JPS61161461A - Conductivity tester - Google Patents
Conductivity testerInfo
- Publication number
- JPS61161461A JPS61161461A JP60001491A JP149185A JPS61161461A JP S61161461 A JPS61161461 A JP S61161461A JP 60001491 A JP60001491 A JP 60001491A JP 149185 A JP149185 A JP 149185A JP S61161461 A JPS61161461 A JP S61161461A
- Authority
- JP
- Japan
- Prior art keywords
- tested
- substance
- connector
- tested substance
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は多芯ケーブル、フレキシブル配線板、グリント
配線等のように多数の導体群を有する被検査物の導通検
査装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a continuity testing device for test objects having a large number of conductor groups, such as multicore cables, flexible wiring boards, glint wiring, and the like.
従来、多芯ケーブルの配線の導通検査(具体的には断線
検査短絡検査および配線の入れかわりの検査)を行う忙
は、テスターを用いて行5のが一般的である。Conventionally, continuity testing (specifically, disconnection testing, short-circuit testing, and wiring replacement testing) of multicore cable wiring has generally been performed using a tester.
この検査を完全に行うには、例えば50芯のケー プル
の場合50x50=2500点の検査が必要であり、多
大な時間と労力とを必要とし、しかも正確さに欠ける欠
点があった。In order to completely perform this inspection, for example, in the case of a 50-core cable, it is necessary to inspect 50 x 50 = 2500 points, which requires a great deal of time and effort, and has the drawback of lacking accuracy.
本発明は前記欠点を除宏するためなされたもので、短時
間にかつ労力が少なく、シかも正確に多数の導体群を有
する被検査物の導通検査を行うことができる導通検査装
置を提供することを目的とする。The present invention has been made in order to eliminate the above-mentioned drawbacks, and provides a continuity testing device that can accurately conduct continuity testing of a test object having a large number of conductor groups in a short time and with less labor. The purpose is to
本発明は上記目的を達成するために、導通検査すべき多
数の導体群を備え、この各導体端部にそれぞれコネクタ
を備えた被検査物と、この被検査物の一方側の各導体端
部のコネクタな接離可能にコネクタを有し、規則的に電
流パルスを発生する・々ルス発生器と、前記被検査物の
他方何の各導体端部のコネクタに接離可能なコネクタを
有し、前記パルス発生器からの電流/4’ルスの入力に
応じて出力を生ずる出力器とから構成したものである。In order to achieve the above object, the present invention includes a test object that includes a large number of conductor groups to be tested for continuity, each conductor end having a connector, and each conductor end on one side of the test object. The connector has a connector that can be connected to and disconnected from, and has a pulse generator that regularly generates current pulses, and a connector that can be connected to and disconnected from the connector at each conductor end of the other object to be inspected. , and an output device that produces an output in response to the current/4' pulse input from the pulse generator.
以下、本発明の実施例について図面を参照して説明する
。第1図は導通検査装置の一実施例を示すプロ、り図で
ある。図中1は多芯ケーブル、フレキシブル配線板、プ
リント配線板のように導通検査すべき導体群を備えた被
検査物で、この被検査物Jの各導体の両端部に電気的に
接続したコネクタ(プラグ又はレセプタクル)2を備え
ている。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic diagram showing an embodiment of the continuity testing device. In the figure, 1 is an object to be tested that is equipped with a group of conductors to be tested for continuity, such as a multi-core cable, flexible wiring board, or printed wiring board, and connectors are electrically connected to both ends of each conductor of this object to be tested J. (plug or receptacle) 2.
3は第2図のクロックCLOCKを発生するクロック発
生器、4はデータを出力するデータ発生器、5はシフト
レジスタで、前記クロック発生器3のクロ、りをカウン
トし、検査開始と同時に前記データ発生器4からのデー
タを入力し、出力端子Q 71 Q z e Q 3・
・・Qnから第2図に示すような電流パルスを出力する
ものである。3 is a clock generator that generates the clock CLOCK shown in FIG. 2; 4 is a data generator that outputs data; 5 is a shift register that counts the clock pulses of the clock generator 3; Input data from generator 4 and output terminal Q 71 Q ze Q 3.
. . . A current pulse as shown in FIG. 2 is output from Qn.
