JPS61127189A - Optical semiconductor device - Google Patents

Optical semiconductor device

Info

Publication number
JPS61127189A
JPS61127189A JP24702784A JP24702784A JPS61127189A JP S61127189 A JPS61127189 A JP S61127189A JP 24702784 A JP24702784 A JP 24702784A JP 24702784 A JP24702784 A JP 24702784A JP S61127189 A JPS61127189 A JP S61127189A
Authority
JP
Japan
Prior art keywords
transmitting plate
infrared
optical semiconductor
infrared transmitting
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24702784A
Other languages
Japanese (ja)
Inventor
Yoshito Nishijima
西嶋 由人
Koji Shinohara
篠原 宏爾
Hirokazu Fukuda
福田 広和
Koji Ebe
広治 江部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP24702784A priority Critical patent/JPS61127189A/en
Publication of JPS61127189A publication Critical patent/JPS61127189A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To reduce the effect of the return light from the infrared-transmitting plate and to prevent a reflected wave noise from generating in an optical semiconductor device by a method wherein an optical semiconductor element is disposed in the cooling container having a window consisting of the infrared- transmitting plate and the other infrared-transmitting plate slanted to the optical axis of the optical semiconductor device is arranged between the optical semiconductor element and the infrared-transmitting plate. CONSTITUTION:The optical semiconductor device is constituted of a cooling container 1 consisting of a Dewar vessel, a window 2 consisting of an infrared- transmitting plate, a cooling substrate 3, a heat sink 4 consisting of copper, a ceramic layer 5, a laser chip 6, a ribbon line 7, a cover 8 and an infrared- transmitting plate 11, which is mounted slantingly to the optical axis of the device in the front of the cover 8. A return light 10 from the infrared- transmitting plate 2 is reflected by the infrared-transmitting plate 11 and does not make incident to the laser chip 6. Accordingly, the generation of a reflected wave noise can be prevented.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、使用する場合に冷却することが必要な光半導
体素子を備えた光半導体装置、例えば赤外光の分野で用
いるのに好適な光半導体装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention provides an optical semiconductor device equipped with an optical semiconductor element that needs to be cooled when used, such as an optical semiconductor device suitable for use in the field of infrared light. Related to optical semiconductor devices.

〔従来の技術〕[Conventional technology]

例えば赤外光を発生する鉛塩レーザは冷却しながら動作
させる必要がある為、デューア瓶(Dewar  ve
ssel)内に素子を配設する。
For example, a lead salt laser that generates infrared light must be operated while being cooled, so it is
ssel).

第2図は従来に於けるこの種の光半導体装置の要部切断
側面図である。
FIG. 2 is a cross-sectional side view of essential parts of a conventional optical semiconductor device of this type.

図に於いて、1は冷岨容器であるデエーア瓶、2はフン
化バリウムやゲルマニウム(Ge)或いはシリコン(S
t)等からなる赤外透過板、3は冷却基台、4は例えば
銅(Cu)からなるヒート・シンク、5はセラミック層
、6はレーザ・チップ、7は例えば金(Au)からなる
リボン線、8はカバー、9は出射赤外光、10は戻り光
をそれぞれ示している。
In the figure, 1 is a deair bottle, which is a cold container, and 2 is a container for barium fluoride, germanium (Ge), or silicon (S).
3 is a cooling base, 4 is a heat sink made of, for example, copper (Cu), 5 is a ceramic layer, 6 is a laser chip, and 7 is a ribbon made of, for example, gold (Au). 8 represents the cover, 9 represents the emitted infrared light, and 10 represents the returned light.

図から判るように、この光半導体装置に於いては、レー
ザ・チップ6から出射された赤外光9の一部は赤外透過
板2で反射され戻り光10となってレーザ・チップ6に
入射される場合がある。
As can be seen from the figure, in this optical semiconductor device, a part of the infrared light 9 emitted from the laser chip 6 is reflected by the infrared transmitting plate 2 and becomes return light 10, which is transmitted to the laser chip 6. It may be injected.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

前記のように赤外透過板2で反射された戻り光10がレ
ーザ・チップ6に入射されると所謂反射波雑音が発生す
る。
As described above, when the return light 10 reflected by the infrared transmitting plate 2 is incident on the laser chip 6, so-called reflected wave noise is generated.

