JPS61172487U - - Google Patents

Info

Publication number
JPS61172487U
JPS61172487U JP5731485U JP5731485U JPS61172487U JP S61172487 U JPS61172487 U JP S61172487U JP 5731485 U JP5731485 U JP 5731485U JP 5731485 U JP5731485 U JP 5731485U JP S61172487 U JPS61172487 U JP S61172487U
Authority
JP
Japan
Prior art keywords
chip
socket
contact pin
pushed down
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5731485U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0218539Y2 (https=
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985057314U priority Critical patent/JPH0218539Y2/ja
Publication of JPS61172487U publication Critical patent/JPS61172487U/ja
Application granted granted Critical
Publication of JPH0218539Y2 publication Critical patent/JPH0218539Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
JP1985057314U 1985-04-17 1985-04-17 Expired JPH0218539Y2 (https=)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985057314U JPH0218539Y2 (https=) 1985-04-17 1985-04-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985057314U JPH0218539Y2 (https=) 1985-04-17 1985-04-17

Publications (2)

Publication Number Publication Date
JPS61172487U true JPS61172487U (https=) 1986-10-27
JPH0218539Y2 JPH0218539Y2 (https=) 1990-05-23

Family

ID=30581726

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985057314U Expired JPH0218539Y2 (https=) 1985-04-17 1985-04-17

Country Status (1)

Country Link
JP (1) JPH0218539Y2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020076664A (ja) * 2018-11-08 2020-05-21 オムロン株式会社 プローブピン、検査治具、検査ユニットおよび検査装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5895587U (ja) * 1981-12-21 1983-06-29 富士通株式会社 Ic用ソケツト
JPS5955873U (ja) * 1982-10-06 1984-04-12 富士通株式会社 半導体ic用ソケツト

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5895587U (ja) * 1981-12-21 1983-06-29 富士通株式会社 Ic用ソケツト
JPS5955873U (ja) * 1982-10-06 1984-04-12 富士通株式会社 半導体ic用ソケツト

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020076664A (ja) * 2018-11-08 2020-05-21 オムロン株式会社 プローブピン、検査治具、検査ユニットおよび検査装置

Also Published As

Publication number Publication date
JPH0218539Y2 (https=) 1990-05-23

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