6は前記シフトレジスタ5の各出力端子Q7〜Qnに対
応して設けた電流ドライバ、7は出力器で例えば複数個
の発光ダイオードからなっている。8.9は前記電流ド
ライバ6の出力端子および前記出力器7の出力端子に電
気的に接続し、前記被検査物lのコネクタに接離可能な
コネクタ(レセプタクル又はプラグ)である。Reference numeral 6 represents a current driver provided corresponding to each output terminal Q7 to Qn of the shift register 5, and reference numeral 7 represents an output device, for example, a plurality of light emitting diodes. Reference numeral 8.9 denotes a connector (receptacle or plug) that is electrically connected to the output terminal of the current driver 6 and the output terminal of the output device 7 and that can be connected to and separated from the connector of the object to be inspected 1.
このような構成のものにおいて、被検査物1の両端のコ
ネクタ2.2と、出力器7および電流ドライバ6のコネ
クタ8.9をそれぞれ接続した状態で導通検査を開始す
る。すると、クロック発生器3によって発生したクロ、
りはシフト−レジスタ5でカウントされると同時にデー
タ発生器4からのデータが第2図のタイミングでシフト
レジスタ5に入力される。従って、電流ドライバ6は第
2図のタイミングで出力を生じ、この出力は被検査物2
を通じて出力器7を構成する発光ダイオードが点灯する
。In such a configuration, the continuity test is started with the connectors 2.2 at both ends of the object to be tested 1 connected to the connectors 8.9 of the output device 7 and the current driver 6, respectively. Then, the clock generated by the clock generator 3,
At the same time, the data from the data generator 4 is input to the shift register 5 at the timing shown in FIG. 2. Therefore, the current driver 6 produces an output at the timing shown in FIG.
Through this, the light emitting diode constituting the output device 7 lights up.
被検査物lが正常の場合、発光ダイオードは第2図のタ
イミング通り順序よく点灯する。ところが、被検査物1
が断線した場合断線箇所に対応する発光ダイオードが点
灯しない。また。When the object to be inspected l is normal, the light emitting diodes are illuminated in an orderly manner according to the timing shown in FIG. However, the object to be inspected 1
If the wire breaks, the light emitting diode corresponding to the broken wire will not light up. Also.
被検査物ノが短絡状態の場合、短絡している導体に対応
する複数個の発光ダイオードが同時に点灯する。さらに
被検査物ノの導体が入れかわりの場合、発光ダイオード
の点灯の順序が入れかわる。When the object to be inspected is short-circuited, a plurality of light emitting diodes corresponding to the short-circuited conductors are lit at the same time. Furthermore, when the conductors of the object to be inspected are replaced, the order in which the light emitting diodes are turned on is changed.
このように被検査物lの各導体に規側的(決められた順
序で)に電流・ぐルスを供給することにより、被検査物
Jの導通検査すなわち、断線、短絡、導体の入れかわり
を短時間にかつ少労力で、しかも正確に検査ができる。In this way, by supplying current/glucose to each conductor of the object to be inspected (in a predetermined order), continuity testing of the object to be inspected (J), i.e., disconnections, short circuits, and replacement of conductors, can be performed. Inspections can be performed accurately in a short time and with little effort.
第3図は本発明による導通検査装置の他の実施例を示す
ブロック図である。前記実施例は出力器7の発光ダイオ
ードを通じて視覚的に行ったものであるが、第3図はシ
フトレジスタ5の端子Q j −Q nのデータと被検
査物Jの出力側Q1’〜Qn′のデータをそれぞれ比較
器10で比較し、両者が不一致のとき比較器JOから誤
配線検出信号を出力するようにしたものである。なお、
1ノは抵抗、12はインバータである。FIG. 3 is a block diagram showing another embodiment of the continuity testing device according to the present invention. The above embodiment was carried out visually through the light emitting diode of the output device 7, but in FIG. The comparator 10 compares the data of the two, and when the two do not match, the comparator JO outputs a miswiring detection signal. In addition,
1 is a resistor, and 12 is an inverter.
