JPS61161774U - - Google Patents
Info
- Publication number
- JPS61161774U JPS61161774U JP4702285U JP4702285U JPS61161774U JP S61161774 U JPS61161774 U JP S61161774U JP 4702285 U JP4702285 U JP 4702285U JP 4702285 U JP4702285 U JP 4702285U JP S61161774 U JPS61161774 U JP S61161774U
- Authority
- JP
- Japan
- Prior art keywords
- board
- probe
- testing
- airtight
- jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 7
- 239000003990 capacitor Substances 0.000 claims 1
- 239000004615 ingredient Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985047022U JPH06779Y2 (ja) | 1985-03-29 | 1985-03-29 | 基板試験用治具 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985047022U JPH06779Y2 (ja) | 1985-03-29 | 1985-03-29 | 基板試験用治具 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61161774U true JPS61161774U (enrdf_load_stackoverflow) | 1986-10-07 |
JPH06779Y2 JPH06779Y2 (ja) | 1994-01-05 |
Family
ID=30561966
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985047022U Expired - Lifetime JPH06779Y2 (ja) | 1985-03-29 | 1985-03-29 | 基板試験用治具 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH06779Y2 (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006220627A (ja) * | 2005-02-14 | 2006-08-24 | Sony Corp | プローブピン、プローブピンユニット及びこれを用いた被検査物の検査方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4914690U (enrdf_load_stackoverflow) * | 1972-05-08 | 1974-02-07 | ||
JPS50112961U (enrdf_load_stackoverflow) * | 1974-02-25 | 1975-09-13 | ||
JPS52164254U (enrdf_load_stackoverflow) * | 1976-06-07 | 1977-12-13 | ||
JPS6013483U (ja) * | 1983-07-07 | 1985-01-29 | 富士通株式会社 | 試験機用固定治具 |
-
1985
- 1985-03-29 JP JP1985047022U patent/JPH06779Y2/ja not_active Expired - Lifetime
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4914690U (enrdf_load_stackoverflow) * | 1972-05-08 | 1974-02-07 | ||
JPS50112961U (enrdf_load_stackoverflow) * | 1974-02-25 | 1975-09-13 | ||
JPS52164254U (enrdf_load_stackoverflow) * | 1976-06-07 | 1977-12-13 | ||
JPS6013483U (ja) * | 1983-07-07 | 1985-01-29 | 富士通株式会社 | 試験機用固定治具 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006220627A (ja) * | 2005-02-14 | 2006-08-24 | Sony Corp | プローブピン、プローブピンユニット及びこれを用いた被検査物の検査方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH06779Y2 (ja) | 1994-01-05 |