JPS61155971A - Voltage margin testing system - Google Patents

Abstract

PURPOSE:To attain to enhance the speed and accuracy of a voltage margin test by automating the change in a voltage value, by performing the change in a voltage value on the basis of the program in a system power source control part. CONSTITUTION:Arbitrary voltage change indication data is set to an arbitrary DA converter in arbitrary order by the control of a voltage control processor 4 during a voltage margin test. The voltage change indication data set to DA converters 6-1-6-m receive AD conversion and the converted signals are amplified by corresponding operational amplifiers 7-1-7-m to be outputted to a DC power source part as voltage change indication signals through operational relays 8-1-8-m. In the DC power source part, a test program is performed under a deviated voltage value and a logical apparatus is tested.

Description

DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a voltage margin test method, and particularly to a voltage margin test method for electronic devices such as logic devices in information processing systems.

In more detail, it includes a system power control unit that centrally controls the power supply to electronic devices, and a system power control unit that is installed in the electronic device to turn on/off the specified DC power of the electronic device and detect abnormalities. The present invention relates to a voltage margin test method for an electronic device in a power supply control system that is configured with a device power supply control section that performs control such as the like, and in which digital data is exchanged between the system power supply control section and the device power supply control section.

(Prior art) In the conventional voltage merge 7 test of this type, the voltage value of the DC power supply is changed by manually operating a switch on a panel provided in the power supply control unit, and the voltage value set in this way is A test program is run for each combination of multiple voltage values.

(Problems to be Solved by the Invention) In this type of conventional technology, since the voltage value is set manually, it takes a considerable amount of time to set the voltage value, and the number of changes in the voltage value remains unchanged. There is a problem in that it is necessary to increase the number of switches accordingly.

Therefore, an object of the present invention is to change the voltage value based on a program in the system power supply control unit, or in some cases in conjunction with a test program. In addition to automating the voltage margin test to make it faster and more precise, the voltage change instruction signal is fixed at zero potential when the voltage margin test is not being performed, and the voltage value is stabilized as shown in Figure 9. Another object of the present invention is to eliminate the need for a conventional voltage change switch.

(Determined Means for Solving the Problems) To this end, the method of the present invention is applicable to a power supply control system that controls at least one DC power supply for an electronic device based on digital data generated under program control. In the voltage margin test method for electronic equipment, DC power is turned on based on digital data.

A processor that performs control such as disconnection and abnormality detection and converts the voltage change instruction data of the 1-ratio digital data into voltage change instruction data for a specific DC power supply, and converts the code-converted ratio voltage change instruction data into an analog signal. with a converter compatible with DC power.

An amplifier compatible with the converter that amplifies the analog signal, a relay and metal fitting that connects the output of the amplifier when the processor is instructing a voltage change, and connects zero potential when not, and connects the output of the relay to the corresponding DC power supply. It is characterized by being supplied.

(Embodiment) FIG. 2 is a block diagram showing the main parts of a power supply control system for a plurality of logical devices to which the embodiment of the present invention shown in FIG. 1 is applied. Referring to FIG. 2, the power supply control system includes a system power supply control unit 11, device power supply control units 13-1 to 13-n provided in logical devices 12-1 to 12-H, respectively, and a termination unit. It is equipped with 14.

In order to centrally control the power supply section of the logical device 12-1--12-r1%t or a specified logical device among these logical devices, the system power control section 11 includes a system power control section. The system power supply control processor generates detailed control data for controlling the power supply unit based on the power supply control software.
The power supply control units 13-1 to 12-H of the logical devices 12-1 to 12-H to be controlled are connected via the control data line 101ft.
13-n%t or the power supply control unit of the specified logical device. In this case, the control data has a bit-serial word structure and is formed by a plurality of types of control words corresponding to a predetermined number of power control items.

Therefore, the control data line 101 may basically be a single-core wire, and the device power control section 13-1"-13
By assigning a predetermined address to -n in advance, it is possible to connect the control data rhino 101t-1 in series as shown in FIG. 2. Note that the termination unit 14 functions as a terminal for terminating control data.

