JPS61102880U - - Google Patents
Info
- Publication number
- JPS61102880U JPS61102880U JP18610084U JP18610084U JPS61102880U JP S61102880 U JPS61102880 U JP S61102880U JP 18610084 U JP18610084 U JP 18610084U JP 18610084 U JP18610084 U JP 18610084U JP S61102880 U JPS61102880 U JP S61102880U
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- burn
- test object
- heater
- stopped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 2
- 230000005611 electricity Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984186100U JPH0439584Y2 (cg-RX-API-DMAC7.html) | 1984-12-10 | 1984-12-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984186100U JPH0439584Y2 (cg-RX-API-DMAC7.html) | 1984-12-10 | 1984-12-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61102880U true JPS61102880U (cg-RX-API-DMAC7.html) | 1986-06-30 |
| JPH0439584Y2 JPH0439584Y2 (cg-RX-API-DMAC7.html) | 1992-09-16 |
Family
ID=30743563
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984186100U Expired JPH0439584Y2 (cg-RX-API-DMAC7.html) | 1984-12-10 | 1984-12-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0439584Y2 (cg-RX-API-DMAC7.html) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57124264A (en) * | 1981-01-26 | 1982-08-03 | Fujitsu Ltd | Burn-in testing equipment |
| JPS58155375A (ja) * | 1982-03-11 | 1983-09-16 | Nec Ic Microcomput Syst Ltd | 半導体装置の電圧印加高温連続試験法 |
-
1984
- 1984-12-10 JP JP1984186100U patent/JPH0439584Y2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57124264A (en) * | 1981-01-26 | 1982-08-03 | Fujitsu Ltd | Burn-in testing equipment |
| JPS58155375A (ja) * | 1982-03-11 | 1983-09-16 | Nec Ic Microcomput Syst Ltd | 半導体装置の電圧印加高温連続試験法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0439584Y2 (cg-RX-API-DMAC7.html) | 1992-09-16 |
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