JPS61159182A - X-ray analysis instrument - Google Patents

X-ray analysis instrument

Info

Publication number
JPS61159182A
JPS61159182A JP59278354A JP27835484A JPS61159182A JP S61159182 A JPS61159182 A JP S61159182A JP 59278354 A JP59278354 A JP 59278354A JP 27835484 A JP27835484 A JP 27835484A JP S61159182 A JPS61159182 A JP S61159182A
Authority
JP
Japan
Prior art keywords
time
oscillation
output
circuit
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59278354A
Other languages
Japanese (ja)
Inventor
Seiji Hashimoto
誠司 橋本
Noriaki Nakanishi
中西 典顕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59278354A priority Critical patent/JPS61159182A/en
Publication of JPS61159182A publication Critical patent/JPS61159182A/en
Pending legal-status Critical Current

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Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)

Abstract

PURPOSE:To eliminate the waste of time and to improve the reliability on the result of the measurement by detecting the oscillation of the output of an X-ray detector with the oscillation of the liquid surface of a refrigerant and starting measurement at the point of the time when the oscillation attenuates down to a prescribed level or below. CONSTITUTION:The X-ray detector D is so constituted as to be cooled by liquid nitrogen. A measuring circuit M which measures the count rate of the X-ray detection pulses and a control circuit Com which detects the oscillation of the output owing to the oscillation of the liquid nitrogen from the output of the circuit M are provided. The reference level l of the oscillation and the time T slightly longer than the period of the oscillation are set at prescribed values. The % of the time when the output of the circuit M exceeds the reference level l with respect to the time T is measured and the measurement is started by discriminating that the oscillation ceases upon attainment of the time when the output of the circuit M exceeds the level l at the prescribed % or below during the time T. The wasteful waiting time is thereby eliminated and the excessively fast start of the measurement is prevented.

Description

【発明の詳細な説明】 イ、産業上の利用分野 本発明はX線検出に液体窒素冷却の半導体検出器を用い
たX線分析装置に関する。
DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to an X-ray analyzer using a liquid nitrogen-cooled semiconductor detector for X-ray detection.

口・ 従来の技術 X線分析装置でX線検出器をゴニオメータ上でブラッグ
の条件を満足する所定位置に移動させて測定を行う場合
、X線検出器に液体窒素等で冷却した半導体検出器を用
いると、冷却媒体も検出器と共に移動させるので、検出
器を所定位置に移動させたとき冷媒の液面が動揺し、そ
れに伴って検出器の感度及びノイズレベルが揺れるため
、移動後、この感度の揺れが収まるまでは測定ができな
い。従来はこの冷媒液面の揺れが収まるまでの時間を経
験的に推定して、検出器移動後タイマで待ち時間を設定
して、待ち時間構過後測定を行うようにしていた。しか
しこのような方法では待ち時間は確実性を優先してどう
しても長めに設定することになり、現実には冷媒液面の
揺れは収まっているのに無駄な時間待ちをしている場合
が多かった。また逆に時間節約を計る余り、待ち時間を
短かめに設定して、揺れが収まっていない時期から測定
の開始して不確かな測定になってしまうと云った失敗も
あった。
- Conventional technology When measuring with an X-ray analyzer by moving the X-ray detector to a predetermined position on a goniometer that satisfies Bragg's conditions, it is necessary to use a semiconductor detector cooled with liquid nitrogen, etc. as the X-ray detector. When the detector is used, the cooling medium is also moved together with the detector, so when the detector is moved to a predetermined position, the liquid level of the refrigerant fluctuates, and the sensitivity and noise level of the detector fluctuate accordingly. Measurements cannot be taken until the shaking has subsided. Conventionally, the time required for the shaking of the refrigerant liquid level to subside was estimated empirically, a waiting time was set using a timer after the detector was moved, and measurements were taken after the waiting time had elapsed. However, with this method, the waiting time is inevitably set to a long time in favor of reliability, and in reality, the waiting time is often wasted even though the fluctuations in the refrigerant liquid level have subsided. . On the other hand, in an attempt to save time, some people made the mistake of setting the waiting time too short and starting measurements before the shaking had subsided, resulting in uncertain measurements.

ノー 発明が解決しようとする問題点 本発明は上述したような、待ち時間を見込みによって設
定することによる時間の無駄をなりシ、また冷媒液面の
揺れの影響が入った不確か、な測定が行われるのを防ご
うとするものである。
No. Problems to be Solved by the Invention The present invention eliminates the waste of time caused by setting the waiting time based on estimates as described above, and also eliminates the need for uncertain measurements that are affected by fluctuations in the refrigerant liquid level. This is what you are trying to prevent from being exposed.

二・ 問題点解決のための手段 冷媒の液面の揺れに伴うX線検出器出力の揺れを検出し
、この揺れが所定レベル以下に減衰した時点で測定を開
始させるようにした。
2. Means for solving the problem The fluctuation of the output of the X-ray detector due to the fluctuation of the liquid level of the refrigerant is detected, and the measurement is started when this fluctuation has attenuated to a predetermined level or less.

ホ0作用 液面の揺れによる検出器出力の揺れが現実に収まるのを
検出して測定を開始させるので、無駄な待ち時間がなく
なシ、早過ぎる測定開始も防止される。
Since the measurement is started after detecting that the fluctuation in the detector output due to the fluctuation of the working liquid level has actually subsided, there is no wasted waiting time, and the premature start of measurement is also prevented.

