JPS61194323A - 放射温度計 - Google Patents
放射温度計Info
- Publication number
- JPS61194323A JPS61194323A JP60034734A JP3473485A JPS61194323A JP S61194323 A JPS61194323 A JP S61194323A JP 60034734 A JP60034734 A JP 60034734A JP 3473485 A JP3473485 A JP 3473485A JP S61194323 A JPS61194323 A JP S61194323A
- Authority
- JP
- Japan
- Prior art keywords
- filter
- infrared
- infrared rays
- detection element
- radiation thermometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0801—Means for wavelength selection or discrimination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0801—Means for wavelength selection or discrimination
- G01J5/0802—Optical filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60034734A JPS61194323A (ja) | 1985-02-22 | 1985-02-22 | 放射温度計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60034734A JPS61194323A (ja) | 1985-02-22 | 1985-02-22 | 放射温度計 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61194323A true JPS61194323A (ja) | 1986-08-28 |
| JPH0518048B2 JPH0518048B2 (enExample) | 1993-03-10 |
Family
ID=12422543
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60034734A Granted JPS61194323A (ja) | 1985-02-22 | 1985-02-22 | 放射温度計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61194323A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008225471A (ja) * | 2007-03-09 | 2008-09-25 | Toshiba Corp | 画像形成装置の定着装置及び定着方法 |
| CN102531348A (zh) * | 2010-12-31 | 2012-07-04 | 日本超精石英株式会社 | 氧化硅玻璃坩埚制造方法及氧化硅玻璃坩埚制造装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5290085U (enExample) * | 1975-12-27 | 1977-07-05 | ||
| JPS53115076U (enExample) * | 1977-02-22 | 1978-09-13 | ||
| JPS569028U (enExample) * | 1979-06-30 | 1981-01-26 | ||
| JPS59172343U (ja) * | 1983-05-02 | 1984-11-17 | 新日本無線株式会社 | 放射温度計 |
-
1985
- 1985-02-22 JP JP60034734A patent/JPS61194323A/ja active Granted
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5290085U (enExample) * | 1975-12-27 | 1977-07-05 | ||
| JPS53115076U (enExample) * | 1977-02-22 | 1978-09-13 | ||
| JPS569028U (enExample) * | 1979-06-30 | 1981-01-26 | ||
| JPS59172343U (ja) * | 1983-05-02 | 1984-11-17 | 新日本無線株式会社 | 放射温度計 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008225471A (ja) * | 2007-03-09 | 2008-09-25 | Toshiba Corp | 画像形成装置の定着装置及び定着方法 |
| CN102531348A (zh) * | 2010-12-31 | 2012-07-04 | 日本超精石英株式会社 | 氧化硅玻璃坩埚制造方法及氧化硅玻璃坩埚制造装置 |
| US20120167623A1 (en) * | 2010-12-31 | 2012-07-05 | Japan Super Quartz Corporation | Method and apparatus for manufacturing vitreous silica crucible |
| US9181121B2 (en) | 2010-12-31 | 2015-11-10 | Sumco Corporation | Method for manufacturing vitreous silica crucible |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0518048B2 (enExample) | 1993-03-10 |
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