JPS6092694A - Wiring testing device of printed circuit board - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wiring testing device for detecting disconnections and bridging locations in printed wiring board circuit patterns.

As shown in FIG. 1, the conventional printed wiring board wiring test device has probes 2 mounted at predetermined pitch intervals on the underside of a plate-shaped globe holder 1 placed horizontally above a printed wiring board 8 to be inspected. Planted in a grid pattern and hanging down.

Further, one end of the probe 2 is connected to a probe section 4 via a wiring cable 3. On the other hand, the printed wiring board to be inspected 8
A pressure table is horizontally disposed below via a positioning adapter 7. This pressurizing chip 4 pull 5 moves up and down in the vertical direction according to the up and down of a pressurizing mechanism 6 connected therebelow. The positioning adapter 7 on the upper surface of the pressure table 5 is configured to be removably fixed. The positioning adapter 7 includes a printed wiring board to be inspected (hereinafter abbreviated as wiring board) 8
A pilot pin 9 for positioning and fixing is installed, and the position of this pilot pin 9 is between the through-hole land 8a of the wiring board 8 and the globe holder 1 when the marking machine 8 is placed on the positioning adapter 7. The probe 2 is determined to correspond to the probe 2.

In order to perform a wiring test on a wiring board using such a conventional wiring testing device, a pilot pin 9 is inserted into the positioning hole 8b of the wiring board 8, fixed on the positioning adapter 7, and the pressure mechanism 6 to raise the pressure table 5 and probe 2.
and through-hole land 8a of wiring board 8 are brought into contact with each other.

Next, the scanner unit 4 is operated and a wiring test of the wiring board 8 is performed.

After the wiring test is completed, the pressure mechanism 6 is activated to lower the pressure table 5, and the wiring board 8 is taken out to complete the wiring test.

However, conventional wiring testing equipment has the following drawbacks.

(Support) Since the probes hanging from the probe holder are planted according to the maximum external shape of the wiring board, the number of probes is large, and the cost of manufacturing the probe holder and globe and the wiring thereof increases, which increases the cost of the product. It gets expensive. For example, the outer diameter of the probe holder is 600 mm x 600 mm, and the grid spacing is 2.
．． For a 54-pitch probe, approximately 55,800
A book probe is required.

0) When the number of probes increases, a large pressing force is required as a whole, and the number of wiring cables also increases, so the structure of the pressing mechanism and the entire device becomes complicated.

(fA: If the external shape of the wiring board is larger than the planned area or the number of probes is insufficient, divide the area of the wiring board where the wiring test will be performed into several areas and wire each area independently. Although a method of performing a line test has been adopted, this divided wiring test method cannot perform a wiring test of a wiring pattern divided into separate areas.

It is an object of the present invention to provide a printed wiring board wiring testing device that eliminates such conventional drawbacks.

According to the present invention, there is provided a probe holder that suspends probes protruding in a grid pattern at predetermined pitch intervals.

The support rod protruding from one side of the glove holder is X,
A support section that moves in the Y direction and holds the support section.

A support plate with the support part suspended from both ends, a pressure table on which a removable positioning adapter with a pilot pin planted under the probe is placed, and a pressure table that comes into contact with the pressure table. A pressurizing mechanism that moves up and down, a scanner unit electrically connected to the probe by wire, and a central processing unit that controls the scanner unit, the control unit, and the external storage unit; ≠1. A printed wiring board wiring test device is obtained, which is characterized in that it is configured from the following.

Examples of the present invention are shown below in Figs. 2(a), φ) and 3(a).
).

This will be explained with reference to ΦL (C)-(dL (e)* (').

FIG. 2(a) is a side sectional view of a schematic configuration showing one embodiment of the present invention, and FIG. 2(a) is a perspective view for explaining the operation of the probe holders 21at and 21b in FIG. It is a diagram.

Probes 2a12 returned at predetermined pitch intervals in a grid pattern
Glove holder 21 with each part b planted and hanging down.
a, 21b and the support rods 22a, 22b protruding from one side of the glove holders 21a, 21b are connected to the support plate 20.
X in FIG. 2 is held between support parts 23a and 23b suspended from both ends of the support parts 23a and 23b, and is driven by a drive mechanism built into the support parts 23a and 23bK, such as an air cylinder.

Move in the Y direction. The control unit 24 of the wiring test device controls the probe holders 21a and 21b according to instructions from the central processing unit 10.
can be moved independently any distance. The scanner section 4 has probe holders 21a, 21b (7
) Each probe 2a, 2b is connected to the wiring cable 3 in an airtight manner.

