JPS61131678U - - Google Patents
Info
- Publication number
- JPS61131678U JPS61131678U JP1440585U JP1440585U JPS61131678U JP S61131678 U JPS61131678 U JP S61131678U JP 1440585 U JP1440585 U JP 1440585U JP 1440585 U JP1440585 U JP 1440585U JP S61131678 U JPS61131678 U JP S61131678U
- Authority
- JP
- Japan
- Prior art keywords
- housing
- test probes
- circuit board
- printed circuit
- housed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000005476 soldering Methods 0.000 claims description 3
- 238000009413 insulation Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1440585U JPS61131678U (enExample) | 1985-02-04 | 1985-02-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1440585U JPS61131678U (enExample) | 1985-02-04 | 1985-02-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61131678U true JPS61131678U (enExample) | 1986-08-16 |
Family
ID=30499299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1440585U Pending JPS61131678U (enExample) | 1985-02-04 | 1985-02-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61131678U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01184480A (ja) * | 1988-01-18 | 1989-07-24 | Tokyo Electron Ltd | 検査方法及び検査装置 |
-
1985
- 1985-02-04 JP JP1440585U patent/JPS61131678U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01184480A (ja) * | 1988-01-18 | 1989-07-24 | Tokyo Electron Ltd | 検査方法及び検査装置 |