JPS61174722A - Semiconductor wafer cleaning apparatus - Google Patents
Semiconductor wafer cleaning apparatusInfo
- Publication number
- JPS61174722A JPS61174722A JP1438985A JP1438985A JPS61174722A JP S61174722 A JPS61174722 A JP S61174722A JP 1438985 A JP1438985 A JP 1438985A JP 1438985 A JP1438985 A JP 1438985A JP S61174722 A JPS61174722 A JP S61174722A
- Authority
- JP
- Japan
- Prior art keywords
- cleaning
- carrier
- wafer
- diffusion
- transfer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 49
- 239000004065 semiconductor Substances 0.000 title claims abstract description 13
- 235000012431 wafers Nutrition 0.000 claims abstract description 68
- 239000000872 buffer Substances 0.000 claims abstract description 14
- 239000000969 carrier Substances 0.000 claims description 8
- 239000006185 dispersion Substances 0.000 claims 1
- 238000009792 diffusion process Methods 0.000 abstract description 33
- 239000007788 liquid Substances 0.000 abstract description 8
- 238000001035 drying Methods 0.000 abstract description 6
- 238000000034 method Methods 0.000 abstract description 6
- 239000000428 dust Substances 0.000 abstract description 4
- 241000220257 Matthiola Species 0.000 abstract 1
- 235000011378 Matthiola incana Nutrition 0.000 abstract 1
- 235000021547 stock Nutrition 0.000 abstract 1
- 230000032258 transport Effects 0.000 description 14
- 238000011068 loading method Methods 0.000 description 5
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 4
- 238000005530 etching Methods 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 239000011259 mixed solution Substances 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- 239000003788 bath preparation Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 239000000178 monomer Substances 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
- H01L21/3046—Mechanical treatment, e.g. grinding, polishing, cutting using blasting, e.g. sand-blasting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
この発明は、洗浄処理が終了したウェハを自動的に拡散
装置に供給する手段を持った半導体ウェハの洗浄装置に
関する。DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to a semiconductor wafer cleaning apparatus having means for automatically supplying wafers that have been cleaned to a diffusion apparatus.
(従来の技術)
従来、半導体ウェハをウェハキャリアにセットして、エ
ツチング、レジスト除去、洗浄等を行う洗浄装置は、投
入ステーションにセットされたウェハキャリアを、洗浄
用搬送ロボットによシ複数の液槽に渡って浸漬した後、
搬出ステーションに送シ出している。搬出ステーション
は、通常、ウェハキャリアを3〜5個収納できるように
なっておシ、警報ブザー等によシ満杯になったことを検
知して、作業者がウェハキャリアを取出すようになって
いる。この取出されたウェハキャリアは、作業者によシ
次工程である拡散工程へ運ばれている。(Prior Art) Conventionally, in a cleaning device that sets a semiconductor wafer on a wafer carrier and performs etching, resist removal, cleaning, etc., the wafer carrier set in an input station is transferred to a cleaning transfer robot using multiple liquids. After dipping across the tank,
It is being sent to the unloading station. The unloading station is usually capable of storing 3 to 5 wafer carriers, and an alarm buzzer or other device detects when the wafer carrier is full, allowing the operator to remove the wafer carriers. . This taken out wafer carrier is carried by an operator to the next process, a diffusion process.
(発明の解決しようとする問題点)
しかしながら、上記の洗浄装置は、洗浄処理の終了した
ウェハを、作業者が拡散装置に運ばなければならず、ウ
エノ・に塵埃が付着するという問題点があった。(Problems to be Solved by the Invention) However, the above-mentioned cleaning apparatus has a problem in that the wafer that has been cleaned must be carried by the operator to the diffusion apparatus, and dust may adhere to the wafer. Ta.
