209U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006337310A (en) * | 2005-06-06 | 2006-12-14 | Global Nuclear Fuel-Japan Co Ltd | Method for measuring thickness of oxide film on metal surface |