Based on the conduction/nonconduction data stored in the external storage section 11, atmospheric pressure is applied to the probes 2a and 2b according to a command from the central processing section, and the probe 2a.

The voltage generated at 2b is detected and the wiring board 8 is made conductive.

Compare with non-conduction data to determine pass/fail. The pressure mechanism 6 moves the pressure table 5 up and down in a direction perpendicular to the plate surface of the pressure table 50 according to a command from the control section 23 . Note that the control unit 2
2 is a probe holder 21a.

21b and the pressure mechanism 6, when the probe holders 21a and 21b respectively move left and right in the arrow directions and stop, the pressure mechanism 6 controls the globe holder 21.
probe holders 21a and 21 in conjunction with a and 21b.
Move up and down so that b can be moved.

Next, a wiring test method for a printed wiring board using the wiring testing apparatus of the present invention will be explained.

FIGS. 3(11) to 3(f) are plan views for explaining the relationship between the wiring board 8 and two movable probe holders 21a and 21b. First, when the scanner unit 4 (not shown) is operated in the state shown in FIG. 3(a), the probe holder 21a
A wiring test can be performed on the wiring pattern included in the effective area (shaded area) of the probes 2a and 21b. That is, the wiring pattern 30a on the wiring board 8 can be subjected to a wiring test, but other wiring patterns are excluded from the wiring test. Next, as shown in FIG. 3), when the probe holder 21b is moved and the scanner section is operated, the wiring pattern included in the effective area (f+ line part) of the probes 2a and 2b spanning the spaced apart globe holders 21a and 21b. Wiring tests can be performed. That is, although the wiring pattern 30f on the wiring board 8 can be subjected to a wiring test,
Other wiring patterns are excluded from the wiring test.

Furthermore, as shown in FIG. 3(C), the probe holder 21a
When the scanner unit 4 is operated by moving the probe holder 21b and contacting the probe holder 21b, the glove holders 21a and 21
The wiring test of the wiring pattern included in the glove effective area (shaded area) of b can be irritated. That is, the wiring pattern 30b on the wiring board 8 can be subjected to a wiring test, but other wiring patterns are excluded from the wiring test. The same applies to FIGS. 3(d) to 4(f).

Therefore, by combining the six operations shown in FIGS. 3(a) to 3(f), wiring tests can be performed on all wiring patterns on the wiring board 8.

As described above, the present invention has the following effects.

Medium There is no need to install the probes in the probe holder to match the maximum external shape of the wiring board, and the number of probes is half that of the case where the probes are installed according to the maximum external shape, so probe costs and wiring costs are reduced. .

(11) Since the number of gloves is halved, the pressing force can be reduced. Therefore, the number of wiring cables is reduced,
The structure of the pressurizing mechanism and the entire device becomes simple.

(Iio The combination of two movable probe holders makes it possible to perform wiring tests on all wiring patterns on a wiring board, so even if the wiring board has a large shape and there are not enough shib ropes, all wiring patterns on the wiring board can be tested. Wiring tests can be performed on wiring patterns.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a side sectional view of a schematic configuration of a conventional wiring test device. FIG. 2(a) shows a schematic diagram of the configuration of a wiring test device according to an example of the present invention.
11! I sectional view. FIG. 2(b) is a perspective view for explaining the operation of the probe holders 21a, 21b in FIG. 2(a). FIGS. 3(a) to 3(f) are plan views illustrating a wiring test method in an embodiment of the present invention. 1... Glove holder, 2a, 2b...
・Probe, 3...Wiring cable, 4...
...Scanner section, 5...Pressure table, 6...
...Pressure mechanism, 7. Old positioning adapter, 8.
...Printed wiring board to be inspected, 8a...Through hole land, Bb...Positioning hole, 9...
...Pilot bin, 10, song, central processing mm, 11
...External memory section, 20 ... Poetry board, 2
1a, 21b°°°°°Probe holter, 22a, 2
2b...Support rod. 23a, 23b... Support portion, 30a to 30f.
Old... Question line pattern Figure 1 Figure 2 (b)

Claims (1)

[Claims] a probe holder that suspends gloves protruding at predetermined pitch intervals in a grid pattern; a support section that moves and holds a support rod protruding from one side of the glove holder in the X and Y directions; and the support section. a support plate suspended from both ends of the probe, a pressure table on which a removable positioning adapter with a pilot bottle planted under the probe is mounted, and a pressure table that comes into contact with the pressure table to move the pressure table up and down. A pressure mechanism, a scanner section electrically connected to the probe, a control section that controls movement of the support plate and the pressure table, and a control section that controls the scanner section, the control section, and an external storage section. A wiring testing device for printed wiring boards whose percentage value is that it has a central processing section that performs the following functions.