JPS61155772U - - Google Patents

Info

Publication number
JPS61155772U
JPS61155772U JP3954785U JP3954785U JPS61155772U JP S61155772 U JPS61155772 U JP S61155772U JP 3954785 U JP3954785 U JP 3954785U JP 3954785 U JP3954785 U JP 3954785U JP S61155772 U JPS61155772 U JP S61155772U
Authority
JP
Japan
Prior art keywords
electrodes
appropriate intervals
semiconductive
insulator
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3954785U
Other languages
Japanese (ja)
Other versions
JPH0353184Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3954785U priority Critical patent/JPH0353184Y2/ja
Publication of JPS61155772U publication Critical patent/JPS61155772U/ja
Application granted granted Critical
Publication of JPH0353184Y2 publication Critical patent/JPH0353184Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Relating To Insulation (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Insulators (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の汚損測定用パイロツト碍子の
要部を示す拡大断面図、第2図はその等価回路図
である。 2:電極、3:半導電部。
FIG. 1 is an enlarged sectional view showing the main parts of a pilot insulator for stain measurement according to the present invention, and FIG. 2 is an equivalent circuit diagram thereof. 2: electrode, 3: semiconductive part.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 碍子表面に汚損測定用の電極2を適当な間隔で
設けるとともに、碍子表面の少くとも電極2,2
間の部分を半導電性の釉薬が施釉された半導電部
3としたことを特徴とする汚損測定用パイロツト
碍子。
Electrodes 2 for contamination measurement are provided on the insulator surface at appropriate intervals, and at least electrodes 2, 2 on the insulator surface are provided at appropriate intervals.
A pilot insulator for stain measurement, characterized in that the part between them is a semiconductive part 3 coated with a semiconductive glaze.
JP3954785U 1985-03-19 1985-03-19 Expired JPH0353184Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3954785U JPH0353184Y2 (en) 1985-03-19 1985-03-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3954785U JPH0353184Y2 (en) 1985-03-19 1985-03-19

Publications (2)

Publication Number Publication Date
JPS61155772U true JPS61155772U (en) 1986-09-27
JPH0353184Y2 JPH0353184Y2 (en) 1991-11-20

Family

ID=30547592

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3954785U Expired JPH0353184Y2 (en) 1985-03-19 1985-03-19

Country Status (1)

Country Link
JP (1) JPH0353184Y2 (en)

Also Published As

Publication number Publication date
JPH0353184Y2 (en) 1991-11-20

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