さらに前記実施例以外に出力器側に例えばマイクロコン
ピュータを設けて被検査物の誤配線を人間に代って認識
させることも可能であり、このようにすれば全体の検出
結果から断線、短絡および入れかわりのいずれかである
かも自動的に判断させることもできる。Furthermore, in addition to the above-mentioned embodiments, it is also possible to install a microcomputer on the output device side to recognize incorrect wiring of the object to be inspected in place of a human being.In this way, disconnections, short circuits, and It is also possible to automatically determine whether there is a replacement.
以上述べた本発明によれば短時間にかつ労力が少なく、
しかも正確に多数の導体群を有する被検査物の導通検査
を行うことができる導通検査−置を提供できる。According to the present invention described above, it is possible to do this in a short time and with less labor.
Furthermore, it is possible to provide a continuity testing device that can accurately perform continuity testing on a test object having a large number of conductor groups.
第1図は本発明による導通検査装置の一実施例を示すプ
ロ、り図、第2図は同実施例の動作を説明するためのタ
イミングチャート、第3図は本発明による導通検査装置
の他の実施例を示すブロック図である。
!・・・被検査物、2・・・コネクタ、3・・・クロッ
ク発生器、4・・・データ発生器、5・・・シフトレジ
スタ、6・・・電流ドライバ、2・・・出力器、8.9
・・・コネクタ、JO・・・比較器、Jノ・・・抵抗。
出願人代理人 弁理士 鈴 江 武 彦第1図
12rM
Q2 −ローーーー
Q3 −一口−−−
Qn −m−」1−FIG. 1 is a schematic diagram showing one embodiment of the continuity testing device according to the present invention, FIG. 2 is a timing chart for explaining the operation of the same embodiment, and FIG. 3 is a diagram showing other continuity testing devices according to the present invention. It is a block diagram showing an example of. ! ...Object to be inspected, 2...Connector, 3...Clock generator, 4...Data generator, 5...Shift register, 6...Current driver, 2...Output device, 8.9
... Connector, JO ... Comparator, J ... Resistor. Applicant's agent Patent attorney Takehiko Suzue Figure 1 12rM Q2 -Lo-Q3 -Sip--Qn -m-''1-
Claims (1)
それぞれコネクタを備えた被検査物と、この被検査物の
一方側の各導体端部のコネクタに接離可能なコネクタを
有し、規則的に電流パルスを発生するパルス発生器と、
前記被検査物の他方側の各導体端部のコネクタに接離可
能なコネクタを有し、前記パルス発生器からの電流パル
スの入力に応じて出力を生ずる出力器とからなる導通検
査装置。A test object is equipped with a large number of groups of conductors to be tested for continuity, each conductor end is equipped with a connector, and a connector on one side of the test object is connected to and detachable from the connector at each conductor end. , a pulse generator that regularly generates current pulses;
A continuity testing device comprising a connector that can be connected to and separated from a connector of each conductor end on the other side of the object to be tested, and an output device that generates an output in response to input of a current pulse from the pulse generator.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60001491A JPS61161461A (en) | 1985-01-10 | 1985-01-10 | Conductivity tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60001491A JPS61161461A (en) | 1985-01-10 | 1985-01-10 | Conductivity tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61161461A true JPS61161461A (en) | 1986-07-22 |
Family
ID=11502919
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60001491A Pending JPS61161461A (en) | 1985-01-10 | 1985-01-10 | Conductivity tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61161461A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0254181A (en) * | 1988-08-18 | 1990-02-23 | Nippon Telegr & Teleph Corp <Ntt> | Tester of connection of connector |
JPH0964973A (en) * | 1995-08-28 | 1997-03-07 | Nec Corp | Lan communication equipment |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4835379A (en) * | 1971-09-06 | 1973-05-24 | ||
JPS515728U (en) * | 1974-06-29 | 1976-01-16 |
-
1985
- 1985-01-10 JP JP60001491A patent/JPS61161461A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4835379A (en) * | 1971-09-06 | 1973-05-24 | ||
JPS515728U (en) * | 1974-06-29 | 1976-01-16 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0254181A (en) * | 1988-08-18 | 1990-02-23 | Nippon Telegr & Teleph Corp <Ntt> | Tester of connection of connector |
JPH0964973A (en) * | 1995-08-28 | 1997-03-07 | Nec Corp | Lan communication equipment |
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