JPS61155774U - - Google Patents
Info
- Publication number
- JPS61155774U JPS61155774U JP3895585U JP3895585U JPS61155774U JP S61155774 U JPS61155774 U JP S61155774U JP 3895585 U JP3895585 U JP 3895585U JP 3895585 U JP3895585 U JP 3895585U JP S61155774 U JPS61155774 U JP S61155774U
- Authority
- JP
- Japan
- Prior art keywords
- measuring
- electronic component
- measurement terminal
- pair
- leadless electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 5
- 239000000696 magnetic material Substances 0.000 claims 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3895585U JPH0443824Y2 (fi) | 1985-03-20 | 1985-03-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3895585U JPH0443824Y2 (fi) | 1985-03-20 | 1985-03-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61155774U true JPS61155774U (fi) | 1986-09-27 |
JPH0443824Y2 JPH0443824Y2 (fi) | 1992-10-15 |
Family
ID=30546450
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3895585U Expired JPH0443824Y2 (fi) | 1985-03-20 | 1985-03-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0443824Y2 (fi) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017198519A (ja) * | 2016-04-27 | 2017-11-02 | 日亜化学工業株式会社 | 発光装置の検査方法 |
JP2020024226A (ja) * | 2016-04-27 | 2020-02-13 | 日亜化学工業株式会社 | 発光装置の検査方法 |
JP2022041092A (ja) * | 2020-08-31 | 2022-03-11 | 株式会社 東京ウエルズ | ワーク検査装置 |
-
1985
- 1985-03-20 JP JP3895585U patent/JPH0443824Y2/ja not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017198519A (ja) * | 2016-04-27 | 2017-11-02 | 日亜化学工業株式会社 | 発光装置の検査方法 |
JP2020024226A (ja) * | 2016-04-27 | 2020-02-13 | 日亜化学工業株式会社 | 発光装置の検査方法 |
JP2022041092A (ja) * | 2020-08-31 | 2022-03-11 | 株式会社 東京ウエルズ | ワーク検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0443824Y2 (fi) | 1992-10-15 |
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