これは、戻り光10がレーザ・チップ6に入るとキャリ
ヤ濃度が変化し、これに依すレーザ共振器内の屈折率が
変化してAM及びFMの雑音を発生するものであり、こ
のような状態になると、高感度のガス観測系に於いては
感度が低下することになる。
This is because when the returned light 10 enters the laser chip 6, the carrier concentration changes, which changes the refractive index within the laser resonator and generates AM and FM noise. If this happens, the sensitivity of highly sensitive gas observation systems will decrease.

本発明は、この種の光半導体装置に於ける戻り光の影響
を低減し、反射波雑音が発生しないようにする。
The present invention reduces the influence of returned light in this type of optical semiconductor device, and prevents reflected wave noise from occurring.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の光半導体装置では、第1の赤外透過板からなる
窓を有する冷却容器と、該冷却容器内に於いて前記赤外
透過板と対向して配置された光半導体素子と、該光半導
体素子と前記赤外透過板との間に於いて該光半導体素子
からの出射光の光軸に対して傾斜した状態で配設された
第2の赤外透過板とを備えている。
The optical semiconductor device of the present invention includes: a cooling container having a window made of a first infrared transmitting plate; an optical semiconductor element disposed in the cooling container facing the infrared transmitting plate; A second infrared transmitting plate is provided between the semiconductor element and the infrared transmitting plate so as to be inclined with respect to the optical axis of the light emitted from the optical semiconductor element.

〔作用〕[Effect]

前記手段を採ると、光半導体素子から出射され第2の赤
外透過板を透過し第1の赤外透過板で反射された戻り光
は、第2の赤外透過板で反射されるので光半導体素子に
入射することはなく、従って、反射波雑音は発生しない
When the above means is adopted, the return light that is emitted from the optical semiconductor element, passes through the second infrared transmitting plate, and is reflected by the first infrared transmitting plate is reflected by the second infrared transmitting plate, so that the light The light does not enter the semiconductor element, so no reflected wave noise is generated.

〔実施例〕〔Example〕

第1図は本発明一実施例の要部切断側面図であり、第2
図に関して説明した部分と同部分は同記号で指示しであ
る。
FIG. 1 is a cutaway side view of essential parts of one embodiment of the present invention, and FIG.
The same parts as those described with respect to the figures are indicated by the same symbols.

本実施例が第2図に示した従来例と相違する点は、赤外
透過板2(第1の赤外透過板)とレーザ・チップ6(光
半導体素子)との間に赤外透過板11 (第2の赤外透
過板)をレーザ・チップ6からの出射光9の光軸に対し
て傾斜した状態に配設したことである。
This embodiment is different from the conventional example shown in FIG. 11 (second infrared transmitting plate) is arranged in an inclined state with respect to the optical axis of the emitted light 9 from the laser chip 6.

即ち、第2図に示したμs来例では、ヒート・シンクに
実装されたレーザ・チップ6は前面が開放されたカバー
8で覆われているのみであったが、本実施例では、その
開放されている前面に第2の赤外透過板である赤外透過
板11を取り付けである。尚、この赤外透過板11も、
赤外透過板2と同様、フン化バリウム、ゲルマニウム、
シリコン等を用いて良い。
That is, in the μs conventional example shown in FIG. An infrared transmitting plate 11, which is a second infrared transmitting plate, is attached to the front surface of the camera. Incidentally, this infrared transmitting plate 11 also
Similar to infrared transmitting plate 2, barium fluoride, germanium,
Silicon or the like may be used.

このようにすると、赤外透過板2からの戻り光10は赤
外透過板11に於いて図示の方向に反射されレーザ・チ
ップ6に入射されることはない。
In this way, the return light 10 from the infrared transmitting plate 2 is reflected by the infrared transmitting plate 11 in the direction shown, and does not enter the laser chip 6.

従って、反射波雑音は発生しないから、この光半導体装
置は高感度を維持することができる。
Therefore, since no reflected wave noise is generated, this optical semiconductor device can maintain high sensitivity.

また、前記実施例に於いて、第2の赤外透過板である赤
外透過板11或いは第1の赤外透過板である赤外透過板
2の裏面、即ち、レーザ・チップ6に対面している側に
無反射コーティングを施すことが望ましい。
Further, in the above embodiment, the back surface of the infrared transmitting plate 11 which is the second infrared transmitting plate or the infrared transmitting plate 2 which is the first infrared transmitting plate, that is, facing the laser chip 6. It is advisable to apply an anti-reflective coating to the side facing the camera.