(問題点を解決するための手段)
この発明は、上記の問題点を解決するため、半導体ウェ
ハの洗浄装置において、計算機の制御によυ、洗浄処理
が終了したウェハを自動的に拡散装置に供給する手段を
設けたものである。(Means for Solving the Problems) In order to solve the above-mentioned problems, the present invention provides a semiconductor wafer cleaning device in which wafers that have been cleaned are automatically transferred to a diffusion device under computer control. A means for supplying the water is provided.
(作 用)
この発明によれば、半導体ウェハの洗浄装置において、
洗浄処理が終了したウェハを自動的に拡散装置に供給す
るので、作業者の介在による塵埃の発生を防ぐことがで
きる。(Function) According to the present invention, in the semiconductor wafer cleaning apparatus,
Since the wafers that have been cleaned are automatically supplied to the diffusion device, it is possible to prevent the generation of dust due to operator intervention.
(実施例)
この発明の実施例を図面によシ説明する。まず、各装置
の配置を第2図に示す。第2図において、本発明の実施
例の洗浄装置101は、半導体ウェハの拡散処理を行う
拡散装置102,103とコの字型を成して、洗浄・拡
散モジー−ル200を構成する。通常、自動洗浄装置の
処理能力は、拡散装置に比較して約6倍となっておシ、
1台の洗浄装置で複数の拡散装置に対応できる。本例は
、洗浄装置の建浴時間及びトラブル等が発生してダウン
した場合を考慮して、洗浄装置1台につき拡散装置2台
をコの字型に配置したものである。また、洗浄・拡散モ
ジュール200へのウェハの供給および回収は、ウェハ
キャリアを多工程に渡って運搬するキャリア搬送装置1
00によシ行なっている。(Example) An example of the present invention will be explained with reference to the drawings. First, FIG. 2 shows the arrangement of each device. In FIG. 2, a cleaning apparatus 101 according to an embodiment of the present invention forms a U-shape with diffusion apparatuses 102 and 103 for performing a diffusion process on semiconductor wafers, and constitutes a cleaning/diffusion module 200. Normally, the processing capacity of automatic cleaning equipment is about 6 times that of diffusion equipment.
One cleaning device can support multiple diffusion devices. In this example, two diffusion devices are arranged in a U-shape for one cleaning device, taking into consideration the bath preparation time of the cleaning device and the possibility that the device goes down due to trouble. Further, the supply and recovery of wafers to the cleaning/diffusion module 200 is carried out by a carrier transport device 1 that transports wafer carriers through multiple steps.
I am going to 00.
次に、洗浄装置101の構成を第1図によシ説明する。Next, the configuration of the cleaning device 101 will be explained with reference to FIG.
第1図において洗浄装置101は前側に、洗浄処理前の
ウェハを搭載する投入ステーション26、洗浄処理後の
ウェハをストックする搬出ステーション28、ウェハを
洗浄(現像、エツチング、レジスト除去)する液槽32
、ウェハを乾燥させる乾燥装置33、ウェハキャリア2
0を投入ステーション26から吊シ上げ洗浄・乾燥を経
て搬出ステーション28へ降ろす洗浄用搬送ロボット3
0を具備する。また、後側には、拡散装置102.10
3に対応したウェハキャリア20の受渡用バッファ34
.36と、これらの上方にあって受渡用バッファ34側
から受渡用バッファ36側ヘウエハキヤリア20を運ぶ
搬送ライン38とを具備する。さらに、洗浄装置101
は、前側と後側との間のウェハキャリアの受渡、および
キャリア搬送装置100とのウエノ・キャリアの受渡を
行なう、回転リフト22.24を左右に具備する。In FIG. 1, the cleaning device 101 has, on the front side, a loading station 26 for loading wafers before cleaning processing, an unloading station 28 for stocking wafers after cleaning processing, and a liquid tank 32 for cleaning wafers (developing, etching, resist removal).
, a drying device 33 for drying the wafer, and a wafer carrier 2
A cleaning transfer robot 3 that lifts 0 from the input station 26 and lowers it to the unloading station 28 after cleaning and drying.