へ・実施例 図面は本発明の一実施例を示す。XはX線源、Sは試料
でGがゴニオメータでアシ、Cは分光結晶、DがX線検
出器で液体窒素で冷却されるようになっている。Mは測
定回路でX線検出パルスの計数率を測定して出力する。
Embodiment The drawings show an embodiment of the present invention. X is an X-ray source, S is a sample, G is a goniometer, C is a spectroscopic crystal, and D is an X-ray detector, which is cooled with liquid nitrogen. M is a measurement circuit that measures and outputs the counting rate of X-ray detection pulses.

C(+mは制御回路で、X線検出器1分光結晶の駆動制
御、測定回路出力の記憶及び表示装置への出力、測定開
始時点の判定等の動作を行っている。X線検出器の出力
信号は測定回路Mに入力され、X線強度値に変換される
。制御回路COmはこの測定回路の出力を読込みメモリ
に記憶さする。
C (+m is a control circuit that performs operations such as controlling the drive of the X-ray detector 1 spectroscopic crystal, storing and outputting the measurement circuit output to the display device, and determining the measurement start point.The output of the X-ray detector The signal is input to a measuring circuit M and converted into an X-ray intensity value.The control circuit COm reads the output of this measuring circuit and stores it in a memory.

制御回路comはまた、測定回路出力から、液体窒素の
揺れによる出力の揺れの検出を行っている。この揺れの
周期は略定っているから、揺れの検出は次のようにして
行われる。揺れの周期より稍長い時間Tを予め設定して
おき、測定回路出力が基準レベルを超えた時間が時間T
に対して何チであるかを時間Tを一周期として繰返し測
定する。
The control circuit com also detects fluctuations in the output due to fluctuations in the liquid nitrogen from the measurement circuit output. Since the period of this shaking is approximately fixed, the shaking is detected as follows. A time T that is slightly longer than the shaking period is set in advance, and the time T is the time when the measurement circuit output exceeds the reference level.
It is repeatedly measured how many chis there are with respect to the time T as one cycle.

第2図から明かなように揺れが大きいときは、測定回路
出力が基準レベルlを超えている時間はTの30%以上
である。反対に揺れが収まった所では測定回路出力は一
定したノイズを示し、基準レベルlを超えることは殆ん
どない。そのように基準レベルjを設定しである。時間
Tは略揺れの周期に採っであるので、この時間のインタ
ーバルと揺れの位相との関係の如何にか\わらず、基準
レベルを超す揺れがある間は時間Tの間には測定回路出
力が必ず基準レベルを超す位相が含まれる。
As is clear from FIG. 2, when the vibration is large, the time during which the measurement circuit output exceeds the reference level l is 30% or more of T. On the other hand, in a place where the shaking has subsided, the output of the measurement circuit exhibits constant noise and almost never exceeds the reference level l. The reference level j is set in this way. Since the time T is taken approximately at the period of the shaking, regardless of the relationship between this time interval and the phase of the shaking, the output of the measuring circuit during the time T while there is a shaking that exceeds the reference level. This includes phases in which always exceeds the reference level.

従って、時間Tの間に測定回路出力が基準レベルを超す
時間が適当に定めたチ以下になった所で揺れが収まった
と判定できる。
Therefore, it can be determined that the shaking has subsided when the time during which the output of the measuring circuit exceeds the reference level during time T becomes less than or equal to a suitably determined value.

ト効果 本発明によれば、冷媒液の液面の揺れによる検出器出力
の揺れを検出し、これが基準レベル以下に減衰したこと
を検知して測定を開始するものであるから、無駄な待ち
時間がなくなって分析の能率が向上し、揺れが充分に収
まったことを検知して測定を開始しているので、測定結
果の信頼性が向上する。
According to the present invention, fluctuations in the detector output due to fluctuations in the liquid level of the refrigerant liquid are detected, and measurement is started when it is detected that this has attenuated below a reference level, thereby eliminating unnecessary waiting time. This improves the efficiency of analysis, and the reliability of measurement results improves because measurements are started after detecting that the shaking has subsided sufficiently.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例装置の構成を示すブロック図
、第2図は検出器出力の揺れの検出動作を説明するグラ
フである。 代理人 弁理士  縣   浩  介 第1 図実方H列の7”0ツク図 第2図
FIG. 1 is a block diagram showing the configuration of an apparatus according to an embodiment of the present invention, and FIG. 2 is a graph illustrating an operation for detecting fluctuations in a detector output. Agent: Hiroshi Agata, Patent Attorney Figure 1: Figure 2: 7”0 block diagram of column H on the actual side

Claims (1)

【特許請求の範囲】[Claims] X線の検出に冷却用液体を用いて冷却された検出器を用
い、上記X線検出器の冷却用液体の液面の揺れによる出
力の揺れを検出する回路と、同回路の出力を基準レベル
と比較し、同回路の出力が基準値以下になったことを検
出して測定を開始させる制御回路を備えたX線分析装置
A detector cooled using a cooling liquid is used to detect X-rays, and a circuit that detects fluctuations in the output due to fluctuations in the surface of the cooling liquid of the X-ray detector is used, and the output of the circuit is set to a reference level. An X-ray analyzer equipped with a control circuit that starts measurement when it detects that the output of the same circuit has fallen below a reference value.
JP59278354A 1984-12-31 1984-12-31 X-ray analysis instrument Pending JPS61159182A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59278354A JPS61159182A (en) 1984-12-31 1984-12-31 X-ray analysis instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59278354A JPS61159182A (en) 1984-12-31 1984-12-31 X-ray analysis instrument

Publications (1)

Publication Number Publication Date
JPS61159182A true JPS61159182A (en) 1986-07-18

Family

ID=17596162

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59278354A Pending JPS61159182A (en) 1984-12-31 1984-12-31 X-ray analysis instrument

Country Status (1)

Country Link
JP (1) JPS61159182A (en)

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