JPS6114590A - 半導体放射線検出装置 - Google Patents

半導体放射線検出装置

Info

Publication number
JPS6114590A
JPS6114590A JP13549284A JP13549284A JPS6114590A JP S6114590 A JPS6114590 A JP S6114590A JP 13549284 A JP13549284 A JP 13549284A JP 13549284 A JP13549284 A JP 13549284A JP S6114590 A JPS6114590 A JP S6114590A
Authority
JP
Japan
Prior art keywords
circuit
output
signal
amplifier
waveform shaping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13549284A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0533356B2 (enrdf_load_html_response
Inventor
Yoshihiko Kumazawa
熊澤　良彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP13549284A priority Critical patent/JPS6114590A/ja
Priority to DE8585107993T priority patent/DE3584477D1/de
Priority to EP85107993A priority patent/EP0167119B1/en
Priority to US06/749,212 priority patent/US4727256A/en
Publication of JPS6114590A publication Critical patent/JPS6114590A/ja
Publication of JPH0533356B2 publication Critical patent/JPH0533356B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP13549284A 1984-06-30 1984-06-30 半導体放射線検出装置 Granted JPS6114590A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP13549284A JPS6114590A (ja) 1984-06-30 1984-06-30 半導体放射線検出装置
DE8585107993T DE3584477D1 (de) 1984-06-30 1985-06-27 Halbleiterstrahlungsdetektor.
EP85107993A EP0167119B1 (en) 1984-06-30 1985-06-27 Semiconductor radiation detector
US06/749,212 US4727256A (en) 1984-06-30 1985-06-27 Semiconductor radiation detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13549284A JPS6114590A (ja) 1984-06-30 1984-06-30 半導体放射線検出装置

Publications (2)

Publication Number Publication Date
JPS6114590A true JPS6114590A (ja) 1986-01-22
JPH0533356B2 JPH0533356B2 (enrdf_load_html_response) 1993-05-19

Family

ID=15152997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13549284A Granted JPS6114590A (ja) 1984-06-30 1984-06-30 半導体放射線検出装置

Country Status (1)

Country Link
JP (1) JPS6114590A (enrdf_load_html_response)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4767929A (en) * 1986-10-06 1988-08-30 The United States Of America As Represented By The United State Department Of Energy Extended range radiation dose-rate monitor
US4893018A (en) * 1986-05-21 1990-01-09 Kabushiki Kaisha Toshiba Radiation detecting circuit including positional error calibrator
JP2002350552A (ja) * 2001-05-28 2002-12-04 Mitsubishi Electric Corp 放射線検出装置
JP2005049144A (ja) * 2003-07-30 2005-02-24 Toshiba Corp 放射線計測方法
JP2006234661A (ja) * 2005-02-25 2006-09-07 Toshiba Corp 放射線入射位置検出装置および放射線入射位置検出方法
US7372035B2 (en) 2004-09-02 2008-05-13 Hitachi, Ltd. Radiological imaging apparatus
JP2009097967A (ja) * 2007-10-16 2009-05-07 High Energy Accelerator Research Organization 中性子計測用ガス検出装置
CN102224434A (zh) * 2009-02-11 2011-10-19 马特斯·丹尼尔森 用于x射线成像的硅检测器组件
CN104020484A (zh) * 2014-05-20 2014-09-03 西北核技术研究所 一种用于系统触发和波形测量的闪烁探测系统及方法
WO2025187264A1 (ja) * 2024-03-07 2025-09-12 国立大学法人 東京大学 信号処理回路、半導体ピクセル検出器、情報処理方法、プログラム、情報処理装置、情報処理システム及び装置

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4893018A (en) * 1986-05-21 1990-01-09 Kabushiki Kaisha Toshiba Radiation detecting circuit including positional error calibrator
US4767929A (en) * 1986-10-06 1988-08-30 The United States Of America As Represented By The United State Department Of Energy Extended range radiation dose-rate monitor
JP2002350552A (ja) * 2001-05-28 2002-12-04 Mitsubishi Electric Corp 放射線検出装置
JP2005049144A (ja) * 2003-07-30 2005-02-24 Toshiba Corp 放射線計測方法
US7372035B2 (en) 2004-09-02 2008-05-13 Hitachi, Ltd. Radiological imaging apparatus
JP2006234661A (ja) * 2005-02-25 2006-09-07 Toshiba Corp 放射線入射位置検出装置および放射線入射位置検出方法
JP2009097967A (ja) * 2007-10-16 2009-05-07 High Energy Accelerator Research Organization 中性子計測用ガス検出装置
CN102224434A (zh) * 2009-02-11 2011-10-19 马特斯·丹尼尔森 用于x射线成像的硅检测器组件
CN104020484A (zh) * 2014-05-20 2014-09-03 西北核技术研究所 一种用于系统触发和波形测量的闪烁探测系统及方法
WO2025187264A1 (ja) * 2024-03-07 2025-09-12 国立大学法人 東京大学 信号処理回路、半導体ピクセル検出器、情報処理方法、プログラム、情報処理装置、情報処理システム及び装置

Also Published As

Publication number Publication date
JPH0533356B2 (enrdf_load_html_response) 1993-05-19

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JPS6114591A (ja) 半導体放射線位置検出装置