0. Also, on the rear side, a diffusion device 102.10
Transfer buffer 34 of wafer carrier 20 corresponding to 3.
.. 36, and a transport line 38 which is located above these and transports the wafer carrier 20 from the transfer buffer 34 side to the transfer buffer 36 side. Furthermore, the cleaning device 101
is equipped with rotary lifts 22 and 24 on the left and right sides for transferring wafer carriers between the front side and the rear side and transferring wafer carriers to and from the carrier transport device 100.
洗浄・拡散モノー−ル200に運ばれるウエノ・には、
レノスト塗付、露光がなされておシ、洗浄装置101に
て現像、エツチング、レジスト除去の処理が施される。The urethane transported to the cleaning/diffusion monomer 200 includes:
After coating and exposure, a cleaning device 101 performs development, etching, and resist removal.
このため、液槽32は(a)硫酸と過酸化水素の混合液
、(b)フッ酸溶液、(C)塩酸と過酸化水素の混合液
を入れたものが並べられている。また、これらの薬液を
入れた液槽32の後には、すすぎのため純水を入れた液
槽32が並べられている。For this purpose, the liquid tank 32 contains (a) a mixed solution of sulfuric acid and hydrogen peroxide, (b) a hydrofluoric acid solution, and (C) a mixed solution of hydrochloric acid and hydrogen peroxide. Further, a liquid tank 32 containing pure water for rinsing is arranged next to the liquid tank 32 containing these chemical solutions.
ここで、ウェハが洗浄・拡散モジュール200で処理さ
れるときの、ウェハキャリア2σの流れを説明する。ウ
ェハキャリア200ロツト管理、キャリア搬送装置10
0による洗浄装置101への搬送、洗浄装置101から
拡散装置102゜103への搬送、および洗浄・拡散条
件の設定は全て計算機制御により実現される。集中管理
されたウェハキャリア20は、洗浄装置101のロット
要求信号によシ、キャリア搬送装置100から回転リフ
ト22の上方の移載位置(図示せず)へと運ばれる。回
転リフト22は上昇してウェハキャリア20を受取シ、
下降して投入ステーション26にウェハキャリア20を
降ろす。洗浄口ゴツト30は、投入ステーションからウ
ェハキャリア20を吊上げ、液槽32および乾燥装置3
3でウェハキャリア20内のウェハに処理を施した後、
ウェハキャリア20を搬出ステーション28に降ろす。Here, the flow of the wafer carrier 2σ when a wafer is processed in the cleaning/diffusion module 200 will be explained. Wafer carrier 200 lot management, carrier transport device 10
0 to the cleaning device 101, transportation from the cleaning device 101 to the diffusion devices 102 and 103, and setting of cleaning and diffusion conditions are all realized by computer control. The centrally managed wafer carrier 20 is transported from the carrier transport device 100 to a transfer position (not shown) above the rotary lift 22 in response to a lot request signal from the cleaning device 101. The rotary lift 22 rises to receive the wafer carrier 20;
The wafer carrier 20 is lowered to the loading station 26. The cleaning port 30 lifts the wafer carrier 20 from the loading station, and connects the liquid tank 32 and the drying device 3.
After processing the wafer in the wafer carrier 20 in step 3,
The wafer carrier 20 is unloaded to the unloading station 28.
洗浄処理の終了したウエノ・キャリア20は、拡散装置
102あるいは拡散装置103へ搬送される。The ueno carrier 20 that has undergone the cleaning process is transported to the diffusion device 102 or the diffusion device 103.
(1)拡散装置102へのウェハキャリア20の搬送回
転リフト24が搬出ステーション28からウェハキャリ
ア20を受取り、180度回転および後部側へスライド
して受渡用バッファ34へ載せる。拡散装置102の移
載フォーク39によシ、ウェハキャリア20は拡散装置
102へ運ばれる。(1) Transferring the wafer carrier 20 to the spreading device 102 The rotating lift 24 receives the wafer carrier 20 from the unloading station 28, rotates it 180 degrees, slides it to the rear side, and places it on the transfer buffer 34. The wafer carrier 20 is transported to the spreading device 102 by the transfer fork 39 of the spreading device 102 .
