JPS61164177A - 低速電子測定装置 - Google Patents

低速電子測定装置

Info

Publication number
JPS61164177A
JPS61164177A JP60005471A JP547185A JPS61164177A JP S61164177 A JPS61164177 A JP S61164177A JP 60005471 A JP60005471 A JP 60005471A JP 547185 A JP547185 A JP 547185A JP S61164177 A JPS61164177 A JP S61164177A
Authority
JP
Japan
Prior art keywords
anode
heating
temperature
electrons
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60005471A
Other languages
English (en)
Japanese (ja)
Other versions
JPH058790B2 (enrdf_load_stackoverflow
Inventor
Masayuki Uda
応之 宇田
Tsunenori Shirohashi
白橋 典範
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Riken Keiki KK
RIKEN
Original Assignee
Riken Keiki KK
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Riken Keiki KK, RIKEN filed Critical Riken Keiki KK
Priority to JP60005471A priority Critical patent/JPS61164177A/ja
Priority to US06/819,226 priority patent/US4740730A/en
Publication of JPS61164177A publication Critical patent/JPS61164177A/ja
Publication of JPH058790B2 publication Critical patent/JPH058790B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Radiation (AREA)
JP60005471A 1985-01-16 1985-01-16 低速電子測定装置 Granted JPS61164177A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP60005471A JPS61164177A (ja) 1985-01-16 1985-01-16 低速電子測定装置
US06/819,226 US4740730A (en) 1985-01-16 1986-01-15 Apparatus for detecting low-speed electrons

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60005471A JPS61164177A (ja) 1985-01-16 1985-01-16 低速電子測定装置

Publications (2)

Publication Number Publication Date
JPS61164177A true JPS61164177A (ja) 1986-07-24
JPH058790B2 JPH058790B2 (enrdf_load_stackoverflow) 1993-02-03

Family

ID=11612155

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60005471A Granted JPS61164177A (ja) 1985-01-16 1985-01-16 低速電子測定装置

Country Status (1)

Country Link
JP (1) JPS61164177A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4823368A (en) * 1987-06-30 1989-04-18 Rikagaku Kenkyujyo Open counter for low energy electron detection with suppressed background noise
JP2007263804A (ja) * 2006-03-29 2007-10-11 Toshiba Corp 放射線測定装置及び放射線測定方法
JP2020071112A (ja) * 2018-10-31 2020-05-07 株式会社日立製作所 放射線モニタ及び放射線の測定方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4823368A (en) * 1987-06-30 1989-04-18 Rikagaku Kenkyujyo Open counter for low energy electron detection with suppressed background noise
JP2007263804A (ja) * 2006-03-29 2007-10-11 Toshiba Corp 放射線測定装置及び放射線測定方法
JP2020071112A (ja) * 2018-10-31 2020-05-07 株式会社日立製作所 放射線モニタ及び放射線の測定方法
WO2020090236A1 (ja) * 2018-10-31 2020-05-07 株式会社日立製作所 放射線モニタ及び放射線の測定方法

Also Published As

Publication number Publication date
JPH058790B2 (enrdf_load_stackoverflow) 1993-02-03

Similar Documents

Publication Publication Date Title
JP4206598B2 (ja) 質量分析装置
WO2019117172A1 (ja) X線管およびx線発生装置
JPS61164177A (ja) 低速電子測定装置
US3887839A (en) Pulsed field emission type electron gun
JPH06176725A (ja) イオン源
US4740730A (en) Apparatus for detecting low-speed electrons
JP4932532B2 (ja) 特定ガスの分圧の検出方法、及び四重極型質量分析計
JP4860202B2 (ja) X線発生装置
JPH10213509A (ja) 圧力測定装置
JP6772391B2 (ja) 電離真空計及び制御装置
Ballantine Fluctuation noise due to collision ionization in electronic amplifier tubes
JP3300775B2 (ja) 定電流動作電界放射型真空計
US5012194A (en) Method testing electron discharge tubes
US6377231B2 (en) Image-casting control method for image display device and image display device
JPH065287B2 (ja) 低速電子測定装置
WO2020178898A1 (ja) X線発生装置、並びに、その診断装置及び診断方法
JPH11250854A (ja) エッチングプラズマにおける基板入射イオンの分析法及び装置
JP2000241281A (ja) 熱陰極電離真空計
JPH075266A (ja) 電極間電圧の変動に伴う測定誤差を補正可能な比例計数管
JP3117459U7 (enrdf_load_stackoverflow)
US20070170926A1 (en) Method and device for measuring ultrahigh vacuum
JPH0616103B2 (ja) 低速電子測定装置
US2627036A (en) Photorelay circuit
JPH0193038A (ja) イオン銃
JP3890343B2 (ja) 電子源の製造装置及び電子源の製造方法

Legal Events

Date Code Title Description
S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313115

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term