FIG. 1 shows the nine power supply control units 13-1 to 13 shown in FIG.
FIG. 2 is a block diagram illustrating a main part of one example of a power supply control unit among the power supply controllers. Referring to FIG. 1, the present embodiment includes a driver 1, a receiver 2, an I/T Ace circuit 3,
A power supply control processor (hereinafter referred to as processor) 4, a decoder 5, and a digital-to-analog converter (hereinafter referred to as DA) 6-1 to 5.
-m and Operation Seal Torua/Guar 1-7
-m, relays 8-1 to 8-dm, and a relay circuit 9. In FIG. 1, control data from the system power supply control unit 11 is input to the interface circuit 3 via the control data life 101 and the receiver 2, and is subjected to serial/parallel conversion in the interface circuit 3. Ru. The converted control data is input to the processor 8-4, the power supply control data is processed, and the predetermined digital data is supplied from the processor 4 to the DA-j core converter rows 1 to 6-m. In response to input of power supply control data, the processor 4 generates control signals for predetermined items for the power supply unit and sends them to the power supply unit.
In order to avoid the complexity of C, the route is omitted.
Sill. Such control signals include voltage merge/
In addition to specific test instructions, this includes turning on and off the power.

i ratio, the processor 4 performs certain monitoring in the power supply section.
Monitors the 1st cell, processes the monitoring signal r from the power supply unit, and then transfers it to the system power supply control unit 11 via the interface circuit 3゜' driver 1 and the control data rhino 101. However, the system and power supply control section 11 uses this monitoring signal as an operation monitoring signal.

If the voltage margin test is not performed, i.e., the logic device is in normal operation, the processor 4 switches all relays -1 to gm to the ground side. Outputs a number that causes As a result of this, the outputs of the operating layer navigators 7-1 to 7-m are not used as the voltage change instruction signal to the power supply section, but 0 is used. Therefore, operation 4 Lua 7p 7
The drift effect effect in -1 to 7-m does not affect the voltage change instruction signal, and the voltage value in the power supply section is reduced to the value set for normal operation, and there is no risk of disturbing the normal operation of the logic device. .

On the other hand, during the voltage margin test, by controlling the glosser 4, it is possible to set any voltage change instruction data to any DA converter in any order. The AC voltage change instruction data set in the display DA converters 6-1 to 6-m is converted into digital data.

are converted into analog signals, and each signal has a corresponding
Amplify with operational four-channel amplifier 7-1 to 7-m
After being attacked by Evil 1, Operate Four-Naru Amplifier 7-1~7
(Relays 8-1 to g switched to -mN
-m, it is output to the DC power supply unit as a voltage change instruction signal.
In the converter/DC power supply section, this voltage change instruction signal is sent quickly.

in response to the voltage value and thus the deviation
The test program is executed under the preset voltage value,
The logical devices 12-1 to 12-n are tested.

Since the electric 1-pressure change instruction data is stored in the zero-person converter, multiple OD
By connecting the data to the data bus from the processor 4, a number of voltages can be generated for multiple voltage values.4. A single change indication signal can be generated, and the test results are performed sequentially for each combination of shifted voltage values. Here, the voltage change instruction signal is generated by the stem power supply control processor based on the voltage control software, and it is easily possible to link it with the voltage value change test program by recalling the following information. can.

According to the present invention, by adopting the above-described configuration, it is possible to automatically change the voltage value of a DC power supply for electronic equipment, thereby improving the efficiency and precision of the voltage margin test. This makes maintenance of electronic devices easier, and voltage merge 7
Since the voltage change instruction signal can be fixed at zero potential when the test is not performed, it is possible to stabilize the voltage value.
Also, it is possible to eliminate the need for voltage change life, which was necessary in the past.

BRIEF DESCRIPTION OF THE 4 PLANES Figure 1 shows an embodiment of the present invention, and Figures 5M and 2 show the main parts of a power supply control system to which this embodiment is applied.

3... I/Tough Ace circuit, 4... Power control processor (processor), 5... Decoder, 6-1 to 6-m... Digital Analog converter (L)A converter), 7-1 to 7-
m...Operating tune up/up, 8-1~B-
m...Relay, 9...Relay circuit.

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Claims (1)

[Scope of Claim] A voltage margin test method for an electronic device in a power supply control system that controls at least one DC power source for an electronic device based on digital data generated under program control, comprising: turning on the DC power based on;
a processor that performs control such as disconnection and abnormality detection, and converts voltage change instruction data of the digital data into voltage change instruction data for the specific DC power source; and converts the code-converted voltage change instruction data into an analog signal. an amplifier compatible with the converter that amplifies the analog signal; an output of the amplifier is connected when the processor is instructing a voltage change, and a zero potential is connected otherwise; A voltage margin test method characterized in that a relay is provided, and the output of the relay is supplied to a corresponding DC power supply.