JPS61132774U - - Google Patents

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Publication number
JPS61132774U
JPS61132774U JP1605385U JP1605385U JPS61132774U JP S61132774 U JPS61132774 U JP S61132774U JP 1605385 U JP1605385 U JP 1605385U JP 1605385 U JP1605385 U JP 1605385U JP S61132774 U JPS61132774 U JP S61132774U
Authority
JP
Japan
Prior art keywords
external terminals
socket
testing
electromagnet
provided below
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1605385U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1605385U priority Critical patent/JPS61132774U/ja
Publication of JPS61132774U publication Critical patent/JPS61132774U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Connecting Device With Holders (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案実施例の構成図、第２図は従来
例を示す図である。 １……ＱＦＰ型ＩＣ（被試験体）、２……外部
端子、３……基台、４……ソケツトターミナル、
５……電磁石、７……試験機本体。 FIG. 1 is a block diagram of an embodiment of the present invention, and FIG. 2 is a diagram showing a conventional example. 1...QFP type IC (test object), 2...External terminal, 3...Base, 4...Socket terminal,
5...Electromagnet, 7...Testing machine body.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 外部端子が強磁性体を含む材料よりなる電子部
品を試験する装置であつて、ソケツトターミナル
の下方に電磁石を設け、試験時に上記外部端子に
磁気吸引力が作用するよう構成された電子部品試
験用ソケツト装置。 An electronic component test device for testing electronic components whose external terminals are made of a material containing ferromagnetic material, which is configured so that an electromagnet is provided below the socket terminal and a magnetic attraction force is applied to the external terminals during testing. socket device.
JP1605385U 1985-02-06 1985-02-06 Pending JPS61132774U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1605385U JPS61132774U (en) 1985-02-06 1985-02-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1605385U JPS61132774U (en) 1985-02-06 1985-02-06

Publications (1)

Publication Number Publication Date
JPS61132774U true JPS61132774U (en) 1986-08-19

Family

ID=30502460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1605385U Pending JPS61132774U (en) 1985-02-06 1985-02-06

Country Status (1)

Country Link
JP (1) JPS61132774U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20130050592A (en) * 2011-11-08 2013-05-16 삼성전자주식회사 Test apparatus of semiconductor package and methods of testing the semiconductor package using the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20130050592A (en) * 2011-11-08 2013-05-16 삼성전자주식회사 Test apparatus of semiconductor package and methods of testing the semiconductor package using the same

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