(2)拡散装置103へのウェハキャリア20の搬送回
転リフト24が搬出ステーション28からウェハキャリ
ア20を受取シ、上昇、180度回転および後部側へス
ライドして搬送ライン38へ載せる。搬送ライン38は
ウエノ・キャリア20を受渡用バッファ36側へ運んで
停止する。回転リフト22が上昇してウェハキャリア2
0を搬送ライン38から受は取シ、下降して受渡用バッ
ファ36へ載せる。拡散装置103の移載フォーク40
によシ、ウェハキャリア20は拡散装置103へ運ばれ
る。(2) Transferring the wafer carrier 20 to the spreading device 103 The rotary lift 24 receives the wafer carrier 20 from the unloading station 28, raises it, rotates it 180 degrees, slides it to the rear side, and places it on the transfer line 38. The conveyance line 38 conveys the ueno carrier 20 to the transfer buffer 36 side and then stops. The rotary lift 22 rises and the wafer carrier 2
0 is taken from the conveyance line 38, lowered, and placed on the transfer buffer 36. Transfer fork 40 of the spreading device 103
The wafer carrier 20 is then transported to the diffusion device 103.
拡散処理が完了したウェハキャリア20は、拡散装置1
02からは移載フォーク39、受渡用バッファ34、回
転リフト24を介してキャリア搬送装置100へ戻され
る。拡散装置103からは移載フォーク40、受渡用バ
ッファ36、回転リフト22を介してキャリア搬送装置
100へ戻される。キャリア搬送装置100は戻された
ウェハキャリア20を次工程へ運ぶ。The wafer carrier 20 that has undergone the diffusion process is transferred to the diffusion device 1
From 02, the carrier is returned to the carrier transport device 100 via the transfer fork 39, the delivery buffer 34, and the rotary lift 24. From the spreading device 103, the carrier is returned to the carrier transport device 100 via the transfer fork 40, the transfer buffer 36, and the rotary lift 22. The carrier transport device 100 transports the returned wafer carrier 20 to the next process.
(発明の効果)
以上のように、本発明による半導体ウェハの洗浄装置は
、ウェハキャリアを自動的に拡散装置へ搬送できる手段
を設けたことによシ、次の効果がある。(Effects of the Invention) As described above, the semiconductor wafer cleaning apparatus according to the present invention has the following effects by providing means for automatically transporting the wafer carrier to the diffusion apparatus.
(1)作業者の介入による塵埃の発生を防ぎ、歩留υの
向上が期待できる。(1) It is possible to prevent the generation of dust due to operator intervention and improve the yield υ.
(2)拡散装置で拡散処理が終了したウェハは、ウェハ
キャリアに収納し、上記の手段を介してキャリア搬送装
置に回収することができる。すなわち、洗浄・拡散モジ
ュールへのウェハの供給および回収が、完全に自動化で
きる。(2) The wafer that has been subjected to the diffusion process in the diffusion device can be stored in a wafer carrier and recovered to the carrier transport device via the above-mentioned means. That is, the supply and collection of wafers to the cleaning/diffusion module can be fully automated.
