JPS6093978U - Measuring equipment for semiconductor devices - Google Patents
Measuring equipment for semiconductor devicesInfo
- Publication number
- JPS6093978U JPS6093978U JP18722083U JP18722083U JPS6093978U JP S6093978 U JPS6093978 U JP S6093978U JP 18722083 U JP18722083 U JP 18722083U JP 18722083 U JP18722083 U JP 18722083U JP S6093978 U JPS6093978 U JP S6093978U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor devices
- measurement terminal
- measuring equipment
- support arm
- vibrator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図はこの考案の実施例を示す平面図、第2図は同正
面図である。
1.2・・・・・・支持アーム、3,4・・・・・・回
転軸、5.6・・・・・・測定端子、7・・・・・・半
導体装置、8,9・・・・・・リード、10・・・・・
・バイブレータ。FIG. 1 is a plan view showing an embodiment of this invention, and FIG. 2 is a front view of the same. 1.2... Support arm, 3, 4... Rotating shaft, 5.6... Measurement terminal, 7... Semiconductor device, 8, 9... ...Lead, 10...
・Vibrator.
Claims (1)
前記測定端子を支持する支持アームと、前記測定端子又
は支持アームに微振動を与えるバイブレータとからなり
、前記リードを表裏面から・挾持する測定端子が前記リ
ードとの接触部でこするように前記バイブレータによっ
て前記測定端子又は支持アームを微振動せしめてなる半
導体装置用測定装置。A measurement terminal that holds the leads of a semiconductor device from the front and back sides,
It consists of a support arm that supports the measurement terminal, and a vibrator that applies slight vibrations to the measurement terminal or support arm, and the measurement terminal that holds the lead from the front and back sides rubs the contact part with the lead. A measuring device for a semiconductor device, which uses a vibrator to slightly vibrate the measuring terminal or the support arm.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18722083U JPS6093978U (en) | 1983-12-02 | 1983-12-02 | Measuring equipment for semiconductor devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18722083U JPS6093978U (en) | 1983-12-02 | 1983-12-02 | Measuring equipment for semiconductor devices |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6093978U true JPS6093978U (en) | 1985-06-26 |
JPH0435820Y2 JPH0435820Y2 (en) | 1992-08-25 |
Family
ID=30404183
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18722083U Granted JPS6093978U (en) | 1983-12-02 | 1983-12-02 | Measuring equipment for semiconductor devices |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6093978U (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56149967U (en) * | 1980-04-11 | 1981-11-11 |
-
1983
- 1983-12-02 JP JP18722083U patent/JPS6093978U/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56149967U (en) * | 1980-04-11 | 1981-11-11 |
Also Published As
Publication number | Publication date |
---|---|
JPH0435820Y2 (en) | 1992-08-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6093978U (en) | Measuring equipment for semiconductor devices | |
JPS5871174U (en) | Characteristic measuring device for electronic components with parallel leads | |
JPS58140479U (en) | Semiconductor device characteristic measuring device | |
JPS5861220U (en) | ultrasonic probe | |
JPS593619U (en) | Crystal oscillator | |
JPS59144417U (en) | Level that can measure angles | |
JPS6064246U (en) | Sample stand for thermogravimetric measuring device | |
JPS59138719U (en) | Sensor holding jig | |
JPS6042937U (en) | Vibration test equipment | |
JPS59107078U (en) | housing | |
JPS58159740U (en) | Wire peel test equipment | |
JPS5927410U (en) | surface roughness measuring instrument | |
JPS6054977U (en) | adapter | |
JPS5920134U (en) | digital pressure measuring device | |
JPS59182742U (en) | computer peripherals | |
JPS6021966U (en) | Slit type contact for handler | |
JPS59151441U (en) | semiconductor test equipment | |
JPS6134484U (en) | Characteristic measuring device for electronic components | |
JPS594671U (en) | Solder immersion test equipment | |
JPS6138574U (en) | IC inspection equipment | |
JPS5869938U (en) | Semiconductor device inspection equipment | |
JPS6079102U (en) | Structure of body shell shape measurement reference tool | |
JPS58125880U (en) | Semiconductor device measurement jig | |
JPS6052623U (en) | Ultrasonic cleaning equipment | |
JPS58158372U (en) | Semiconductor device measurement jig |