〔発明の効果〕〔Effect of the invention〕

本発明の光半導体装置では、冷却容器の窓である第1の
赤外透過板と該第1の赤外透過板に対向する光半導体素
子との間に該光半導体素子の出射光の光軸に対し所定の
傾斜をもたせて第2の赤外透過板を配設した構造になっ
ている。
In the optical semiconductor device of the present invention, the optical axis of the light emitted from the optical semiconductor element is located between the first infrared transmitting plate, which is the window of the cooling container, and the optical semiconductor element facing the first infrared transmitting plate. The second infrared transmitting plate is arranged at a predetermined inclination relative to the second infrared transmitting plate.

従って、光半導体素子から出射された赤外光は第2及び
第1の赤外透過板を通過して外部に放射され、そして、
第1の赤外透過板に依って赤外光の一部が反射されて戻
り光になったとしても、その戻り光は第2の赤外透過板
に依って反射されるので光半導体素子に入射されること
はないから、反射波雑音の発生は極めて低く抑えること
ができる。また、本発明を実施するにも、従来、開放さ
  1、れていたカバーの前面に第2の赤外透過板を取
り付けるだけであるから、従来の光半導体装置と比較し
て、然程大きな構造改変にはならない。
Therefore, the infrared light emitted from the optical semiconductor element passes through the second and first infrared transmitting plates and is emitted to the outside, and
Even if a part of the infrared light is reflected by the first infrared transmitting plate and becomes return light, the returned light is reflected by the second infrared transmitting plate, so that it does not affect the optical semiconductor element. Since it is not incident, the generation of reflected wave noise can be suppressed to an extremely low level. Furthermore, in carrying out the present invention, only a second infrared transmitting plate is attached to the front surface of the cover, which was conventionally left open, so the device is considerably larger than the conventional optical semiconductor device. There will be no structural changes.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明一実施例の要部切断側面図、第2図は従
来例の要部切断側面図をそれぞれ表している。 図に於いて、1は冷却容器であるデューア瓶、2は赤外
透過板、3は冷却基台、4はヒート・シンク、5はセラ
ミック層、6はレーザ・チップ、7はリボン線、8はカ
バー、9は出射赤外光、10は戻り光、11は赤外透過
板をそれぞれ示している。
FIG. 1 is a cutaway side view of the main part of an embodiment of the present invention, and FIG. 2 is a cutaway side view of the main part of a conventional example. In the figure, 1 is a Dewar bottle which is a cooling container, 2 is an infrared transmission plate, 3 is a cooling base, 4 is a heat sink, 5 is a ceramic layer, 6 is a laser chip, 7 is a ribbon wire, 8 9 indicates a cover, 9 indicates an emitted infrared light, 10 indicates a returned light, and 11 indicates an infrared transmitting plate.

Claims (1)

【特許請求の範囲】[Claims] 第1の赤外透過板からなる窓を有する冷却容器と、該冷
却容器内に於いて前記赤外透過板と対向して配置された
光半導体素子と、該光半導体素子と前記赤外透過板との
間に於いて該光半導体素子からの出射光の光軸に対して
傾斜した状態で配設された第2の赤外透過板とを備えて
なることを特徴とする光半導体装置。
a cooling container having a window made of a first infrared transmitting plate; an optical semiconductor element disposed in the cooling container to face the infrared transmitting plate; and the optical semiconductor element and the infrared transmitting plate. an optical semiconductor device, comprising: a second infrared transmitting plate disposed between the optical semiconductor device and the second infrared transmitting plate in an inclined state with respect to the optical axis of the light emitted from the optical semiconductor element.
JP24702784A 1984-11-24 1984-11-24 Optical semiconductor device Pending JPS61127189A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24702784A JPS61127189A (en) 1984-11-24 1984-11-24 Optical semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24702784A JPS61127189A (en) 1984-11-24 1984-11-24 Optical semiconductor device

Publications (1)

Publication Number Publication Date
JPS61127189A true JPS61127189A (en) 1986-06-14

Family

ID=17157311

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24702784A Pending JPS61127189A (en) 1984-11-24 1984-11-24 Optical semiconductor device

Country Status (1)

Country Link
JP (1) JPS61127189A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007063542A2 (en) * 2005-11-29 2007-06-07 Elta Systems Ltd. Optical projection system and method for a cooled light source

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007063542A2 (en) * 2005-11-29 2007-06-07 Elta Systems Ltd. Optical projection system and method for a cooled light source
WO2007063542A3 (en) * 2005-11-29 2007-07-19 Elta Systems Ltd Optical projection system and method for a cooled light source
US8121158B2 (en) 2005-11-29 2012-02-21 Elta Systems Ltd. Optical projection system and method for a cooled light source

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