第1図は本発明の一実施例である半導体ウェハの洗浄装
置の構成を示す概略説明図、第2図は上記洗浄装置、拡
散装置およびキャリア搬送装置の配置を示す斜視図。
20・・・ウェハキャリア、22.24・・・回転リフ
ト、26・・・投入ステーション、28・・・搬出ステ
ーション、30・・・洗浄用搬送ロボット、32・・・
液槽、33・・・乾燥装置、34.36・・・受渡用バ
ッファ、38・・・搬送ライン、39,40・・・移載
フォーク。
100・・・キャリア搬送装置、101・・・半導体ウ
ェハの洗浄装置、102,103・・・拡散装置、20
0・・・洗浄・拡散モジュール。FIG. 1 is a schematic explanatory diagram showing the configuration of a semiconductor wafer cleaning device according to an embodiment of the present invention, and FIG. 2 is a perspective view showing the arrangement of the cleaning device, the diffusion device, and the carrier transport device. 20... Wafer carrier, 22. 24... Rotating lift, 26... Loading station, 28... Carrying out station, 30... Cleaning transfer robot, 32...
Liquid tank, 33... Drying device, 34.36... Delivery buffer, 38... Conveyance line, 39, 40... Transfer fork. 100... Carrier transport device, 101... Semiconductor wafer cleaning device, 102, 103... Diffusion device, 20
0...Cleaning/diffusion module.
Claims (1)
ェハキャリアを搭載する複数のステーションを持った半
導体ウェハの洗浄装置であって、(a)前記洗浄装置と
直角方向に並列に配置される複数の拡散装置にウェハキ
ャリアを供給するため、一時的にウェハキャリアを搭載
する複数の受渡用バッファ部と、 (b)一の前記受渡用バッファ部側から他の前記受渡用
バッファ部側へウェハキャリアを移動させる搬送手段と
、 (c)前記ステーション、前記バッファ部および前記搬
送手段の3点間で、ウェハキャリアを自在に移載する複
数の移載手段と、 (d)上記各装置の処理状況とウェハキャリアの運搬と
を調整、制御する計算機装置とを具備することを特徴と
する半導体ウェハの洗浄装置。[Scope of Claims] A semiconductor wafer cleaning apparatus having a plurality of stations on which wafer carriers containing wafers before or after cleaning processing are mounted, the apparatus comprising: (a) parallel to the cleaning apparatus in a perpendicular direction; (b) a plurality of transfer buffer sections on which wafer carriers are temporarily mounted in order to supply wafer carriers to the plurality of dispersion devices arranged; (b) from one transfer buffer section side to another transfer buffer section; (c) a plurality of transfer means for freely transferring the wafer carrier between three points: the station, the buffer section, and the transfer means; (d) each of the above. A semiconductor wafer cleaning device comprising a computer device that adjusts and controls the processing status of the device and the transportation of a wafer carrier.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1438985A JPS61174722A (en) | 1985-01-30 | 1985-01-30 | Semiconductor wafer cleaning apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1438985A JPS61174722A (en) | 1985-01-30 | 1985-01-30 | Semiconductor wafer cleaning apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61174722A true JPS61174722A (en) | 1986-08-06 |
Family
ID=11859699
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1438985A Pending JPS61174722A (en) | 1985-01-30 | 1985-01-30 | Semiconductor wafer cleaning apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61174722A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6471134A (en) * | 1987-09-10 | 1989-03-16 | Mitsubishi Electric Corp | Automatic thermal treatment mechanism of semiconductor wafer |
JPH04249320A (en) * | 1991-02-05 | 1992-09-04 | Mitsubishi Electric Corp | Transport system of automatic cleaning apparatus |
JPH05109680A (en) * | 1991-10-21 | 1993-04-30 | Mitsubishi Electric Corp | Semiconductor wafer treating device |
-
1985
- 1985-01-30 JP JP1438985A patent/JPS61174722A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6471134A (en) * | 1987-09-10 | 1989-03-16 | Mitsubishi Electric Corp | Automatic thermal treatment mechanism of semiconductor wafer |
JPH04249320A (en) * | 1991-02-05 | 1992-09-04 | Mitsubishi Electric Corp | Transport system of automatic cleaning apparatus |
JPH05109680A (en) * | 1991-10-21 | 1993-04-30 | Mitsubishi Electric Corp | Semiconductor wafer treating device |
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